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"MULTES/IS: An Effective and Reliable Test Generation System for Partial ..."

Takuji Ogihara et al. (1989)

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DOI: 10.1145/74382.74469

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/OgiharaMYM89
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Takuji Ogihara, K. Muroi, Genichi Yonemori, Shinichi Murai:
MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. DAC 1989: 519-524

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