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"Embedded Tutorial: Test Consideration for Nanometer Scale CMOS Circuits."

Kaushik Roy, T. M. Mak, Kwang-Ting Cheng (2003)

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DOI: 10.1109/VTEST.2003.1197668

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/RoyMC03
Kaushik Roy, T. M. Mak, Kwang-Ting Cheng:
Embedded Tutorial: Test Consideration for Nanometer Scale CMOS Circuits. VTS 2003: 313-318

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