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TWI608222B - Optical measuring device - Google Patents

Optical measuring device Download PDF

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Publication number
TWI608222B
TWI608222B TW104101581A TW104101581A TWI608222B TW I608222 B TWI608222 B TW I608222B TW 104101581 A TW104101581 A TW 104101581A TW 104101581 A TW104101581 A TW 104101581A TW I608222 B TWI608222 B TW I608222B
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TW
Taiwan
Prior art keywords
light
emitting element
measuring device
optical measuring
optical
Prior art date
Application number
TW104101581A
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Chinese (zh)
Other versions
TW201531673A (en
Inventor
望月學
藤森昭一
Original Assignee
日本先鋒公司
先鋒自動化設備股份有限公司
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Publication of TW201531673A publication Critical patent/TW201531673A/en
Application granted granted Critical
Publication of TWI608222B publication Critical patent/TWI608222B/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0242Control or determination of height or angle information of sensors or receivers; Goniophotometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254Spectrometers, other than colorimeters, making use of an integrating sphere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0289Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/505Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by lighting fixtures other than screens, monitors, displays or CRTs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Description

光學測定裝置 Optical measuring device

本發明係關於一種光學測定裝置。 The present invention relates to an optical measuring device.

專利文獻1揭示一種用於進行多個排列之LED(Light Emitting Diode)的光學檢查之檢查裝置。 Patent Document 1 discloses an inspection apparatus for performing optical inspection of a plurality of LEDs (Light Emitting Diodes).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2013-11542號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2013-11542

然而,在專利文獻1所揭示的裝置中,會有檢測到由於檢查對象之LED的發光所造成之從其他LED出射的光的情況,因此,在測定精度上仍有改善的餘地。 However, in the device disclosed in Patent Document 1, there is a case where light emitted from other LEDs due to light emission of the LED to be inspected is detected, and therefore there is still room for improvement in measurement accuracy.

本發明鑒於上述情況,將解決上述問題作為一課題。即,本發明的一課題是提供一種能以簡單的構造高精度地測定發光元件的光學特性之光學測定裝置。 The present invention has been made in view of the above circumstances as a problem. That is, an object of the present invention is to provide an optical measuring apparatus capable of measuring the optical characteristics of a light-emitting element with high precision with a simple structure.

本發明的請求項1之光學測定裝置具備:一受光元件,其檢測與其他發光元件相鄰排列的一發光元件所發出的光,該受光元件檢測藉由供給電力至該一發光元件而使該一發光元件所發出的光,且不檢測該 一發光元件所發出的光造成之該其他發光元件所發出的光,以及該一發光元件所發出的光之中從該其他發光元件反射的光。 An optical measuring apparatus according to claim 1 of the present invention includes: a light receiving element that detects light emitted from a light emitting element arranged adjacent to another light emitting element, wherein the light receiving element detects that the light is supplied to the light emitting element Light emitted by a light-emitting element without detecting the light Light emitted by a light-emitting element causes light emitted by the other light-emitting element and light reflected from the other light-emitting element among light emitted by the light-emitting element.

3‧‧‧光學測定裝置 3‧‧‧Optical measuring device

101‧‧‧發光元件 101‧‧‧Lighting elements

101a‧‧‧發光面 101a‧‧‧Lighting surface

101b‧‧‧生成部 101b‧‧‧Generation Department

101c‧‧‧波長轉換部 101c‧‧‧wavelength conversion unit

103‧‧‧載置桌 103‧‧‧Loading table

103a‧‧‧玻璃桌 103a‧‧‧glass table

103b‧‧‧切割片 103b‧‧‧cutting piece

105‧‧‧光檢測器 105‧‧‧Photodetector

105a‧‧‧受光元件 105a‧‧‧Light-receiving components

105b‧‧‧間隙 105b‧‧‧ gap

108‧‧‧積分球 108‧‧·score ball

108a‧‧‧內壁 108a‧‧‧ inner wall

108b‧‧‧取入口 108b‧‧‧take entrance

108c‧‧‧取出口 108c‧‧‧Export

109‧‧‧探針 109‧‧‧Probe

111‧‧‧訊號線 111‧‧‧Signal line

113‧‧‧放大器 113‧‧‧Amplifier

117‧‧‧光纖 117‧‧‧ fiber optic

117a‧‧‧光纖頭 117a‧‧‧Fiber head

117b‧‧‧光傳輸路 117b‧‧‧Light transmission path

117c‧‧‧入射口 117c‧‧‧ entrance port

117d‧‧‧第一路徑 117d‧‧‧First path

117e‧‧‧第二路徑 117e‧‧‧second path

118‧‧‧集束光纖 118‧‧‧Bundle fiber

118c‧‧‧入射口 118c‧‧‧ entrance port

119‧‧‧集束光纖 119‧‧‧Bundle fiber

119c‧‧‧入射口 119c‧‧‧ entrance port

120‧‧‧光導波路 120‧‧‧Light Guide

121‧‧‧分光器 121‧‧‧Spectroscope

121a‧‧‧受光元件 121a‧‧‧Light-receiving components

122‧‧‧光量調節器 122‧‧‧Light quantity regulator

125‧‧‧電氣特性計測部 125‧‧‧Electrical Characteristics Measurement Department

151‧‧‧控制部 151‧‧‧Control Department

153‧‧‧HV單元 153‧‧‧HV unit

155‧‧‧ESD單元 155‧‧‧ESD unit

157‧‧‧切換單元 157‧‧‧Switch unit

159‧‧‧定位單元 159‧‧‧ Positioning unit

163‧‧‧輸出部 163‧‧‧Output Department

201‧‧‧光圈 201‧‧‧ aperture

201a‧‧‧開口部 201a‧‧‧ Opening

202‧‧‧透鏡 202‧‧‧ lens

203‧‧‧柱狀透鏡陣列 203‧‧‧ lenticular lens array

203a‧‧‧柱狀透鏡 203a‧‧‧ lenticular lens

204‧‧‧微透鏡陣列 204‧‧‧Microlens array

204a‧‧‧貫通孔 204a‧‧‧through hole

205‧‧‧管 205‧‧‧ tube

205a‧‧‧開口 205a‧‧‧ openings

206‧‧‧遮蔽板 206‧‧‧Shielding board

206a‧‧‧開口 206a‧‧‧ Opening

207‧‧‧反射體 207‧‧‧ reflector

A‧‧‧從作為測定對象之發光元件101的中心到外緣為止的距離 A‧‧‧Distance from the center of the light-emitting element 101 to be measured to the outer edge

A‧‧‧從作為測定對象的發光元件101之中心到生成部101b之外緣為止的距離 A‧‧‧ Distance from the center of the light-emitting element 101 to be measured to the outer edge of the generating portion 101b

B‧‧‧相鄰之發光元件101彼此之間的距離 B‧‧‧Distance between adjacent light-emitting elements 101

D‧‧‧將範圍S0投影至發光元件101時的、從發光元件101的中心到範圍S0的外緣為止的距離 D‧‧‧ The distance from the center of the light-emitting element 101 to the outer edge of the range S 0 when the range S 0 is projected onto the light-emitting element 101

L‧‧‧作為測定對象之發光元件101與光纖117之間的距離 L‧‧‧ Distance between the light-emitting element 101 and the optical fiber 117 to be measured

LCA‧‧‧發光中心軸 LCA‧‧‧Lighting Center Shaft

S10‧‧‧步驟 S10‧‧‧ steps

S20‧‧‧步驟 S20‧‧‧ steps

S30‧‧‧步驟 S30‧‧‧ steps

S40‧‧‧步驟 S40‧‧‧ steps

S50‧‧‧步驟 S50‧‧ steps

S60‧‧‧步驟 S60‧‧ steps

S70‧‧‧步驟 S70‧‧‧ steps

S80‧‧‧步驟 S80‧‧‧ steps

S0‧‧‧數值孔徑NA所示之範圍 S 0 ‧‧‧The range indicated by the numerical aperture NA

S1‧‧‧集束光纖118的數值孔徑所示之範圍 The range indicated by the numerical aperture of the S 1 ‧‧‧ bundled fiber 118

S2‧‧‧集束光纖119的數值孔徑所示之範圍 The range indicated by the numerical aperture of the S 2 ‧‧‧ bundled fiber 119

X‧‧‧從作為測定對象之發光元件101的中心到與作為測定對象之發光元件101相鄰之發光元件101的外緣為止的距離 X‧‧‧ Distance from the center of the light-emitting element 101 to be measured to the outer edge of the light-emitting element 101 adjacent to the light-emitting element 101 to be measured

A‧‧‧在光纖117內全反射所得到之光的入射角的最大值 A‧‧‧Maximum angle of incidence of light obtained by total reflection in fiber 117

β‧‧‧由連結開口205a的周緣以及入射口117c的直線與發光中心軸LCA所成之角度 β‧‧‧An angle formed by the line connecting the periphery of the opening 205a and the entrance port 117c to the center axis of illumination LCA

θ‧‧‧將Φ固定時,將與發光中心軸LCA所夾之角度 Θ‧‧‧ When the Φ is fixed, it will be angled with the central axis of the illumination LCA

Φ‧‧‧將包含發光面101a之平面上的一方向當作基準軸(X軸)時,並將從該平面上的X軸逆時針旋轉的角度 Φ‧‧‧ When the direction including the plane of the light-emitting surface 101a is taken as the reference axis (X-axis), and the angle from the X-axis on the plane is rotated counterclockwise

僅以本發明的幾個實施形態為例,參照附圖進行以下的說明。 Only a few embodiments of the present invention will be described below with reference to the drawings.

圖1(a)~(c)係顯示以光學測定裝置測定發光元件的發光狀況。 Fig. 1 (a) to (c) show the measurement of the light emission state of the light-emitting element by an optical measuring device.

圖2係示意地顯示光學測定裝置的構造。 Fig. 2 is a view schematically showing the configuration of an optical measuring device.

圖3A係為光學測定裝置所包括的光纖及發光元件之放大圖。 Fig. 3A is an enlarged view of an optical fiber and a light-emitting element included in the optical measuring device.

圖3B係為顯示從發光中心軸的方向觀看圖3A所示之發光元件的圖。 Fig. 3B is a view showing the light-emitting element shown in Fig. 3A viewed from the direction of the central axis of the light emission.

圖4係為用於說明光學測定裝置之調節部的例1的圖。 Fig. 4 is a view for explaining an example 1 of an adjustment unit of the optical measuring device.

圖5係為用於說明光學測定裝置之調節部的其它之例2的圖。 Fig. 5 is a view for explaining another example 2 of the adjustment unit of the optical measuring device.

圖6係為用於說明以光學測定裝置測定發光元件的光學特性時之測定條件的圖。 Fig. 6 is a view for explaining measurement conditions when optical characteristics of a light-emitting element are measured by an optical measuring device.

圖7A係為與圖6所示之發光元件的色度相關的測定結果,顯示CIE-XYZ顏色系統中的色度座標x。 Fig. 7A is a measurement result relating to the chromaticity of the light-emitting element shown in Fig. 6, showing the chromaticity coordinate x in the CIE-XYZ color system.

圖7B係為與圖6所示之發光元件的色度相關的測定結果,顯示CIE-XYZ顏色系統中的色度座標y。 Fig. 7B is a measurement result relating to the chromaticity of the light-emitting element shown in Fig. 6, showing the chromaticity coordinate y in the CIE-XYZ color system.

圖8係顯示與圖6所示之發光元件的光量相關的測定結果。 Fig. 8 shows the measurement results relating to the amount of light of the light-emitting element shown in Fig. 6.

圖9A係為用於說明以多個發光元件同時測定多個排列的發光元件的光學特性之光學測定裝置的圖。 9A is a view for explaining an optical measuring apparatus for simultaneously measuring optical characteristics of a plurality of arranged light-emitting elements by a plurality of light-emitting elements.

圖9B係為顯示從發光中心軸的方向觀看圖9A所示之發光元件的圖。 Fig. 9B is a view showing the light-emitting element shown in Fig. 9A viewed from the direction of the central axis of the light emission.

圖10A係為用於說明光學測定裝置的變形例1的圖。 Fig. 10A is a view for explaining a first modification of the optical measuring device.

圖10B係為顯示從發光中心軸的方向觀看圖10A所示之發光元件以及集束光纖的圖。 Fig. 10B is a view showing the light-emitting element and the bundled optical fiber shown in Fig. 10A as seen from the direction of the central axis of the light emission.

圖10C係為說明圖10A及圖10B所示之集束光纖的其它剖面形狀的 圖。 Figure 10C is a view showing other cross-sectional shapes of the bundled optical fibers shown in Figures 10A and 10B. Figure.

圖11係為用於說明光學測定裝置的變形例2的圖。 Fig. 11 is a view for explaining a second modification of the optical measuring device.

圖12A係為用於說明光學測定裝置的變形例3的圖。 Fig. 12A is a view for explaining a third modification of the optical measuring apparatus.

圖12B係為用於說明圖12A所示之透鏡中的光折射的圖。 Fig. 12B is a view for explaining light refraction in the lens shown in Fig. 12A.

圖13A係為用於說明光學測定裝置的變形例4的圖。 Fig. 13A is a view for explaining a fourth modification of the optical measuring apparatus.

圖13B係為顯示從發光中心軸的方向觀看圖13A所示之發光元件以及集束光纖的圖。 Fig. 13B is a view showing the light-emitting element and the bundled optical fiber shown in Fig. 13A as seen from the direction of the central axis of the light emission.

圖14A係為用於說明光學測定裝置的變形例5的圖。 Fig. 14A is a view for explaining a fifth modification of the optical measuring apparatus.

圖14B係為用於說明光學測定裝置的變形例5中的其它例1的圖。 FIG. 14B is a view for explaining another example 1 in the fifth modification of the optical measuring apparatus.

圖14C係為用於說明光學測定裝置的變形例5中的其它例2的圖。 Fig. 14C is a view for explaining another example 2 in the fifth modification of the optical measuring apparatus.

圖15A係為用於說明光學測定裝置的變形例6的圖。 Fig. 15A is a view for explaining a sixth modification of the optical measuring apparatus.

圖15B係為顯示從發光中心軸的方向觀看圖15A所示之光檢測器的受光元件的圖。 Fig. 15B is a view showing the light receiving element of the photodetector shown in Fig. 15A viewed from the direction of the central axis of the light emission.

圖16係為用於說明光學測定裝置的變形例7的圖。 Fig. 16 is a view for explaining a modification 7 of the optical measuring apparatus.

圖17係為用於說明光學測定裝置的變形例8的圖。 Fig. 17 is a view for explaining a modification 8 of the optical measuring apparatus.

圖18係為用於說明光學測定裝置的變形例9的圖。 Fig. 18 is a view for explaining a modification 9 of the optical measuring apparatus.

圖19A係為用於說明光學測定裝置的變形例10的圖。 19A is a view for explaining a modification 10 of the optical measuring device.

圖19B係為顯示從發光中心軸的方向觀看圖19A所示之遮蔽板以及發光元件的圖。 Fig. 19B is a view showing the shielding plate and the light-emitting element shown in Fig. 19A as seen from the direction of the central axis of the light emission.

圖20係為用於說明光學測定裝置的變形例10中的其它例的圖。 FIG. 20 is a view for explaining another example of Modification 10 of the optical measuring apparatus.

圖21係為用於說明光學測定裝置3的變形例11的圖。 FIG. 21 is a view for explaining a modification 11 of the optical measuring apparatus 3.

圖22係為用於說明圖21所示之控制部151在光學特性測定時進行的處理之流程圖。 Fig. 22 is a flowchart for explaining processing performed when the control unit 151 shown in Fig. 21 performs optical characteristic measurement.

圖23係為用於說明光學測定裝置的變形例11中的其它例的圖。 Fig. 23 is a view for explaining another example of the eleventh modification of the optical measuring apparatus.

以下,針對本發明的實施形態,參照圖面進行詳細說明。以下 說明之實施形態僅為本發明的幾個例子,本發明並不受其內容所限制。另外,於各實施形態中說明的所有構造及動作並非本發明必須的構造或動作。此外,對相同的構成要件賦予相同的參照符號,並省略重複的說明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. the following The embodiments described are only a few examples of the invention, and the invention is not limited by the contents thereof. In addition, all the structures and operations described in the respective embodiments are not essential structures or operations of the present invention. In addition, the same components are denoted by the same reference numerals, and the duplicated description is omitted.

<發光元件的發光狀況> <Lighting condition of light-emitting element>

利用圖1對光學測定裝置3所測定的發光元件101的發光狀況進行說明。 The state of light emission of the light-emitting element 101 measured by the optical measuring device 3 will be described with reference to Fig. 1 .

圖1係顯示以光學測定裝置3測定發光元件101的發光狀況。 Fig. 1 shows the measurement of the light-emitting state of the light-emitting element 101 by the optical measuring device 3.

發光元件101至少包括電極及發光部,為當電力供給時可發出特定波長範圍之光的元件。發光元件101可例如為發光二極體。 The light-emitting element 101 includes at least an electrode and a light-emitting portion, which is an element that emits light of a specific wavelength range when power is supplied. The light emitting element 101 can be, for example, a light emitting diode.

如圖1(a)所示,從發光元件101的發光面101a出射的光呈放射狀。 As shown in FIG. 1(a), the light emitted from the light-emitting surface 101a of the light-emitting element 101 is radially formed.

發光面101a位於發光元件101的表面。將發光元件101的發光面101a的法線稱為發光中心軸LCA。在圖1(a)中,發光面101a為發光元件101在發光中心軸LCA正方向側上的表面。 The light emitting surface 101a is located on the surface of the light emitting element 101. The normal line of the light-emitting surface 101a of the light-emitting element 101 is referred to as an emission center axis LCA. In Fig. 1(a), the light-emitting surface 101a is a surface of the light-emitting element 101 on the positive side of the light-emitting central axis LCA.

將包含發光面101a之平面上的一方向當作基準軸(x軸)時,並將從該平面上的x軸逆時針旋轉的角度定義為Φ。此外,將Φ固定時,將與發光中心軸LCA所夾之角度定義為θ。 When a direction on the plane including the light-emitting surface 101a is taken as the reference axis (x-axis), the angle rotated counterclockwise from the x-axis on the plane is defined as Φ. Further, when Φ is fixed, the angle with the center axis of illumination LCA is defined as θ.

發光元件101發光時,其從發光面101a出射的光強度會依與發光中心軸LCA所夾之角度θ等而不同。 When the light-emitting element 101 emits light, the intensity of light emitted from the light-emitting surface 101a differs depending on the angle θ or the like between the light-emitting central axis LCA.

光量為將Φ的值為由0°到360°、θ的值為由0°到90°為止的範圍內之光強度全部累計,並且針對發光元件101的背面側也進行計算,並將其兩者合計的值。 The amount of light is such that the value of Φ is from 0° to 360°, and the value of θ is from 0° to 90°, and the light intensity is calculated for the back side of the light-emitting element 101, and two of them are calculated. The total value of the person.

可藉由得知此光量而檢查出其發光元件101是否適用於各種使用方式。 By knowing the amount of light, it is possible to check whether or not the light-emitting element 101 is suitable for various modes of use.

從發光元件101出射的光強度的值,依據不同的θ及Φ而不同。為 了以視覺方式表現光強度,使用如圖1(b)的圖進行說明。 The value of the light intensity emitted from the light-emitting element 101 differs depending on the different θ and Φ. for The light intensity is visually expressed and described using a graph as shown in Fig. 1(b).

在圖1(b)中,x軸與y軸的交點部份以θ=0°表示。圓上的各點分別表示θ=90°的每個Φ的位置。 In Fig. 1(b), the intersection of the x-axis and the y-axis is represented by θ = 0°. Each point on the circle represents the position of each Φ of θ = 90°.

圖1(c)為Φ值在固定位置的剖面圖。 Figure 1 (c) is a cross-sectional view of the Φ value at a fixed position.

在此,在距離發光元件101相同距離、且位於與發光中心軸LCA所夾的角度θ的位置上,將光強度定義為配光強度E(θ)。此配光強度E(θ)對應每個θ之配光強度分布如圖所示。 Here, the light intensity is defined as the light distribution intensity E(θ) at the same distance from the light-emitting element 101 and at an angle θ with respect to the light-emitting central axis LCA. The light distribution intensity E(θ) corresponds to the light distribution intensity distribution of each θ as shown in the figure.

此外,一旦知道配光強度分布,即可按照接下來的步驟以求出發光元件101的光量。 Further, once the light distribution intensity distribution is known, the amount of light of the light-emitting element 101 can be obtained in accordance with the next step.

即,以發光中心軸LCA周圍的圓周對配光強度E(θ)作積分(Φ=0°至360°為止作積分),求出周配光強度J(θ)。周配光強度J(θ)以J(θ)=E(θ).2πr.sinθ表示。將此周配光強度J(θ)的θ=0°至θ°為止作積分,可求出發光元件101之表面側的光量K(θ)。 That is, the light distribution intensity E(θ) is integrated by the circumference around the light emission center axis LCA (integrally from Φ=0° to 360°), and the circumferential light distribution intensity J(θ) is obtained. The circumferential light intensity J(θ) is J(θ)=E(θ). 2πr. Sin θ is expressed. By integrating θ=0° to θ° of the circumferential light distribution intensity J(θ), the amount of light K(θ) on the surface side of the light-emitting element 101 can be obtained.

此外,將K(θ)乘上固定係數κ,可算出發光元件101之背面側的光量。 Further, by multiplying K(θ) by the fixed coefficient κ, the amount of light on the back side of the light-emitting element 101 can be calculated.

接著,將表面側的光量K(θ)加上背面側的光量K(θ).κ,可算出發光元件101的光量。 Next, the amount of light K (θ) on the surface side is added to the amount of light K (θ) on the back side. κ, the amount of light of the light-emitting element 101 can be calculated.

另外,可知以同一製程製造的發光元件101,其發光元件101之表面側的光量與背面側的光量之差為大致固定。因此,只要實際測量一個發光元件101的光量而求出係數κ之後,其他的發光元件101也可適用此值。 In addition, it is understood that the light-emitting element 101 manufactured by the same process has a substantially constant difference between the amount of light on the surface side of the light-emitting element 101 and the amount of light on the back side. Therefore, as long as the amount of light of one light-emitting element 101 is actually measured and the coefficient κ is obtained, the other light-emitting elements 101 can also apply this value.

在圖1的說明中,假設在距離發光元件101夠遠的位置進行測定,則發光元件101可被視為是一個點。一般而言,發光元件101與光檢測器105等(參照圖2)相比極為渺小,因此這樣的假設是可以成立的。於圖2之後的說明中若無特別記載,皆為相同。 In the description of Fig. 1, it is assumed that the light-emitting element 101 can be regarded as one point, assuming that the measurement is made far enough from the light-emitting element 101. In general, the light-emitting element 101 is extremely small compared to the photodetector 105 (see FIG. 2), and thus such an assumption can be established. Unless otherwise stated in the description of FIG. 2 and subsequent steps, the same is true.

<光學測定裝置的構造> <Configuration of Optical Measuring Device>

利用圖2,對光學測定裝置3的構造進行說明。 The structure of the optical measuring device 3 will be described with reference to Fig. 2 .

圖2係示意地顯示光學測定裝置3的構造。 FIG. 2 schematically shows the configuration of the optical measuring device 3.

光學測定裝置3為測定發光元件101所發出的光之光學特性的裝置。在光學測定裝置3所測定的光學特性中,至少包括發光元件101所發出的光之光量、波長及色度。 The optical measuring device 3 is a device that measures the optical characteristics of light emitted from the light-emitting element 101. The optical characteristics measured by the optical measuring device 3 include at least the amount of light, the wavelength, and the chromaticity of the light emitted from the light-emitting element 101.

此外,光學測定裝置3可適用於發光元件101的製程所包括的檢查步驟中所使用的檢查裝置。光學測定裝置3除了發光元件101的光學特性之外,也能測定其電氣特性。 Further, the optical measuring device 3 can be applied to an inspection device used in an inspection step included in the process of the light-emitting element 101. The optical measuring device 3 can measure the electrical characteristics in addition to the optical characteristics of the light-emitting element 101.

光學測定裝置3至少具備載置桌103、探針109、光纖117、訊號線111、光檢測器105、放大器113、分光器121、電氣特性計測部125、控制部151及輸出部163。 The optical measuring apparatus 3 includes at least a mounting table 103, a probe 109, an optical fiber 117, a signal line 111, a photodetector 105, an amplifier 113, a spectroscope 121, an electrical characteristic measuring unit 125, a control unit 151, and an output unit 163.

載置桌103為載置作為測定對象之發光元件101的測定樣品台。 The mounting table 103 is a measurement sample stage on which the light-emitting element 101 to be measured is placed.

載置桌103具有大致均勻的平板狀,設置為大致水平。 The placing table 103 has a substantially uniform flat shape and is provided to be substantially horizontal.

載置桌103與其所載置的發光元件101為彼此大致平行。 The mounting table 103 and the light-emitting elements 101 mounted thereon are substantially parallel to each other.

載置桌103至少具有玻璃桌103a與切割片103b。 The mounting table 103 has at least a glass table 103a and a dicing sheet 103b.

玻璃桌103a使用藍寶石及玻璃等的透光材料,形成大致均勻的平板狀。 The glass table 103a uses a light-transmitting material such as sapphire or glass to form a substantially uniform flat plate shape.

切割片103b的表面具有黏著性,層積在玻璃桌103a上。發光元件101載置於此切割片103b上。 The surface of the dicing sheet 103b has adhesiveness and is laminated on the glass table 103a. The light-emitting element 101 is placed on this dicing sheet 103b.

具有切割片103b的載置桌103可在測定時將發光元件101輕易地移載至載置桌103,且抑制其移位。 The mounting table 103 having the dicing sheet 103b can easily transfer the light-emitting element 101 to the mounting table 103 at the time of measurement, and suppress the displacement thereof.

此外,在發光元件101的製程中,在切割片103b上預先排列有多個發光元件101時,也可將發光元件101及切割片103b一起載置於玻璃桌103a上。 Further, in the process of the light-emitting element 101, when a plurality of light-emitting elements 101 are arranged in advance on the dicing sheet 103b, the light-emitting element 101 and the dicing sheet 103b may be placed together on the glass table 103a.

探針109供給電力至發光元件101,以使發光元件101發光。探針109與發光元件101的發光面101a大致平行,沿與發光元件101的法線 呈直角的方向放射狀延伸。 The probe 109 supplies electric power to the light emitting element 101 to cause the light emitting element 101 to emit light. The probe 109 is substantially parallel to the light emitting surface 101a of the light emitting element 101 along the normal to the light emitting element 101. Radially extending in a right angle.

圖2的探針109在測定發光元件101的光學特性時,接觸發光元件101的電極並向其施加電壓。此外,探針109與電氣特性計測部125連接,可同時測定發光元件101的電氣特性。探針109配合發光元件101的電極位置,配置於發光元件101的上表面、下表面或是上下兩面。 The probe 109 of FIG. 2, when measuring the optical characteristics of the light-emitting element 101, contacts the electrode of the light-emitting element 101 and applies a voltage thereto. Further, the probe 109 is connected to the electrical characteristic measuring unit 125, and the electrical characteristics of the light-emitting element 101 can be simultaneously measured. The probe 109 is disposed on the upper surface, the lower surface, or the upper and lower surfaces of the light-emitting element 101 in accordance with the electrode position of the light-emitting element 101.

使探針109接觸發光元件101時,可在載置桌103及發光元件101為固定的狀態下移動探針109。相反的,也可以在探針109為固定的狀態下,移動載置桌103及發光元件101。 When the probe 109 is brought into contact with the light-emitting element 101, the probe 109 can be moved while the mounting table 103 and the light-emitting element 101 are fixed. Conversely, the mounting table 103 and the light-emitting element 101 may be moved while the probe 109 is stationary.

光纖117取入發光元件101所發出的光,導光至光檢測器105及分光器121。光纖117利用預定的數值孔徑取入光線。 The optical fiber 117 takes in light emitted from the light-emitting element 101 and conducts light to the photodetector 105 and the spectroscope 121. The optical fiber 117 takes in light using a predetermined numerical aperture.

光纖117包括光纖頭117a、光傳輸路117b及入射口117c。 The optical fiber 117 includes a fiber tip 117a, an optical transmission path 117b, and an entrance port 117c.

光纖頭117a為取入光的部分。 The optical fiber head 117a is a portion that takes in light.

光纖頭117a形成為筒狀。光纖頭117a的頂端設有讓光入射的開口,即入射口117c。光纖頭117a配置為使入射口117c與發光元件101的發光面101a相對。入射口117c的中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。光纖頭117a的中心軸與入射口117c的中心軸大致相同。 The optical fiber head 117a is formed in a cylindrical shape. The tip end of the optical fiber head 117a is provided with an opening for allowing light to enter, that is, an entrance port 117c. The optical fiber head 117a is disposed such that the entrance port 117c faces the light emitting surface 101a of the light emitting element 101. The central axis of the entrance port 117c is substantially the same as the central axis of illumination LCA of the light-emitting element 101 to be measured. The central axis of the fiber tip 117a is substantially the same as the central axis of the entrance port 117c.

入射口117c使與預定的光纖117之數值孔徑相對應之範圍的光入射。 The entrance port 117c makes light incident in a range corresponding to the numerical aperture of the predetermined optical fiber 117.

光傳輸路117b光學連接與光纖頭117a設有入射口117c的頂端相反側的端部、光檢測器105以及分光器121。 The optical transmission path 117b is optically connected to the optical fiber head 117a at the end opposite to the distal end of the entrance port 117c, the photodetector 105, and the spectroscope 121.

光傳輸路117b將從入射口117c入射的光導光至光檢測器105及分光器121。光傳輸路117b使從入射口117c入射的光在其內部全反射,盡可能降低傳輸損失,導光至光檢測器105及分光器121。 The light transmission path 117b guides light incident from the entrance port 117c to the photodetector 105 and the beam splitter 121. The light transmission path 117b totally reflects the light incident from the entrance port 117c therein, and reduces the transmission loss as much as possible, and guides the light to the photodetector 105 and the spectroscope 121.

光檢測器105經由光纖117並利用受光元件105a來檢測發光元件101所發出的光,測定其光學特性。 The photodetector 105 detects the light emitted from the light-emitting element 101 via the optical fiber 117 and the light-receiving element 105a, and measures the optical characteristics.

在光檢測器105所測定的光學特性中,至少包括發光元件101所發出的光之光量。 Among the optical characteristics measured by the photodetector 105, at least the amount of light emitted by the light-emitting element 101 is included.

一旦有光入射至受光元件105a,就會藉由光電轉換產生對應此入射光的電荷。受光元件105a可例如為光電二極體等。 When light is incident on the light receiving element 105a, charges corresponding to the incident light are generated by photoelectric conversion. The light receiving element 105a can be, for example, a photodiode or the like.

光檢測器105累計入射至受光元件105a之入射光的所有光強度,求出入射光的光量。光檢測器105對應求得的光量,產生電氣訊號。光檢測器105將所產生之電氣訊號經由訊號線111輸出至放大器113。此電氣訊號相當於光檢測器105所測定之光量資訊。 The photodetector 105 collects all the light intensities of the incident light incident on the light receiving element 105a, and obtains the amount of incident light. The photodetector 105 generates an electrical signal corresponding to the determined amount of light. The photodetector 105 outputs the generated electrical signal to the amplifier 113 via the signal line 111. This electrical signal corresponds to the amount of light information measured by the photodetector 105.

放大器113放大從光檢測器105輸出的電氣訊號,輸出至控制部151。 The amplifier 113 amplifies the electric signal output from the photodetector 105 and outputs it to the control unit 151.

分光器121經由光纖117並利用受光元件121a來檢測發光元件101所發出的光,測定其光學特性。 The spectroscope 121 detects the light emitted from the light-emitting element 101 via the optical fiber 117 and the light-receiving element 121a, and measures the optical characteristics.

在分光器121所測定的光學特性中,至少包括發光元件101所發出的光之光量、波長及色度。 Among the optical characteristics measured by the spectroscope 121, at least the amount of light, the wavelength, and the chromaticity of the light emitted from the light-emitting element 101 are included.

一旦有光入射至受光元件121a,就會藉由光電轉換產生對應此入射光的電荷。受光元件121a可例如為CCD(Charge Coupled Device)或光電二極體陣列等。 When light is incident on the light receiving element 121a, electric charges corresponding to the incident light are generated by photoelectric conversion. The light receiving element 121a can be, for example, a CCD (Charge Coupled Device) or a photodiode array.

分光器121對入射至受光元件121a之入射光進行波長分散,並求出分散後的各波長之光強度。各波長之光強度相當於入射光的波長光譜資訊。分光器121從此波長光譜資訊計算出紅(R)、綠(G)、藍(B)三刺激值的成分比例,求出入射光的色度。另外,分光器121累計分散後的各波長之光強度,求出入射光的光量。分光器121可應需要求出其他光學特性。 The spectroscope 121 wavelength-divides the incident light incident on the light-receiving element 121a, and obtains the light intensity of each wavelength after dispersion. The light intensity at each wavelength corresponds to the wavelength spectrum information of the incident light. The spectroscope 121 calculates the component ratios of the red (R), green (G), and blue (B) tristimulus values from the wavelength spectrum information, and obtains the chromaticity of the incident light. Further, the spectroscope 121 accumulates the light intensities of the respective wavelengths after dispersion, and obtains the amount of incident light. The beam splitter 121 can find other optical characteristics as needed.

分光器121產生對應所求得的各種光學特性之電氣訊號。分光器121將所產生之電氣訊號經由訊號線111輸出至控制部151。此電氣訊號相當於分光器121所測定之波長光譜資訊、色度資訊以及光量資訊 等。 The beam splitter 121 produces electrical signals corresponding to the various optical characteristics found. The spectroscope 121 outputs the generated electric signal to the control unit 151 via the signal line 111. The electrical signal is equivalent to the wavelength spectrum information, the chrominance information, and the light quantity information measured by the beam splitter 121. Wait.

電氣特性計測部125至少具備定位單元159、HV單元153、ESD單元155及切換單元157。 The electrical characteristic measurement unit 125 includes at least a positioning unit 159, an HV unit 153, an ESD unit 155, and a switching unit 157.

定位單元159定位且固定探針109。具體而言,在載置桌103移動的形式下,定位單元159具有將探針109的頂端位置保持在固定位置的功能。相反的,在探針109移動的形式下,定位單元159具有將探針109的頂端位置移動至載置有發光元件101的載置桌103上之預定位置,並在此之後將其保持在該位置的功能。 The positioning unit 159 positions and fixes the probe 109. Specifically, in the form in which the placement table 103 moves, the positioning unit 159 has a function of holding the tip end position of the probe 109 at a fixed position. Conversely, in the form in which the probe 109 is moved, the positioning unit 159 has a predetermined position at which the tip end position of the probe 109 is moved to the mounting table 103 on which the light-emitting element 101 is placed, and thereafter held therein. The function of the location.

HV單元153具有施加額定電壓、並且檢測出對額定電壓之發光元件101的各種電氣特性的作用。 The HV unit 153 has a function of applying a rated voltage and detecting various electrical characteristics of the light-emitting element 101 of the rated voltage.

通常,在施加有來自此HV單元153的電壓的狀態下,發光元件101發出的光由光檢測器105及分光器121進行測定。 Normally, the light emitted from the light-emitting element 101 is measured by the photodetector 105 and the spectroscope 121 in a state where the voltage from the HV unit 153 is applied.

HV單元153檢測出的各種特性訊息將輸出至控制部151。 The various characteristic messages detected by the HV unit 153 are output to the control unit 151.

ESD單元155為對發光元件101施加瞬間大電壓造成靜電放電並檢查其是否遭受靜電破壞等的單元。 The ESD unit 155 is a unit that applies an instantaneous large voltage to the light-emitting element 101 to cause electrostatic discharge and checks whether it is subjected to electrostatic breakdown or the like.

ESD單元155檢測出的靜電破壞資訊將輸出至控制部151。 The static electricity destruction information detected by the ESD unit 155 is output to the control unit 151.

切換單元157進行HV單元153與ESD單元155的切換。 The switching unit 157 performs switching of the HV unit 153 and the ESD unit 155.

藉由切換單元157改變通過探針109施加至發光元件101的電壓。接著,藉由此改變,發光元件101的檢查項目可分別改變為檢測在額定電壓下的各種特性,或是檢測其是否遭到靜電破壞。 The voltage applied to the light emitting element 101 by the probe 109 is changed by the switching unit 157. Then, by this change, the inspection items of the light-emitting element 101 can be changed to detect various characteristics at the rated voltage, respectively, or to detect whether they are damaged by static electricity.

控制部151總體控制光學測定裝置3的動作。 The control unit 151 generally controls the operation of the optical measurement device 3.

由光檢測器105所測定出的光量資訊輸入至控制部151。 The light amount information measured by the photodetector 105 is input to the control unit 151.

由分光器121所測定出的波長光譜資訊、色度資訊以及光量資訊輸入至控制部151。由HV單元153所輸出的各種電氣特性資訊輸入至控制部151。而由ESD單元155所檢測出的靜電破壞資訊也輸入至控制部151。 The wavelength spectrum information, the chromaticity information, and the light amount information measured by the spectroscope 121 are input to the control unit 151. The various electrical characteristic information output by the HV unit 153 is input to the control unit 151. The electrostatic breakdown information detected by the ESD unit 155 is also input to the control unit 151.

控制部151藉由這些輸入對發光元件101之各種特性進行分類及分析。分析出各種特性後,控制部151將其分析結果由輸出部163進行影像輸出等的資訊輸出。並且,控制部151根據其分析結果,依據需要,控制光學測定裝置3的各構成要件。 The control unit 151 classifies and analyzes various characteristics of the light-emitting element 101 by these inputs. After analyzing various characteristics, the control unit 151 outputs the analysis result by the output unit 163 for information such as video output. Further, based on the analysis result, the control unit 151 controls each component of the optical measurement device 3 as needed.

<發光元件的構造> <Configuration of Light-emitting Element>

利用圖3A及圖3B對本實施形態之發光元件101的構造進行說明。 The structure of the light-emitting element 101 of the present embodiment will be described with reference to FIGS. 3A and 3B.

圖3A係為光學測定裝置3所包括的光纖117及發光元件101之放大圖。圖3B係為顯示從發光中心軸LCA的方向觀看圖3A所示之發光元件101的圖。 3A is an enlarged view of the optical fiber 117 and the light-emitting element 101 included in the optical measuring device 3. Fig. 3B is a view showing the light-emitting element 101 shown in Fig. 3A viewed from the direction of the light-emitting central axis LCA.

如上所述,發光元件101為當電力供給時可發出特定波長範圍的光的元件。特定波長範圍的光呈現特定的顏色。 As described above, the light-emitting element 101 is an element that can emit light of a specific wavelength range when power is supplied. Light of a particular wavelength range exhibits a particular color.

本實施形態的發光元件101產生呈現特定顏色的光,對產生的光進行波長轉換為呈現其它顏色的光之後,出射至外部。也就是,本實施形態的發光元件101發出與其產生的光呈現不同顏色的光。發光元件101可例如為將黃色螢光體覆蓋在藍色發光二極體上的擬似白色發光二極體。 The light-emitting element 101 of the present embodiment generates light of a specific color, and converts the generated light into a light of another color, and then emits it to the outside. That is, the light-emitting element 101 of the present embodiment emits light of a different color from the light generated therefrom. The light-emitting element 101 can be, for example, a pseudo-white light-emitting diode that covers a yellow phosphor on a blue light-emitting diode.

本實施形態的發光元件101至少包括生成部101b及波長轉換部101c。 The light-emitting element 101 of the present embodiment includes at least a generating unit 101b and a wavelength converting unit 101c.

一旦有電力供給至生成部101b,則產生特定波長範圍的光。生成部101b出射產生的光。 When power is supplied to the generating portion 101b, light of a specific wavelength range is generated. The generating unit 101b emits the generated light.

生成部101b可為利用電致發光現象之部件。生成部101b可例如為發光二極體。生成部101b也可例如為藍色發光二極體。 The generating portion 101b may be a member that utilizes an electroluminescence phenomenon. The generating portion 101b can be, for example, a light emitting diode. The generating portion 101b may be, for example, a blue light emitting diode.

波長轉換部101c轉換入射的光之波長。波長轉換部101c出射進行波長轉換後的光。 The wavelength conversion unit 101c converts the wavelength of the incident light. The wavelength conversion unit 101c emits light that has undergone wavelength conversion.

波長轉換部101c可為利用光致發光現象之部件。波長轉換部101c可例如為螢光體。波長轉換部101c可例如為黃色螢光體。 The wavelength converting portion 101c may be a member that utilizes a photoluminescence phenomenon. The wavelength conversion unit 101c can be, for example, a phosphor. The wavelength converting portion 101c can be, for example, a yellow phosphor.

波長轉換部101c設置為覆蓋生成部101b之表面。此時,生成部101b所出射的光入射至波長轉換部101c。波長轉換部101c對入射的光進行波長轉換,並出射至外部。波長轉換部101c所出射至外部的光與生成部101b所出射的光的顏色不同。 The wavelength conversion unit 101c is provided to cover the surface of the generation unit 101b. At this time, the light emitted from the generating unit 101b is incident on the wavelength conversion unit 101c. The wavelength conversion unit 101c performs wavelength conversion on the incident light and emits it to the outside. The light emitted from the wavelength conversion unit 101c to the outside is different from the color of the light emitted from the generating unit 101b.

生成部101b為藍色發光二極體,且波長轉換部101c為黃色螢光體時,生成部101b所出射的藍色光入射至波長轉換部101c。波長轉換部101c吸收入射的一部分藍色光以成為激發態,並在向基態轉移時放射出黃色的光。接著,波長轉換部101c將混合了該黃色光以及未吸收之藍色光之白色光出射至外部。意即,發光元件101所發出的光為波長轉換部101c所出射的光。 When the generating unit 101b is a blue light emitting diode and the wavelength converting unit 101c is a yellow phosphor, the blue light emitted from the generating unit 101b is incident on the wavelength converting unit 101c. The wavelength conversion unit 101c absorbs a part of the incident blue light to be in an excited state, and emits yellow light when it is transferred to the ground state. Next, the wavelength conversion unit 101c emits white light in which the yellow light and the unabsorbed blue light are mixed to the outside. That is, the light emitted from the light-emitting element 101 is the light emitted from the wavelength conversion portion 101c.

<檢查步驟中的發光元件的排列型態> <Arrangement pattern of light-emitting elements in the inspection step>

在為發光元件101製程之一的檢查步驟中,如圖3A及圖3B所示,發光元件101排列成多個排列的格子狀。藉由將貼附於切割片上的半導體晶圓切割成多個晶片製造成發光元件101。切割後的發光元件101成為在切割片上多個排列成格子狀的狀態。 In the inspection step which is one of the processes of the light-emitting element 101, as shown in FIGS. 3A and 3B, the light-emitting elements 101 are arranged in a lattice pattern of a plurality of arrays. The light-emitting element 101 is fabricated by cutting a semiconductor wafer attached to a dicing sheet into a plurality of wafers. The light-emitting element 101 after the dicing is in a state in which a plurality of dicing sheets are arranged in a lattice shape.

光學測定裝置3測定多個排列狀態下的發光元件101的光學特性及電氣特性,檢查其是否具有所期望之性能。在檢查時,發光元件101在光學測定裝置3的載置桌103上多個排列的狀態下被移載。光學測定裝置3依序供給電力至多個排列狀態下的每個發光元件101,並測定光學特性及電氣特性。作為測定對象之發光元件101一旦被供給電力,則該發光元件101所發出的光的大部分會入射至光纖117。另一方面,作為測定對象之發光元件101所發出的光的一部分就會入射至測定對象之外的發光元件101。 The optical measuring device 3 measures the optical characteristics and electrical characteristics of the light-emitting elements 101 in a plurality of arranged states, and checks whether or not they have desired performance. At the time of inspection, the light-emitting elements 101 are transferred in a state in which a plurality of light-emitting elements 101 are arranged on the mounting table 103 of the optical measuring device 3. The optical measuring device 3 sequentially supplies electric power to each of the plurality of light-emitting elements 101 in an array state, and measures optical characteristics and electrical characteristics. When the light-emitting element 101 to be measured is supplied with electric power, most of the light emitted from the light-emitting element 101 is incident on the optical fiber 117. On the other hand, a part of the light emitted from the light-emitting element 101 to be measured is incident on the light-emitting element 101 other than the measurement target.

如上所述,入射至測定對象之外的發光元件101的一部分的光會被測定對象之外的發光元件101之波長轉換部101c所吸收,將使測定對象之外的發光元件101發光。另外,入射至測定對象之外的發光元件 101的光的一部分,會被測定對象之外的發光元件101反射,從測定對象之外的發光元件101出射。此測定對象之外的發光元件101所發出的光,以及此測定對象以外的發光元件101所反射的光為「作為測定對象之發光元件101的發光所導致的測定對象之外的發光元件101所出射的光」。 As described above, the light incident on a part of the light-emitting element 101 other than the measurement target is absorbed by the wavelength conversion unit 101c of the light-emitting element 101 other than the measurement target, and the light-emitting element 101 other than the measurement target is caused to emit light. In addition, a light-emitting element that is incident on the outside of the measurement target A part of the light of 101 is reflected by the light-emitting element 101 other than the measurement target, and is emitted from the light-emitting element 101 other than the measurement target. The light emitted from the light-emitting element 101 other than the measurement target and the light reflected by the light-emitting element 101 other than the measurement target are "the light-emitting element 101 other than the measurement target caused by the light emission of the light-emitting element 101 to be measured. The light that is emitted."

「作為測定對象之發光元件101的發光所導致的測定對象之外的發光元件101所出射的光」為測定者所非預期的光。因此,在本實施形態中,也將「作為測定對象之發光元件101的發光所導致的測定對象之外的發光元件101所出射的光」稱為「測定對象之外的發光元件101所出射的非預期之光」。 The "light emitted from the light-emitting element 101 other than the measurement target due to the light emission of the light-emitting element 101 to be measured" is light that is not expected by the measurer. Therefore, in the present embodiment, the "light emitted from the light-emitting element 101 other than the measurement target due to the light emission of the light-emitting element 101 to be measured" is also referred to as "the light emitted from the light-emitting element 101 other than the measurement target". Unexpected light."

換言之,在本實施形態中,由於作為測定對象之發光元件101所發出的光的入射所造成的測定對象之外的發光元件101所發出的光,以及作為測定對象之發光元件101所發出的光被測定對象以外的發光元件101反射的光,皆稱為「測定對象之外的發光元件101所出射的非預期之光」。 In other words, in the present embodiment, the light emitted from the light-emitting element 101 other than the measurement target caused by the incidence of the light emitted from the light-emitting element 101 to be measured, and the light emitted from the light-emitting element 101 as the measurement target The light reflected by the light-emitting element 101 other than the measurement target is referred to as "unexpected light emitted from the light-emitting element 101 other than the measurement target".

「測定對象之外的發光元件101所出射的非預期之光」也會入射至與作為測定對象之發光元件101相對配置的光纖117。而「測定對象之外的發光元件101所出射的非預期之光」一旦入射至光纖117,就無法高精度地測定出作為測定對象之發光元件101的光學特性。 The "unintended light emitted from the light-emitting element 101 other than the measurement target" is also incident on the optical fiber 117 disposed to face the light-emitting element 101 to be measured. When the "unintended light emitted from the light-emitting element 101 other than the measurement target" is incident on the optical fiber 117, the optical characteristics of the light-emitting element 101 to be measured cannot be accurately measured.

尤其,當發光元件101為擬似白色發光二極體時,就更難以較高精度測定出其色度。意即,作為測定對象之發光元件101所發出的白色光,會入射至測定對象之外的發光元件101的黃色螢光體即波長轉換部101c。如此一來,測定對象之外的發光元件101就會發出黃色的光。而此黃色的光將會入射至用於測定作為測定對象之發光元件101的色度而配置之光纖117中。 In particular, when the light-emitting element 101 is a pseudo-white light-emitting diode, it is more difficult to measure its chromaticity with higher precision. In other words, the white light emitted from the light-emitting element 101 to be measured is incident on the wavelength conversion unit 101c which is a yellow phosphor of the light-emitting element 101 other than the measurement target. As a result, the light-emitting element 101 other than the measurement target emits yellow light. On the other hand, the yellow light is incident on the optical fiber 117 arranged to measure the chromaticity of the light-emitting element 101 to be measured.

測定對象之外的發光元件101所發出的黃色光一旦入射至光纖 117,則該黃色光就會被導光至光檢測器105以及分光器121,並藉由受光元件105a以及受光元件121a檢測出。最終會造成作為測定對象之發光元件101的色度相關之測定結果中的黃色成分的比率上升。而黃色成分的比率上升代表無法高精度地測定作為測定對象之發光元件101的色度。 The yellow light emitted from the light-emitting element 101 other than the measurement object is incident on the optical fiber once incident 117, the yellow light is guided to the photodetector 105 and the spectroscope 121, and detected by the light receiving element 105a and the light receiving element 121a. Eventually, the ratio of the yellow component in the measurement result of the chromaticity of the light-emitting element 101 to be measured is increased. On the other hand, the increase in the ratio of the yellow component means that the chromaticity of the light-emitting element 101 to be measured cannot be measured with high precision.

因此,需要在多個排列的發光元件101中也能高精度地測定出作為測定對象之發光元件101的光學特性之技術。 Therefore, it is necessary to accurately measure the optical characteristics of the light-emitting element 101 to be measured in the plurality of arranged light-emitting elements 101.

<光學測定裝置中的光檢測範圍> <Light detection range in optical measuring device>

本實施形態之光學測定裝置3具備檢測出在多個排列的發光元件101之中作為測定對象之發光元件101所發出的光,並且不檢測出作為測定對象之外的發光元件101所出射的非預期之光的構造。 The optical measurement device 3 of the present embodiment is configured to detect light emitted from the light-emitting element 101 to be measured among the plurality of light-emitting elements 101 arranged in a plurality of rows, and does not detect the non-emission of the light-emitting element 101 other than the measurement target. The construction of the expected light.

在圖3A及圖3B中,將配置於中央的發光元件101作為測定對象。 在該發光元件101周圍配置的發光元件101為測定對象之外的發光元件101。 In FIGS. 3A and 3B, the light-emitting element 101 disposed at the center is used as a measurement target. The light-emitting element 101 disposed around the light-emitting element 101 is a light-emitting element 101 other than the measurement target.

在測定作為測定對象之發光元件101的光學特性時,光學測定裝置3使光纖117的入射口117c與作為測定對象之發光元件101相對。較佳的是,光學測定裝置3使作為測定對象之發光元件101的發光中心軸LCA與入射口117c的中心軸為大致相同,並使兩者相對。 When the optical characteristics of the light-emitting element 101 to be measured are measured, the optical measuring device 3 faces the light-emitting element 101 of the optical fiber 117 with respect to the light-emitting element 101 to be measured. Preferably, the optical measuring device 3 makes the central axis of the light-emitting central axis LCA and the entrance opening 117c of the light-emitting element 101 to be measured substantially the same, and opposes the two.

在此,如圖3A所示,將作為測定對象之發光元件101與光纖117之間的距離定義為L。將從作為測定對象之發光元件101的中心到外緣為止的距離定義為A。將相鄰之發光元件101彼此之間的距離定義為B。將從作為測定對象之發光元件101的中心到與作為測定對象之發光元件101相鄰之發光元件101的外緣為止的距離定義為X。 Here, as shown in FIG. 3A, the distance between the light-emitting element 101 to be measured and the optical fiber 117 is defined as L. The distance from the center to the outer edge of the light-emitting element 101 to be measured is defined as A. The distance between adjacent light-emitting elements 101 is defined as B. The distance from the center of the light-emitting element 101 to be measured to the outer edge of the light-emitting element 101 adjacent to the light-emitting element 101 to be measured is defined as X.

此外,在光纖117內全反射所得到之光的入射角的最大值定義為α。光纖117與發光元件101之間的介質定義為空氣,定義其折射率=1。光纖117的數值孔徑定義為NA,數值孔徑NA所示之範圍定義為 S0。將範圍S0投影至發光元件101時的、從發光元件101的中心到範圍S0的外緣為止的距離定義為D。 Further, the maximum value of the incident angle of the light obtained by total reflection in the optical fiber 117 is defined as α. The medium between the optical fiber 117 and the light-emitting element 101 is defined as air, and its refractive index = 1 is defined. The numerical aperture of the optical fiber 117 is defined as NA, and the range indicated by the numerical aperture NA is defined as S 0 . The distance from the center of the light-emitting element 101 to the outer edge of the range S 0 when the range S 0 is projected onto the light-emitting element 101 is defined as D.

此時,數值孔徑NA為NA=sinα。距離X為X=A+B。距離D為D=Ltanα。 At this time, the numerical aperture NA is NA = sinα. The distance X is X=A+B. The distance D is D = Ltan α.

發光元件101若存在於數值孔徑NA所示之範圍S0中,則發光元件101所發出的光就會在光纖117內反覆進行全反射,而導光至光檢測器105及分光器121。而發光元件101若不存在於範圍S0內,則發光元件101所發出的光就無法導光至光檢測器105及分光器121。 When the light-emitting element 101 is present in the range S 0 indicated by the numerical aperture NA, the light emitted from the light-emitting element 101 is totally reflected in the optical fiber 117, and is guided to the photodetector 105 and the spectroscope 121. On the other hand, if the light-emitting element 101 does not exist in the range S 0 , the light emitted from the light-emitting element 101 cannot be guided to the photodetector 105 and the spectroscope 121.

因此,數值孔徑NA所示之範圍S0相當於藉由光檢測器105所包括的受光元件105a及分光器121所包括的受光元件121a可檢測出光的範圍。 Therefore, the range S 0 indicated by the numerical aperture NA corresponds to a range in which light can be detected by the light receiving element 105a included in the photodetector 105 and the light receiving element 121a included in the spectroscope 121.

在本實施形態中,也可以將藉由受光元件105a及受光元件121a檢測出光的範圍稱為「檢測範圍」。 In the present embodiment, the range in which the light is detected by the light receiving element 105a and the light receiving element 121a may be referred to as a "detection range".

此外,受光元件105a及受光元件121a的檢測範圍相當於光學測定裝置3可測定出光學特性的光的範圍。 Further, the detection ranges of the light receiving element 105a and the light receiving element 121a correspond to the range of light in which the optical measuring device 3 can measure optical characteristics.

光學測定裝置3為了在檢測作為測定對象之發光元件101所發出的光的同時不檢測測定對象之外的發光元件101所出射的非預期之光,而調節受光元件105a及受光元件121a的檢測範圍。 The optical measuring device 3 adjusts the detection range of the light receiving element 105a and the light receiving element 121a so as not to detect the unintended light emitted from the light emitting element 101 other than the measurement target while detecting the light emitted from the light emitting element 101 to be measured. .

受光元件105a及受光元件121a的檢測範圍,例如可藉由調節作為測定對象之發光元件101與光纖117之間的距離L來進行調節。 The detection range of the light receiving element 105a and the light receiving element 121a can be adjusted, for example, by adjusting the distance L between the light emitting element 101 and the optical fiber 117 to be measured.

光學測定裝置3為了在檢測作為測定對象之發光元件101所發出的光的同時不檢測測定對象之外的發光元件101所出射的非預期之光,將會以下述之方式調節距離L。意即,光學測定裝置3會調節距離L,以使作為測定對象之發光元件101位於範圍S0內,並且使測定對象以外之發光元件101不位於範圍S0內。 In order to detect the light emitted from the light-emitting element 101 to be measured, the optical measuring device 3 does not detect the unexpected light emitted from the light-emitting element 101 other than the measurement target, and adjusts the distance L as follows. In other words, the optical measuring device 3 adjusts the distance L so that the light-emitting element 101 to be measured is located in the range S 0 and the light-emitting element 101 other than the measurement target is not located in the range S 0 .

只要距離D為距離A以上,就滿足作為測定對象之發光元件101位 於範圍S0內的條件。距離D≧距離A時的距離L為L≧A/tanα。光學測定裝置3為了使作為測定對象之發光元件101位於範圍S0內,只要調節距離L,使其滿足L≧A/tanα之關係即可。只要滿足此關係,則作為測定對象之發光元件101所發出的光,就會被導光至受光元件105a及受光元件121a並且被檢測。 As long as the distance D is equal to or greater than the distance A, the condition that the light-emitting element 101 to be measured is within the range S 0 is satisfied. The distance L when the distance D is a distance D is L ≧ A / tan α. In order to position the light-emitting element 101 to be measured within the range S 0 , the optical measuring device 3 may adjust the distance L so as to satisfy the relationship of L ≧ A / tan α. When the relationship is satisfied, the light emitted from the light-emitting element 101 to be measured is guided to the light-receiving element 105a and the light-receiving element 121a and detected.

而只要距離D為距離X以下,就滿足測定對象之外的發光元件101不位於範圍S0內的條件。距離D≦距離X時的距離L為L≦X/tanα。光學測定裝置3為了使測定對象之外的發光元件101不位於範圍S0內,只要調節距離L,使其滿足L≦X/tanα之關係即可。只要滿足此關係,則測定對象之外發光元件101所出射的非預期之的光,就不會被導光至受光元件105a及受光元件121a並且不會被檢測。 On the other hand, as long as the distance D is equal to or less than the distance X, the condition that the light-emitting element 101 other than the measurement target is not located in the range S 0 is satisfied. The distance L when the distance D is distance X is L≦X/tanα. In order to prevent the light-emitting element 101 other than the measurement target from being located within the range S 0 , the optical measuring device 3 may adjust the distance L so as to satisfy the relationship of L ≦ X / tan α. As long as the relationship is satisfied, the unintended light emitted from the light-emitting element 101 other than the measurement target is not guided to the light-receiving element 105a and the light-receiving element 121a and is not detected.

意即,光學測定裝置3為了使作為測定對象之發光元件101位於範圍S0內,並且使測定對象以外之發光元件101不位於範圍S0內,將距離L調節成滿足下式之關係。 In other words, the optical measuring device 3 adjusts the distance L so as to satisfy the relationship of the following equation so that the light-emitting element 101 to be measured is located in the range S 0 and the light-emitting element 101 other than the measurement target is not located in the range S 0 .

A/tanα≦L≦X/tanα A/tanα≦L≦X/tanα

藉此,光學測定裝置3在排列有多個發光元件101的狀態下,不會檢測到測定對象之外的發光元件101所出射的非預期之光,而只會檢測到作為測定對象之發光元件101所發出的光。 In the state where the plurality of light-emitting elements 101 are arranged, the optical measuring device 3 does not detect the unexpected light emitted from the light-emitting element 101 other than the measurement target, and only detects the light-emitting element as the measurement target. The light emitted by 101.

此外,根據測定之光學特性,有時即使作為測定對象之發光元件101的生成部101b及波長轉換部101c全部不位於範圍S0內,也能充分確保其測定精度。 In addition, measurement of the optical characteristics, even if the light-emitting element may be measured as the generating unit 101b and 101c of the wavelength conversion portion 101 is not located within the entire range S 0, can be sufficiently ensure the measurement accuracy thereof.

例如,有時只要作為測定對象之發光元件101的生成部101b位於範圍S0內就能十分確保其測定精度。在此情況下,將從作為測定對象的發光元件101之中心到生成部101b之外緣為止的距離定義為a(<A),則光學測定裝置3將距離L調節成滿足下式之關係。 For example, the light-emitting element may be measured as long as the generating unit 101b 101 can be positioned to ensure that measurement accuracy is in the range of S 0. In this case, the distance from the center of the light-emitting element 101 to be measured to the outer edge of the generating portion 101b is defined as a (<A), and the optical measuring device 3 adjusts the distance L to satisfy the relationship of the following formula.

a/tanα≦L≦X/tanα a/tanα≦L≦X/tanα

無論哪種情況,光學測定裝置3只要將距離L調節為至少滿足L≦X/tanα的關係即可。 In either case, the optical measuring device 3 only needs to adjust the distance L to at least satisfy the relationship of L ≦ X / tan α.

<光學測定裝置的調節部> <Adjustment section of optical measuring device>

利用圖4及圖5說明光學測定裝置3所具備的調節部。 The adjustment unit provided in the optical measurement device 3 will be described with reference to FIGS. 4 and 5 .

圖4係為用於說明光學測定裝置3之調節部的例1的圖。圖5係為用於說明光學測定裝置3之調節部的其它之例2的圖。 FIG. 4 is a view for explaining an example 1 of the adjustment unit of the optical measurement device 3. FIG. 5 is a view for explaining another example 2 of the adjustment unit of the optical measuring apparatus 3.

調節部為用於調節由受光元件105a及受光元件121a所檢測之光的範圍即檢測範圍的機構。 The adjustment unit is a mechanism for adjusting the detection range of the range of light detected by the light receiving element 105a and the light receiving element 121a.

如上所述,受光元件105a及受光元件121a的檢測範圍藉由調節作為測定對象之發光元件101與光纖117之間的距離L來調節。 As described above, the detection ranges of the light receiving element 105a and the light receiving element 121a are adjusted by adjusting the distance L between the light emitting element 101 and the optical fiber 117 to be measured.

光學測定裝置3具備例如距離L的調節機構以作為用於調節受光元件105a及受光元件121a的檢測範圍之調節部。 The optical measuring device 3 includes an adjustment mechanism such as a distance L as an adjustment unit for adjusting the detection ranges of the light receiving element 105a and the light receiving element 121a.

距離L的調節機構可由例如安裝在光纖117上的未繪示之致動器所構成。如圖4所示,距離L的調節機構使光纖117沿發光中心軸LCA移動。因此,即使光纖117藉由距離L的調節機構移動,也能使光纖117的入射口117c、發光元件101以及載置桌103保持互相大致平行之配置關係。 The adjustment mechanism of the distance L can be constituted by, for example, an actuator (not shown) mounted on the optical fiber 117. As shown in FIG. 4, the adjustment mechanism of the distance L causes the optical fiber 117 to move along the central axis of illumination LCA. Therefore, even if the optical fiber 117 is moved by the adjustment mechanism of the distance L, the incident port 117c of the optical fiber 117, the light-emitting element 101, and the mounting table 103 can be placed in an arrangement relationship substantially parallel to each other.

一旦藉由調節機構使光纖117移動,則光纖117的入射口117c就會接近或遠離發光元件101,從而改變距離L。藉此,限制入射至光纖117的光,調節受光元件105a及受光元件121a的檢測範圍。 Once the optical fiber 117 is moved by the adjustment mechanism, the entrance port 117c of the optical fiber 117 approaches or moves away from the light-emitting element 101, thereby changing the distance L. Thereby, the light incident on the optical fiber 117 is restricted, and the detection ranges of the light receiving element 105a and the light receiving element 121a are adjusted.

此外,距離L的調節機構也可不使光纖117移動,而是使載置有發光元件101的載置桌103移動,也可使該載置桌103及光纖117兩者都移動。 Further, the adjustment mechanism of the distance L may move the mounting table 103 on which the light-emitting element 101 is placed without moving the optical fiber 117, and may move both the mounting table 103 and the optical fiber 117.

另外,受光元件105a及受光元件121a的檢測範圍也可藉由調節作為測定對象之發光元件101與光纖117之間的距離L之外的方法進行調節。 Further, the detection range of the light receiving element 105a and the light receiving element 121a can be adjusted by adjusting the distance L between the light emitting element 101 and the optical fiber 117 which are measurement targets.

光學測定裝置3可藉由遮斷作為測定對象之發光元件101所發出的光的一部分,限制入射至光纖117的光,以調節受光元件105a及受光元件121a的檢測範圍。 The optical measuring device 3 can block the light incident on the optical fiber 117 by blocking a part of the light emitted from the light-emitting element 101 to be measured, and adjust the detection range of the light-receiving element 105a and the light-receiving element 121a.

如圖5所示,光學測定裝置3也可具備例如光圈201以作為用於調節受光元件105a及受光元件121a的檢測範圍之調節部。 As shown in FIG. 5, the optical measurement device 3 may include, for example, a diaphragm 201 as an adjustment unit for adjusting the detection ranges of the light receiving element 105a and the light receiving element 121a.

光圈201配置在作為測定對象之發光元件101與光纖117之間。光圈201形成為以發光中心軸LCA為中心軸之略圓盤狀。光圈201在中央具有可改變其大小之開口部201a。 The aperture 201 is disposed between the light-emitting element 101 to be measured and the optical fiber 117. The aperture 201 is formed in a substantially disk shape with the central axis of illumination LCA as a central axis. The aperture 201 has an opening portion 201a at the center which can be changed in size.

在圖5之光學測定裝置3中,光纖117的位置固定在使測定對象之外的發光元件101不包括在範圍S0內的位置上。意即,光纖117的位置固定在距離L調節為L=X/tanα的位置。並且,光圈201設計為可使固定於該位置之光纖117的範圍S0落在開口部201a內。 In the optical measuring apparatus 3 of Fig. 5, the position of the optical fiber 117 is fixed at a position where the light-emitting element 101 other than the measurement target is not included in the range S 0 . That is, the position of the optical fiber 117 is fixed at a position where the distance L is adjusted to L = X / tan α. Further, the aperture 201 is designed such that the range S 0 of the optical fiber 117 fixed at this position falls within the opening 201a.

一旦改變光圈201之開口部201a的大小,就可改變作為測定對象之發光元件101所發出的光之遮斷範圍。藉此,限制入射至光纖117的光,調節受光元件105a及受光元件121a的檢測範圍。 When the size of the opening 201a of the aperture 201 is changed, the blocking range of the light emitted by the light-emitting element 101 to be measured can be changed. Thereby, the light incident on the optical fiber 117 is restricted, and the detection ranges of the light receiving element 105a and the light receiving element 121a are adjusted.

<測定結果> <Measurement result>

利用圖6至圖8,說明使用光學測定裝置3測定發光元件101的光學特性之測定結果。 The measurement results of the optical characteristics of the light-emitting element 101 measured by the optical measuring device 3 will be described with reference to Figs. 6 to 8 .

首先,利用圖6說明測定條件。 First, the measurement conditions will be described using FIG.

圖6係為用於說明以光學測定裝置3測定發光元件101的光學特性時之測定條件的圖。 FIG. 6 is a view for explaining measurement conditions when the optical characteristics of the light-emitting element 101 are measured by the optical measuring device 3.

在圖6中,以黑色表示作為測定對象之發光元件101,以白色表示測定對象之外的發光元件101。 In FIG. 6, the light-emitting element 101 as a measurement target is shown in black, and the light-emitting element 101 other than the measurement target is shown in white.

將使用光學測定裝置3測定發光元件101之光學特性時的測定條件定義為測定條件1~4。測定條件1~4中的發光元件101之排列型態不同。 The measurement conditions when the optical characteristics of the light-emitting element 101 are measured by the optical measuring device 3 are defined as measurement conditions 1 to 4. The arrangement patterns of the light-emitting elements 101 in the measurement conditions 1 to 4 are different.

測定條件1~4之共同條件如下。 The common conditions of the measurement conditions 1 to 4 are as follows.

在測定條件1~4中的作為測定對象之發光元件101以及測定對象之外的發光元件101皆為包括生成部101b及波長轉換部101c之相同的發光元件101。將此發光元件101定義為生成部101b是藍色發光二極體、波長轉換部101c是黃色螢光體之擬似白色發光二極體。並且,發光元件101形成為邊長1mm之正方形的形狀。 The light-emitting elements 101 to be measured and the light-emitting elements 101 other than the measurement target in the measurement conditions 1 to 4 are the same light-emitting elements 101 including the generation unit 101b and the wavelength conversion unit 101c. The light-emitting element 101 is defined as a pseudo-white light-emitting diode in which the generating portion 101b is a blue light-emitting diode and the wavelength converting portion 101c is a yellow phosphor. Further, the light-emitting element 101 is formed into a square shape having a side length of 1 mm.

在測定條件1~4中的相鄰之發光元件101彼此的間隔皆為0.3mm。 The distance between adjacent light-emitting elements 101 in the measurement conditions 1 to 4 was 0.3 mm.

在測定條件1~4中皆將一個發光元件101作為測定對象並供給電力使其發光,並測定其色度及光量。 In each of the measurement conditions 1 to 4, one light-emitting element 101 is used as a measurement target, and electric power is supplied to emit light, and the chromaticity and the amount of light are measured.

在測定條件1~4中皆使用本實施形態之光學測定裝置3及習知的測定裝置進行測定。本實施形態之光學測定裝置3的調節部,使用圖5所示之例2的調節部。 In the measurement conditions 1 to 4, the measurement was performed using the optical measurement device 3 of the present embodiment and a conventional measurement device. In the adjustment portion of the optical measurement device 3 of the present embodiment, the adjustment portion of the example 2 shown in Fig. 5 is used.

在測定條件1~4中之其它條件也相同。 The other conditions in the measurement conditions 1 to 4 are also the same.

測定條件1~4之相異條件如下。 The conditions for the measurement conditions 1 to 4 are as follows.

在測定條件1下使用1個發光元件101。測定條件1的排列型態為只配置一個作為測定對象之發光元件101之單片狀態的型態。發光元件101的排列總長度為1mm。 One light-emitting element 101 was used under the measurement condition 1. The arrangement pattern of the measurement condition 1 is a configuration in which only one single-piece state of the light-emitting element 101 to be measured is placed. The total length of the arrangement of the light-emitting elements 101 is 1 mm.

在測定條件2下使用5個發光元件101。測定條件2的排列型態為將作為測定對象之發光元件101配置在中央,並且在其周圍配置4個相鄰之測定對象之外的發光元件101的型態。發光元件101的排列總長度為3.6mm。 Five light-emitting elements 101 were used under the measurement condition 2. The arrangement pattern of the measurement condition 2 is a configuration in which the light-emitting element 101 to be measured is placed at the center, and four adjacent light-emitting elements 101 other than the measurement target are disposed around the light-emitting element 101. The total length of the arrangement of the light-emitting elements 101 is 3.6 mm.

在測定條件3下使用9個發光元件101。測定條件3的排列型態為將作為測定對象之發光元件101配置在中央,並且在其周圍配置8個相鄰之測定對象之外的發光元件101的型態。發光元件101的排列總長度為3.6mm。 Nine light-emitting elements 101 were used under the measurement condition 3. The arrangement pattern of the measurement condition 3 is a configuration in which the light-emitting element 101 to be measured is placed at the center, and the light-emitting elements 101 other than the eight adjacent measurement targets are disposed around the light-emitting element 101. The total length of the arrangement of the light-emitting elements 101 is 3.6 mm.

在測定條件4下使用25個發光元件101。測定條件4的排列型態為 將作為測定對象之發光元件101配置在中央,並且在其周圍配置24個相鄰之測定對象之外的發光元件101的型態。發光元件101的排列總長度為6.2mm。 25 light-emitting elements 101 were used under the measurement condition 4. The arrangement pattern of the measurement condition 4 is The light-emitting element 101 to be measured is placed at the center, and the shape of the light-emitting elements 101 other than the 24 adjacent measurement targets is disposed around the light-emitting element 101. The total length of the arrangement of the light-emitting elements 101 is 6.2 mm.

接著,利用圖7A及圖7B說明色度相關之測定結果。 Next, the measurement results of the chromaticity correlation will be described using FIG. 7A and FIG. 7B.

圖7A係為與圖6所示之發光元件101的色度相關的測定結果,顯示CIE-XYZ顏色系統中的色度座標x。圖7B係為與圖6所示之發光元件101的色度相關的測定結果,顯示CIE-XYZ顏色系統中的色度座標y。 Fig. 7A is a measurement result relating to the chromaticity of the light-emitting element 101 shown in Fig. 6, showing the chromaticity coordinate x in the CIE-XYZ color system. Fig. 7B is a measurement result relating to the chromaticity of the light-emitting element 101 shown in Fig. 6, showing the chromaticity coordinates y in the CIE-XYZ color system.

如上所述,作為測定對象之發光元件101所發出的白色光入射至測定對象之外的發光元件101之波長轉換部101c,會使該測定對象之外的發光元件101之波長轉換部101c發出黃色的光。 As described above, the white light emitted by the light-emitting element 101 to be measured is incident on the wavelength conversion unit 101c of the light-emitting element 101 other than the measurement target, and the wavelength conversion unit 101c of the light-emitting element 101 other than the measurement target emits yellow. Light.

如圖7A及圖7B所示,使用習知的測定裝置測定色度時,測定條件1之測定結果與測定條件2~4之各測定結果會有很大的差距。 As shown in FIG. 7A and FIG. 7B, when the chromaticity is measured using a conventional measuring device, the measurement result of the measurement condition 1 and the measurement results of the measurement conditions 2 to 4 are greatly different.

在測定條件1下,發光元件101的排列型態為單片狀態。測定條件1之測定結果為不受測定對象之外的發光元件101所出射的非預期之光的影響之理想結果。 Under the measurement condition 1, the arrangement pattern of the light-emitting elements 101 is in a single-chip state. The measurement result of the measurement condition 1 is an ideal result that is not affected by the unintended light emitted from the light-emitting element 101 other than the measurement target.

在測定條件2~4下,為配置有與作為測定對象之發光元件101相鄰之測定對象之外的多個發光元件101之排列型態。而測定條件2~4與測定條件1之測定結果有很大差距的理由,在於受到了測定對象之外的發光元件101所出射的非預期之光的影響。例如,原因在於測定對象之外的發光元件101之波長轉換部101c發出的黃色光入射至光纖117,被受光元件121a檢測出,並由分光器121測定出其色度。 In the measurement conditions 2 to 4, the arrangement pattern of the plurality of light-emitting elements 101 other than the measurement target adjacent to the light-emitting element 101 to be measured is disposed. The reason why the measurement conditions 2 to 4 differ greatly from the measurement result of the measurement condition 1 is that it is affected by unintended light emitted from the light-emitting element 101 other than the measurement target. For example, the reason is that the yellow light emitted from the wavelength conversion portion 101c of the light-emitting element 101 other than the measurement target is incident on the optical fiber 117, is detected by the light-receiving element 121a, and the chromaticity is measured by the spectroscope 121.

意即,在多個排列的發光元件101之色度測定中,習知的測定裝置的測定結果受到了測定對象之外的發光元件101所出射的非預期之光的影響,造成測定精度降低。 In other words, in the chromaticity measurement of the plurality of arranged light-emitting elements 101, the measurement result of the conventional measuring device is affected by unintended light emitted from the light-emitting element 101 other than the measurement target, and the measurement accuracy is lowered.

另外,如圖7A及圖7B所示,隨著測定條件1、測定條件2、測定條件3、測定條件4的順序,色度座標值會增加,接近黃色的色度座標 (x≒0.4、y≒0.5)。 Further, as shown in FIG. 7A and FIG. 7B, with the order of measurement condition 1, measurement condition 2, measurement condition 3, and measurement condition 4, the chromaticity coordinate value increases, and the chromaticity coordinate close to yellow is obtained. (x≒0.4, y≒0.5).

其原因在於測定對象之外的發光元件101配置的數量越多,則測定對象之外的發光元件101所發出的黃色光會增加,由受光元件121a所檢測出的黃色光之成份的比率也會增加。 The reason for this is that the larger the number of light-emitting elements 101 other than the measurement target, the more the yellow light emitted by the light-emitting element 101 other than the measurement target increases, and the ratio of the yellow light component detected by the light-receiving element 121a. increase.

意即,在進行多個排列的發光元件101之色度測定時,測定對象之外的發光元件101配置的數量越多,則習知的測定裝置的測定結果也越容易受到測定對象之外的發光元件101所出射的非預期之光的影響。因此,測定對象之外的發光元件101配置的數量越多,則習知的測定裝置的測定結果之測定精度也越容易降低。 In other words, when the chromaticity of the plurality of light-emitting elements 101 is measured, the number of light-emitting elements 101 other than the measurement target is larger, and the measurement result of the conventional measurement device is more likely to be affected by the measurement target. The influence of unintended light emitted by the light-emitting element 101. Therefore, the larger the number of the light-emitting elements 101 other than the measurement target, the more easily the measurement accuracy of the measurement result of the conventional measurement device is lowered.

另一方面,如圖7A及圖7B所示,使用本實施形態之光學測定裝置3測定色度時,在測定條件1~4下的各測定結果大致相同。 On the other hand, as shown in FIG. 7A and FIG. 7B, when the chromaticity is measured using the optical measuring device 3 of the present embodiment, the measurement results under the measurement conditions 1 to 4 are substantially the same.

這是因為本實施形態之光學測定裝置3具備上述的調節部,藉此可使測定對象之外的發光元件101所出射的非預期之光不會入射至光纖117,也不會被受光元件121a檢測出。 This is because the optical measuring device 3 of the present embodiment includes the above-described adjustment unit, so that unintended light emitted from the light-emitting element 101 other than the measurement target can be prevented from entering the optical fiber 117 or being received by the light-receiving element 121a. detected.

意即,多個排列的發光元件101的色度測定中,本實施形態的光學測定裝置3的測定結果不會受到測定對象之外的發光元件101所出射的非預期之光的影響,而能得到與單片狀態的測定結果相同的高測定精度。 In the chromaticity measurement of the light-emitting elements 101 of the plurality of arrays, the measurement result of the optical measurement device 3 of the present embodiment is not affected by the unintended light emitted from the light-emitting element 101 other than the measurement target, and The same high measurement accuracy as the measurement result in the single piece state was obtained.

接著利用圖8說明光量相關之測定結果。 Next, the measurement result of the light amount correlation will be described using FIG.

圖8係顯示與圖6所示之發光元件101的光量相關的測定結果。 Fig. 8 shows the measurement results relating to the amount of light of the light-emitting element 101 shown in Fig. 6.

如圖8所示,使用習知的測定裝置測定光量時,測定條件1之測定結果與測定條件2~4之各測定結果會有很大的差距。並且,隨著測定條件1、測定條件2、測定條件3、測定條件4的順序,光量會增加。 As shown in FIG. 8, when the amount of light is measured using a conventional measuring device, the measurement result of the measurement condition 1 and the measurement results of the measurement conditions 2 to 4 are greatly different. Further, with the order of measurement conditions 1, measurement conditions 2, measurement conditions 3, and measurement conditions 4, the amount of light increases.

其原因在於測定對象之外的發光元件101配置的數量越多,則測定對象之外的發光元件101所發出的黃色光會增加,受光元件105a就更容易檢測出,由光檢測器105所測定的光量也會增加。 The reason for this is that the larger the number of light-emitting elements 101 other than the measurement target, the more the yellow light emitted by the light-emitting element 101 other than the measurement target increases, and the light-receiving element 105a is more easily detected and measured by the photodetector 105. The amount of light will also increase.

意即,在進行多個排列的發光元件101之光量測定時,測定對象之外的發光元件101配置的數量越多,則習知的測定裝置的測定結果也越容易受到測定對象之外的發光元件101所出射的非預期之光的影響。因此,測定對象之外的發光元件101配置的數量越多,則習知的測定裝置的測定結果之測定精度也越容易降低。 In the measurement of the light amount of the plurality of light-emitting elements 101, the number of light-emitting elements 101 other than the measurement target is larger, and the measurement result of the conventional measurement device is more likely to be emitted outside the measurement target. The effect of unintended light emitted by element 101. Therefore, the larger the number of the light-emitting elements 101 other than the measurement target, the more easily the measurement accuracy of the measurement result of the conventional measurement device is lowered.

另一方面,如圖8所示,使用本實施形態之光學測定裝置3測定光量時,在測定條件1~4下的各測定結果大致相同。 On the other hand, as shown in FIG. 8, when the amount of light is measured by the optical measuring device 3 of the present embodiment, the measurement results under the measurement conditions 1 to 4 are substantially the same.

這是因為本實施形態之光學測定裝置3具備上述的調節部,藉此可使測定對象之外的發光元件101所出射的非預期之光不會入射至光纖117,也不會被受光元件105a檢測出。 This is because the optical measuring device 3 of the present embodiment includes the above-described adjustment unit, so that unexpected light emitted from the light-emitting element 101 other than the measurement target can be prevented from entering the optical fiber 117 or being received by the light-receiving element 105a. detected.

意即,多個排列的發光元件101的光量測定中,本實施形態的光學測定裝置3的測定結果不會受到測定對象之外的發光元件101所出射的非預期之光的影響,而能得到與單片狀態的測定結果相同的高測定精度。 In the measurement of the light amount of the plurality of light-emitting elements 101, the measurement result of the optical measuring device 3 of the present embodiment is not affected by the unintended light emitted from the light-emitting element 101 other than the measurement target, and can be obtained. The same high measurement accuracy as the measurement result in the single piece state.

如此一來,無論發光元件101的排列型態如何,本實施形態之光學測定裝置3都能以與單片狀態的測定相同的高測定精度來測定發光元件101的光學特性。 In this way, regardless of the arrangement pattern of the light-emitting elements 101, the optical measuring apparatus 3 of the present embodiment can measure the optical characteristics of the light-emitting element 101 with the same high measurement accuracy as the measurement in the single-chip state.

此外,圖7A至圖8所示之測定結果中,在多個發光元件101排列的狀態下,作為測定對象之發光元件101為一個發光元件101。即,光學測定裝置3以一個發光元件101作為測定對象並供給電力使其發光,並測定其光學特性。 In the measurement results shown in FIG. 7A to FIG. 8 , in the state in which the plurality of light-emitting elements 101 are arranged, the light-emitting element 101 to be measured is one light-emitting element 101 . In other words, the optical measuring device 3 supplies electric power to one of the light-emitting elements 101 as a measurement target, and emits light to measure the optical characteristics.

但是,光學測定裝置3亦可在多個發光元件101排列的狀態下,將多個發光元件101同時作為測定對象。意即,光學測定裝置3亦可以多個發光元件101作為測定對象並供給電力使其發光,並測定其光學特性。 However, the optical measuring device 3 may simultaneously measure the plurality of light-emitting elements 101 in a state in which the plurality of light-emitting elements 101 are arranged. In other words, the optical measuring device 3 may supply a plurality of light-emitting elements 101 as measurement targets, supply electric power to emit light, and measure optical characteristics.

圖9A係為用於說明以多個發光元件101同時測定多個排列的發光 元件101的光學特性之光學測定裝置3的圖。圖9B係為顯示從發光中心軸LCA的方向觀看圖9A所示之發光元件101的圖。 9A is a view for explaining the simultaneous measurement of a plurality of arrangements of light rays by a plurality of light-emitting elements 101 A diagram of the optical measuring device 3 of the optical characteristics of the element 101. Fig. 9B is a view showing the light-emitting element 101 shown in Fig. 9A viewed from the direction of the light-emitting central axis LCA.

在將多個發光元件101作為測定對象同時進行測定之光學測定裝置3中,預先設有多個探針109及多個光纖117。另外,該光學測定裝置3中,預先設計有可同時測定多個發光元件101之光檢測器105、放大器113、分光器121、電氣特性計測部125以及控制部151。 In the optical measurement device 3 that simultaneously measures the plurality of light-emitting elements 101 as measurement targets, a plurality of probes 109 and a plurality of optical fibers 117 are provided in advance. Further, in the optical measuring device 3, a photodetector 105, an amplifier 113, a spectroscope 121, an electrical property measuring unit 125, and a control unit 151 capable of simultaneously measuring a plurality of light-emitting elements 101 are designed in advance.

而且,此光學測定裝置3配置有與作為測定對象之多個發光元件101分別相對之多個光纖117。再者,此光學測定裝置3中的探針109分別接觸作為測定對象之多個發光元件101的電極。光學測定裝置3同時供給電力至作為測定對象之多個發光元件101使其發光,並同時測定該些之發光元件101光學特性。 Further, the optical measuring device 3 is provided with a plurality of optical fibers 117 opposed to the plurality of light-emitting elements 101 to be measured. Further, the probes 109 in the optical measuring device 3 are respectively in contact with the electrodes of the plurality of light-emitting elements 101 to be measured. The optical measuring device 3 simultaneously supplies electric power to a plurality of light-emitting elements 101 to be measured to emit light, and simultaneously measures the optical characteristics of the light-emitting elements 101.

但是,此光學測定裝置3決定作為測定對象之發光元件101彼此的間隔,以使其他測定對象的發光元件101所發出的光不會入射至與一個作為測定對象之發光元件101相對配置之光纖117。 However, the optical measuring device 3 determines the distance between the light-emitting elements 101 to be measured, so that the light emitted from the light-emitting elements 101 of the other measurement target does not enter the optical fiber 117 disposed opposite to one of the light-emitting elements 101 to be measured. .

例如,如圖9A及圖9B所示,各發光元件101形成為1mm角之正方形的形狀,在相鄰之發光元件101排列為彼此的間隔為0.3mm時,將作為測定對象之發光元件101彼此的間隔定為6.2mm。6.2mm的間隔相當於其中有四個作為測定對象之發光元件101的間隔。此間隔的大小為測定對象之外的發光元件101所出射的非預期之光不會入射至光纖117的大小。同時,該間隔的大小為一個作為測定對象之發光元件101所發出的光不會入射至其他作為測定對象之發光元件101中的大小。 For example, as shown in FIG. 9A and FIG. 9B, each of the light-emitting elements 101 is formed in a square shape having an angle of 1 mm, and when the adjacent light-emitting elements 101 are arranged at intervals of 0.3 mm, the light-emitting elements 101 to be measured are mutually connected. The interval is set to 6.2 mm. The interval of 6.2 mm corresponds to the interval in which there are four light-emitting elements 101 to be measured. The size of this interval is such that the unexpected light emitted from the light-emitting element 101 other than the measurement target is not incident on the optical fiber 117. At the same time, the size of the interval is such that the light emitted from the light-emitting element 101 to be measured is not incident on the other light-emitting element 101 to be measured.

光學測定裝置3藉由同時測定相隔有此間隔之多個發光元件101,能得到與依序逐個測定多個發光元件101時相同的測定精度。 The optical measuring device 3 can simultaneously measure the plurality of light-emitting elements 101 separated by the interval, and can obtain the same measurement accuracy as when the plurality of light-emitting elements 101 are sequentially measured one by one.

<光學測定裝置的變形例> <Modification of Optical Measuring Device>

利用圖10A至圖23說明光學測定裝置3的變形例。 A modification of the optical measuring device 3 will be described with reference to Figs. 10A to 23 .

在圖10A至圖23所示之光學測定裝置3的構造中,省略與圖2至圖 9所示之光學測定裝置3相同的構造之說明。 In the configuration of the optical measuring device 3 shown in FIGS. 10A to 23, the same as FIG. 2 to FIG. Description of the same configuration of the optical measuring device 3 shown in FIG.

利用圖10A至圖10C說明光學測定裝置3的變形例1。 Modification 1 of the optical measuring device 3 will be described with reference to Figs. 10A to 10C.

圖10A係為用於說明光學測定裝置3的變形例1的圖。圖10B係為顯示從發光中心軸LCA的方向觀看圖10A所示之發光元件101以及集束光纖118的圖。圖10C係為說明圖10A及圖10B所示之集束光纖118的其它剖面形狀的圖。 FIG. 10A is a view for explaining a first modification of the optical measuring device 3. Fig. 10B is a view showing the light-emitting element 101 and the bundled optical fiber 118 shown in Fig. 10A as seen from the direction of the light-emitting central axis LCA. Fig. 10C is a view for explaining another cross-sectional shape of the bundled optical fiber 118 shown in Figs. 10A and 10B.

變形例1的光學測定裝置3具備集束光纖118。 The optical measuring device 3 of the first modification includes a bundled optical fiber 118.

集束光纖118由多個光纖117成束所構成。 The bundled optical fiber 118 is composed of a bundle of a plurality of optical fibers 117.

集束光纖118之入射口118c與作為測定對象之發光元件101的發光面101a相對配置。在集束光纖118的中心軸上之光纖117,其中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。 The entrance port 118c of the bundled optical fiber 118 is disposed to face the light-emitting surface 101a of the light-emitting element 101 to be measured. The optical fiber 117 on the central axis of the bundled optical fiber 118 has substantially the same central axis as the light-emitting central axis LCA of the light-emitting element 101 to be measured.

雖未繪示,但構成集束光纖118之多個光纖117分別與光檢測器105及分光器121連接。 Although not shown, the plurality of optical fibers 117 constituting the bundled optical fiber 118 are connected to the photodetector 105 and the spectroscope 121, respectively.

如圖10A及圖10B所示,集束光纖118的垂直於發光中心軸LCA的剖面之大小,可比作為測定對象之發光元件101的發光面101a大。但是,如圖10A及圖10B所示,該剖面的大小為不覆蓋與作為測定對象之發光元件101相鄰的發光元件101程度的大小。 As shown in FIG. 10A and FIG. 10B, the cross-section of the bundled optical fiber 118 perpendicular to the central axis of the light emission LCA can be larger than the light-emitting surface 101a of the light-emitting element 101 to be measured. However, as shown in FIG. 10A and FIG. 10B, the size of the cross section is such that it does not cover the light-emitting element 101 adjacent to the light-emitting element 101 to be measured.

此外,集束光纖118的垂直於發光中心軸LCA的剖面之形狀,可為如圖10B所示之矩形,亦可為如圖10C所示之圓形的形狀。 Further, the shape of the cross section of the bundled optical fiber 118 perpendicular to the central axis of illumination LCA may be a rectangle as shown in FIG. 10B or a circular shape as shown in FIG. 10C.

變形例1之光學測定裝置3的集束光纖118固定在使集束光纖118的數值孔徑所示之範圍S1內不包括測定對象之外的發光元件101的位置。 Modification Example 1 of the optical measuring device 3 is fixed to the bundle of fiber 118 so that the numerical aperture of the optical fiber bundle 118 is shown within the range S does not include the light emitting element 1 than the position of the measurement object 101.

集束光纖118的數值孔徑所示之範圍S1比包含在集束光纖118中的一根光纖117的數值孔徑NA所示之範圍S0更大。 The range S 1 indicated by the numerical aperture of the bundled fiber 118 is larger than the range S 0 indicated by the numerical aperture NA of one of the fibers 117 included in the bundled fiber 118.

因此,集束光纖118的位置係可在比與使用一根光纖117時的光纖117的位置更足夠接近作為測定對象之發光元件101的位置。所以,測 定對象以外的發光元件101所出射的非預期之光會很難入射至集束光纖118。藉此,變形例1之光學測定裝置3不會測定出測定對象之外的發光元件101所出射的非預期之光,而能以受光元件105a及受光元件121a檢測出作為測定對象之發光元件101所發出的光。 Therefore, the position of the bundled optical fiber 118 can be closer to the position of the light-emitting element 101 to be measured than the position of the optical fiber 117 when one optical fiber 117 is used. So, measure Unexpected light emitted from the light-emitting element 101 other than the fixed object is hard to be incident on the bundled optical fiber 118. As a result, the optical measuring device 3 of the first modification does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and the light-emitting element 101 can be detected by the light-receiving element 105a and the light-receiving element 121a. The light emitted.

變形例1之光學測定裝置3的範圍S1比範圍S0更大,因此,入射至集束光纖118之作為測定對象之發光元件101所發出的光,比使用一根光纖117時的還多。所以,變形例1之光學測定裝置3,其受光元件105a及受光元件121a能檢測出更多的光,能更高精度地測定光量。也容易進行集束光纖118等的對位作業。 3 range of the device S 1 of S 0 greater than the range of a modification of the optical measurement, therefore, the object of the light emitting element 101 is emitted from the optical fiber bundle is incident to the measurement as 118, more than one optical fiber 117 during use. Therefore, in the optical measuring device 3 of the first modification, the light receiving element 105a and the light receiving element 121a can detect more light, and the amount of light can be measured with higher precision. It is also easy to perform alignment work of the bundled optical fiber 118 or the like.

再者,在變形例1之光學測定裝置3中,光檢測器105及分光器121分別連接構成集束光纖118之多個光纖117,因此,可測定作為測定對象之發光元件101的發光面101a之光強度分布和色度分布等。 Further, in the optical measuring device 3 of the first modification, the photodetector 105 and the spectroscope 121 are connected to the plurality of optical fibers 117 constituting the bundled optical fiber 118, and therefore, the light-emitting surface 101a of the light-emitting element 101 to be measured can be measured. Light intensity distribution and chromaticity distribution, etc.

此外,變形例1之光學測定裝置3可改變構成集束光纖118之多個光纖117的數量。一旦改變構成集束光纖118之多個光纖117的數量,則集束光纖118的數值孔徑所示之範圍S1也會改變。藉此,變形例1之光學測定裝置3可限制入射至集束光纖118的光,並調節受光元件105a及受光元件121a的檢測範圍。 Further, the optical measuring device 3 of Modification 1 can change the number of the plurality of optical fibers 117 constituting the bundled optical fiber 118. Once the number of fibers 117 constituting the bundled fiber 118 is changed, the range S 1 indicated by the numerical aperture of the bundled fiber 118 also changes. Thereby, the optical measuring device 3 of the first modification can restrict the light incident on the bundled optical fiber 118 and adjust the detection range of the light receiving element 105a and the light receiving element 121a.

改變構成集束光纖118之多個光纖117的數量之方式,構成變形例1之光學測定裝置3所具備的調節部。 The adjustment unit included in the optical measuring device 3 of the first modification is configured such that the number of the plurality of optical fibers 117 constituting the bundled optical fiber 118 is changed.

或者,變形例1之光學測定裝置3可具備將構成集束光纖118之多個光纖117與受光元件105a及受光元件121a之間的各個連接切換成有效或無效之開關。並且,變形例1之光學測定裝置3也可以藉由控制該開關,改變集束光纖118的數值孔徑所示之範圍S1。藉此,變形例1之光學測定裝置3可調節受光元件105a及受光元件121a的檢測範圍。 Alternatively, the optical measuring device 3 according to the first modification may include a switch that switches the respective connections between the plurality of optical fibers 117 constituting the bundled optical fiber 118 and the light receiving element 105a and the light receiving element 121a to be effective or ineffective. Further, the optical measuring device 3 of the first modification may change the range S 1 indicated by the numerical aperture of the bundled optical fiber 118 by controlling the switch. Thereby, the optical measuring apparatus 3 of the modification 1 can adjust the detection range of the light receiving element 105a and the light receiving element 121a.

切換構成集束光纖118之多個光纖117與受光元件105a及受光元件121a之間各連接的方式,也構成變形例1之光學測定裝置3所具備的調 節部。 The mode in which the plurality of optical fibers 117 constituting the bundled optical fiber 118 are connected to the light-receiving element 105a and the light-receiving element 121a is also configured to be tuned by the optical measuring device 3 of the first modification. Department.

更進一步,變形例1之光學測定裝置3也可具備利用圖4所說明之調節機構和利用圖5所說明之光圈201。並且,該些調節機構和光圈201,也可以構成變形例1之光學測定裝置3所具備的調節部。 Furthermore, the optical measuring apparatus 3 of the first modification may include the adjustment mechanism described with reference to FIG. 4 and the aperture 201 described with reference to FIG. 5. Further, the adjustment mechanism and the diaphragm 201 may constitute an adjustment unit included in the optical measurement device 3 of the first modification.

變形例1之光學測定裝置3的其他構造,與圖2至圖9B所示之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the first modification is the same as that of the optical measuring device 3 shown in FIGS. 2 to 9B.

利用圖11說明光學測定裝置3的變形例2。 Modification 2 of the optical measuring device 3 will be described with reference to Fig. 11 .

圖11係為用於說明光學測定裝置3的變形例2的圖。 FIG. 11 is a view for explaining a second modification of the optical measuring device 3.

變形例2之光學測定裝置3與變形例1之光學測定裝置3相比,多了積分球108的構造。 The optical measuring device 3 of the second modification has a larger structure of the integrating sphere 108 than the optical measuring device 3 of the first modification.

積分球108形成為中空之略球狀。 The integrating sphere 108 is formed in a hollow slightly spherical shape.

積分球108具有內壁108a、取入口108b以及取出口108c。 The integrating sphere 108 has an inner wall 108a, an intake port 108b, and a take-out port 108c.

內壁108a形成積分球108的內部空間。內壁108a由高反射率且擴散性佳的材料所構成。 The inner wall 108a forms an inner space of the integrating sphere 108. The inner wall 108a is made of a material having high reflectance and good diffusibility.

在內壁108a設有取入口108b及取出口108c。 An inlet 108b and a outlet 108c are provided in the inner wall 108a.

取入口108b為一開口,用以取入作為測定對象之發光元件101所發出的光。 The inlet 108b is an opening for taking in light emitted from the light-emitting element 101 to be measured.

圖11的取入口108b之開口中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。但是,集束光纖118可以彎曲,因此,也可以使取入口108b之開口中心軸與作為測定對象之發光元件101的發光中心軸LCA不相同。 The central axis of the opening of the inlet 108b of Fig. 11 is substantially the same as the central axis of the light emission LCA of the light-emitting element 101 to be measured. However, since the bundled optical fiber 118 can be bent, the central axis of the opening of the inlet 108b can be made different from the central axis of illumination LCA of the light-emitting element 101 to be measured.

圖11的取入口108b形成為與集束光纖118的外周形狀相同的開口形狀。在取入口108b上安裝有集束光纖118。 The intake port 108b of FIG. 11 is formed in the same opening shape as the outer peripheral shape of the bundled optical fiber 118. A bundled optical fiber 118 is mounted on the intake port 108b.

此外,集束光纖118的外周形狀在其入射口118c附近的外周形狀可以與其在取入口108b附近的外周形狀不同。例如,集束光纖118的外周形狀在其入射口118c附近的外周形狀可為矩形的形狀,而其在取 入口108b附近的外周形狀可以為圓形的形狀。 Further, the outer peripheral shape of the bundled optical fiber 118 in the vicinity of the entrance port 118c may be different from the outer peripheral shape in the vicinity of the intake port 108b. For example, the outer peripheral shape of the bundled optical fiber 118 in the vicinity of its entrance opening 118c may have a rectangular shape, and it is taken The outer peripheral shape near the inlet 108b may have a circular shape.

圖11的取入口108b將藉由集束光纖118導光的光引導至積分球108的內部。從取入口108b引導至積分球108內部的光在內壁108a重覆反射,到達取出口108c。 The inlet 108b of FIG. 11 directs light guided by the bundled fiber 118 to the interior of the integrating sphere 108. The light guided from the intake port 108b to the inside of the integrating sphere 108 is repeatedly reflected on the inner wall 108a, and reaches the take-out port 108c.

取出口108c為一開口,用以將在內壁108a反射的光取出至積分球108的外部。 The take-out port 108c is an opening for taking out the light reflected from the inner wall 108a to the outside of the integrating sphere 108.

取出口108c設在與內壁108a的取入口108b不同的位置上。 The take-out port 108c is provided at a position different from the take-in port 108b of the inner wall 108a.

圖11的取出口108c中設有光纖117。 An optical fiber 117 is provided in the take-out port 108c of Fig. 11.

圖11的取出口108c將在內壁108a反射的光引導至光纖117。引導至光纖117的光入射至光纖117,由受光元件105a及受光元件121a檢測出,並由光檢測器105及分光器121測定其光學特性。 The take-out port 108c of FIG. 11 guides the light reflected by the inner wall 108a to the optical fiber 117. The light guided to the optical fiber 117 is incident on the optical fiber 117, and is detected by the light receiving element 105a and the light receiving element 121a, and the optical characteristics are measured by the photodetector 105 and the spectroscope 121.

變形例2之光學測定裝置3的其他構造與圖10A至圖10C所示之變形例1之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the second modification is the same as that of the optical measuring device 3 of the first modification shown in FIGS. 10A to 10C.

利用圖12A及圖12B說明光學測定裝置3的變形例3。 Modification 3 of the optical measuring device 3 will be described with reference to Figs. 12A and 12B.

圖12A係為用於說明光學測定裝置3的變形例3的圖。圖12B係為用於說明圖12A所示之透鏡202中的光折射的圖。 FIG. 12A is a view for explaining a third modification of the optical measuring apparatus 3. Fig. 12B is a view for explaining light refraction in the lens 202 shown in Fig. 12A.

變形例3之光學測定裝置3與變形例1之光學測定裝置3相比,多了透鏡202的構造。 The optical measuring device 3 of the third modification has more structure of the lens 202 than the optical measuring device 3 of the first modification.

透鏡202為用於將作為測定對象之發光元件101所發出的光集光至集束光纖118的透鏡。 The lens 202 is a lens for collecting light emitted from the light-emitting element 101 to be measured to the bundled fiber 118.

透鏡202使用例如平凸透鏡而構成。 The lens 202 is constructed using, for example, a plano-convex lens.

透鏡202配置在集束光纖118與作為測定對象之發光元件101之間並與其兩者相對。透鏡202配置為與集束光纖118的入射口118c以及作為測定對象之發光元件101的發光面101a大致平行。 The lens 202 is disposed between the bundled optical fiber 118 and the light-emitting element 101 to be measured, and is opposed to both of them. The lens 202 is disposed substantially in parallel with the entrance port 118c of the bundled fiber 118 and the light-emitting surface 101a of the light-emitting element 101 to be measured.

透鏡202之中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。 The central axis of the lens 202 is substantially the same as the central axis of illumination LCA of the light-emitting element 101 to be measured.

如圖12A所示,透鏡202的垂直於發光中心軸LCA的剖面與集束光纖118的垂直於發光中心軸LCA的剖面之大小程度相同。但是,如圖12A所示,透鏡202的該剖面的大小為不覆蓋與作為測定對象之發光元件101相鄰的發光元件101程度的大小。 As shown in FIG. 12A, the cross section of the lens 202 perpendicular to the central axis of illumination LCA is the same as the cross section of the bundled optical fiber 118 perpendicular to the central axis of illumination LCA. However, as shown in FIG. 12A, the size of the cross section of the lens 202 is such a size that it does not cover the light-emitting element 101 adjacent to the light-emitting element 101 to be measured.

如圖12B所示,作為測定對象之發光元件101所發出的光一旦入射至透鏡202,則朝向集束光纖118的入射口118c折射。但是,測定對象以外的發光元件101所出射的非預期之光,即使入射至透鏡202,也不朝向入射口118c折射。因此,測定對象之發光元件101所出射的非預期之光,將很難入射至集束光纖118。藉此,變形例3之光學測定裝置3不會測定出測定對象之外的發光元件101所出射的非預期之光,而能利用受光元件105a及受光元件121a測定出作為測定對象之發光元件101所發出的光。 As shown in FIG. 12B, once the light emitted from the light-emitting element 101 to be measured is incident on the lens 202, it is refracted toward the incident port 118c of the bundled fiber 118. However, the unexpected light emitted from the light-emitting element 101 other than the measurement target is not refracted toward the entrance 118c even if it enters the lens 202. Therefore, the unexpected light emitted from the light-emitting element 101 of the measurement object is hard to be incident on the bundled optical fiber 118. In this way, the optical measuring device 3 of the third modification does not measure the unexpected light emitted from the light-emitting element 101 other than the measurement target, and the light-emitting element 101 can be measured by the light-receiving element 105a and the light-receiving element 121a. The light emitted.

再者,變形例3之光學測定裝置3利用透鏡202將作為測定對象之發光元件101所發出的光集光至集束光纖118。因此,變形例3之光學測定裝置3即使發生集束光纖118等的移位,也比在不使用透鏡202的情況下更能抑制測定精度的降低。也更容易進行集束光纖118等的對位作業。 Further, in the optical measuring device 3 of the third modification, the light emitted from the light-emitting element 101 to be measured is collected by the lens 202 to the bundled fiber 118. Therefore, even if the optical measuring device 3 of the third modification is displaced by the bundled optical fiber 118 or the like, the measurement accuracy can be suppressed more than when the lens 202 is not used. It is also easier to perform the alignment operation of the bundled optical fiber 118 or the like.

如此一來,變形例3之光學測定裝置3使用透鏡202可限制入射至集束光纖118的光,並調節受光元件105a及受光元件121a的檢測範圍。 As described above, the optical measuring device 3 of the third modification can restrict the light incident on the bundled optical fiber 118 by using the lens 202, and adjust the detection ranges of the light receiving element 105a and the light receiving element 121a.

透鏡202構成變形例3之光學測定裝置3所具備的調節部。 The lens 202 constitutes an adjustment unit included in the optical measurement device 3 of the third modification.

此外,變形例3之光學測定裝置3也可具備使透鏡202沿作為測定對象之發光元件101的發光中心軸LCA在上下方向移動之移動機構。一旦改變透鏡202在上下方向上的位置,則會改變可入射至集束光纖118的入射口118c之光的範圍。藉此,變形例3之光學測定裝置3可調節受光元件105a及受光元件121a的檢測範圍。 In addition, the optical measuring device 3 of the third modification may include a moving mechanism that moves the lens 202 in the vertical direction along the light emission center axis LCA of the light-emitting element 101 to be measured. Once the position of the lens 202 in the up and down direction is changed, the range of light that can be incident on the entrance port 118c of the bundled fiber 118 is changed. Thereby, the optical measuring apparatus 3 of the modification 3 can adjust the detection range of the light receiving element 105a and the light receiving element 121a.

使透鏡202沿發光中心軸LCA移動之移動機構,也構成變形例3之 光學測定裝置3所具備的調節部。 The moving mechanism for moving the lens 202 along the central axis of the light emission LCA also constitutes the modification 3 An adjustment unit provided in the optical measurement device 3.

變形例3之光學測定裝置3的其他構造,與圖10A至圖10C所示之變形例1之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the third modification is the same as that of the optical measuring device 3 of the first modification shown in FIGS. 10A to 10C.

利用圖13A及圖13B說明光學測定裝置3的變形例4。 Modification 4 of the optical measuring device 3 will be described with reference to Figs. 13A and 13B.

圖13A係為用於說明光學測定裝置3的變形例4的圖。圖13B係為顯示從發光中心軸LCA的方向觀看圖13A所示之發光元件101以及集束光纖119的圖。 FIG. 13A is a view for explaining a fourth modification of the optical measuring apparatus 3. Fig. 13B is a view showing the light-emitting element 101 and the bundled optical fiber 119 shown in Fig. 13A as seen from the direction of the light-emitting central axis LCA.

變形例4之光學測定裝置3具備與變形例1之光學測定裝置3所包括的集束光纖118不同構造的集束光纖119。 The optical measuring device 3 of the fourth modification includes the bundled optical fiber 119 having a structure different from that of the bundled optical fiber 118 included in the optical measuring device 3 of the first modification.

集束光纖119與集束光纖118相同,皆由多個光纖117成束所構成。 The bundled fiber 119 is the same as the bundled fiber 118, and is composed of a plurality of fibers 117 bundled.

集束光纖119之入射口119c與作為測定對象之發光元件101的發光面101a相對配置。在集束光纖119的中心軸上之光纖117,其中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。 The entrance port 119c of the bundled fiber 119 is disposed to face the light-emitting surface 101a of the light-emitting element 101 to be measured. The optical fiber 117 on the central axis of the bundled optical fiber 119 has substantially the same central axis as the emission central axis LCA of the light-emitting element 101 to be measured.

在集束光纖119的中心軸附近之一個或多個光纖117與分光器121連接。在集束光纖119的中心軸附近以外的多個光纖117連接光檢測器105。 One or more optical fibers 117 near the central axis of the bundled fiber 119 are connected to the beam splitter 121. The photodetector 105 is connected to a plurality of optical fibers 117 other than the vicinity of the central axis of the bundled optical fiber 119.

在圖13A及圖13B中,以黑色表示在集束光纖119的中心軸附近之一個或多個光纖117,並以白色表示在集束光纖119的中心軸附近以外的多個光纖117。在圖14A至圖14C中也相同。 In FIGS. 13A and 13B, one or a plurality of optical fibers 117 in the vicinity of the central axis of the bundled optical fiber 119 are shown in black, and a plurality of optical fibers 117 other than the vicinity of the central axis of the bundled optical fiber 119 are shown in white. The same is true in FIGS. 14A to 14C.

如圖13A及圖13B所示,集束光纖119的垂直於發光中心軸LCA的剖面之大小,可比作為測定對象之發光元件101的發光面101a大,並且為覆蓋測定對象之外的多個發光元件101程度的大小。 As shown in FIG. 13A and FIG. 13B, the cross-section of the bundled optical fiber 119 perpendicular to the central axis of the light emission LCA is larger than the light-emitting surface 101a of the light-emitting element 101 to be measured, and is a plurality of light-emitting elements that cover the measurement target. The size of 101 degrees.

集束光纖119的數值孔徑所示之範圍S2比集束光纖118的數值孔徑所示之範圍S1更大。在範圍S2內除了作為測定對象之發光元件101之外,也包括測定對象之外的發光元件101。 The range S 2 indicated by the numerical aperture of the bundled fiber 119 is larger than the range S 1 indicated by the numerical aperture of the bundled fiber 118. In addition to the light-emitting element 101 to be measured, the light-emitting element 101 other than the measurement target is included in the range S 2 .

變形例4之光學測定裝置3的範圍S2比範圍S1更大,因此,入射至集束光纖119之作為測定對象之發光元件101所發出的光,比入射至集束光纖118時的還多。所以,變形例4之光學測定裝置3,其受光元件105a及受光元件121a能檢測出更多的光,能更高精度地測定光量。也更容易進行集束光纖119等的對位作業。 Since the range S 2 of the optical measuring apparatus 3 of the fourth modification is larger than the range S 1 , the light emitted from the light-emitting element 101 which is incident on the bundled optical fiber 119 is larger than that when it is incident on the bundled optical fiber 118. Therefore, in the optical measuring device 3 of the fourth modification, the light receiving element 105a and the light receiving element 121a can detect more light, and the amount of light can be measured with higher precision. It is also easier to perform the alignment operation of the bundled optical fiber 119 or the like.

變形例4之光學測定裝置3的集束光纖119的中心軸與作為測定對象之發光元件101的發光中心軸LCA為大致相同,僅有在集束光纖119的中心軸附近之光纖117與分光器121連接。因此,進行色度等測定之分光器121之受光元件121a不會檢測出測定對象之外的發光元件101所出射的非預期之光,而能檢測出作為測定對象之發光元件101所發出的光。因此,變形例4之光學測定裝置3能高精度地測定色度等。 The central axis of the bundled optical fiber 119 of the optical measuring device 3 of the fourth modification is substantially the same as the central axis of illumination LCA of the light-emitting element 101 to be measured, and only the optical fiber 117 near the central axis of the bundled optical fiber 119 is connected to the optical splitter 121. . Therefore, the light-receiving element 121a of the spectroscope 121 that measures the chromaticity or the like does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and can detect the light emitted from the light-emitting element 101 to be measured. . Therefore, the optical measuring device 3 of the fourth modification can measure chromaticity and the like with high precision.

在變形例4之光學測定裝置3中,集束光纖119的中心軸附近以外的多個光纖117分別連接至光檢測器105,因此,能測定測定對象之外的發光元件101之發光面101a的光強度分布。 In the optical measuring device 3 of the fourth modification, the plurality of optical fibers 117 other than the vicinity of the central axis of the bundled optical fiber 119 are connected to the photodetector 105, and therefore, the light of the light-emitting surface 101a of the light-emitting element 101 other than the measurement target can be measured. Intensity distribution.

再者,在變形例4之光學測定裝置3中,測定對象之外的發光元件101也位於集束光纖119的範圍S2內。因此,變形例4之光學測定裝置3可將與連接至分光器121的光纖117相對的發光元件101作為色度等測定的測定對象,並將其餘的多個發光元件101作為光量測定的測定對象。意即,雖然作為測定對象之發光元件101不同,變形例4之光學測定裝置3也能同時進行色度等的測定以及光量測定。 Further, in the optical measuring device 3 of the fourth modification, the light-emitting element 101 other than the measurement target is also located in the range S 2 of the bundled optical fiber 119. Therefore, the optical measuring device 3 of the fourth modification can measure the light-emitting element 101 that is opposed to the optical fiber 117 connected to the spectroscope 121 as a measurement target for measurement of chromaticity or the like, and the remaining plurality of light-emitting elements 101 can be used as measurement targets for measurement of the amount of light. . In other words, the optical measuring device 3 of the fourth modification can simultaneously measure the chromaticity and the like and measure the amount of light.

變形例4之光學測定裝置3的其他構造,與圖10A至圖10C所示之變形例1之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the fourth modification is the same as that of the optical measuring device 3 of the first modification shown in FIGS. 10A to 10C.

利用圖14A至圖14C說明光學測定裝置3的變形例5。 A modification 5 of the optical measuring apparatus 3 will be described with reference to Figs. 14A to 14C.

圖14A係為用於說明光學測定裝置3的變形例5的圖。 FIG. 14A is a view for explaining a fifth modification of the optical measuring apparatus 3.

圖14B係為用於說明光學測定裝置3的變形例5中的其它例1的圖。圖14C係為用於說明光學測定裝置3的變形例5中的其它例2的圖。 FIG. 14B is a view for explaining another example 1 in the fifth modification of the optical measuring apparatus 3. 14C is a view for explaining another example 2 in the fifth modification of the optical measuring device 3.

變形例5之光學測定裝置3與變形例4之光學測定裝置3相比,多了柱狀透鏡陣列203或微透鏡陣列204的構造。 The optical measuring device 3 of the fifth modification has a larger structure of the lenticular lens array 203 or the microlens array 204 than the optical measuring device 3 of the fourth modification.

柱狀透鏡陣列203為多個柱狀透鏡203a互相大致平行地排列。 The lenticular lens array 203 is such that a plurality of lenticular lenses 203a are arranged substantially in parallel with each other.

柱狀透鏡203a為讓發光元件101所發出的光在內部反射並導光至集束光纖119之透鏡。 The lenticular lens 203a is a lens that allows light emitted from the light-emitting element 101 to be internally reflected and guided to the bundled fiber 119.

柱狀透鏡203a使用例如具有雙折射性之透鏡而構成。柱狀透鏡203a的中心軸附近的折射率比外周附近的折射率大。 The lenticular lens 203a is configured using, for example, a lens having birefringence. The refractive index in the vicinity of the central axis of the lenticular lens 203a is larger than the refractive index in the vicinity of the outer periphery.

柱狀透鏡203a配置在集束光纖119與發光元件101之間。柱狀透鏡203a之端面與集束光纖119之入射口119c以及發光元件101的發光面101a相對。 The lenticular lens 203a is disposed between the bundled optical fiber 119 and the light-emitting element 101. The end surface of the lenticular lens 203a faces the entrance port 119c of the bundled fiber 119 and the light-emitting surface 101a of the light-emitting element 101.

柱狀透鏡203a的中心軸與發光元件101的發光中心軸LCA大致平行。配置在柱狀透鏡陣列203中央的柱狀透鏡203a的中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。 The central axis of the lenticular lens 203a is substantially parallel to the illuminating central axis LCA of the light-emitting element 101. The central axis of the lenticular lens 203a disposed at the center of the lenticular lens array 203 is substantially the same as the illuminating central axis LCA of the light-emitting element 101 to be measured.

柱狀透鏡203a的垂直於發光中心軸LCA的剖面之大小比發光元件101的發光面101a小。 The cross section of the lenticular lens 203a perpendicular to the central axis of the light emission LCA is smaller than the light emitting surface 101a of the light-emitting element 101.

柱狀透鏡陣列203的垂直於發光中心軸LCA的剖面之大小,與集束光纖119的垂直於發光中心軸LCA的剖面之大小為相同程度或是稍大。 The cross-section of the lenticular lens array 203 perpendicular to the central axis of illumination LCA is equal to or slightly larger than the cross-section of the bundled optical fiber 119 perpendicular to the central axis of illumination LCA.

作為測定對象之發光元件101所發出的光入射至配置在柱狀透鏡陣列203中央的柱狀透鏡203a。入射至配置在該中央的柱狀透鏡203a的光,在配置在該中央的柱狀透鏡203a的內部反覆進行反射。接著,入射至配置在該中央的柱狀透鏡203a的光朝向在集束光纖119的中心軸附近的光纖117之入射口117c導光。但是,測定對象以外的發光元件101所出射的非預期之光很難入射至配置在該中央的柱狀透鏡203a。藉此,變形例5之光學測定裝置3不會檢測出測定對象之外的發光元件101所出射的非預期之光,而能利用受光元件121a檢測出作為測定對 象之發光元件101所發出的光。因此,圖14A所示之變形例5之光學測定裝置3能高精度地測定色度等。此外,如上所述,只有在集束光纖119的中心軸附近之光纖117連接至具有受光元件121a之分光器121。 Light emitted from the light-emitting element 101 to be measured is incident on the lenticular lens 203a disposed at the center of the lenticular lens array 203. The light incident on the lenticular lens 203a disposed at the center is repeatedly reflected inside the lenticular lens 203a disposed at the center. Then, the light incident on the lenticular lens 203a disposed at the center is guided toward the entrance port 117c of the optical fiber 117 near the central axis of the bundled fiber 119. However, it is difficult for the unexpected light emitted from the light-emitting element 101 other than the measurement target to enter the lenticular lens 203a disposed at the center. As a result, the optical measuring device 3 of the fifth modification does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and can be detected by the light-receiving element 121a as a measurement pair. Light emitted by the light-emitting element 101. Therefore, the optical measuring apparatus 3 of the fifth modification shown in FIG. 14A can measure chromaticity and the like with high precision. Further, as described above, only the optical fiber 117 near the central axis of the bundled optical fiber 119 is connected to the spectroscope 121 having the light receiving element 121a.

此外,如圖14B所示,變形例5之光學測定裝置3也可以使用微透鏡陣列204來代替柱狀透鏡陣列203。 Further, as shown in FIG. 14B, the optical measuring device 3 of the fifth modification may use the microlens array 204 instead of the lenticular lens array 203.

另外,如圖14C所示,變形例5之光學測定裝置3可在微透鏡陣列204的中央設有貫通孔204a。也可在該貫通孔204a中插入在集束光纖119的中心軸附近之光纖117。並且,可以只有在集束光纖119的中心軸附近之光纖117連接至具有受光元件121a之分光器121。 Further, as shown in FIG. 14C, the optical measuring device 3 of the fifth modification may be provided with a through hole 204a at the center of the microlens array 204. An optical fiber 117 near the central axis of the bundled optical fiber 119 may be inserted into the through hole 204a. Further, only the optical fiber 117 near the central axis of the bundled optical fiber 119 may be connected to the spectroscope 121 having the light receiving element 121a.

圖14C所示之變形例5之光學測定裝置3中,作為測定對象之發光元件101所發出的光不經由微透鏡陣列204,而直接入射至在集束光纖119的中心軸附近之光纖117。因此,圖14C所示之變形例5之光學測定裝置3能以更高精度地測定色度等。更進一步,還能提高該色度等的測定之再現性。 In the optical measuring device 3 of the fifth modification shown in FIG. 14C, the light emitted from the light-emitting element 101 to be measured is directly incident on the optical fiber 117 near the central axis of the bundled optical fiber 119 without passing through the microlens array 204. Therefore, the optical measuring device 3 of the fifth modification shown in FIG. 14C can measure chromaticity or the like with higher precision. Furthermore, the reproducibility of the measurement such as the chromaticity can be improved.

如此一來,變形例5之光學測定裝置3可使用柱狀透鏡陣列203或微透鏡陣列204來限制入射至集束光纖119的光,並調節受光元件105a及受光元件121a的檢測範圍。 As described above, the optical measuring device 3 of the fifth modification can restrict the light incident on the bundled optical fiber 119 by using the lenticular lens array 203 or the microlens array 204, and adjust the detection ranges of the light receiving element 105a and the light receiving element 121a.

柱狀透鏡陣列203或微透鏡陣列204構成變形例5之光學測定裝置3所具備的調節部。 The lenticular lens array 203 or the microlens array 204 constitutes an adjustment unit included in the optical measurement device 3 of the fifth modification.

此外,變形例5之光學測定裝置3也可具備使柱狀透鏡陣列203或微透鏡陣列204沿作為測定對象之發光元件101的發光中心軸LCA在上下方向移動之移動機構。一旦改變柱狀透鏡陣列203或微透鏡陣列204在上下方向上的位置,則會改變可入射至集束光纖119的入射口119c之光的範圍。藉此,變形例5之光學測定裝置3可調節受光元件105a及受光元件121a的檢測範圍。 In addition, the optical measuring device 3 of the fifth modification may include a moving mechanism that moves the lenticular lens array 203 or the microlens array 204 in the vertical direction along the light emission center axis LCA of the light-emitting element 101 to be measured. Once the position of the lenticular lens array 203 or the microlens array 204 in the up and down direction is changed, the range of light that can be incident on the incident opening 119c of the bundled optical fiber 119 is changed. Thereby, the optical measuring apparatus 3 of the modification 5 can adjust the detection range of the light receiving element 105a and the light receiving element 121a.

使柱狀透鏡陣列203或微透鏡陣列204沿發光中心軸LCA移動之移 動機構,也可構成變形例5之光學測定裝置3所具備的調節部。 Moving the lenticular lens array 203 or the microlens array 204 along the central axis of illumination LCA The moving mechanism may constitute an adjusting unit provided in the optical measuring device 3 of the fifth modification.

變形例5之光學測定裝置3的其他構造,與圖13A及圖13B所示之變形例4之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the fifth modification is the same as that of the optical measuring device 3 of the fourth modification shown in FIGS. 13A and 13B.

利用圖15A及圖15B說明光學測定裝置3的變形例6。 A modification 6 of the optical measuring device 3 will be described with reference to Figs. 15A and 15B.

圖15A係為用於說明光學測定裝置3的變形例6的圖。圖15B係為顯示從發光中心軸LCA的方向觀看圖15A所示之光檢測器105的受光元件105a的圖。 FIG. 15A is a view for explaining a sixth modification of the optical measuring apparatus 3. Fig. 15B is a view showing the light receiving element 105a of the photodetector 105 shown in Fig. 15A viewed from the direction of the light emission center axis LCA.

變形例6之光學測定裝置3具備在圖4所示之光學測定裝置3所包括的光纖117之光纖頭117a的頂端周邊,設有光檢測器105之受光元件105a之構造。 The optical measuring device 3 of the sixth modification has a structure in which the light receiving element 105a of the photodetector 105 is provided around the distal end of the optical fiber head 117a of the optical fiber 117 included in the optical measuring device 3 shown in FIG.

如圖15B所示,變形例6之光學測定裝置3設有多個受光元件105a,並在多個受光元件105a的中央形成有間隙105b。 As shown in FIG. 15B, the optical measuring apparatus 3 of the sixth modification is provided with a plurality of light receiving elements 105a, and a gap 105b is formed in the center of the plurality of light receiving elements 105a.

在間隙105b中插入並固定光纖117之光纖頭117a。 The optical fiber head 117a of the optical fiber 117 is inserted and fixed in the gap 105b.

4片受光元件105a之受光面以及光纖117與發光元件101之發光面101a相對配置。4片受光元件105a之受光面的大小可以比作為測定對象之發光元件101的發光面101a大。4片受光元件105a之受光面的大小比光纖117之入射口117c大很多。 The light-receiving surface of the four light-receiving elements 105a and the optical fiber 117 are arranged to face the light-emitting surface 101a of the light-emitting element 101. The size of the light receiving surface of the four light receiving elements 105a can be larger than the light emitting surface 101a of the light emitting element 101 to be measured. The size of the light receiving surface of the four light receiving elements 105a is much larger than the incident surface 117c of the optical fiber 117.

變形例6之光學測定裝置3所包括之光纖117只連接至分光器121。 The optical fiber 117 included in the optical measuring device 3 of the modification 6 is connected only to the spectroscope 121.

作為測定對象之發光元件101所發出的光的一部分會入射至光纖117,被受光元件121a檢測,並由分光器121測定出其色度等。 A part of the light emitted from the light-emitting element 101 to be measured is incident on the optical fiber 117, is detected by the light-receiving element 121a, and the chromaticity or the like is measured by the spectroscope 121.

另外,作為測定對象之發光元件101所發出的光之中未入射至光纖117的光,大部分都不經由光纖117而由受光元件105a直接檢測,並由光檢測器105檢測其光量。 Further, most of the light emitted from the light-emitting element 101 to be measured, which is not incident on the optical fiber 117, is directly detected by the light-receiving element 105a without passing through the optical fiber 117, and the light amount is detected by the photodetector 105.

變形例6之光學測定裝置3利用比光纖117之入射口117c大很多的4片受光元件105a的受光面,直接檢測作為測定對象之發光元件101所發出的光。因此,變形例6之光學測定裝置3與圖4所示之光學測定裝 置3相比,能檢測出比利用受光元件105a時較多的光,能以更高精度測定光量。 In the optical measuring device 3 of the sixth modification, the light emitted from the light-emitting element 101 to be measured is directly detected by the light-receiving surface of the four light-receiving elements 105a which are much larger than the entrance port 117c of the optical fiber 117. Therefore, the optical measuring device 3 of the modification 6 and the optical measuring device shown in FIG. 4 In comparison with the third aspect, it is possible to detect a larger amount of light than when the light receiving element 105a is used, and it is possible to measure the amount of light with higher accuracy.

變形例6之光學測定裝置3的其他構造,與圖4所示之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the sixth modification is the same as that of the optical measuring device 3 shown in Fig. 4 .

利用圖16說明光學測定裝置3的變形例7。 A modification 7 of the optical measuring apparatus 3 will be described with reference to Fig. 16 .

圖16係為用於說明光學測定裝置3的變形例7的圖。 FIG. 16 is a view for explaining a modification 7 of the optical measuring apparatus 3.

變形例7之光學測定裝置3與變形例6之光學測定裝置3相比,多了積分球108的構造。另外,變形例7之光學測定裝置3具備將變形例6之光學測定裝置的受光元件105a配置在不同位置的構造。 The optical measuring device 3 of the seventh modification has a larger structure of the integrating sphere 108 than the optical measuring device 3 of the sixth modification. Further, the optical measuring device 3 of the seventh modification has a structure in which the light receiving elements 105a of the optical measuring device according to the sixth modification are disposed at different positions.

變形例7之光學測定裝置3的積分球108,與圖11所示之變形例2之光學測定裝置3所包括的積分球108具有相同的構造。 The integrating sphere 108 of the optical measuring device 3 of the seventh modification has the same structure as the integrating sphere 108 included in the optical measuring device 3 of the second modification shown in FIG.

在變形例7之光學測定裝置3中,光纖117之入射口117c配置在積分球108之取入口108b上。積分球108之取入口108b以及光纖117之入射口117c,與作為測定對象之發光元件101的發光面101a相對配置。積分球108之取入口108b的大小比光纖117之入射口117c大很多。 In the optical measuring device 3 of the seventh modification, the entrance port 117c of the optical fiber 117 is disposed on the inlet 108b of the integrating sphere 108. The inlet 108b of the integrating sphere 108 and the entrance port 117c of the optical fiber 117 are disposed to face the light-emitting surface 101a of the light-emitting element 101 to be measured. The size of the inlet 108b of the integrating sphere 108 is much larger than the entrance port 117c of the optical fiber 117.

變形例7之光學測定裝置3所包括之光纖117僅連接至分光器121。 The optical fiber 117 included in the optical measuring device 3 of the seventh modification is connected only to the spectroscope 121.

變形例7之光學測定裝置3中的受光元件105a配置在積分球108之取出口108c上。 The light receiving element 105a of the optical measuring device 3 of the seventh modification is disposed on the take-out port 108c of the integrating sphere 108.

作為測定對象之發光元件101所發出的光的一部分會入射至光纖117,被受光元件121a檢測,並由分光器121測定出其色度等。 A part of the light emitted from the light-emitting element 101 to be measured is incident on the optical fiber 117, is detected by the light-receiving element 121a, and the chromaticity or the like is measured by the spectroscope 121.

另外,作為測定對象之發光元件101所發出的光之中未入射至光纖117的光,大部分都從取入口108b引導至積分球108的內部。從取入口108b引導至積分球108內部的光在內壁108a重覆反射,到達取出口108c。接著,到達取出口108c的光由受光元件105a檢測出,並由光檢測器105測定光量。 Further, most of the light emitted from the light-emitting element 101 to be measured, which is not incident on the optical fiber 117, is guided from the inlet 108b to the inside of the integrating sphere 108. The light guided from the intake port 108b to the inside of the integrating sphere 108 is repeatedly reflected on the inner wall 108a, and reaches the take-out port 108c. Then, the light reaching the take-out port 108c is detected by the light-receiving element 105a, and the amount of light is measured by the photodetector 105.

變形例7之光學測定裝置3將作為測定對象之發光元件101所發出的 光,由比光纖117之入射口117c大很多的積分球108之取入口108b取入。並且,變形例7之光學測定裝置3使設在取出口108c的受光元件105a直接檢測由積分球108取入的光。因此,變形例7之光學測定裝置3與變形例6之光學測定裝置3相同,能檢測出比利用受光元件105a時較多的光,能以更高精度測定光量。 The optical measuring device 3 of the seventh modification emits the light-emitting element 101 as the measurement target. The light is taken in by the inlet 108b of the integrating sphere 108 which is much larger than the entrance port 117c of the optical fiber 117. Further, the optical measuring device 3 of the seventh modification directly detects the light taken in by the integrating sphere 108 by the light receiving element 105a provided at the take-out port 108c. Therefore, the optical measuring device 3 of the seventh modification can detect the amount of light with higher accuracy than the optical measuring device 3 of the sixth modification, and can detect more light than when the light receiving element 105a is used.

變形例7之光學測定裝置3的其他構造,與圖15A及圖15B所示之變形例6之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the seventh modification is the same as that of the optical measuring device 3 of the sixth modification shown in FIGS. 15A and 15B.

利用圖17說明光學測定裝置3的變形例8。 A modification 8 of the optical measuring device 3 will be described with reference to Fig. 17 .

圖17係為用於說明光學測定裝置3的變形例8的圖。 FIG. 17 is a view for explaining a modification 8 of the optical measuring apparatus 3.

變形例8之光學測定裝置3具備取代圖5所示之光學測定裝置3所包括的光圈201之管205的構造。 The optical measuring device 3 of the eighth modification has a structure in place of the tube 205 of the diaphragm 201 included in the optical measuring device 3 shown in Fig. 5 .

管205用以遮斷作為測定對象之發光元件101所發出的光的一部分,限制入射至光纖117的光。 The tube 205 is for blocking a part of the light emitted from the light-emitting element 101 to be measured, and restricts the light incident on the optical fiber 117.

管205由吸收光之吸收部件所形成。 The tube 205 is formed by an absorbing member that absorbs light.

管205將光纖117之光纖頭117a作為基端,頂端朝向作為測定對象之發光元件101延伸。在管205頂端之開口205a與發光元件101之發光面101a以及光纖117之入射口117c相對。 The tube 205 has the fiber end 117a of the optical fiber 117 as a base end, and the distal end thereof extends toward the light-emitting element 101 to be measured. The opening 205a at the top end of the tube 205 is opposed to the light-emitting surface 101a of the light-emitting element 101 and the entrance port 117c of the optical fiber 117.

管205及開口205a的中心軸與作為測定對象之發光元件101的發光中心軸LCA大致相同。 The central axis of the tube 205 and the opening 205a is substantially the same as the central axis of illumination LCA of the light-emitting element 101 to be measured.

開口205a的大小為與發光元件101之發光面101a的大小相同程度或稍大。但是,如圖17所示,開口205a的大小為不覆蓋與作為測定對象之發光元件101相鄰的發光元件101程度的大小。 The size of the opening 205a is equal to or slightly larger than the size of the light-emitting surface 101a of the light-emitting element 101. However, as shown in FIG. 17, the size of the opening 205a is such a size that it does not cover the light-emitting element 101 adjacent to the light-emitting element 101 to be measured.

管205由吸收部件所形成,因此,入射至管205內周面的光不會被反射,而會直接被吸收。入射至光纖117的光為不入射至管205內周面、從管205的開口205a直接朝向入射口117c的光。該光的範圍是由連結開口205a的周緣以及入射口117c的直線與發光中心軸LCA所成之 角度β的大小所規定的。意即,入射至光纖117之光的範圍由角度β所規定。此外,圖17顯示角度β比用以規定光纖117之數值孔徑NA的角度α小的例子。 The tube 205 is formed by the absorbing member, so that light incident on the inner peripheral surface of the tube 205 is not reflected but is directly absorbed. The light incident on the optical fiber 117 is light that is not incident on the inner circumferential surface of the tube 205 and directly from the opening 205a of the tube 205 toward the entrance port 117c. The range of the light is formed by the line connecting the periphery of the opening 205a and the line of the entrance port 117c and the center axis of illumination LCA. The size of the angle β is specified. That is, the range of light incident on the optical fiber 117 is defined by the angle β. Further, Fig. 17 shows an example in which the angle β is smaller than the angle α for specifying the numerical aperture NA of the optical fiber 117.

另一方面,管205的長度規定開口205a於上下方向的位置。因而,管205的長度規定角度β的大小。 On the other hand, the length of the tube 205 defines the position of the opening 205a in the up and down direction. Thus, the length of the tube 205 defines the magnitude of the angle β.

因此,管205的長度規定入射至光纖117之光的範圍。 Therefore, the length of the tube 205 defines the range of light incident on the optical fiber 117.

變形例8之光學測定裝置3所具有的管205形成之長度,可使角度β成為使入射至管205的內部之光的範圍內不包括測定對象之外的發光元件101。 The length of the tube 205 included in the optical measuring device 3 of the eighth modification is such that the angle β is such that the light-emitting element 101 other than the measurement target is not included in the range of the light incident on the inside of the tube 205.

因此,不會有測定對象之外的發光元件101所出射的非預期之光入射至變形例8之光學測定裝置3的光纖117。藉此,變形例8之光學測定裝置3不會檢測到測定對象之外的發光元件101所出射的非預期之光,而能以受光元件105a及受光元件121a檢測出作為測定對象之發光元件101所發出的光。 Therefore, unintended light emitted from the light-emitting element 101 other than the measurement target is not incident on the optical fiber 117 of the optical measuring device 3 of the eighth modification. As a result, the optical measuring device 3 of the eighth modification does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and the light-emitting element 101 can be detected by the light-receiving element 105a and the light-receiving element 121a. The light emitted.

如此一來,變形例8之光學測定裝置3可使用管205來限制入射至光纖117的光,並調節受光元件105a及受光元件121a的檢測範圍。 As described above, the optical measuring device 3 of the eighth modification can restrict the light incident on the optical fiber 117 by using the tube 205, and adjust the detection range of the light receiving element 105a and the light receiving element 121a.

管205構成變形例8之光學測定裝置3所具備的調節部。 The tube 205 constitutes an adjustment unit included in the optical measurement device 3 of the eighth modification.

此外,變形例8之光學測定裝置3也可具備改變管205之長度的機構。一旦改變管205的長度,則角度β也會改變,而改變可入射至光纖117之光的範圍。藉此,變形例8之光學測定裝置3可調節受光元件105a及受光元件121a的檢測範圍。 Further, the optical measuring device 3 of the eighth modification may be provided with a mechanism for changing the length of the tube 205. Once the length of the tube 205 is changed, the angle β also changes, changing the range of light that can be incident on the fiber 117. Thereby, the optical measuring device 3 of the eighth modification can adjust the detection range of the light receiving element 105a and the light receiving element 121a.

改變管205之長度的機構也構成變形例8之光學測定裝置3所具備的調節部。 The mechanism for changing the length of the tube 205 also constitutes an adjustment unit provided in the optical measuring device 3 of the eighth modification.

變形例8之光學測定裝置3的其他構造,與圖4所示之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the eighth modification is the same as that of the optical measuring device 3 shown in Fig. 4 .

利用圖18說明光學測定裝置3的變形例9。 A modification 9 of the optical measuring device 3 will be described with reference to Fig. 18 .

圖18係為用於說明光學測定裝置3的變形例9的圖。 FIG. 18 is a view for explaining a modification 9 of the optical measuring apparatus 3.

變形例9之光學測定裝置3與變形例8之光學測定裝置3相比,多了積分球108的構造。 The optical measuring device 3 of the ninth modification has a larger structure of the integrating sphere 108 than the optical measuring device 3 of the eighth modification.

變形例9之光學測定裝置3所包括的管205以積分球108之取入口108b為基端,頂端朝向作為測定對象之發光元件101延伸。 The tube 205 included in the optical measuring device 3 of the ninth embodiment is based on the inlet 108b of the integrating sphere 108, and the distal end thereof extends toward the light-emitting element 101 to be measured.

變形例9之光學測定裝置3所包括的光纖117設在積分球108之取出口108c上。 The optical fiber 117 included in the optical measuring device 3 of the modification 9 is provided on the take-out port 108c of the integrating sphere 108.

入射至光纖117的光為從取入口108b取入至積分球108內部的光。 接著,從取入口108b取入至積分球108內部的光與變形例8之光學測定裝置3相同,為從開口205a直接朝向取入口108b的光。意即,入射至光纖117的光為從開口205a直接朝向取入口108b的光。該光的範圍是由連結取入口108b之周緣以及開口205a之周緣的直線與發光中心軸LCA所成之角度γ的大小所規定的。此外,圖18顯示角度γ比用以規定光纖117之數值孔徑NA的角度α大的例子。 The light incident on the optical fiber 117 is light that is taken in from the intake port 108b to the inside of the integrating sphere 108. Next, the light taken into the inside of the integrating sphere 108 from the inlet 108b is the same as the optical measuring apparatus 3 of the eighth modification, and is light that directly faces the inlet 108b from the opening 205a. That is, the light incident on the optical fiber 117 is light directly from the opening 205a toward the intake port 108b. The range of the light is defined by the magnitude of the angle γ formed by the line connecting the periphery of the inlet 108b and the periphery of the opening 205a with the central axis of the light emission LCA. Further, FIG. 18 shows an example in which the angle γ is larger than the angle α for specifying the numerical aperture NA of the optical fiber 117.

變形例9之光學測定裝置3所具有的管205形成之長度,是可使角度γ成為使入射至管205的內部之光的範圍內不包括測定對象之外的發光元件101所出射的非預期之光的長度。與變形例8之光學測定裝置3相同,管205的長度規定了角度γ的大小,因此規定了入射至光纖117的光的範圍。 The length of the tube 205 of the optical measuring device 3 of the ninth embodiment is such that the angle γ is such that the light incident on the inside of the tube 205 does not include the light-emitting element 101 other than the measurement target. The length of the light. Similarly to the optical measuring device 3 of the eighth modification, since the length of the tube 205 is defined by the angle γ, the range of light incident on the optical fiber 117 is defined.

由此,會有作為測定對象之發光元件101所發出的光入射至變形例9之光學測定裝置3的光纖117,而不會有測定對象之外的發光元件101所出射的非預期之光入射至變形例9之光學測定裝置3的光纖117。 藉此,變形例9之光學測定裝置3不會檢測到測定對象之外的發光元件101所出射的非預期之光,而能以受光元件105a及受光元件121a檢測出作為測定對象之發光元件101所發出的光。 As a result, light emitted from the light-emitting element 101 to be measured is incident on the optical fiber 117 of the optical measuring device 3 of the ninth modification, and the unexpected light incident from the light-emitting element 101 other than the measurement target is not incident. The optical fiber 117 of the optical measuring device 3 of Modification 9. As a result, the optical measuring device 3 of the ninth embodiment does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and the light-emitting element 101 can be detected by the light-receiving element 105a and the light-receiving element 121a. The light emitted.

如此一來,變形例9之光學測定裝置3可使用管205來限制入射至 光纖117的光,並調節受光元件105a及受光元件121a的檢測範圍。 In this way, the optical measuring device 3 of Modification 9 can use the tube 205 to restrict the incidence to The light of the optical fiber 117 adjusts the detection range of the light receiving element 105a and the light receiving element 121a.

管205構成變形例9之光學測定裝置3所具備的調節部。 The tube 205 constitutes an adjustment unit included in the optical measuring device 3 of the ninth modification.

此外,與變形例8之光學測定裝置3相同,變形例9之光學測定裝置3也可具備改變管205之長度的機構。 Further, similarly to the optical measuring device 3 of the eighth modification, the optical measuring device 3 of the modified example 9 may include a mechanism for changing the length of the tube 205.

改變管205之長度的機構也構成變形例9之光學測定裝置3所具備的調節部。 The mechanism for changing the length of the tube 205 also constitutes an adjustment unit provided in the optical measuring device 3 of the ninth modification.

變形例9之光學測定裝置3的其他構造,與圖17所示之變形例8之光學測定裝置3的構造相同。 The other structure of the optical measuring apparatus 3 of the modification 9 is the same as that of the optical measuring apparatus 3 of the modification 8 shown in FIG.

利用圖19至圖20說明光學測定裝置3的變形例10。 A modification 10 of the optical measuring apparatus 3 will be described with reference to Figs. 19 to 20 .

圖19A係為用於說明光學測定裝置3的變形例10的圖。圖19B係為顯示從發光中心軸LCA的方向觀看圖19A所示之遮蔽板206以及發光元件101的圖。圖20係為用於說明光學測定裝置3的變形例10中的其他例的圖。 19A is a view for explaining a modification 10 of the optical measuring device 3. Fig. 19B is a view showing the shielding plate 206 and the light-emitting element 101 shown in Fig. 19A as seen from the direction of the light-emitting central axis LCA. FIG. 20 is a view for explaining another example of the modification 10 of the optical measuring apparatus 3.

變形例10之光學測定裝置3具備遮蔽板206的構造,用以取代變形例9之光學測定裝置3所包括的管205。 The optical measuring device 3 of the modification 10 is provided with a structure of the shielding plate 206 instead of the tube 205 included in the optical measuring device 3 of the modification 9.

遮蔽板206為阻擋作為測定對象之發光元件101所發出的光入射至測定對象以外的發光元件101的遮蔽部件。 The shielding plate 206 is a shielding member that blocks light emitted from the light-emitting element 101 to be measured from entering the light-emitting element 101 other than the measurement target.

圖19所示之遮蔽板206為劃分相鄰發光元件101彼此之間的空間的板。 The shielding plate 206 shown in Fig. 19 is a plate that divides the space between adjacent light-emitting elements 101 from each other.

遮蔽板206配置在積分球108之取入口108b與發光元件101之間。 遮蔽板206的開口206a與積分球108之取入口108b及載置有發光元件101之載置桌103鄰接。可使作為測定對象之發光元件101位於積分球108及遮蔽板206所形成的封閉空間的內部。 The shielding plate 206 is disposed between the inlet 108b of the integrating sphere 108 and the light emitting element 101. The opening 206a of the shielding plate 206 is adjacent to the inlet 108b of the integrating sphere 108 and the mounting table 103 on which the light-emitting element 101 is placed. The light-emitting element 101 to be measured can be placed inside the closed space formed by the integrating sphere 108 and the shielding plate 206.

遮蔽板206遮蔽作為測定對象之發光元件101所發出的光入射至測定對象以外的發光元件101。因此,不會產生測定對象以外的發光元件101所出射的非預期之光。所以,入射至光纖117的光僅限制於作 為測定對象之發光元件101所發出的光。藉此,變形例10之光學測定裝置3不會檢測到測定對象之外的發光元件101所出射的非預期之光,而能以受光元件105a及受光元件121a檢測出作為測定對象之發光元件101所發出的光。 The shielding plate 206 shields the light emitted from the light-emitting element 101 that is the measurement target from the light-emitting element 101 other than the measurement target. Therefore, unintended light emitted from the light-emitting element 101 other than the measurement target does not occur. Therefore, the light incident on the optical fiber 117 is limited to The light emitted by the light-emitting element 101 of the object is measured. As a result, the optical measuring device 3 of the modification 10 does not detect the unintended light emitted from the light-emitting element 101 other than the measurement target, and can detect the light-emitting element 101 to be measured by the light-receiving element 105a and the light-receiving element 121a. The light emitted.

此外,如圖20所示,變形例10之光學測定裝置3可使用反射體207來取代遮蔽板206。 Further, as shown in FIG. 20, the optical measuring device 3 of Modification 10 can use the reflector 207 instead of the shielding plate 206.

反射體207為劃分作為測定對象之發光元件101與其之外的發光元件101之間的空間的管。 The reflector 207 is a tube that divides a space between the light-emitting element 101 to be measured and the light-emitting element 101 other than the light-emitting element 101.

反射體207配置在積分球108之取入口108b與作為測定對象之發光元件101之間。反射體207固定於積分球108之取入口108b上。反射體207的頂端與載置有作為測定對象之發光元件101之載置桌103鄰接。可使作為測定對象之發光元件101位於積分球108及反射體207所形成的封閉空間的內部。 The reflector 207 is disposed between the inlet 108b of the integrating sphere 108 and the light-emitting element 101 to be measured. The reflector 207 is fixed to the inlet 108b of the integrating sphere 108. The distal end of the reflector 207 is adjacent to the mounting table 103 on which the light-emitting element 101 to be measured is placed. The light-emitting element 101 to be measured can be placed inside the closed space formed by the integrating sphere 108 and the reflector 207.

因此,圖20所示之變形例10之光學測定裝置3,也是將入射至光纖117的光限制為作為測定對象之發光元件101所發出的光。 Therefore, the optical measuring device 3 according to the modification 10 shown in FIG. 20 restricts the light incident on the optical fiber 117 to the light emitted from the light-emitting element 101 to be measured.

另外,反射體207形成為向積分球108方向內徑逐漸擴大的管狀。反射體207的內周面塗佈有高反射率材料。因此,作為測定對象之發光元件101所發出的光可由反射體207的內周面朝向積分球108之取入口108b反射。藉此,使用反射體207之變形例10之光學測定裝置3與使用遮蔽板206時相比,會有更多的光入射至光纖117,因此,能以更高精度測定光量。 Further, the reflector 207 is formed in a tubular shape whose inner diameter gradually increases toward the integrating sphere 108. The inner peripheral surface of the reflector 207 is coated with a high reflectance material. Therefore, the light emitted from the light-emitting element 101 as the measurement target can be reflected by the inner peripheral surface of the reflector 207 toward the inlet 108b of the integrating sphere 108. As a result, the optical measuring device 3 according to the modified example 10 of the reflector 207 has more light incident on the optical fiber 117 than when the shielding plate 206 is used. Therefore, the amount of light can be measured with higher precision.

如此一來,變形例10之光學測定裝置3使用遮蔽板206或反射體207可限制入射至光纖117的光,並調節受光元件105a及受光元件121a的檢測範圍。 As described above, the optical measuring device 3 of the modification 10 can restrict the light incident on the optical fiber 117 by using the shielding plate 206 or the reflector 207, and adjust the detection range of the light receiving element 105a and the light receiving element 121a.

遮蔽板206及反射體207構成變形例10之光學測定裝置3所具備的調節部。 The shielding plate 206 and the reflector 207 constitute an adjustment unit included in the optical measuring device 3 of the modification 10.

變形例10之光學測定裝置3的其他構造,與圖18所示的變形例9之光學測定裝置3的構造相同。 The other structure of the optical measuring apparatus 3 of the modification 10 is the same as that of the optical measuring apparatus 3 of the modification 9 shown in FIG. 18.

利用圖21至圖23說明光學測定裝置3的變形例11。 A modification 11 of the optical measuring apparatus 3 will be described with reference to Figs. 21 to 23 .

圖21係為用於說明光學測定裝置3的變形例11的圖。圖22係為用於說明圖21所示之控制部151在光學特性測定時進行的處理之流程圖。圖23係為用於說明光學測定裝置3的變形例11中的其他例的圖。 FIG. 21 is a view for explaining a modification 11 of the optical measuring apparatus 3. Fig. 22 is a flowchart for explaining processing performed when the control unit 151 shown in Fig. 21 performs optical characteristic measurement. FIG. 23 is a view for explaining another example of the eleventh modification of the optical measuring apparatus 3.

變形例11之光學測定裝置3與圖2至圖9B所示之光學測定裝置3相比,多了光導波路120及光量調節器122的構造。 The optical measuring device 3 of the modification 11 has a larger structure of the optical waveguide 120 and the light amount adjuster 122 than the optical measuring device 3 shown in FIGS. 2 to 9B.

變形例11之光學測定裝置3可使用光導波路120將光纖117之光傳輸路117b分支。 The optical measuring device 3 of the eleventh embodiment can branch the optical transmission path 117b of the optical fiber 117 using the optical waveguide 120.

光導波路120將光傳輸路117b分支為朝向分光器121之第一路徑117d,和朝向光檢測器105之第二路徑117e。第一路徑117d為連接光導波路120與分光器121之間的光傳輸路117b。第二路徑117e為連接光導波路120與光檢測器105之間的光傳輸路117b。 The optical waveguide 120 branches the optical transmission path 117b into a first path 117d toward the spectroscope 121 and a second path 117e toward the photodetector 105. The first path 117d is an optical transmission path 117b connecting the optical waveguide 120 and the spectroscope 121. The second path 117e is an optical transmission path 117b connecting the optical waveguide 120 and the photodetector 105.

光導波路120使入射的光在其內部全反射以極力抑制傳輸損失,將光分支並導光至第一路徑117d及第二路徑117e。 The optical waveguide 120 totally reflects the incident light inside thereof to suppress the transmission loss as much as possible, and branches and guides the light to the first path 117d and the second path 117e.

光量調節器122調節分光器121之受光元件121a所檢測出的光之光量。 The light amount adjuster 122 adjusts the amount of light detected by the light receiving element 121a of the spectroscope 121.

光量調節器122配置在連接光導波路120與分光器121之間的光傳輸路117b之第一路徑177d上。 The light amount adjuster 122 is disposed on the first path 177d that connects the optical transmission path 117b between the optical waveguide 120 and the optical splitter 121.

光量調節器122可由例如ND濾光器(Neutral Density Filter)等用以衰減光量之濾光器構成。或者,光量調節器122也可由電光元件、磁光元件、聲光元件或是液晶光學元件等構成。 The light amount adjuster 122 can be constituted by a filter such as an ND filter (Neutral Density Filter) for attenuating the amount of light. Alternatively, the light amount adjuster 122 may be composed of an electro-optical element, a magneto-optical element, an acousto-optic element, or a liquid crystal optical element.

光量調節器122連接控制部151。 The light amount adjuster 122 is connected to the control unit 151.

另外,光量調節器122構成為可調節通過的光之衰減量。 Further, the light amount adjuster 122 is configured to adjust the amount of attenuation of light passing therethrough.

以光量調節器122調節之衰減量是由控制部151所設定。 The amount of attenuation adjusted by the light amount adjuster 122 is set by the control unit 151.

以光量調節器122調節之衰減量是為使進入分光器121的入射光量控制在分光器121的光電轉換特性中的動態範圍內可適當設定的。 主要是根據發光元件101的種類來設定不同的衰減量。此外,光量調節器122也具有使衰減量為零的構造。 The amount of attenuation adjusted by the light amount adjuster 122 is appropriately set in order to control the amount of incident light entering the spectroscope 121 within the dynamic range of the photoelectric conversion characteristics of the spectroscope 121. Mainly, different attenuation amounts are set in accordance with the type of the light-emitting element 101. Further, the light amount adjuster 122 also has a configuration in which the amount of attenuation is zero.

在此,分光器121的「光電轉換特性」為分光器121中的入射光量與輸出電流之間的關係。 Here, the "photoelectric conversion characteristic" of the spectroscope 121 is the relationship between the amount of incident light in the spectroscope 121 and the output current.

另外,將輸入與輸出呈正比關係稱為「線性」。更進一步,將輸入與輸出之正比關係成立的範圍稱為「動態範圍」。動態範圍為線性成立之範圍。 In addition, the proportional relationship between input and output is called "linear". Furthermore, the range in which the proportional relationship between input and output is established is referred to as "dynamic range". The dynamic range is a range in which linearity is established.

分光器121的光電轉換特性中的動態範圍為入射光量與輸出電流之間的正比關係成立的範圍,也是光電轉換特性中線性成立之範圍。 The dynamic range in the photoelectric conversion characteristics of the spectroscope 121 is a range in which the proportional relationship between the incident light amount and the output current is established, and is also a range in which the photoelectric conversion characteristics are linearly established.

分光器121的光電轉換特性中的動態範圍比光檢測器105的狹窄。因此,在使用分光器121測定發光元件101的各種光學特性時,可能會由於進入分光器121之入射光量的情況造成分光器121的測定結果不正確。 The dynamic range in the photoelectric conversion characteristics of the spectroscope 121 is narrower than that of the photodetector 105. Therefore, when the optical characteristics of the light-emitting element 101 are measured using the spectroscope 121, the measurement result of the spectroscope 121 may be incorrect due to the amount of incident light entering the spectroscope 121.

因此,需要能以高可靠度測定發光元件101的光學特性之技術。 Therefore, there is a need for a technique capable of measuring the optical characteristics of the light-emitting element 101 with high reliability.

另外,不同種類的發光元件101,其發光特性大多也會因為種類不同而相異。所以,在測定不同種類的發光元件101之光學特性時,經常會有進入分光器121之入射光量不同的情形。因此,必須依據發光元件101的各個種類調整成適當的入射光量。然而,為了調整進入分光器121之入射光量而依據發光元件101的各個種類改變測定環境,會造成很大的負擔。 In addition, the light-emitting characteristics of different types of light-emitting elements 101 are often different depending on the type. Therefore, when measuring the optical characteristics of the different types of light-emitting elements 101, there is often a case where the amount of incident light entering the spectroscope 121 is different. Therefore, it is necessary to adjust the appropriate amount of incident light in accordance with each type of the light-emitting element 101. However, in order to adjust the amount of incident light entering the spectroscope 121, the measurement environment is changed depending on the respective types of the light-emitting elements 101, which causes a great burden.

因此,需要即使在測定不同種類的發光元件101的光學特性時也能在相同的測定環境下高精度地測定之技術。 Therefore, there is a need for a technique capable of measuring with high precision in the same measurement environment even when measuring optical characteristics of different types of light-emitting elements 101.

因而,變形例11之光學測定裝置3具備光量調節器122。 Therefore, the optical measuring device 3 of the modification 11 is provided with the light amount adjuster 122.

利用圖22說明包括在變形例11之光學測定裝置3中的控制部151在 光學特性測定時所進行的處理。 The control unit 151 included in the optical measuring apparatus 3 of the modification 11 will be described with reference to FIG. The processing performed when the optical characteristics were measured.

在步驟S10中,控制部151判斷是否已輸入光檢測器105的光量測定結果及分光器121的測定結果。 In step S10, the control unit 151 determines whether or not the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 have been input.

控制部151待機直到有光檢測器105的光量測定結果及分光器121的測定結果輸入。另一方面,控制部151若判斷光檢測器105的光量測定結果及分光器121的測定結果已輸入,則將相對應的各結果存儲於預定的存儲區域中。接著,控制部151執行步驟S20。 The control unit 151 waits until the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 are input. On the other hand, when the control unit 151 determines that the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 have been input, the control unit 151 stores the corresponding results in a predetermined storage area. Next, the control unit 151 executes step S20.

在步驟S20中,控制部151根據光檢測器105的光量測定結果,驗證分光器121的測定結果之正確性。 In step S20, the control unit 151 verifies the accuracy of the measurement result of the spectroscope 121 based on the light amount measurement result of the photodetector 105.

控制部151可使用例如以下的方法來驗證分光器121的測定結果。 The control unit 151 can verify the measurement result of the spectroscope 121 using, for example, the following method.

例如,控制部151確認在步驟S10中輸入的、分光器121的測定結果中所包含之光量測定結果。接著,控制部151求出分光器121之該光量測定結果與在步驟S10中所輸入的光檢測器105的光量測定結果之間的差值。然後,控制部151判定該差值是否在預定的容許範圍內。並且,若該差值在預定的容許範圍內,則控制部151判斷在步驟S10中所輸入的分光器121之測定結果為正確。另一方面,若該差值不在預定的容許範圍內,則控制部151判斷在步驟S10中所輸入的分光器121之測定結果為不正確。 For example, the control unit 151 confirms the light amount measurement result included in the measurement result of the spectroscope 121 input in step S10. Next, the control unit 151 obtains the difference between the light amount measurement result of the spectroscope 121 and the light amount measurement result of the photodetector 105 input in step S10. Then, the control unit 151 determines whether the difference is within a predetermined allowable range. Then, if the difference is within the predetermined allowable range, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is correct. On the other hand, if the difference is not within the predetermined allowable range, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is incorrect.

此外,例如控制部151預先存儲有在分光器121之光電轉換特性中的動態範圍內所取得的分光器121的光量測定結果之範圍。接著,控制部151判斷在步驟S10中輸入的光檢測器105之光量測定結果是否在預先存儲的該分光器121之光量測定結果的範圍內。然後,若在步驟S10中輸入的光檢測器105之光量測定結果在預先存儲的該分光器121之光量測定結果的範圍內,則控制部151就會判斷在步驟S10中輸入的分光器121之測定結果為正確。另一方面,若在步驟S10中輸入的 光檢測器105之光量測定結果不在預先存儲的該分光器121之光量測定結果的範圍內,則控制部151就會判斷在步驟S10中輸入的分光器121之測定結果為不正確。 Further, for example, the control unit 151 stores in advance a range of the light amount measurement result of the spectroscope 121 acquired in the dynamic range of the photoelectric conversion characteristics of the spectroscope 121. Next, the control unit 151 determines whether or not the light amount measurement result of the photodetector 105 input in step S10 is within the range of the light amount measurement result of the spectroscope 121 stored in advance. Then, if the light amount measurement result of the photodetector 105 input in step S10 is within the range of the light amount measurement result of the spectroscope 121 stored in advance, the control unit 151 determines the spectroscope 121 input in step S10. The measurement result is correct. On the other hand, if input in step S10 When the light amount measurement result of the photodetector 105 is not within the range of the light amount measurement result of the spectroscope 121 stored in advance, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is incorrect.

在步驟S30中,控制部151判斷分光器121之測定結果是否正確。 In step S30, the control unit 151 determines whether or not the measurement result of the spectroscope 121 is correct.

若控制部151經過步驟S20的驗證判斷分光器121之測定結果為正確時,則執行步驟S40。另一方面,若控制部151經過步驟S20的驗證判斷分光器121之測定結果為不正確時,則執行步驟S60。 When the control unit 151 determines that the measurement result of the spectroscope 121 is correct by the verification of step S20, step S40 is executed. On the other hand, when the control unit 151 determines that the measurement result of the spectroscope 121 is incorrect by the verification of step S20, step S60 is executed.

在步驟S40中,控制部151令分光器121之測定結果有效。 In step S40, the control unit 151 makes the measurement result of the spectroscope 121 valid.

在步驟S50中,控制部151輸出分光器121之測定結果至輸出部163。接著,控制部151結束光學特性之測定。 In step S50, the control unit 151 outputs the measurement result of the spectroscope 121 to the output unit 163. Next, the control unit 151 ends the measurement of the optical characteristics.

分光器121之測定結果由輸出部163輸出資訊。 The measurement result of the spectroscope 121 is outputted by the output unit 163.

在步驟S60中,控制部151令分光器121之測定結果無效。 In step S60, the control unit 151 invalidates the measurement result of the spectroscope 121.

在步驟S70中,控制部151控制光量調節器122。 In step S70, the control unit 151 controls the light amount adjuster 122.

控制部151確認在步驟S60中被無效的分光器121之測定結果以及與該結果有對應關聯之光檢測器105之光量測定結果。接著,控制部151根據該光量測定結果,求出以光量調節器122調節之衰減量。控制部151將包括求出之衰減量的控制訊號輸出至光量調節器122,設定光量調節器122的衰減量。 The control unit 151 confirms the measurement result of the spectroscope 121 that was invalidated in step S60 and the light amount measurement result of the photodetector 105 associated with the result. Next, the control unit 151 obtains the attenuation amount adjusted by the light amount adjuster 122 based on the light amount measurement result. The control unit 151 outputs a control signal including the obtained attenuation amount to the light amount adjuster 122, and sets the attenuation amount of the light amount adjuster 122.

控制部151可使用例如以下的方法來求得以光量調節器122調節之衰減量。 The control unit 151 can determine the amount of attenuation that can be adjusted by the light amount adjuster 122 using, for example, the following method.

例如,控制部151在步驟S20的驗證中,求出分光器121之光量測定結果與光檢測器105之光量測定結果之間的差值並驗證後,求出使該差值可控制在該差值之容許範圍內的衰減量。 For example, in the verification of step S20, the control unit 151 obtains the difference between the light quantity measurement result of the spectroscope 121 and the light quantity measurement result of the photodetector 105, and verifies the difference, and obtains the difference so that the difference can be controlled at the difference. The amount of attenuation within the allowable range of values.

另外,例如控制部151在步驟S20的驗證中,使用在分光器121之光電轉換特性中的動態範圍內所取得的分光器121的光量測定結果的範圍進行驗證時,可利用以下方式。即,控制部151根據該範圍的臨 界值與光檢測器105之光量測定結果之間的差值,求出在光衰減器123中的衰減量。 Further, for example, when the control unit 151 performs verification in the step S20, using the range of the light amount measurement result of the spectroscope 121 acquired in the dynamic range of the photoelectric conversion characteristics of the spectroscope 121, the following method can be used. That is, the control unit 151 is based on the range of The difference between the threshold value and the light amount measurement result of the photodetector 105 is used to determine the amount of attenuation in the optical attenuator 123.

在步驟S80中,控制部151指示光檢測器105及分光器121再次進行測定。 In step S80, the control unit 151 instructs the photodetector 105 and the spectroscope 121 to perform measurement again.

控制部151輸出控制訊號至光檢測器105及分光器121,並指示光檢測器105及分光器121進行再次測定。 The control unit 151 outputs a control signal to the photodetector 105 and the spectroscope 121, and instructs the photodetector 105 and the spectroscope 121 to perform the re-measurement.

在再次測定時,分光器121能夠檢測出被步驟S70中所設定的衰減量衰減後的光,並測定其光學特性。接著,再次測定後的分光器121的測定結果重新輸入至控制部151,進行在步驟S20中的驗證。藉此,在步驟S50中輸出的分光器121之測定結果,皆為可靠度高之測定。 When the measurement is performed again, the spectroscope 121 can detect the light attenuated by the attenuation amount set in step S70, and measure the optical characteristics. Then, the measurement result of the spectroscope 121 measured again is input again to the control unit 151, and the verification in step S20 is performed. Thereby, the measurement results of the spectroscope 121 outputted in step S50 are all highly reliable measurements.

如此一來,變形例11之光學測定裝置3可根據動態範圍比分光器121更大的光檢測器105所測定之光量測定結果,選擇性地令分光器121之測定結果有效。 As a result, the optical measuring device 3 of the eleventh embodiment can selectively make the measurement result of the spectroscope 121 effective based on the measurement result of the light amount measured by the photodetector 105 having a larger dynamic range than the spectroscope 121.

因此,變形例11之光學測定裝置3能夠在發光元件101的光學特性測定時,僅將可靠度高的測定結果作為有效並輸出。 Therefore, in the optical measurement device 3 of the modification 11, when the optical characteristics of the light-emitting element 101 are measured, only the measurement result with high reliability can be effectively output.

藉此,變形例11之光學測定裝置3之光學特性的測定結果能具有高可靠度。 Thereby, the measurement result of the optical characteristics of the optical measuring apparatus 3 of the modification 11 can have high reliability.

更進一步,若分光器121的測定結果為不正確,則變形例11之光學測定裝置3會將分光器121的入射光自動調節成適當的光量。並且,變形例11之光學測定裝置3能夠使分光器121再次測定已調節成適當光量之入射光的光學特性。 Further, if the measurement result of the spectroscope 121 is incorrect, the optical measuring device 3 of Modification 11 automatically adjusts the incident light of the spectroscope 121 to an appropriate amount of light. Further, the optical measuring device 3 of Modification 11 can cause the spectroscope 121 to measure the optical characteristics of the incident light adjusted to an appropriate amount of light again.

因此,變形例11之光學測定裝置3即使在測定發光特性不同的發光元件101之光學特定時,也能不改變測定環境,自動保持進入分光器121之入射光量的合理性。 Therefore, even when the optical measuring device 3 of the eleventh embodiment measures the optical specificity of the light-emitting element 101 having different light-emitting characteristics, it is possible to automatically maintain the plausibility of the amount of incident light entering the spectroscope 121 without changing the measurement environment.

藉此,變形例11之光學測定裝置3可在相同的測定環境下高精度 地測定種類不同的發光元件101之光學特性。 Thereby, the optical measuring device 3 of Modification 11 can be highly accurate in the same measurement environment. The optical characteristics of the light-emitting elements 101 of different types were measured.

此外,變形例11之光學測定裝置3也可以不用如圖21及圖22所示之光學測定裝置3那樣,根據光檢測器105所測定到的光量測定結果來設定光量調節器122調節的衰減量。 Further, in the optical measuring device 3 of the eleventh modification, the amount of attenuation adjusted by the light amount adjuster 122 can be set based on the measurement result of the light amount measured by the photodetector 105, as in the optical measuring device 3 shown in Figs. 21 and 22 . .

變形例11之光學測定裝置3可以根據分光器121所測定到的測定結果所包含之光量測定結果來設定光量調節器122調節的衰減量。 The optical measuring device 3 according to the modification 11 can set the amount of attenuation adjusted by the light amount adjuster 122 based on the light amount measurement result included in the measurement result measured by the spectroscope 121.

此時,如圖23所示,變形例11之光學測定裝置3可為省略光導波路120、光檢測器105以及放大器113之構造。 At this time, as shown in FIG. 23, the optical measuring apparatus 3 of the modification 11 can be configured such that the optical waveguide 120, the photodetector 105, and the amplifier 113 are omitted.

在省略光檢測器105的情況下,如圖23所示之控制部151可使用以下的方法來驗證分光器121所測定到的測定結果之正確性。該驗證相當於圖22的步驟S20中的一部分處理。 When the photodetector 105 is omitted, the control unit 151 shown in FIG. 23 can verify the accuracy of the measurement result measured by the spectroscope 121 using the following method. This verification corresponds to a part of the processing in step S20 of Fig. 22 .

如圖23所示之控制部151預先存儲有在分光器121之光電轉換特性中的動態範圍內所能取得的分光器121的光量測定結果之範圍。接著,控制部151判斷分光器121所測定到的光量測定結果是否在預先存儲的光量測定結果的範圍內。然後,若分光器121所測定到的光量測定結果在預先存儲的光量測定結果的範圍內,則控制部151就會判斷分光器121所測定到的測定結果為正確。另一方面,若分光器121所測定到的光量測定結果不在預先存儲的光量測定結果的範圍內,則控制部151就會判斷分光器121所測定到的測定結果為不正確。 The control unit 151 shown in FIG. 23 stores in advance a range of the light amount measurement result of the spectroscope 121 that can be obtained in the dynamic range of the photoelectric conversion characteristics of the spectroscope 121. Next, the control unit 151 determines whether or not the light amount measurement result measured by the spectroscope 121 is within the range of the light amount measurement result stored in advance. Then, when the light amount measurement result measured by the spectroscope 121 is within the range of the light amount measurement result stored in advance, the control unit 151 determines that the measurement result measured by the spectroscope 121 is correct. On the other hand, if the measurement result of the light amount measured by the spectroscope 121 is not within the range of the measurement result of the light amount stored in advance, the control unit 151 determines that the measurement result measured by the spectroscope 121 is incorrect.

此外,在省略光檢測器105的情況下,如圖23所示之控制部151可使用以下的方法來求出光量調節器122調節之衰減量。該衰減量之計算相當於圖22的步驟S70中的一部分處理。 Further, in the case where the photodetector 105 is omitted, the control unit 151 shown in FIG. 23 can obtain the amount of attenuation adjusted by the light amount adjuster 122 using the following method. The calculation of the amount of attenuation corresponds to a part of the processing in step S70 of Fig. 22 .

圖23所示之控制部151根據在分光器121之光電轉換特性中的動態範圍內所能取得的分光器121之光量測定結果的範圍之臨界值與分光器121所測定到的光量測定結果之差值,求得衰減量。 The control unit 151 shown in FIG. 23 determines the threshold value of the range of the light amount measurement result of the spectroscope 121 which can be obtained in the dynamic range of the photoelectric conversion characteristics of the spectroscope 121, and the measurement result of the light amount measured by the spectroscope 121. The difference is the amount of attenuation.

藉由此構造,圖23所示之變形例11之光學測定裝置3即使省略光 檢測器105,也能根據分光器121所測定到的光量測定結果,將進入分光器121的入射光自動地調節為適當的光量。 With this configuration, the optical measuring device 3 of Modification 11 shown in FIG. 23 even omits light. The detector 105 can also automatically adjust the incident light entering the spectroscope 121 to an appropriate amount of light based on the measurement result of the light amount measured by the spectroscope 121.

因此,圖23所示之變形例11之光學測定裝置3與圖21及圖22所示之變形例11之光學測定裝置3相比,能以更簡單的構造得到可靠度高之測定結果。 Therefore, the optical measuring apparatus 3 of the modification 11 shown in FIG. 23 can obtain a highly reliable measurement result with a simpler structure than the optical measuring apparatus 3 of the modification 11 shown in FIGS. 21 and 22.

變形例11之光學測定裝置3的其他構造與圖2至圖9B所示之光學測定裝置3的構造相同。 The other structure of the optical measuring device 3 of the modification 11 is the same as that of the optical measuring device 3 shown in Figs. 2 to 9B.

上述說明之實施形態,對熟習此項技術者顯而易見的是,可互相適用包括變形例之各個實施形態之間的技術。 In the above-described embodiments, it will be apparent to those skilled in the art that the techniques of the various embodiments including the modifications can be applied to each other.

上述說明僅以例示為其意圖,並非用於限制。因此,對熟習此項技術者顯而易見的是,可在不偏離申請專利的範圍下改變本發明之實施形態。 The above description is intended to be illustrative only and not limiting. Therefore, it will be apparent to those skilled in the art that the embodiments of the invention can be modified without departing from the scope of the invention.

應將在本說明書以及申請專利範圍中所使用的所有用語解釋為「非限定」用語。例如,「包括」或「被包括」之用語,應解釋為「所包括的並不限定於所記載者」。「具有」之用語,應解釋為「所具有的並不限定於所記載者」。此外,本說明書及申請專利範圍中所記載的不定冠詞「一個」應解釋為「至少一個」或是「一個或者一個以上」的意思。 All terms used in this specification and the scope of the patent application are to be construed as "unqualified". For example, the terms "including" or "included" should be interpreted as "included and not limited to those described." The term "having" should be interpreted as "the possession is not limited to those described." In addition, the indefinite article “a” or “an” or “an”

<實施形態的構造及效果> <Structure and Effect of Embodiment>

本實施形態的光學測定裝置3的特徵在於其具備用於檢測與其他發光元件101相鄰排列之一發光元件101所發出的光之受光元件105a及受光元件121a,受光元件105a及受光元件121a檢測藉由供給電力至一發光元件101而使一發光元件101所發出的光,且不檢測因一發光元件101所發出的光造成之其他發光元件101所發出的光,也不檢測一發光元件101所發出的光之中的從其他發光元件101反射過來的光。 The optical measuring device 3 of the present embodiment is characterized in that it includes a light receiving element 105a and a light receiving element 121a for detecting light emitted from one of the light emitting elements 101 adjacent to the other light emitting elements 101, and the light receiving element 105a and the light receiving element 121a are detected. The light emitted from one of the light-emitting elements 101 is supplied to the light-emitting element 101, and the light emitted by the other light-emitting elements 101 caused by the light emitted from the light-emitting element 101 is not detected, and a light-emitting element 101 is not detected. Among the emitted light, the light reflected from the other light-emitting elements 101.

藉由此構造,無論發光元件101的排列型態如何,光學測定裝置 3都能以簡單的構造,高精度地測定發光元件101的光學特性。 With this configuration, regardless of the arrangement pattern of the light-emitting elements 101, the optical measuring device 3 The optical characteristics of the light-emitting element 101 can be measured with high precision with a simple configuration.

本實施形態的光學測定裝置3可以僅提供電力至一發光元件101。 The optical measuring device 3 of the present embodiment can supply only electric power to one light-emitting element 101.

藉由此構造,光學測定裝置3能更高精度地測定發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 with higher precision.

另外,本實施形態的光學測定裝置3可具備調節部,其用以調節受光元件105a及受光元件121a所檢測之光的範圍即檢測範圍,以使藉由供給電力至一發光元件101而使一發光元件101所發出的光被受光元件105a及受光元件121a檢測,而因一發光元件101所發出的光造成之其他發光元件101所發出的光,以及一發光元件101所發出的光之中的從其他發光元件101反射過來的光不被受光元件105a及受光元件121a檢測。 Further, the optical measuring device 3 of the present embodiment may include an adjustment unit for adjusting a detection range of a range of light detected by the light receiving element 105a and the light receiving element 121a so as to supply electric power to a light emitting element 101. The light emitted from the light-emitting element 101 is detected by the light-receiving element 105a and the light-receiving element 121a, and the light emitted by the other light-emitting element 101 due to the light emitted by one light-emitting element 101, and the light emitted by a light-emitting element 101 Light reflected from the other light-emitting elements 101 is not detected by the light-receiving element 105a and the light-receiving element 121a.

藉由此構造,無論發光元件101的排列型態如何,光學測定裝置3都能以簡單的構造,高精度地測定發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 with high precision with a simple configuration regardless of the arrangement pattern of the light-emitting elements 101.

另外,本實施形態的光學測定裝置3可具備光纖117,其用於讓一發光元件101所發出的光入射,並將入射的光導光至受光元件105a及受光元件121a,而調節部可藉由限制入射至光纖117的光,來調節檢測範圍。 Further, the optical measuring apparatus 3 of the present embodiment may include an optical fiber 117 for causing light emitted from one light-emitting element 101 to be incident, and guiding the incident light to the light-receiving element 105a and the light-receiving element 121a, and the adjustment section may be The light incident on the optical fiber 117 is limited to adjust the detection range.

藉由此構造,光學測定裝置3能以更簡單的構造來測定發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 with a simpler configuration.

又,本實施形態的光學測定裝置3中的一發光元件101以及其他發光元件101可分別包括:生成部101b,其當電力供給時會生成特定波長範圍的光;以及波長轉換部101c,其對入射的光的波長進行波長轉換。調節部可限制因一發光元件101所發出的光入射至其他發光元件101之波長轉換部101c造成之其他發光元件101所發出的光,以及一發光元件101所發出的光之中的從其他發光元件101反射過來的光入射至 光纖117。 Further, each of the light-emitting elements 101 and the other light-emitting elements 101 in the optical measuring device 3 of the present embodiment may include a generating portion 101b that generates light of a specific wavelength range when power is supplied, and a wavelength converting portion 101c that is paired The wavelength of the incident light is wavelength converted. The adjustment unit can limit the light emitted by the other light-emitting elements 101 caused by the light emitted from one light-emitting element 101 to the wavelength conversion portion 101c of the other light-emitting elements 101, and the other light emitted from the light emitted by the light-emitting element 101. The light reflected by the element 101 is incident on Optical fiber 117.

藉由此構造,無論發光元件101的排列型態如何,光學測定裝置3都能以簡單的構造,高精度地測定包括生成部101b及波長轉換部101c之發光元件101的光學特性。 With this configuration, the optical measuring device 3 can accurately measure the optical characteristics of the light-emitting element 101 including the generating portion 101b and the wavelength converting portion 101c with a simple structure regardless of the arrangement pattern of the light-emitting elements 101.

再者,在本實施形態的光學測定裝置3中,讓一發光元件101所發出的光入射的光纖117之入射口117c與一發光元件101相對配置。調節部可根據光纖117之數值孔徑NA改變入射口117c與一發光元件101之間的距離L,來限制入射至光纖117的光。 Further, in the optical measuring apparatus 3 of the present embodiment, the entrance port 117c of the optical fiber 117 on which the light emitted from the light-emitting element 101 is incident is disposed to face the light-emitting element 101. The adjusting portion can limit the light incident to the optical fiber 117 by changing the distance L between the incident opening 117c and a light emitting element 101 in accordance with the numerical aperture NA of the optical fiber 117.

藉由此構造,光學測定裝置3能以更簡單的構造來測定包括生成部101b及波長轉換部101c之發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 including the generating portion 101b and the wavelength converting portion 101c with a simpler structure.

此外,本實施形態的光學測定裝置3將在光纖117內全反射所得之光的入射角的最大值定義為α,從一發光元件101的中心到與一發光元件101相鄰的其他發光元件101的外緣為止的距離定義為X,則調節部改變入射口與一發光元件101的距離L,以使距離L滿足L≦X/tanα的關係。 Further, the optical measuring apparatus 3 of the present embodiment defines the maximum value of the incident angle of the light totally reflected in the optical fiber 117 as α, from the center of one light-emitting element 101 to the other light-emitting element 101 adjacent to one light-emitting element 101. The distance from the outer edge is defined as X, and the adjustment portion changes the distance L between the entrance port and a light-emitting element 101 so that the distance L satisfies the relationship of L ≦ X / tan α.

藉由此構造,光學測定裝置3能以更簡單的構造來測定包括生成部101b及波長轉換部101c之發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 including the generating portion 101b and the wavelength converting portion 101c with a simpler structure.

可讓一發光元件101所發出的光入射的光纖117之入射口117c與一發光元件101相對配置。調節部可由配置在入射口117c與一發光元件101之間、用以阻擋一發光元件101所發出的光入射至其他發光元件101的遮蔽部件所構成,藉由遮蔽部件限制入射至光纖117的光。 The incident port 117c of the optical fiber 117 through which light emitted from a light-emitting element 101 is incident is disposed opposite to a light-emitting element 101. The adjusting portion may be configured by a shielding member disposed between the incident port 117c and a light emitting element 101 for blocking light emitted from a light emitting element 101 from entering the other light emitting element 101, and the light incident on the optical fiber 117 is restricted by the shielding member. .

藉由此構造,光學測定裝置3能以更簡單的構造來測定包括生成部101b及波長轉換部101c之發光元件101的光學特性。 With this configuration, the optical measuring device 3 can measure the optical characteristics of the light-emitting element 101 including the generating portion 101b and the wavelength converting portion 101c with a simpler structure.

<定義等> <define, etc.>

本發明的「一發光元件」的一例為多個排列的發光元件101之中作為測定對象之發光元件101。 An example of the "one light-emitting element" of the present invention is a light-emitting element 101 that is a measurement target among a plurality of light-emitting elements 101 arranged in series.

本發明的「其他發光元件」的一例為多個排列的發光元件101之中的測定對象之外的發光元件101。 An example of the "other light-emitting element" of the present invention is a light-emitting element 101 other than the measurement target among the plurality of light-emitting elements 101 arranged in series.

通常在每次測定中,作為測定對象之發光元件101皆不同。意即,本發明的「一發光元件」與「其他發光元件」的差異僅在是否作為測定對象,而其構造在實質上是可以相同的。 Generally, in each measurement, the light-emitting elements 101 to be measured are different. In other words, the difference between the "one light-emitting element" of the present invention and the "other light-emitting element" is only the measurement target, and the structure thereof can be substantially the same.

受光元件105a及受光元件121a作為本發明的「受光元件」之一例。 The light receiving element 105a and the light receiving element 121a are examples of the "light receiving element" of the present invention.

距離L的調節機構及光圈201作為本發明的「調節部」之一例。而其他的例子已適當地記載於說明書中。 The adjustment mechanism of the distance L and the diaphragm 201 are examples of the "adjustment unit" of the present invention. Other examples have been properly described in the specification.

光纖117、集束光纖118以及集束光纖119作為本發明的「導光管」之一例。 The optical fiber 117, the bundled optical fiber 118, and the bundled optical fiber 119 are examples of the "light guide tube" of the present invention.

生成部101b作為本發明的「生成部」之一例。 The generating unit 101b is an example of the "generating unit" of the present invention.

波長轉換部101c作為本發明的「波長轉換部」之一例。 The wavelength conversion unit 101c is an example of the "wavelength conversion unit" of the present invention.

入射口117c作為本發明的「入射口」之一例。 The entrance port 117c is an example of the "incident port" of the present invention.

遮蔽板206及反射體207作為本發明的「遮蔽部件」之一例。 The shielding plate 206 and the reflector 207 are examples of the "shielding member" of the present invention.

101‧‧‧發光元件 101‧‧‧Lighting elements

101a‧‧‧發光面 101a‧‧‧Lighting surface

101b‧‧‧生成部 101b‧‧‧Generation Department

101c‧‧‧波長轉換部 101c‧‧‧wavelength conversion unit

117‧‧‧光纖 117‧‧‧ fiber optic

117a‧‧‧光纖頭 117a‧‧‧Fiber head

117b‧‧‧光傳輸路 117b‧‧‧Light transmission path

117c‧‧‧入射口 117c‧‧‧ entrance port

A‧‧‧從作為測定對象之發光元件101的中心到外緣為止的距離 A‧‧‧Distance from the center of the light-emitting element 101 to be measured to the outer edge

A‧‧‧從作為測定對象的發光元件101之中心到生成部101b之外緣為止的距離 A‧‧‧ Distance from the center of the light-emitting element 101 to be measured to the outer edge of the generating portion 101b

B‧‧‧相鄰之發光元件101彼此之間的距離 B‧‧‧Distance between adjacent light-emitting elements 101

D‧‧‧將範圍S0投影至發光元件101時的、從發光元件101的中心到範圍S0的外緣為止的距離 D‧‧‧ The distance from the center of the light-emitting element 101 to the outer edge of the range S 0 when the range S 0 is projected onto the light-emitting element 101

L‧‧‧作為測定對象之發光元件101與光纖117之間的距離 L‧‧‧ Distance between the light-emitting element 101 and the optical fiber 117 to be measured

LCA‧‧‧發光中心軸 LCA‧‧‧Lighting Center Shaft

S0‧‧‧數值孔徑NA所示之範圍 S 0 ‧‧‧The range indicated by the numerical aperture NA

X‧‧‧從作為測定對象之發光元件101的中心到與作為測定對象之發光元件101相鄰之發光元件101的外緣為止的距離 X‧‧‧ Distance from the center of the light-emitting element 101 to be measured to the outer edge of the light-emitting element 101 adjacent to the light-emitting element 101 to be measured

α‧‧‧在光纖117內全反射所得到之光的入射角的最大值 α‧‧‧Maximum angle of incidence of light obtained by total reflection in fiber 117

Claims (4)

一種光學測定裝置,其包含:受光元件,其檢測與至少包括對入射的光的波長進行波長轉換之波長轉換部之其他發光元件相鄰排列的一發光元件所發出的光;導光管,其具有讓該一發光元件所發出的光入射之入射口,並將自該入射口入射的光導光至該受光元件;及調節部,其調節該入射口與該一發光元件之間之距離,並調節該受光元件檢測出之光之範圍即檢測範圍;該受光元件檢測藉由供給電力至該一發光元件而使該一發光元件所發出的光;且該調節部藉由調節該距離使得僅該一發光元件位在朝向該入射口成圓錐狀變窄之該檢測範圍內,藉此使經由該一發光元件所發出的光入射至該其他發光元件之該波長轉換部而該其他發光元件所發出的光、及該一發光元件所發出的光之中的從該其他發光元件反射過來的光,不被該受光元件檢測到。 An optical measuring apparatus comprising: a light receiving element that detects light emitted by a light emitting element that is adjacent to another light emitting element including a wavelength converting portion that wavelength-converts a wavelength of incident light; and a light guide tube An entrance port for allowing light emitted by the light-emitting element to be incident, and guiding light incident from the entrance port to the light-receiving element; and an adjustment portion that adjusts a distance between the entrance port and the light-emitting element, and Adjusting a range of light detected by the light receiving element, that is, a detection range; the light receiving element detects light emitted by the light emitting element by supplying electric power to the light emitting element; and the adjusting portion adjusts the distance so that only a light-emitting element is located within the detection range that is conically narrowed toward the entrance port, whereby light emitted through the light-emitting element is incident on the wavelength conversion portion of the other light-emitting element and the other light-emitting element is emitted The light reflected from the other light-emitting elements among the light emitted by the light-emitting element is not detected by the light-receiving element. 如申請專利範圍第1項所述之光學測定裝置,其中該檢測範圍係以對應於該導光管內全反射而得之光之入射角之最大值之部分為外緣。 The optical measuring device according to claim 1, wherein the detecting range is an outer edge of a portion corresponding to a maximum value of an incident angle of light obtained by total reflection in the light guiding tube. 如申請專利範圍第2項所述之光學測定裝置,其中讓該一發光元件所發出的光入射的該導光管之入射口與該一發光元件相對配置;且該調節部根據該導光管之數值孔徑改變該入射口與該一發光元件之間的距離,來限制入射至該導光管的光。 The optical measuring device according to claim 2, wherein an entrance of the light guiding tube to which light emitted by the light emitting element is incident is disposed opposite to the light emitting element; and the adjusting portion is configured according to the light guiding tube The numerical aperture changes the distance between the entrance port and the light-emitting element to limit the light incident on the light pipe. 如申請專利範圍第1~3項任一項所述之光學測定裝置,其中將在 該導光管內全反射所得之光的入射角的最大值定義為α,從該一發光元件的中心到與該一發光元件相鄰的該其他發光元件的外緣為止的距離定義為X,該調節部改變該入射口與該一發光元件的距離L,以使該距離L滿足L≦X/tanα的關係。 The optical measuring device according to any one of claims 1 to 3, wherein The maximum value of the incident angle of the light obtained by total reflection in the light pipe is defined as α, and the distance from the center of the light-emitting element to the outer edge of the other light-emitting element adjacent to the light-emitting element is defined as X, The adjustment portion changes the distance L between the entrance port and the one light-emitting element such that the distance L satisfies the relationship of L≦X/tanα.
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