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"Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in ..."

Vezio Malandruccolo et al. (2009)

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DOI: 10.1109/ETS.2009.18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/ets/MalandruccoloCFR09
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  persistent URL:
  - https://dblp.org/rec/conf/ets/MalandruccoloCFR09
Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. ETS 2009: 67-72

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