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"Sensitivity and Reliability Evaluation for Mixed-Signal ICs under ..."

Xiangdong Xuan, Abhijit Chatterjee (2001)

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DOI: 10.1109/DFTVS.2001.966785

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/XuanC01
Xiangdong Xuan, Abhijit Chatterjee:
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. DFT 2001: 323-328

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