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Adaptively tolerate power-gating-induced power/ground noise under process variations

Published: 09 March 2015 Publication History

Abstract

Power gating is one of the most effective techniques to reduce the leakage power in multiprocessor system-on-chips (MPSoCs). However, the power-mode transition during the power gating period of an individual processing unit will introduce serious power/ground (P/G) noise to the neighboring processing units. As technology scales, the P/G noise problem becomes a severe reliability threat to MPSoCs. At the same time, the increasing manufacturing process variations also bring uncertainties to the P/G noise problem and make it difficult to predict and deal with. In order to address this problem, for the first time, this paper analyzes the power-gating-induced P/G noise in the presence of process variations, and proposes a hardware-software collaborated online method to adaptively protect processing units from P/G noise. Sensor network-on-chip (SENoC) is used to gather noise information and coordinate different system components. Meanwhile an online software-based algorithm is developed to effectively decide the noise impact range and arrange protections for affected processing units based on the collected information. We evaluate the proposed method through Monte Carlo simulations on a NoC-based MPSoC platform. The experimental results show that for a set of real applications, our method achieves on average 13.2% overall performance improvement and 13.3% system energy reduction compared with the traditional stop-go method.

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          cover image ACM Conferences
          DATE '15: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition
          March 2015
          1827 pages
          ISBN:9783981537048

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          EDA Consortium

          San Jose, CA, United States

          Publication History

          Published: 09 March 2015

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          Author Tags

          1. multiprocessor system-on-chip
          2. power gating
          3. process variation
          4. reliability
          5. sensor network-on-chip

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          DATE '15
          Sponsor:
          • EDAA
          • EDAC
          • SIGDA
          • Russian Acadamy of Sciences
          DATE '15: Design, Automation and Test in Europe
          March 9 - 13, 2015
          Grenoble, France

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          DATE '15 Paper Acceptance Rate 206 of 915 submissions, 23%;
          Overall Acceptance Rate 518 of 1,794 submissions, 29%

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          DATE '25
          Design, Automation and Test in Europe
          March 31 - April 2, 2025
          Lyon , France

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