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. Author manuscript; available in PMC: 2024 Oct 23.
Published in final edited form as: IEEE Trans Instrum Meas. 2012 Nov;62(6):10.1109/tim.2012.2225917. doi: 10.1109/tim.2012.2225917

Fig. 6.

Fig. 6.

Comparison resistance values ΔR, expressed as relative deviation from nominal value, of L&N 100-μΩ resistor number 8. The measurement values have been given an arbitrary offset value. Uncertainty bars give the experimental standard deviation (type A; k = 1) only. The solid line is a fit through the VSL data, showing a drift rate of the resistor of only (0.15 ± 0.20) μΩ/Ω/year.