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"Optimal Contexts for the Self-Test of Coarse Grain Dynamically ..."

Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara (2007)

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DOI: 10.1109/ETS.2007.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ets/InoueFI07
Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara:
Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. ETS 2007: 117-124

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