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"Random Access Scan: A solution to test power, test data volume and test time."
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara (2004)
- Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara:
Random Access Scan: A solution to test power, test data volume and test time. VLSI Design 2004: 883-888
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