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"At-speed Test of High-Speed DUT Using Built-Off Test Interface."

Joonsung Park et al. (2010)

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DOI: 10.1109/ATS.2010.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/ParkLCHABWO10
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  persistent URL:
  - https://dblp.org/rec/conf/ats/ParkLCHABWO10
Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274

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