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Pierre Magnan
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2020 – today
- 2024
- [c16]M. Gouveia da Cunha, Sébastien Place, O. Gauthier, N. Virollet, M. Vignetti, Philippe Martin-Gonthier, Pierre Magnan, Vincent Goiffon:
Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors. IRPS 2024: 67 - 2023
- [c15]Nour Fassi, Jean-Pierre Carrère, Pierre Magnan, Magali Estribeau, Vincent Goiffon:
Quantum efficiency of backside-illuminated pixels under ultraviolet illumination: ARC coatings impact measurements and simulations. Imaging Sensors and Systems 2023: 1-5 - 2022
- [c14]Emilie Robert, Magali Estribeau, Cédric Virmontois, Pierre Magnan, Justin Plantier, Edoardo Cucchetti:
Hue-specific Color Correction for Raw-RGB Images. CIC 2022: 96-102 - 2021
- [j5]Aymeric Panglosse
, Philippe Martin-Gonthier, Olivier Marcelot
Modeling, Simulation Methods and Characterization of Photon Detection Probability in CMOS-SPAD. Sensors 21(17): 5860 (2021) - [c13]Pierre Magnan:
The essential contribution of CMOS imaging technologies to Earth Observation applications. ESSDERC 2021: 35-42 - 2020
- [j4]Célestin Doyen
Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process. Sensors 20(1): 287 (2020) - [j3]Aymeric Panglosse
Dark Count Rate Modeling in Single-Photon Avalanche Diodes. IEEE Trans. Circuits Syst. I Fundam. Theory Appl. 67-I(5): 1507-1515 (2020)
2010 – 2019
- 2019
- [j2]Yolène Sacchettini, Jean-Pierre Carrère, Romain Duru
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current. Sensors 19(24): 5534 (2019) - [j1]Alexandre Le Roch
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors 19(24): 5550 (2019) - [c12]Federico Pace, Olivier Marcelot, Philippe Martin-Gonthier, Olivier Saint-Pé, Michel Breart de Boisanger, Rose-Marie Sauvage, Pierre Magnan:
A Fast Method for Modeling and Optimizing Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors. ESSDERC 2019: 230-233 - [c11]Yolène Sacchettini, Jean-Pierre Carrère, Vincent Goiffon
Plasma Antenna Charging in CMOS Image Sensors. IRPS 2019: 1-5 - [c10]Aymeric Panglosse, Philippe Martin-Gonthier, Olivier Marcelot, Cédric Virmontois, Olivier Saint-Pé, Pierre Magnan:
Dark Count Rate Modeling in Single-Photon Avalanche Diodes for Space LIDAR Applications. NEWCAS 2019: 1-4 - [c9]Aymeric Panglosse, Philippe Martin-Gonthier, Olivier Marcelot, Cédric Virmontois, Olivier Saint-Pé, Pierre Magnan:
Performance Parameters Modeling and Simulation of Single-Photon Avalanche Diodes for Space LIDAR Applications. PRIME 2019: 269-272 - [c8]Federico Pace, Olivier Marcelot, Philippe Martin-Gonthier, Olivier Saint-Pé, Michel Breart de Boisanger, Rose-Marie Sauvage, Pierre Magnan:
Modeling of Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors. SMACD 2019: 101-104 - 2018
- [c7]Dan McGrath, Steve Tobin, Vincent Goiffon, Pierre Magnan, Alexandre Le Roch
Dark Current Limiting Mechanisms in CMOS Image Sensors. IMSE 2018: 1-8 - 2015
- [c6]Alice Pelamatti, Vincent Goiffon
Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method. ESSDERC 2015: 156-159 - [c5]Nisrina Abdo, Magali Estribeau, Pierre Magnan, Denis Sallin, Adil Koukab, Maher Kayal:
Optical effect considerations for bulk to SOI retargeting of hybrid MOS-PN dynamic photo-sensor. IWASI 2015: 163-167 - [c4]Denis Sallin, Nisrina Abdo, Adil Koukab, Magali Estribeau, Pierre Magnan, Maher Kayal:
Silicon-on-insulator technology for bioluminescence imaging and application to a switching photodetector. MIXDES 2015: 511-514 - 2013
- [c3]Olivier Doussin, Damienne Bajon, Sidina Wane, Pierre Magnan, Thierry Parra:
Integrated Schottky Diodes for sub-millimeter and THz passive imaging: Influence of detector arrays topology. RWS 2013: 52-54 - 2012
- [c2]Philippe Martin-Gonthier, Romain Molina, Paola Cervantes, Pierre Magnan:
Analysis and optimization of noise response for low-noise CMOS image sensors. NEWCAS 2012: 513-516
2000 – 2009
- 2009
- [c1]Philippe Martin-Gonthier, Pierre Magnan:
RTS noise impact in CMOS image sensors readout circuit. ICECS 2009: 928-931
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