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Kaiming Nie
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- affiliation: Tianjin University, China
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2020 – today
- 2024
- [j50]Changju Liu, Zhijun Wu, Kaiming Nie, Yiqiang Li, Jiangtao Xu, Xiuyu Wang, Ying Wang, Rui Gong, Jiaqi Lu:
Splicable random windowing row selection circuit for large array CMOS image sensor. Microelectron. J. 147: 106175 (2024) - [j49]Haojie Zheng, Kaiming Nie, Wanbin Zha, Jiangtao Xu:
A self-adaptive correlated multiple sampling technique based on single-slope ADC for low-noise CMOS image sensors. Microelectron. J. 149: 106232 (2024) - [j48]Yanghao He, Xiaopei Shi, Kaiming Nie, Jiangtao Xu:
A dual threshold adaptation method to dynamic vision sensor pixel. Microelectron. J. 149: 106236 (2024) - [j47]Xiduo Zou, Jing Gao, Kaiming Nie, Zaifeng Shi, Jiangtao Xu:
Design of a wide range and high precision phase/duty-cycle correction circuit for modulation driving of 2D/3D image sensors. Microelectron. J. 149: 106241 (2024) - [j46]Shuanghan Zhao, Jing Gao, Quanmin Chen, Kaiming Nie, Jiangtao Xu:
A 12-bit 2.5-bit/phase two-stage cyclic ADC with phase scaling and low-power Sub-ADC for CMOS image sensor. Microelectron. J. 150: 106282 (2024) - [j45]Xiaolin Shi, Shaomeng Li, Kaiming Nie:
An 11-bit low power column-parallel single slope ADC with comparator toggle prediction technique for CMOS image sensor. Microelectron. J. 153: 106427 (2024) - 2023
- [j44]Yalei Liu, Jiangtao Xu, Wanbin Zha, Kaiming Nie:
A 1/f noise optimized correlated multiple sampling technique for complementary metal oxide semiconductor image sensor. Int. J. Circuit Theory Appl. 51(12): 5529-5542 (2023) - [j43]Xiuyu Wang, Tantan Ju, Changju Liu, Kaiming Nie, Jiangtao Xu:
A column-parallel 1-bit ADC with threshold offset reduction technique for single-bit quanta image sensor. Microelectron. J. 133: 105714 (2023) - [j42]Yuanmeng Zhang, Jiangtao Xu, Kaiming Nie, Changju Liu, Yuli Yang, Hao Wang:
Analysis and optimization design of control signal line parasitic effects on streaking phenomenon in CMOS image sensor. Microelectron. J. 133: 105721 (2023) - [j41]Jing Gao, Xin Yang, Xiaopei Shi, Zhiyuan Gao, Kaiming Nie, Jiangtao Xu:
Two ramp reference voltages CDS scheme applied to low noise and high dynamic range PWM pixel. Microelectron. J. 135: 105744 (2023) - [j40]Gaoyuan Wang, Quanmin Chen, Jiangtao Xu, Kaiming Nie:
2μs row time 12-bit column-parallel single slope ADC for high-speed CMOS image sensor. Microelectron. J. 135: 105768 (2023) - [j39]Peng Gu, Jing Gao, Zhiyuan Gao, Kaiming Nie, Jiangtao Xu:
No calibration required two-step double-data-rate counter for low-power SS ADC in CMOS image sensors. Microelectron. J. 136: 105798 (2023) - 2022
- [j38]Jiangtao Xu, Peng Lin, Zhiyuan Gao, Kaiming Nie, Liang Xu:
A variable threshold visual sensing and image reconstruction method based on pulse sequence. Sci. China Inf. Sci. 65(2) (2022) - [j37]Peiwen Zhang, Jiangtao Xu, Huafeng Nie, Zhiyuan Gao, Kaiming Nie:
Motion detection for high-speed high-brightness objects based on a pulse array image sensor. Frontiers Inf. Technol. Electron. Eng. 23(1): 113-122 (2022) - [j36]Jing Gao, Ningxi Yan, Kaiming Nie, Zhiyuan Gao, Jiangtao Xu:
A 2.44μs row conversion time 12-bit high-speed differential single-slope ADC with TDC applied to CMOS image sensor. Microelectron. J. 120: 105322 (2022) - [j35]Jing Gao, Rui Li, Kaiming Nie, Jiangtao Xu:
A linear charge pump with novel adaptive charge compensation structure for transient-response improvement in CMOS image sensors. Microelectron. J. 122: 105391 (2022) - [j34]Jiangtao Xu, Jiahao Wei, Quanmin Chen, Wanbin Zha, Kaiming Nie:
A low-power conditional analog correlated multiple sampling circuit for low-noise CMOS image sensor. Microelectron. J. 123: 105428 (2022) - [j33]Zeqing Wang, Qiang Li, Kaiming Nie, Jiangtao Xu, Guan Tian, Jing Gao:
A delay cell with duty-cycle correction and parasitic compensation for large array indirect time-of-flight CMOS image sensors. Microelectron. J. 125: 105448 (2022) - [j32]Xiuyu Wang, Changchun Li, Wanbin Zha, Kaiming Nie, Jiangtao Xu:
A low-noise readout circuit design for multi-bit quanta image sensor. Microelectron. J. 125: 105463 (2022) - [j31]Kaiming Nie, Zhihong Pan, Jiangtao Xu, Zhiyuan Gao:
A low reference voltage interference 10-bit cyclic ADC based on current sub-DAC. Microelectron. J. 125: 105468 (2022) - 2021
- [j30]Jiangtao Xu, Xiangfeng Wang, Zhiyuan Gao, Kaiming Nie:
High-speed target tracking algorithm for the pulse-sequence-based image sensor. IET Image Process. 15(5): 1157-1165 (2021) - [j29]Jing Gao, Baoshuai Zhang, Kaiming Nie, Jiangtao Xu:
Research on a pulse-based high-line-rate TDI CMOS image sensor. Microelectron. J. 111: 105021 (2021) - [j28]Jing Gao, Tianyu Gu, Kaiming Nie, Zhiyuan Gao, Jiangtao Xu:
A Low-Ripple Charge Pump With Novel Compensator for Transient-Response Improvement in CMOS Image Sensors. IEEE Trans. Circuits Syst. II Express Briefs 68(4): 1113-1117 (2021) - [j27]Kaiming Nie, Xiaopei Shi, Silu Cheng, Zhiyuan Gao, Jiangtao Xu:
High Frame Rate Video Reconstruction and Deblurring Based on Dynamic and Active Pixel Vision Image Sensor. IEEE Trans. Circuits Syst. Video Technol. 31(8): 2938-2952 (2021) - [j26]Jiangtao Xu, Liang Xu, Zhiyuan Gao, Peng Lin, Kaiming Nie:
A Denoising Method Based on Pulse Interval Compensation for High-Speed Spike-Based Image Sensor. IEEE Trans. Circuits Syst. Video Technol. 31(8): 2966-2980 (2021) - 2020
- [j25]Jing Gao, Dezhi Zhang, Kaiming Nie, Jiangtao Xu:
Analysis and Optimization design of the column bus parasitic effects on large-array CMOS image sensor. Microelectron. J. 96: 104681 (2020) - [j24]Jianian Zhu, Jiangtao Xu, Kaiming Nie:
A low-power column-parallel cyclic ADC for CMOS image sensor with capacitance and current scaling. Microelectron. J. 105: 104908 (2020) - [j23]Kaiming Nie, Wanbin Zha, Xiaolin Shi, Jiawen Li, Jiangtao Xu, Jianguo Ma:
A Single Slope ADC With Row-Wise Noise Reduction Technique for CMOS Image Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(9): 2873-2882 (2020)
2010 – 2019
- 2019
- [j22]Jiangtao Xu, Peiwen Zhang, Zhe Yang, Zhiyuan Gao, Kaiming Nie, Jianguo Ma:
Image Lag Elimination Algorithm for Pulse-Sequence-Based High-Speed Image Sensor. IEEE Access 7: 159575-159583 (2019) - [j21]Jiangtao Xu, Wei Li, Kaiming Nie, Liqiang Han, Xiyang Zhao:
A Method to Reduce the Effect on Image Quality Caused by Resistance of Column Bus. IEEE Trans. Very Large Scale Integr. Syst. 27(1): 173-181 (2019) - 2018
- [j20]Jiangtao Xu, Xiaolin Shi, Zhiyuan Gao, Kaiming Nie:
Low-leakage analog switches for low-speed sample-and-hold circuits. Microelectron. J. 76: 22-27 (2018) - [j19]Jing Gao, Yanzhao Wang, Kaiming Nie, Zhiyuan Gao, Jiangtao Xu:
The Analysis and Suppressing of Non-Uniformity in a High-Speed Spike-Based Image Sensor. Sensors 18(12): 4232 (2018) - [j18]Jiangtao Xu, Xiyang Zhao, Liqiang Han, Kaiming Nie, Liang Xu, Jianguo Ma:
Effect of the Transition Points Mismatch on Quanta Image Sensors. Sensors 18(12): 4357 (2018) - 2017
- [j17]Kaiming Nie, Zhaoyang Yin, Jiangtao Xu:
A fast correlated multiple sampling technique based on 12-bit SAR ADC with digital calibration for low-noise CMOS image sensor. Microelectron. J. 59: 47-54 (2017) - [j16]Jiangtao Xu, An Zhang, Zhiyuan Gao, Kaiming Nie, Jun Qiao:
A low data-rate fluorescence lifetime imaging system with CMM pre-processed in-pixel. Microelectron. J. 69: 28-34 (2017) - 2016
- [j15]Gengyu Zhang, Xia Xiao, Jiangtao Xu, Kaiming Nie, Zhiyuan Gao:
Particle Swarm Optimization Design of Low-Power Multistage Amplifier using gm/ID Methodology. J. Circuits Syst. Comput. 25(9): 1650104:1-1650104:31 (2016) - [j14]Yong Zong, Jing Gao, Zhaoyang Yin, Shilin Shen, Kaiming Nie, Wen Liu, Jiangtao Xu:
A real-time digital calibration scheme for the cyclic ADC. Microelectron. J. 54: 93-100 (2016) - [j13]Kaiming Nie, Jianxin Li, Zhiyuan Gao, Jiangtao Xu:
A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors. Microelectron. Reliab. 60: 70-77 (2016) - [j12]Kaiming Nie, Xinlei Wang, Jun Qiao, Jiangtao Xu:
A Full Parallel Event Driven Readout Technique for Area Array SPAD FLIM Image Sensors. Sensors 16(2): 160 (2016) - [j11]Changwei Yu, Kaiming Nie, Jiangtao Xu, Jing Gao:
A Low Power Digital Accumulation Technique for Digital-Domain CMOS TDI Image Sensor. Sensors 16(10): 1572 (2016) - [j10]Yu Xia, Kaiming Nie, Jiangtao Xu, Suying Yao:
A Two-Step Analog Accumulator for CMOS TDI Image Sensor With Temporal Undersampling Exposure Method. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 1104-1117 (2016) - [j9]Kaiming Nie, Lin Li, Suying Yao, Jiangtao Xu:
Scanning Modulation Transfer Function Model of TDI CMOS Image Sensor. J. Signal Process. Syst. 82(1): 17-25 (2016) - 2015
- [j8]Jiangtao Xu, Jing Yu, Fujun Huang, Kaiming Nie:
A 10-Bit Column-Parallel Single Slope ADC Based on Two-Step TDC with Error Calibration for CMOS Image Sensors. J. Circuits Syst. Comput. 24(4): 1550054:1-1550054:16 (2015) - [j7]Zhenwang Liu, Jiangtao Xu, Xinlei Wang, Kaiming Nie, Weimin Jin:
A Fixed-Pattern Noise Correction Method Based on Gray Value Compensation for TDI CMOS Image Sensor. Sensors 15(9): 23496-23513 (2015) - [j6]Zhiyuan Gao, Congjie Yang, Jiangtao Xu, Kaiming Nie:
A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors. Sensors 15(11): 28224-28243 (2015) - 2014
- [j5]Jiangtao Xu, Weisong Jin, Kaiming Nie, Suying Yao:
A 0.5-1.2 V PWM CMOS DPS with 120 DB Dynamic Range for bionic Human eye in Deep submicron CMOS Technology. J. Circuits Syst. Comput. 23(2) (2014) - [j4]Tao Lyu, Suying Yao, Kaiming Nie, Jiangtao Xu:
A 12-Bit High-Speed Column-Parallel Two-Step Single-Slope Analog-to-Digital Converter (ADC) for CMOS Image Sensors. Sensors 14(11): 21603-21625 (2014) - [j3]Kaiming Nie, Suying Yao, Jiangtao Xu, Jing Gao, Yu Xia:
A 128-Stage Analog Accumulator for CMOS TDI Image Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(7): 1952-1961 (2014) - [j2]Kaiming Nie, Suying Yao, Jiangtao Xu, Jing Gao:
Thirty Two-Stage CMOS TDI Image Sensor With On-Chip Analog Accumulator. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 951-956 (2014) - 2013
- [j1]Kaiming Nie, Suying Yao, Jiangtao Xu, Jing Gao:
A Current Source with Immunity from IR-drop for High-Resolution CMOS Image Sensors. J. Circuits Syst. Comput. 22(1) (2013)
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last updated on 2024-10-23 20:31 CEST by the dblp team
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