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About:
http://dbpedia.org/class/yago/WikicatSemiconductors
An Entity of Type:
Thing
,
from Named Graph:
http://dbpedia.org
,
within Data Space:
dbpedia.org
Property
Value
rdfs:
subClassOf
yago
:Semiconductor114821248
owl:
equivalentClass
yago-res
:wikicat_Semiconductors
is
rdf:
type
of
dbr
:Caesium_auride
dbr
:Amorphous_silicon
dbr
:Quantum_Hall_effect
dbr
:Electron_acceptor
dbr
:Electron_donor
dbr
:Electron_hole
dbr
:Electron_mobility
dbr
:Electronic_band_structure
dbr
:Metalorganics
dbr
:Monocrystalline_silicon
dbr
:Sheet_resistance
dbr
:Thermoelectric_cooling
dbr
:Bismuth_telluride
dbr
:Degenerate_semiconductor
dbr
:Anomalous_photovoltaic_effect
dbr
:Hydride_vapour_phase_epitaxy
dbr
:Reliability_(semiconductor)
dbr
:Current_injection_technique
dbr
:Burstein–Moss_effect
dbr
:Deathnium
dbr
:Debye_length
dbr
:Intrinsic_semiconductor
dbr
:Overdrive_voltage
dbr
:Photocatalysis
dbr
:Molecular_beam_epitaxy
dbr
:Copper(II)_oxide
dbr
:Copper_indium_gallium_selenide_solar_cells
dbr
:Organic_semiconductor
dbr
:Low_level_injection
dbr
:Gallium(II)_selenide
dbr
:Gallium_antimonide
dbr
:Gallium_arsenide
dbr
:Gallium_nitride
dbr
:Equivalent_oxide_thickness
dbr
:Negative_luminescence
dbr
:On-die_termination
dbr
:Stratum_(linguistics)
dbr
:Roll-to-roll_processing
dbr
:Transmission_line_measurement
dbr
:Triethylgallium
dbr
:Trimethylgallium
dbr
:Trimethylindium
dbr
:Wafer_(electronics)
dbr
:Wide-bandgap_semiconductor
dbr
:Haynes–Shockley_experiment
dbr
:Johnson's_figure_of_merit
dbr
:Junction_temperature
dbr
:Strain_engineering
dbr
:Thermal_copper_pillar_bump
dbr
:Proximity_communication
dbr
:Photo–Dember_effect
dbr
:Aluminium_nitride
dbr
:Aluminium_phosphide
dbr
:Aluminium_gallium_arsenide
dbr
:Carbon_nanofoam
dbr
:Dicing_saw
dbr
:Diffusion_capacitance
dbr
:Floating_body_effect
dbr
:Isotropic_etching
dbr
:Quantum_dot
dbr
:Rapid_thermal_processing
dbr
:Rashba_effect
dbr
:Atomic_layer_deposition
dbr
:Isobutylgermane
dbr
:Random_logic
dbr
:Self-aligned_gate
dbr
:TRIAC
dbr
:High-temperature_operating_life
dbr
:Diffusion_current
dbr
:Field-effect_transistor
dbr
:Indium_antimonide
dbr
:Indium_phosphide
dbr
:Airgap_(microelectronics)
dbr
:Wire_bonding
dbr
:HOMO/LUMO
dbr
:Silicon_on_insulator
dbr
:Transistor_diode_model
dbr
:Etch_pit_density
dbr
:Extrinsic_semiconductor
dbr
:Chemical-mechanical_planarization
dbr
:Impact_ionization
dbr
:Luttinger_parameter
dbr
:Valleytronics
dbr
:Tunnel_injection
dbr
:Rock's_law
dbr
:Reverse_leakage_current
dbr
:Polycrystalline_silicon
dbr
:Staebler–Wronski_effect
dbr
:Technology_CAD
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