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"The Effect of Built-In Current Sensors (BICS) on Operational and Test ..."

Sankaran M. Menon et al. (1994)

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DOI: 10.1109/ICVD.1994.282682

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/MenonMJT94
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/MenonMJT94
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190

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