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"A Dual-Mode Built-In Self-Test Technique for Capacitive MEMS Devices."

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone (2004)

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DOI: 10.1109/VTEST.2004.1299238

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/XiongWJ04
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  persistent URL:
  - https://dblp.org/rec/conf/vts/XiongWJ04
Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
A Dual-Mode Built-In Self-Test Technique for Capacitive MEMS Devices. VTS 2004: 148-153

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