WO2023160815A1 - Verfahren zur vermessung optischer linsenflächen - Google Patents
Verfahren zur vermessung optischer linsenflächen Download PDFInfo
- Publication number
- WO2023160815A1 WO2023160815A1 PCT/EP2022/054947 EP2022054947W WO2023160815A1 WO 2023160815 A1 WO2023160815 A1 WO 2023160815A1 EP 2022054947 W EP2022054947 W EP 2022054947W WO 2023160815 A1 WO2023160815 A1 WO 2023160815A1
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- WO
- WIPO (PCT)
- Prior art keywords
- optical
- lens
- measuring beam
- measured
- lens surface
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
Definitions
- the present invention relates to a method for measuring optical lens surfaces, in particular for centering measurements on aspheric lenses, in which the lens surfaces are measured in reflection with an optical measuring arrangement, in which an aperture limiting the optical measuring radiation is used and blurred as a light spot on an optical detector of the measuring arrangement is mapped.
- EP 1918687 B1 describes a method for determining the position of an axis of symmetry of an aspheric lens surface relative to a reference axis, in which the position of the center of curvature of the spherical portion of the lens surface is first determined and a wobbling movement of the aspheric component is then measured by rotating the lens about an axis of rotation in order to determine the position of the axis of symmetry of the aspheric lens surface relative to the axis of rotation. The measurements are made with autocollimators via a reflection on the lens surface to be measured.
- EP 1636542 B1 discloses a method and a measuring device for the non-contact measurement of angles or changes in angles on objects, which can also be used, among other things, for measuring aspherical lens or mirror surfaces.
- an optical measuring beam is generated with an extended light source, with which a diaphragm acting as a field diaphragm is illuminated and which, after reflection on the surface to be measured, is recorded with an optical detector.
- the screened aperture is imaged as a blurred light spot on the optical detector by an optical system.
- EP 3037800 B1 discloses a method for measuring optical lens arrangements using back reflections from different lens surfaces, in which relatively complex imaging optics are used to generate different image planes at presumed positions of the centers of curvature of the lens surfaces.
- WO 2014/114444 A1 shows a method for measuring optical lenses using an autocollimation telescope, in which individual lens surfaces are measured one after the other by focusing on the corresponding lens surface.
- Another method for measuring optical lens surfaces is known from US Pat. No. 7,286,212 B2, in which separate imaging optics are used for each lens surface. Each lens surface is only measured from the side to which it is directed.
- the object of the present invention is to specify a method for measuring optical lens surfaces of an optical lens arrangement that enables a quick measurement of at least two lens surfaces of the optical lens arrangement without complex imaging optics.
- an optical measuring beam is generated with an extended light source, collimated via an optical arrangement, directed onto a first lens surface to be measured of an optical lens arrangement and, after reflection on the first lens surface to be measured, detected with at least one spatially resolving optical detector.
- a measuring beam is placed between the light source and the optical detector limiting aperture is used, which acts as a vignetting field stop and is imaged onto the optical detector and detected by the measuring beam as a blurred light spot, hereinafter referred to as the first light spot due to the reflection on the first lens surface to be measured.
- the extended light source is designed in such a way that it generates a uniform areal luminance, for example by using one or more LEDs with a diffusing screen arranged in front of it or with a condenser arranged in front of it or also a combination of diffusing screen and condenser arranged in front of it.
- the position-resolving optical detector can be formed, for example, by a CCD or CMOS area sensor. Of course, other spatially resolving optical detectors can also be used. Several location-resolving detectors arranged next to one another are also possible.
- the aperture delimiting the optical measuring beam is preferably formed by a diaphragm with a fixed or adjustable diaphragm opening. It can also be formed by a suitable lens mount of a lens of the optical arrangement. It is arranged at a suitable point in the beam path of the measuring beam in order to achieve the vignetting effect for generating the blurred light spot on the detector, preferably in or between the optical arrangement for collimation, preferably autocollimation optics, and the optical lens arrangement with the lens surfaces to be measured.
- the optical lens arrangement can be a single lens, for example single- or double-sided asphere , i . H . an aspherical lens with one aspherical and one spherical or with two aspherical lens surfaces, or an arrangement of several lenses spaced apart from each other.
- At least one second light spot which is obtained by reflection of the measuring beam on a further lens surface, hereinafter referred to as the second lens surface, of the optical lens arrangement, is now also detected with the optical detector simultaneously with the detection of the first light spot.
- This second light spot is also created by the effect of the aperture limiting the measuring beam as a vignetting field stop and imaging of this aperture - after reflection on the second lens surface - onto the optical detector.
- the intensity distributions of the two light spots recorded simultaneously with the optical detector are then evaluated for the respective angle between the first lens surface and the optical axis of the measuring beam at the point of intersection of the optical axis of the measuring beam with the first lens surface and between the second lens surface and the optical axis of the measuring beam at the point of intersection of the optical axis of the measuring beam with the second lens surface.
- This determination of the angle can take place in the same way as is described, for example, in the already mentioned EP 1636542 B1.
- the respective angle at the measuring position point of intersection between the optical axis of the measuring beam and the lens surface
- the vignetting effect of the measuring beam limiting Aperture enables the position of the light spot to be determined very precisely via the intensity distribution generated by the light spot, which has a V-shape along a line passing through the center of the light spot.
- the second lens surface can be, for example. be the rear lens surface of a lens or - in the case of cemented lenses - an inner lens surface.
- the two light spots on the detector must be sufficiently distinguishable or be separable . If this is not the case during a measurement, the lens arrangement or Lens shifted perpendicularly to the optical axis of the measuring beam until the two light spots are sufficiently distinguishable or are separable.
- the distance of the displacement is appropriately recorded and taken into account in the evaluation.
- at least two lens surfaces can thus be measured simultaneously with regard to their angle to the optical axis of the measuring beam at the respective measuring position without an additional or complex optical arrangement.
- a measurement on the aspheric part with a single rotation measurement by at least 180° - or correspondingly several measurements on different Positions in one half of the asphere - determine the exact position of the asphere, in particular tilting and lateral offset.
- Fig. 1 shows a schematic representation of an exemplary optical structure as it can be used when carrying out the proposed method
- Fig. 2 shows an example of the use of this optical structure when measuring an asphere using the proposed method
- FIG. 3 shows a further example for carrying out the proposed method with such a structure
- Fig. 4 an example for the measurement of a
- Fig. 5 shows another example for measuring an asphere using the proposed method
- Fig. 6a/b Examples of the measurement of a double-sided asphere using the proposed method.
- At least two at least partially reflecting lens surfaces which can be spherical or aspherical, are each used to create blurry exit hatches as images of the limiting aperture or aperture used in the method.
- Aperture stop of the optically effective system shown on a detector. In order to ensure this type of effect of the aperture stop as a field stop, it is positioned at a suitable point in the beam path of the measuring beam. The emitted measurement or Whether ect beams are not fixed in place, e.g. B. in the classic autocollimator with crosshairs.
- an extended light source (illuminated object surface) is used as the object, which preferably has at least the same dimensions or should have the same size as the detection surface of the detector, so that each ob j ect illuminated point corresponds to a corresponding conjugate image point position, which corresponds to a corresponding chief ray inclination a through the center of the aperture stop.
- This angle of the main beam is determined and evaluated during detection. It is particularly preferable for the object illumination area to be selected to be larger than the detection area. Due to the principle-related blurred imaging of the exit pupil of the overall system on the detector, different blurred exit apertures can now be evaluated longitudinally on the detector from different lens surfaces (with usually different radii).
- the rays on the lens surfaces have different (separable) surface tilt angles. Then more than two surfaces can also be detected.
- FIG. 1 first shows a schematic of an exemplary structure of the measuring system, as it can be used in the proposed method.
- the figure shows an extended light source 21, also referred to as a planar emitter in the present patent application, which in this example is formed by irradiating a diffused light disk 21b from a radiation source 21a, for example an LED.
- the measurement beam bundle 28 emanating from this extended light source 21 is radiated into the optical system via a beam splitter 22 , deflected by 90° and shines through the aperture diaphragm 24 .
- the bundle of rays is reflected at the lens 10 to be measured and imaged via the lens 23 after passing through the beam splitter 22 again onto the photosensitive detector 25 .
- a reflection occurs not only on the lens surface of the lens 10 facing the measuring system, but also on the lens surface facing away from the measuring system. If the lens surfaces are not exactly at an angle of 90° to this axis at the point of intersection with the optical axis 29 of this measuring system, a light spot is imaged on the detector 25 for each of the lens surfaces optical axis 29 with the detector 25 deviates.
- the light spot is created by the vignetting effect of the aperture stop 24 and enables an exact measurement of the angular deviation from the 90° angle, as is described in more detail in EP 1636542 B1, for example.
- FIG. 2 shows a schematic representation of the measurement of a lens 10 , which is spherical in this case, with the measurement arrangement of FIG. 1, which is also referred to as sensor 20 in this and the following examples.
- an auxiliary lens 50 for beam shaping is arranged in front of this sensor 20 .
- the lens 10 to be measured is preferably placed on a lens holder 30 , for example a ring edge or three-point support, on a rotary table 40 which can be rotated about an axis of rotation 41 (rotation C).
- the lens mount 30 also enables precise referencing of the sensor 20 to the lens to be measured, for example by placing a polished ball of known precision on the lens mount 30 and adjusting the arrangement with this ball.
- a reference axis can then be determined with the sensor 20 or a similar, suitable instrument, and the lens support can be referenced as the reference surface of the lens to be measured.
- FIG. 3 shows a detailed representation of the measurement of a spherical lens 10 with the sensor 20 according to the proposed method.
- the extended light source 21, the detector 25, the beam splitter 22 as well as the objective 23 and the aperture stop 24 are shown schematically in the sensor 20 shown .
- the auxiliary lens 50 can also be seen in this representation.
- the spherical lens 10 to be measured rests on the lens holder 30 on the turntable.
- the spherical lens 10 has a vertex 11 , a rim region 12 , a rear vertex 13 , a rear rim region 14 and a rim cylinder 15 .
- the center of curvature 16 of the front lens surface and the center of curvature 17 of the rear lens surface lie on the optical axis 18 of the lens, which, however, does not coincide with the axis of rotation 41 of the turntable.
- Two main rays 26 , 27 are indicated in FIG. 3 which, after reflection on the two lens surfaces, appear as unsharp light spots on the detector 25 due to the vignetting by the aperture stop 24 .
- the vignetting main ray 26, which is reflected at the front lens surface leads to a light spot 26a, the vignetting main ray 27, which is reflected at the rear lens surface, to a blurred light spot 27a on the detector.
- both light spots each describe a circular or elliptical shape with a corresponding diameter, which corresponds to the real (front side, surface 1) or corresponds to virtual (rear side, surface 2) surface tilt angle.
- the circle shape is in indicated in the upper left part of FIG. 3 in the field of view of the detector 25 .
- the meridional and sagittal beam paths can be evaluated separately.
- the real surface tilt angle of the back can be calculated backwards via the measured optical power of the first (front) surface (radius, refractive index, thickness) using an optics design program.
- the angular deviations can also be interpreted as a lateral offset of the respective meridional and sagittal centers of curvature to the axis of rotation.
- This correction factor can be provided, for example, via a LUT (look-up table) as a function of the angle of incidence.
- an asphere has not just one, but many centers of curvature, all of which lie on an axis that runs through the apex (rotational symmetry point).
- An aspheric surface has an aspheric axis. This axis can be inclined to a reference axis and the apex or Rotational symmetry point of the surface can be offset laterally from the reference axis.
- FIG. 4 shows the example of a one-sided asphere 10 (one side asphere, other side sphere) with the apex 11 or Central area of the front surface of the asphere and the edge area 12 of the front surface of the asphere.
- the sensor 20 is only simplified with the detector in this figure 25 and the auxiliary lens 50 shown.
- the two measuring beams reflected on the front and back of the asphere 10, vignetted main beam 26 and vignetted main beam 27, are also shown as examples.
- the asphere 10 has an apparent center of curvature 19 at the edge and a center of curvature 16 at the apex.
- the asphere axis 18 is also shown in the figure.
- the reflection of the measuring beam on the two lens surfaces of the asphere results in two light spots on the detector 25, through which the two lens surfaces can be measured both in the central area and at the edge.
- This is shown again in FIG. 5 with the same reference numbers using an example in which two sensors 20a and 20b are used in order to be able to carry out measurements simultaneously in the center of the asphere 10 and in the edge area of the asphere 10.
- the asphere axis can no longer be determined with sufficient accuracy just by measuring in the center.
- the measurement is required at different points, as is shown schematically with reference to FIGS. 6a and 6b with an additional measurement of the rear surface at the edge using a third sensor 20c.
- the two measurements on the front and rear surface at the edge according to the proposed method with only one sensor, for example.
- Sensor 20b carried out at the same time.
- the determination of the inner centration error of an aspheric lens can e.g. take place with the following steps: a) referencing of the support (or lens holder 30) as a reference surface of the lens, e.g.
- a sphere of a preferred, approximately averaged radius of the two lens surfaces with the sensor 20 or a similar, suitable instrument, which is able to measure the centers of curvature of the lens surfaces without changing auxiliary lenses, shifting the instrument along the optical axis or varying the focus; b) measuring the position of the center of curvature of the spherical portion of the aspheric lens surfaces to be measured; c ) Measurement on the aspherical part outside the vertex (for both lens surfaces simultaneously); d) Determination of the inherent, internal centering error by calculating the two measured values together with the help of known design data
- the structure of the optical arrangement for measuring the lens surfaces can also deviate from the example in Figure 1, for example by swapping the detector and light source, by using a different beam splitter, by arranging the vignetting field stop at a different location or by other modifications, as long as the vignetting effect of the field or Aperture diaphragm for generating the blurred light spots on the detector remains guaranteed.
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Abstract
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18/841,753 US20250180429A1 (en) | 2022-02-28 | 2022-02-28 | Method for measuring optical lens surfaces |
JP2024551612A JP2025508505A (ja) | 2022-02-28 | 2022-02-28 | 光学レンズ表面を測定する方法 |
PCT/EP2022/054947 WO2023160815A1 (de) | 2022-02-28 | 2022-02-28 | Verfahren zur vermessung optischer linsenflächen |
Applications Claiming Priority (1)
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PCT/EP2022/054947 WO2023160815A1 (de) | 2022-02-28 | 2022-02-28 | Verfahren zur vermessung optischer linsenflächen |
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WO2023160815A1 true WO2023160815A1 (de) | 2023-08-31 |
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PCT/EP2022/054947 WO2023160815A1 (de) | 2022-02-28 | 2022-02-28 | Verfahren zur vermessung optischer linsenflächen |
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US (1) | US20250180429A1 (de) |
JP (1) | JP2025508505A (de) |
WO (1) | WO2023160815A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN118392458A (zh) * | 2024-06-26 | 2024-07-26 | 长沙康乾电子科技有限公司 | 一种光学原件的加工质量检测装置 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1636542B1 (de) | 2003-06-20 | 2007-09-05 | Engelbert Hofbauer | Verfahren und messvorrichtung zur berührungslosen messung von winkeln oder winkeländerungen an gegenständen |
US7286212B2 (en) | 2003-11-07 | 2007-10-23 | Olympus Corporation | Apparatus and method for measuring eccentricity of aspherical surface |
EP1918687B1 (de) | 2006-11-04 | 2011-09-07 | Trioptics GmbH | Verfahren und Vorrichtung zur Bestimmung der Lage einer Symmetrieachse einer asphärischen Linsenfläche |
US20120033228A1 (en) * | 2009-02-21 | 2012-02-09 | Jos. Schneider Optische Werke Gmbh | Method for zero-contact measurement of topography" |
US20130027692A1 (en) * | 2010-04-13 | 2013-01-31 | Kazuyuki Ogura | Eccentricity measuring method |
WO2014114444A1 (de) | 2013-01-23 | 2014-07-31 | Jenoptik Optical Systems Gmbh | System zur lagebestimmung eines prüfobjektes und zugehöriges verfahren |
EP3037800B1 (de) | 2014-12-24 | 2018-04-04 | Trioptics GmbH | Messung der Positionen von Krümmungsmittelpunkten optischer Flächen eines ein-oder mehrlinsigen optischen Systems |
EP3961180A1 (de) * | 2020-09-01 | 2022-03-02 | Engelbert Hofbauer | Verfahren zur vermessung optischer linsenflächen |
-
2022
- 2022-02-28 WO PCT/EP2022/054947 patent/WO2023160815A1/de active Application Filing
- 2022-02-28 US US18/841,753 patent/US20250180429A1/en active Pending
- 2022-02-28 JP JP2024551612A patent/JP2025508505A/ja active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1636542B1 (de) | 2003-06-20 | 2007-09-05 | Engelbert Hofbauer | Verfahren und messvorrichtung zur berührungslosen messung von winkeln oder winkeländerungen an gegenständen |
US7286212B2 (en) | 2003-11-07 | 2007-10-23 | Olympus Corporation | Apparatus and method for measuring eccentricity of aspherical surface |
EP1918687B1 (de) | 2006-11-04 | 2011-09-07 | Trioptics GmbH | Verfahren und Vorrichtung zur Bestimmung der Lage einer Symmetrieachse einer asphärischen Linsenfläche |
US20120033228A1 (en) * | 2009-02-21 | 2012-02-09 | Jos. Schneider Optische Werke Gmbh | Method for zero-contact measurement of topography" |
US20130027692A1 (en) * | 2010-04-13 | 2013-01-31 | Kazuyuki Ogura | Eccentricity measuring method |
WO2014114444A1 (de) | 2013-01-23 | 2014-07-31 | Jenoptik Optical Systems Gmbh | System zur lagebestimmung eines prüfobjektes und zugehöriges verfahren |
EP3037800B1 (de) | 2014-12-24 | 2018-04-04 | Trioptics GmbH | Messung der Positionen von Krümmungsmittelpunkten optischer Flächen eines ein-oder mehrlinsigen optischen Systems |
EP3961180A1 (de) * | 2020-09-01 | 2022-03-02 | Engelbert Hofbauer | Verfahren zur vermessung optischer linsenflächen |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN118392458A (zh) * | 2024-06-26 | 2024-07-26 | 长沙康乾电子科技有限公司 | 一种光学原件的加工质量检测装置 |
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US20250180429A1 (en) | 2025-06-05 |
JP2025508505A (ja) | 2025-03-26 |
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