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"Superior reliability and reduced Time-Dependent variability in ..."

Jacopo Franco et al. (2012)

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DOI: 10.1109/ICICDT.2012.6232839

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/icicdt/FrancoKMTCERGCK12
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  - https://dblp.org/rec/conf/icicdt/FrancoKMTCERGCK12
Jacopo Franco, Ben Kaczer, Jérôme Mitard, Maria Toledano-Luque, Felice Crupi, Geert Eneman, Ph. J. Rousse, Tibor Grasser, M. Cho, Thomas Kauerauf, Liesbeth Witters, Geert Hellings, L.-Å. Ragnarsson, Naoto Horiguchi, Marc M. Heyns, Guido Groeseneken:
Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications. ICICDT 2012: 1-4

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