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"An efficient test technique to prevent scan-based side-channel attacks."

Satyadev Ahlawat, Darshit Vaghani, Virendra Singh (2017)

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DOI: 10.1109/ETS.2017.7968241

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - conf/ets/AhlawatVS17
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Satyadev Ahlawat, Darshit Vaghani, Virendra Singh:
An efficient test technique to prevent scan-based side-channel attacks. ETS 2017: 1-2

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