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"A Novel Test Set Design for Parametric Testing of Analog and Mixed-Signal ..."

Jin Chen, Akhileswaran Ramachandran (1997)

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DOI: 10.1109/ICCD.1997.628911

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iccd/ChenR97
Jin Chen, Akhileswaran Ramachandran:
A Novel Test Set Design for Parametric Testing of Analog and Mixed-Signal Circuits. ICCD 1997: 474-480

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