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"A neural inverse function for automatic test pattern generation using ..."

Masatoshi Arai, Tohru Nakagawa, Hajime Kitagawa (1993)

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DOI: 10.1109/VTEST.1993.313318

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/AraiNK93
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  - https://dblp.org/rec/conf/vts/AraiNK93
Masatoshi Arai, Tohru Nakagawa, Hajime Kitagawa:
A neural inverse function for automatic test pattern generation using strictly digital neural networks. VTS 1993: 238-243

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