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"An approach to diagnose logical faults in partially observable sequential ..."

Koji Yamazaki, Teruhiko Yamada (1997)

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DOI: 10.1109/ATS.1997.643954

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Koji Yamazaki, Teruhiko Yamada:
An approach to diagnose logical faults in partially observable sequential circuits. Asian Test Symposium 1997: 168-173

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