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"Tests for Resistive and Capacitive Defects in Address Decoders."

Matthias Klaus, Ad J. van de Goor (2001)

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DOI: 10.1109/ATS.2001.990255

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Matthias Klaus, Ad J. van de Goor:
Tests for Resistive and Capacitive Defects in Address Decoders. Asian Test Symposium 2001: 31-36

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