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"Characterization and Modeling of BTI in SiC MOSFETs."

Davide Cornigli et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901761

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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  - conf/essderc/CornigliTRFSSVC19
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  - https://dblp.org/rec/conf/essderc/CornigliTRFSSVC19
Davide Cornigli, Andrea Natale Tallarico, Susanna Reggiani, Claudio Fiegna, Enrico Sangiorgi, Luis Sanchez, Carlos Valdivieso, Giuseppe Consentino, Felice Crupi:
Characterization and Modeling of BTI in SiC MOSFETs. ESSDERC 2019: 82-85

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