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"Low Power BIST for Scan-Shift and Capture Power."

Yasuo Sato et al. (2012)

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DOI: 10.1109/ATS.2012.27

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/SatoWKMK12
Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara:
Low Power BIST for Scan-Shift and Capture Power. Asian Test Symposium 2012: 173-178

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