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"ISTA: Automatic Test Case Generation and Optimization for Intelligent ..."

Wei Zheng et al. (2023)

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DOI: 10.1109/SANER56733.2023.00086

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-10

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  dblp key:
  - conf/wcre/ZhengLCLHSXG23
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Wei Zheng, Lidan Lin, Xiang Chen, Guoliang Liu, Hao Huang, Jinjin Shen, Qingqing Xu, Yizeng Gu:
ISTA: Automatic Test Case Generation and Optimization for Intelligent Systems based on Coverage Analysis. SANER 2023: 758-762

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