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"The role of the temperature on the scattering mechanisms limiting the ..."

Philippe Gaubert et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343371

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Philippe Gaubert, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi:
The role of the temperature on the scattering mechanisms limiting the electron mobility in metal-oxide-semiconductor field-effect-transistors fabricated on (110) silicon-oriented wafers. ESSDERC 2012: 213-216

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