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"On the quality of test vectors for post-silicon characterization."

Matthias Sauer et al. (2012)

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DOI: 10.1109/ETS.2012.6233027

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  dblp key:
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Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian:
On the quality of test vectors for post-silicon characterization. ETS 2012: 1-6

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