Dielectric characterization of low-loss materials a comparison of techniques
JH Grosvenor, J Krupka - IEEE Transactions on Dielectrics and …, 1998 - ieeexplore.ieee.org
Measurements on low-loss materials using closed and open cavity resonators, and dielectric
resonator methods are presented. Results indicate that consistent measurement results can …
resonator methods are presented. Results indicate that consistent measurement results can …
[PDF][PDF] Dielectric Characterization of Low-Loss Materials: a Comparison of Techniques
J Baker-Jarvis, RG Geyer, D Michael, BR Janezic… - PIERS 199S, 1998 - apps.dtic.mil
The goal of this paper is to present measurements on a large number of commonly used low-
loss materials using a number of techniques. We also compare and contrast measurements …
loss materials using a number of techniques. We also compare and contrast measurements …
[CITATION][C] Dielectric characterization of low-loss materials: A comparison of techniques
J BAKER-JARVIS, RG GEYER… - … on dielectrics and …, 1998 - pascal-francis.inist.fr
Dielectric characterization of low-loss materials : A comparison of techniques CNRS Inist
Pascal-Francis CNRS Pascal and Francis Bibliographic Databases Simple search Advanced …
Pascal-Francis CNRS Pascal and Francis Bibliographic Databases Simple search Advanced …
[CITATION][C] Dielectric characterization of low-loss materials a comparison of techniques
J Baker-Jarvis, RG Geyer, JH Grosvenor… - IEEE Transactions on …, 1998 - cir.nii.ac.jp
Dielectric characterization of low-loss materials a comparison of techniques | CiNii
Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …
Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …
Dielectric characterization of low-loss materials a comparison of techniques
J Baker-Jarvis, RG Geyer, MD Janezic… - IEEE Transactions on …, 1998 - repo.pw.edu.pl
Measurements on low-loss materials using closed and open cavity resonators, and dielectric
resonator methods are presented. Results indicate that consistent measurement results can …
resonator methods are presented. Results indicate that consistent measurement results can …
Dielectric characterization of low-loss materials a comparison of techniques
J Baker-Jarvis, RG Geyer, MD Janezic… - IEEE Transactions on …, 1998 - repo.pw.edu.pl
Measurements on low-loss materials using closed and open cavity resonators, and dielectric
resonator methods are presented. Results indicate that consistent measurement results can …
resonator methods are presented. Results indicate that consistent measurement results can …
[PDF][PDF] Dielectric Characterization of Low-Loss Materials: a Comparison of Techniques
J Baker-Jarvis, RG Geyer, D Michael, BR Janezic… - PIERS 199S, 1998 - apps.dtic.mil
The goal of this paper is to present measurements on a large number of commonly used low-
loss materials using a number of techniques. We also compare and contrast measurements …
loss materials using a number of techniques. We also compare and contrast measurements …