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Journal of Electronic Testing, Volume 12
Volume 12, Numbers 1-2, February 1998
- Vishwani D. Agrawal:
Editorial. 5 - Michael Nicolaidis, Yervant Zorian:
On-Line Testing for VLSI - A Compendium of Approaches. 7-20 - Jack J. Stiffler:
On-Line Fault Monitoring. 21-27 - Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian:
Efficient Totally Self-Checking Shifter Design. 29-39 - Valerij V. Saposhnikov, Andrej A. Morosov, Vladimir V. Saposhnikov, Michael Gössel:
A New Design Method for Self-Checking Unidirectional Combinational Circuits. 41-53 - Antonis M. Paschalis, Dimitris Gizopoulos, Nikolaos Gaitanis:
Concurrent Delay Testing in Totally Self-Checking Systems. 55-61 - Stanislaw J. Piestrak:
Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters. 63-68 - Dimitris Nikolos:
Self-Testing Embedded Two-Rail Checkers. 69-79 - Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. 81-92 - Karim Arabi, Bozena Kaminska:
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. 93-99 - Eugenio García-Moreno, Benjamín Iñíguez, Miquel Roca, Jaume Segura
, Eugeni Isern
Clocked Dosimeter Compatible with Digital CMOS Technology. 101-110 - Hussain Al-Asaad, John P. Hayes, Brian T. Murray:
Scalable Test Generators for High-Speed Datapath Circuits. 111-125 - Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
Mixed-Mode BIST Using Embedded Processors. 127-138 - Piero Olivo, Marcello Dalpasso
A Bist Scheme for Non-Volatile Memories. 139-144 - Alex Orailoglu:
On-Line Fault Resilience Through Gracefully Degradable ASICs. 145-151 - Ytzhak H. Levendel:
Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components. 153-159
Volume 12, Number 3, June 1998
- Vishwani D. Agrawal:
Editorial. 167 - Chouki Aktouf, Chantal Robach, A. Marinescu, Guy Mazaré:
An Implementation Approach of the IEEE 1149.1 for the Routing Test of a VLSI Massively Parallel Architecture. 171-185 - J. Yeandel, D. Thulborn, Simon Jones:
The Design and Implementation of an On-Line Testable UART. 187-198 - Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar:
Optimization of Mutual and Signature Testing Schemes for Highly Concurrent Systems. 199-216 - Zohair Sahraoui, Francky Catthoor, Paul Six, Hugo De Man:
Techniques for Reducing the Number of Decisions and Backtracks in Combinational Test Generation. 217-238 - Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas:
Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. 239-254 - De-Qiang Wang, Lian-Chang Zhao:
Combinatorial Analysis of Check Set Construction for Algorithm-Based Fault Tolerance Systems. 255-260
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