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"Testing High Speed VLSI Devices Using Slower Testers."

Angela Krstic, Kwang-Ting (Tim) Cheng, Srimat T. Chakradhar (1999)

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DOI: 10.1109/VTEST.1999.766641

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/KrsticCC99
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  persistent URL:
  - https://dblp.org/rec/conf/vts/KrsticCC99
Angela Krstic, Kwang-Ting (Tim) Cheng, Srimat T. Chakradhar:
Testing High Speed VLSI Devices Using Slower Testers. VTS 1999: 16-21

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