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"A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm ..."

David Levacq et al. (2007)

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DOI: 10.1109/CICC.2007.4405727

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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David Levacq, Takuya Minakawa, Makoto Takamiya, Takayasu Sakurai:
A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 × 1 Transistor Arrays in 90nm CMOS. CICC 2007: 257-260

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