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Vladimír Székely
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2010 – 2019
- 2015
- [j14]Vladimír Székely, Albin Szalai:
Transformation between linear network features in convolution approach. Int. J. Circuit Theory Appl. 43(1): 94-110 (2015) - 2012
- [j13]Albin Szalai, Vladimír Székely:
Possible acception criteria for structure functions. Microelectron. J. 43(2): 164-168 (2012) - [j12]Vladimír Székely, Albin Szalai:
Measurement of the time-constant spectrum: Systematic errors, correction. Microelectron. J. 43(11): 904-907 (2012) - 2010
- [j11]Vladimír Székely, Clemens J. M. Lasance:
Editorial. Microelectron. J. 41(9): 539 (2010) - [j10]Vladimír Székely:
Evaluation of short pulse and short time thermal transient measurements. Microelectron. J. 41(9): 560-565 (2010) - [j9]László Pohl, Zsolt Kohári, Vladimír Székely:
Fast field solver for the simulation of large-area OLEDs. Microelectron. J. 41(9): 566-573 (2010)
2000 – 2009
- 2008
- [i3]Péter G. Szabó, Vladimír Székely:
Characterization and Modeling of an Electro-thermal MEMS Structure. CoRR abs/0805.0863 (2008) - [i2]Zoltán Szucs, György Bognár, Vladimír Székely, Márta Rencz:
Contactless Thermal Characterization of High Temperature Test Chamber. CoRR abs/0805.0865 (2008) - 2007
- [i1]György Bognár, Vladimír Székely, Márta Rencz:
Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array. CoRR abs/0711.3324 (2007) - 2006
- [c12]György Bognár, Gyula Horváth, Zoltán Szucs, Vladimír Székely:
Die Attach Quality Testing by Fully Contact-less Measurement Method. DDECS 2006: 81-82 - 2004
- [j8]Vladimír Székely:
Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). Microelectron. J. 35(10): 789-790 (2004) - 2003
- [c11]Márta Rencz, Vladimír Székely, András Poppe:
A Fast Algorithm for the Layout Based Electro-Thermal Simulation. DATE 2003: 11032-11037 - 2002
- [j7]Vladimír Székely:
Enhancing reliability with thermal transient testing. Microelectron. Reliab. 42(4-5): 629-640 (2002) - 2000
- [j6]Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki
, Bernard Courtois:
IDDQ Testing of Submicron CMOS - by Cooling? J. Electron. Test. 16(5): 453-461 (2000)
1990 – 1999
- 1999
- [c10]Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
Design and Test of MEMs. VLSI Design 1999: 270- - 1998
- [j5]Vladimír Székely, Márta Rencz, Bernard Courtois:
Tracing the Thermal Behavior of ICs. IEEE Des. Test Comput. 15(2): 14-21 (1998) - [j4]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12(1-2): 81-92 (1998) - [c9]Vladimír Székely, Márta Rencz:
Fast Field Solvers for Thermal and Electrostatic Analysis. DATE 1998: 518-523 - 1997
- [j3]Vladimír Székely, András Poppe
Electro-thermal and logi-thermal simulation of VLSI designs. IEEE Trans. Very Large Scale Integr. Syst. 5(3): 258-269 (1997) - [j2]Vladimír Székely, Cs. Márta, Zsolt Kohári, Márta Rencz:
CMOS sensors for on-line thermal monitoring of VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 5(3): 270-276 (1997) - [c8]Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
CAD and Foundries for Microsystems. DAC 1997: 674-679 - [c7]Vladimír Székely, Andras Pahi, András Poppe, Márta Rencz, Alpar Csendes:
SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. ED&TC 1997: 617 - [c6]Vladimír Székely, Márta Rencz:
Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. ICCAD 1997: 684-689 - [c5]Vladimír Székely, Márta Rencz, Bernard Courtois:
Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445 - 1996
- [c4]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 - [c3]Jean-Michel Karam, Bernard Courtois, András Poppe
Applied design and analysis of microsystems. ED&TC 1996: 528-532 - [c2]Vladimír Székely, András Poppe
An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework. ED&TC 1996: 604 - 1995
- [c1]Vladimír Székely, Márta Rencz:
Thermal test and monitoring [microelectronic structures]. ED&TC 1995: 601 - 1993
- [j1]Éva Nikodémusz-Székely, Vladimír Székely:
Image recognition problems of fingerprint identification. Microprocess. Microsystems 17(4): 215-218 (1993)
Coauthor Index
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