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"CRIS: a test cultivation program for sequential VLSI circuits."

Daniel G. Saab, Youssef Saab, Jacob A. Abraham (1992)

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DOI: 10.1109/ICCAD.1992.279372

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/SaabSA92
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  - https://dblp.org/rec/conf/iccad/SaabSA92
Daniel G. Saab, Youssef Saab, Jacob A. Abraham:
CRIS: a test cultivation program for sequential VLSI circuits. ICCAD 1992: 216-219

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