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"EXTEST: a method to extend test sequences of synchronous sequential ..."

Irith Pomeranz, Sudhakar M. Reddy (1997)

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DOI: 10.1109/VTEST.1997.600297

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/PomeranzR97
Irith Pomeranz, Sudhakar M. Reddy:
EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage. VTS 1997: 329-335

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