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"Spectral RTL Test Generation for Gate-Level Stuck-at Faults."

Nitin Yogi, Vishwani D. Agrawal (2006)

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DOI: 10.1109/ATS.2006.260997

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Nitin Yogi, Vishwani D. Agrawal:
Spectral RTL Test Generation for Gate-Level Stuck-at Faults. ATS 2006: 83-88

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