research-article

Comparative analysis of SRAM memories used as PUF primitives

Authors:

Geert-Jan Schrijen,

Vincent van der LeestAuthors Info & Claims

DATE '12: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 1319 - 1324

Published: 12 March 2012 Publication History

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Abstract

In this publication we present the results of our investigations into the reliability and uniqueness of Static Random Access Memories (SRAMs) in different technology nodes when used as a Physically Unclonable Function (PUF). The comparative analysis that can be found in this publication is the first ever of its kind, using different SRAM memories in technologies ranging from 180nm to 65nm. Each SRAM memory presents a unique and unpredictable start-up pattern when being powered up. In order to use an SRAM as a PUF in an application, the stability of its start-up patterns needs to be assured under a wide variety of conditions such as temperature and applied voltage. Furthermore the start-up patterns of different memories must be unique and contain sufficient entropy. This paper presents the results of tests that investigate these properties of different SRAM memory technology nodes. Furthermore, it proposes the construction of a fuzzy extractor, which can be used in combination with the tested memories for extracting secure cryptographic keys.

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Gross MHohentanner KWiehler SSigl G(2021)Enhancing the Security of FPGA-SoCs via the Usage of ARM TrustZone and a Hybrid-TPMACM Transactions on Reconfigurable Technology and Systems10.1145/347295915:1(1-26)Online publication date: 30-Nov-2021
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Hussain SRiazi MKoushanfar F(2018)SHAIPACM Transactions on Design Automation of Electronic Systems10.1145/327466923:6(1-20)Online publication date: 13-Dec-2018
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Yang KForte DTehranipoor M(2015)ReSCRevised Selected Papers of the 11th International Workshop on Radio Frequency Identification - Volume 944010.1007/978-3-319-24837-0_3(32-49)Online publication date: 23-Jun-2015
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Index Terms

Comparative analysis of SRAM memories used as PUF primitives
1. Hardware
  1. Hardware validation
  2. Integrated circuits
    1. Semiconductor memory
      1. Static memory

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Information & Contributors

Information

Published In

DATE '12: Proceedings of the Conference on Design, Automation and Test in Europe

March 2012

1690 pages

ISBN:9783981080186

General Chairs:
Wolfgang Rosenstiel
University of Tuebingen and edacentrum, DE
,
Enrico Macii
Politecnico di Torino, IT

Publisher

EDA Consortium

San Jose, CA, United States

Publication History

Published: 12 March 2012

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DATE '12

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EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '12: Design, Automation and Test in Europe

March 12 - 16, 2012

Dresden, Germany

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

View all

Gross MHohentanner KWiehler SSigl G(2021)Enhancing the Security of FPGA-SoCs via the Usage of ARM TrustZone and a Hybrid-TPMACM Transactions on Reconfigurable Technology and Systems10.1145/347295915:1(1-26)Online publication date: 30-Nov-2021
https://dl.acm.org/doi/10.1145/3472959
Hussain SRiazi MKoushanfar F(2018)SHAIPACM Transactions on Design Automation of Electronic Systems10.1145/327466923:6(1-20)Online publication date: 13-Dec-2018
https://dl.acm.org/doi/10.1145/3274669
Yang KForte DTehranipoor M(2015)ReSCRevised Selected Papers of the 11th International Workshop on Radio Frequency Identification - Volume 944010.1007/978-3-319-24837-0_3(32-49)Online publication date: 23-Jun-2015
https://dl.acm.org/doi/10.1007/978-3-319-24837-0_3
Schaller AArul TLeest VKatzenbeisser S(2014)Lightweight Anti-counterfeiting Solution for Low-End Commodity Hardware Using Inherent PUFsProceedings of the 7th International Conference on Trust and Trustworthy Computing - Volume 856410.1007/978-3-319-08593-7_6(83-100)Online publication date: 30-Jun-2014
https://dl.acm.org/doi/10.1007/978-3-319-08593-7_6
van der Leest VTuyls PMacii E(2013)Anti-counterfeiting with hardware intrinsic securityProceedings of the Conference on Design, Automation and Test in Europe10.5555/2485288.2485563(1137-1142)Online publication date: 18-Mar-2013
https://dl.acm.org/doi/10.5555/2485288.2485563
van den Berg RSkoric Bvan der Leest VSadeghi AArmknecht FSeifert J(2013)Bias-based modeling and entropy analysis of PUFsProceedings of the 3rd international workshop on Trustworthy embedded devices10.1145/2517300.2517301(13-20)Online publication date: 4-Nov-2013
https://dl.acm.org/doi/10.1145/2517300.2517301

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