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"Impact of Partial Reset on Fault Independent Testing and BIST."

Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy (1997)

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DOI: 10.1109/ICVD.1997.568202

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/NguyenCR97
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  - https://dblp.org/rec/conf/vlsid/NguyenCR97
Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy:
Impact of Partial Reset on Fault Independent Testing and BIST. VLSI Design 1997: 537-539

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