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"Test generation of C-testable array dividers."

Chin-Long Wey, Sin-Min Chang (1988)

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DOI: 10.1109/ICCD.1988.25678

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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  - conf/iccd/WeyC88
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Chin-Long Wey, Sin-Min Chang:
Test generation of C-testable array dividers. ICCD 1988: 140-144

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