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"2017 ACM/IEEE International Symposium on Empirical Software Engineering ..."

Ayse Bener, Burak Turhan, Stefan Biffl (2017)

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DOI: —

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type: Editorship

metadata version: 2019-10-16

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Ayse Bener, Burak Turhan, Stefan Biffl:
2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2017, Toronto, ON, Canada, November 9-10, 2017. IEEE Computer Society 2017, ISBN 978-1-5090-4039-1 [contents]

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