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"Current SiC Power Device Development, Material Defect Measurements and ..."

Daniel Baierhofer (2019)

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DOI: 10.1109/ESSDERC.2019.8901792

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

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Daniel Baierhofer:
Current SiC Power Device Development, Material Defect Measurements and Characterization at Bosch. ESSDERC 2019: 31-34

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