TW202437296A - Ion source - Google Patents
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
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Abstract
Description
本發明是有關於一種用於例如離子注入裝置等的離子源。The present invention relates to an ion source used in, for example, an ion implantation device.
作為此種離子源,如專利文獻1所示,存在具有如下構件的離子源,即:電漿生成容器,供離子源氣體導入且呈長方體形狀;多個磁鐵,配置於所述電漿生成容器的側面外側且在電漿生成容器內部形成會切磁場;以及燈絲,自電漿生成容器的側壁插入至內部而設置,且放出電子。在所述離子源中,電漿生成容器兼作陽極,使自燈絲放出的電子在電漿生成容器內放電,使離子源氣體電離而生成電漿。而且,構成為使用設置於電漿生成容器的一個側壁上所形成的離子引出口附近的引出電極系統,自電漿引出離子束。 [現有技術文獻] [專利文獻] As such an ion source, as shown in Patent Document 1, there is an ion source having the following components: a plasma generation container into which ion source gas is introduced and which is in a rectangular parallelepiped shape; a plurality of magnets arranged outside the side surface of the plasma generation container and forming a cusp magnetic field inside the plasma generation container; and a filament inserted from the side wall of the plasma generation container to the inside and emitting electrons. In the ion source, the plasma generation container also serves as an anode, and the electrons emitted from the filament are discharged in the plasma generation container, so that the ion source gas is ionized to generate plasma. Furthermore, the ion beam is extracted from the plasma using an extraction electrode system disposed near an ion extraction port formed on a side wall of a plasma generation container. [Prior art literature] [Patent literature]
[專利文獻1]日本專利特開2011-228044號公報[Patent Document 1] Japanese Patent Publication No. 2011-228044
[發明所欲解決之課題] 在如上所述的將燈絲自電漿生成容器的側壁插入至內部的離子源中,為了生成電漿而對電漿生成容器施加負電壓,因此燈絲受到基於正離子的濺鍍而消耗。特別是在使用BF 3等鹵化物的離子源氣體產生電漿的情況下,燈絲受到伴隨化學反應的濺鍍,更進一步容易消耗。隨著燈絲的消耗加劇,需要對其進行更換等的維護,因此,在先前的離子源中,燈絲的壽命是決定離子源的維護週期的主要因素。 [Problem to be solved by the invention] In the ion source in which the filament is inserted from the side wall of the plasma generating container as described above, a negative voltage is applied to the plasma generating container in order to generate plasma, so the filament is consumed by sputtering based on positive ions. In particular, when plasma is generated using an ion source gas such as a halogenide such as BF3 , the filament is further consumed by sputtering accompanied by a chemical reaction. As the consumption of the filament increases, it becomes necessary to perform maintenance such as replacement, and therefore, in the conventional ion source, the life of the filament is the main factor determining the maintenance cycle of the ion source.
另外,為了在電漿生成容器內生成大致均勻的電漿,需要設置多根燈絲,而且需要對各燈絲設置電源,因此零件個數增加,裝置大型化。另外,因零件個數增加而其安裝所需的加工工時亦增加,進而由於電源增加而控制點數亦成比例地增加,成本變高。進而由於設置多根燈絲,燈絲接線用的高電流用電纜的根數亦增加,藉此亦產生配線路徑複雜化而維護時的作業性差的問題。 另外,亦謀求進一步提高離子引出口附近的電漿密度。 In addition, in order to generate roughly uniform plasma in the plasma generating container, multiple filaments need to be installed, and each filament needs to be provided with a power supply, so the number of parts increases and the device becomes larger. In addition, the processing time required for its installation also increases due to the increase in the number of parts, and the number of control points also increases proportionally due to the increase in power supply, and the cost becomes higher. Furthermore, due to the installation of multiple filaments, the number of high-current cables for filament wiring also increases, which also complicates the wiring path and causes poor workability during maintenance. In addition, it is also intended to further increase the plasma density near the ion extraction port.
本發明是為了一舉解決所述問題而成,主要的課題在於提供一種離子源,其維護的週期長、維護時的作用性好、進而可達成裝置整體的小型化、製造成本亦得到抑制且可提高在離子引出口附近的電漿密度。 [解決課題之手段] The present invention is designed to solve the above problems in one fell swoop. The main subject is to provide an ion source with a long maintenance cycle and good maintenance performance, thereby achieving miniaturization of the entire device, suppressing manufacturing costs, and increasing the plasma density near the ion extraction port. [Means for solving the problem]
即,本發明的離子源的特徵在於包括:電漿生成容器,為具有供離子源氣體導入的內部空間的容器,在其一個側壁形成有離子引出口;電漿生成單元,使所述離子源氣體電離而在所述內部空間生成電漿,且包括天線以及磁場透射窗,所述天線設置於所述電漿生成容器的外部並與高頻電源連接而產生高頻磁場,所述磁場透射窗形成於所述電漿生成容器的側壁的面向所述天線的位置,使由所述天線產生的高頻磁場透射至所述內部空間;放電電極,設置於所述內部空間的所述離子引出口的附近;以及引出電極系統,設置於電漿生成容器的外部,將離子束經由所述離子引出口自所述內部空間引出。 [發明的效果] That is, the ion source of the present invention is characterized in that it comprises: a plasma generating container, which is a container having an internal space for introducing ion source gas, and an ion introduction port is formed on one side wall thereof; a plasma generating unit, which ionizes the ion source gas to generate plasma in the internal space, and comprises an antenna and a magnetic field transmission window, wherein the antenna is arranged outside the plasma generating container and connected to a high frequency power source to generate A high-frequency magnetic field, wherein the magnetic field transmission window is formed on the side wall of the plasma generating container facing the antenna, so that the high-frequency magnetic field generated by the antenna is transmitted to the internal space; a discharge electrode is arranged near the ion extraction port in the internal space; and an extraction electrode system is arranged outside the plasma generating container to extract the ion beam from the internal space through the ion extraction port. [Effect of the invention]
藉由如此般構成的本發明,可提供一種離子源,其維護的週期長、維護時的作用性好、進而可達成裝置整體的小型化、製造成本亦得到抑制且可提高在離子引出口附近的電漿密度。The present invention thus constructed can provide an ion source having a long maintenance cycle and good maintenance performance, thereby achieving miniaturization of the entire device, suppressing manufacturing costs, and increasing the plasma density near the ion extraction port.
本發明的離子源用於例如半導體製造步驟或平板顯示器製造步驟中使用的離子注入裝置或離子摻雜裝置等離子束照射裝置。以下,參照圖式對本發明的一實施形態的包括離子源100的離子注入裝置400進行說明。The ion source of the present invention is used in, for example, an ion implantation device or an ion doping device plasma beam irradiation device used in a semiconductor manufacturing step or a flat panel display manufacturing step. Hereinafter, an ion implantation device 400 including an ion source 100 according to an embodiment of the present invention will be described with reference to the drawings.
如圖1所示,本實施形態的離子注入裝置400用於對作為目標的基板W照射離子束IB而進行離子注入。具體而言,所述離子注入裝置400包括:離子源100,沿規定的引出方向引出離子束IB;質量分析部200,設置於離子源100的下游側,進行自離子源100引出的離子束IB的質量分析;以及處理室300,設置有基板W。在本實施形態的離子注入裝置400中,自離子源100引出圖1的紙面的表背方向的寬度較與其正交的方向上的厚度充分大的帶狀離子束IB。As shown in FIG1 , the ion implantation device 400 of the present embodiment is used to perform ion implantation by irradiating an ion beam IB onto a target substrate W. Specifically, the ion implantation device 400 includes: an ion source 100 that extracts an ion beam IB along a predetermined extraction direction; a mass analysis unit 200 that is disposed on the downstream side of the ion source 100 and performs mass analysis of the ion beam IB extracted from the ion source 100; and a processing chamber 300 in which the substrate W is disposed. In the ion implantation device 400 of the present embodiment, a ribbon-shaped ion beam IB is extracted from the ion source 100, and the width in the front and back directions of the paper surface of FIG1 is sufficiently greater than the thickness in the direction orthogonal thereto.
質量分析部200具有質量分析磁鐵210以及分析狹縫220。質量分析磁鐵210使離子束IB沿其厚度方向彎曲後篩選並導出所期望的離子。分析狹縫220設置於質量分析磁鐵210的下游側,藉由與質量分析磁鐵210協作,篩選所述所期望的離子並使其穿過。在質量分析磁鐵210的入口,設置有形成入射狹縫的狹縫板211。所述狹縫板211對入射至質量分析部210時的離子束IB的入射角度以及束寬度進行限制,藉此可提高穿過分析狹縫220的離子束的分析性能。The mass analysis unit 200 has a mass analysis magnet 210 and an analysis slit 220. The mass analysis magnet 210 bends the ion beam IB along its thickness direction and then selects and guides out the desired ions. The analysis slit 220 is disposed on the downstream side of the mass analysis magnet 210, and by cooperating with the mass analysis magnet 210, the desired ions are selected and passed through. At the entrance of the mass analysis magnet 210, a slit plate 211 forming an incident slit is disposed. The slit plate 211 limits the incident angle and beam width of the ion beam IB when incident on the mass analysis unit 210, thereby improving the analysis performance of the ion beam passing through the analysis slit 220.
在處理室300中,基板W以其處理面朝向離子束IB的方式由基板驅動裝置310保持。所述基板驅動裝置310構成為,在保持基板W的同時,在沿著入射至基板W的離子束IB的厚度的方向上機械地往復驅動。離子注入裝置400藉由所述基板驅動裝置310對基板W的往復驅動以及呈帶狀的離子束IB的照射,可使離子束IB入射至基板W的整個面而進行離子注入。In the processing chamber 300, the substrate W is held by the substrate driving device 310 in such a manner that the processing surface thereof faces the ion beam IB. The substrate driving device 310 is configured to mechanically reciprocate in a direction along the thickness of the ion beam IB incident on the substrate W while holding the substrate W. The ion implantation device 400 can implant the ion beam IB into the entire surface of the substrate W by reciprocatingly driving the substrate W by the substrate driving device 310 and irradiating the ion beam IB in a strip shape, thereby implanting ions.
以下,對離子源100的結構進行詳細的說明。再者,在各圖中,僅記載了本發明的實施形態的離子源100的主要部分,省略各種的構件進行記載。The following is a detailed description of the structure of the ion source 100. In each figure, only the main part of the ion source 100 according to the embodiment of the present invention is shown, and various components are omitted.
具體而言,如圖2及圖3所示,所述離子源100包括:電漿生成容器1,用於供離子源氣體導入而生成電漿;多個磁鐵2,設置於電漿生成容器1的外部而在所述電漿生成容器1內形成磁場(具體而言亦稱為會切磁場,更嚴格地說亦稱為多會切磁場,亦稱為多極磁場);電漿生成單元3,在電漿生成容器1內形成電漿;引出電極系統4,自電漿生成容器1引出離子束IB;以及氣體源5,以一定流量向電漿生成容器1供給離子源氣體。Specifically, as shown in FIG. 2 and FIG. 3 , the ion source 100 includes: a plasma generating container 1 for introducing ion source gas to generate plasma; a plurality of magnets 2, which are arranged outside the plasma generating container 1 and form a magnetic field (specifically also called a cusp magnetic field, more strictly speaking also called a multi-cusp magnetic field, also called a multipole magnetic field) in the plasma generating container 1; a plasma generating unit 3, which forms plasma in the plasma generating container 1; an extraction electrode system 4, which extracts the ion beam IB from the plasma generating container 1; and a gas source 5, which supplies the ion source gas to the plasma generating container 1 at a certain flow rate.
電漿生成容器1是呈例如長方體形狀等的長條狀的容器。藉由所述電漿生成容器1的內壁面形成有用於供離子源氣體導入而生成電漿的內部空間1s。所述內部空間1s是以沿著電漿生成容器1的長邊方向延伸的方式形成且呈大致長方體形狀的長條狀空間,由沿著引出方向彼此相向的一對內壁面以及沿著寬度方向彼此相向的一對內壁面包圍而形成。再者,內部空間藉由未圖示的真空排氣裝置進行真空排氣。The plasma generating container 1 is a long container such as a rectangular parallelepiped. An internal space 1s for introducing ion source gas to generate plasma is formed by the inner wall surface of the plasma generating container 1. The internal space 1s is a long space in a substantially rectangular parallelepiped shape formed in a manner extending along the long side direction of the plasma generating container 1, and is surrounded by a pair of inner wall surfaces facing each other in the extraction direction and a pair of inner wall surfaces facing each other in the width direction. In addition, the internal space is vacuum-exhausted by a vacuum exhaust device not shown.
在與長邊方向平行的電漿生成容器1的一個側壁(以下,稱為前側壁11a),形成有用於自內部空間1s引出離子束IB的開口即離子引出口1H。與內部空間1s同樣地,離子引出口1H以沿著長邊方向延伸的方式形成於前側壁11a。在本實施形態中,所述前側壁11a形成為與離子束IB的引出方向正交。以下,將與引出方向及長邊方向正交的方向稱為寬度方向。再者,所謂長條狀,是指以如下方式形成的任意形狀、即自引出方向觀察時在彼此正交的兩個軸向上其中一個軸向上的長度(即長邊方向上的長度)較另一個軸向上的長度(即寬度方向上的長度)長,並不限定於長方體形狀。An ion extraction port 1H, which is an opening for extracting the ion beam IB from the internal space 1s, is formed on one side wall (hereinafter referred to as the front side wall 11a) of the plasma generating container 1 parallel to the long side direction. The ion extraction port 1H is formed on the front side wall 11a in a manner extending along the long side direction, similarly to the internal space 1s. In the present embodiment, the front side wall 11a is formed to be orthogonal to the extraction direction of the ion beam IB. Hereinafter, the direction orthogonal to the extraction direction and the long side direction is referred to as the width direction. Furthermore, the so-called elongated strip shape refers to any shape formed in the following manner, that is, when observed from the lead-out direction, the length in one of the two axes that are orthogonal to each other (i.e., the length in the long side direction) is longer than the length in the other axis (i.e., the length in the width direction), and is not limited to a rectangular shape.
自長邊方向觀察時,在夾著經由離子引出口1H沿引出方向伸長的軸線(以下,亦稱為離子引出軸線L1)而相向(在寬度方向上相向)的兩個側壁(以下,亦稱為橫側壁11c、橫側壁11d)上形成有多個氣體導入孔1g,所述多個氣體導入孔1g用於與氣體源5連通、經由氣體流量調整器(未圖示)向內部空間1s導入離子源氣體。多個氣體導入孔1g為彼此大致相同直徑,在橫側壁11c、橫側壁11d的離子引出口1H附近(即,與前側壁11a的接合部附近)沿著電漿生成容器1的長邊方向大致等間隔地設置。自所述氣體導入孔1g向內部空間1s導入BF 3氣體或PH 3氣體等離子源氣體。 When observed from the long side direction, a plurality of gas introduction holes 1g are formed on two side walls (hereinafter also referred to as transverse side walls 11c and transverse side walls 11d) that are opposite to each other (opposite to each other in the width direction) sandwiching an axis (hereinafter also referred to as ion extraction axis L1) extending in the extraction direction through the ion extraction port 1H. The plurality of gas introduction holes 1g are used to connect with the gas source 5 and introduce ion source gas into the internal space 1s through a gas flow regulator (not shown). A plurality of gas introduction holes 1g are of substantially the same diameter and are provided at substantially equal intervals along the long side direction of the plasma generating container 1 near the ion introduction ports 1H of the side walls 11c and 11d (i.e., near the junction with the front wall 11a). BF3 gas or PH3 gas plasma source gas is introduced into the internal space 1s through the gas introduction holes 1g.
再者,多個氣體導入孔1g亦可形成於兩個橫側壁11c、11d中的僅其中一者,另外亦可設置於橫側壁11c、橫側壁11d的與和前側壁11a相向的後側壁11b的接合部附近(即,後述的磁場透射窗3w附近)。另外,多個氣體導入孔1g亦可彼此大致等間隔地設置,並且沿著長邊方向的兩端部的孔徑與中央部的孔徑相比相對大。或者,多個氣體導入孔1g亦可設為彼此大致相同孔徑,並且沿著長邊方向的兩端部的配置間隔與中央部的配置間隔相比相對窄。進而,氣體導入孔1g設置成在電漿生成容器1的側壁的內表面開口,但亦可設置成在配置於電漿生成容器1內的氣體供給管的管壁開口。Furthermore, the plurality of gas introduction holes 1g may be formed in only one of the two transverse walls 11c and 11d, or may be arranged near the junction of the transverse wall 11c, the transverse wall 11d and the rear side wall 11b facing the front side wall 11a (i.e., near the magnetic field transmission window 3w described later). In addition, the plurality of gas introduction holes 1g may be arranged at approximately equal intervals from each other, and the hole diameters at both ends along the long side direction may be relatively larger than the hole diameter at the central portion. Alternatively, the plurality of gas introduction holes 1g may be arranged to have approximately the same hole diameter from each other, and the arrangement intervals at both ends along the long side direction may be relatively narrower than the arrangement intervals at the central portion. Furthermore, the gas introduction hole 1g is provided to open on the inner surface of the side wall of the plasma generating container 1, but may also be provided to open on the tube wall of the gas supply tube arranged in the plasma generating container 1.
多個磁鐵2沿著前側壁11a以外的其他側壁(具體而言為橫側壁11c、橫側壁11d)的外表面而設置於外部,在橫側壁11c、橫側壁11d的內表面附近形成會切磁場。本實施形態的各磁鐵2是永久磁鐵,但亦可使用電磁鐵。所述多個磁鐵2沿著與離子引出方向正交的方向以極性彼此不同的方式並且大致等間隔地排列。再者,多個磁鐵2的排列形態並不限於此,能夠適當變更。A plurality of magnets 2 are arranged outside along the outer surfaces of the other side walls (specifically, the side walls 11c and 11d) other than the front side wall 11a, and a cusp magnetic field is formed near the inner surfaces of the side walls 11c and 11d. Each magnet 2 in this embodiment is a permanent magnet, but an electromagnetic magnet may also be used. The plurality of magnets 2 are arranged at approximately equal intervals in a direction orthogonal to the ion extraction direction in a manner that the polarities are different from each other. In addition, the arrangement form of the plurality of magnets 2 is not limited to this and can be appropriately changed.
電漿生成單元3藉由對電漿生成容器1的內部空間1s供給高頻磁場而使離子源氣體電離從而生成電漿。The plasma generating unit 3 generates plasma by supplying a high-frequency magnetic field to the inner space 1s of the plasma generating container 1 to ionize the ion source gas.
引出電極系統4設置於電漿生成容器1的離子引出口1H附近,藉由對與電漿生成容器1之間提供電位差而將離子束IB加速並引出。具體而言,所述引出電極系統4具有形成有狹縫4x的多張板狀電極41〜44,更具體而言,如圖2及圖3所示,具有沿著離子引出方向自電漿生成容器1朝向下游依次配置的電漿電極41、引出電極42、抑制電極43及接地電極44。該些各電極均在其中央部形成有沿著厚度方向貫通並沿著長邊方向伸長的細長形狀的狹縫4x。而且,各電極以形成於中央部的狹縫4x與電漿生成容器1的離子引出口1H相向的方式配置。再者,各電極間例如藉由絕緣物(未圖示)彼此電性絕緣。再者,所述引出電極系統4較佳為構成為離電漿生成容器1最近的電極(此處為電漿電極41)的狹縫寬度可變。若如此,則可使電漿室內的氣體壓力可變,可對電漿生成容器1內的壓力以及引出電極區域的真空度的設定賦予自由度,藉此,可使施加於電極間的耐電壓具有裕度。The extraction electrode system 4 is arranged near the ion extraction port 1H of the plasma generation container 1, and accelerates and extracts the ion beam IB by providing a potential difference with the plasma generation container 1. Specifically, the extraction electrode system 4 has a plurality of plate-shaped electrodes 41 to 44 formed with slits 4x, and more specifically, as shown in FIG. 2 and FIG. 3, it has a plasma electrode 41, an extraction electrode 42, a suppression electrode 43, and a grounding electrode 44 arranged in sequence from the plasma generation container 1 toward the downstream along the ion extraction direction. Each of these electrodes has a slit 4x in the central portion thereof that penetrates in the thickness direction and extends in the long side direction. Moreover, each electrode is arranged in such a manner that the slit 4x formed in the central portion faces the ion extraction port 1H of the plasma generating container 1. Furthermore, each electrode is electrically insulated from each other by, for example, an insulator (not shown). Furthermore, the extraction electrode system 4 is preferably configured such that the slit width of the electrode closest to the plasma generating container 1 (here, the plasma electrode 41) is variable. If so, the gas pressure in the plasma chamber can be made variable, and the pressure in the plasma generating container 1 and the vacuum degree of the extraction electrode region can be set with freedom, thereby providing a margin for the withstand voltage applied between the electrodes.
而且,本實施形態的離子源100中,電漿生成單元3構成為在電漿生成容器1的內部空間1s產生感應耦合型的電漿,且包括:天線31,設置於電漿生成容器1的外部;高頻電源32,對天線31施加高頻;以及磁場透射窗3w,形成於電漿生成容器1的側壁的面向天線31的位置,使由天線31產生的高頻磁場透射至內部空間1s。在所述結構中,藉由自高頻電源32對天線31施加高頻,高頻電流流經天線31,在電漿生成容器1內產生感應電場從而生成感應耦合型的電漿。Furthermore, in the ion source 100 of the present embodiment, the plasma generating unit 3 is configured to generate inductively coupled plasma in the internal space 1s of the plasma generating container 1, and includes: an antenna 31, which is arranged outside the plasma generating container 1; a high-frequency power source 32, which applies a high frequency to the antenna 31; and a magnetic field transmission window 3w, which is formed at a position facing the antenna 31 on the side wall of the plasma generating container 1, so that the high-frequency magnetic field generated by the antenna 31 is transmitted to the internal space 1s. In the above structure, by applying a high frequency from the high-frequency power source 32 to the antenna 31, a high-frequency current flows through the antenna 31, and an induced electric field is generated in the plasma generating container 1, thereby generating inductively coupled plasma.
天線31自外觀觀察呈長度為數十cm以上的直線狀(具體而言為圓柱狀)。所述天線31在電漿生成容器1的外部與磁場透射窗3w具有間隙,並沿著電漿生成容器1的長邊方向呈筆直地設置。即,天線31沿著離子引出口1H或引出電極系統4的狹縫4x的長邊方向呈筆直地設置。而且,自離子引出方向觀察時,天線31配置於面向離子引出口1H的位置,更具體而言,配置於所述離子引出軸線L1上。天線31的一端部即供電端部經由匹配電路321而連接有高頻電源32。The antenna 31 is in the shape of a straight line (specifically, a cylindrical shape) with a length of more than tens of centimeters when observed from the outside. The antenna 31 has a gap with the magnetic field transmission window 3w outside the plasma generation container 1, and is arranged straight along the long side direction of the plasma generation container 1. That is, the antenna 31 is arranged straight along the long side direction of the ion extraction port 1H or the slit 4x of the extraction electrode system 4. Moreover, when observed from the ion extraction direction, the antenna 31 is arranged at a position facing the ion extraction port 1H, more specifically, on the ion extraction axis L1. One end of the antenna 31, i.e., the power supply end, is connected to the high-frequency power supply 32 via the matching circuit 321.
高頻電源32可經由匹配電路321而在天線31中流動高頻電流。高頻的頻率例如為一般的13.56 MHz,但並不限於此,亦可適當變更。The high frequency power source 32 can flow a high frequency current in the antenna 31 via the matching circuit 321. The frequency of the high frequency is, for example, 13.56 MHz in general, but is not limited thereto and can be changed appropriately.
磁場透射窗3w形成於電漿生成容器1的與前側壁11a相向的側壁(稱為後側壁11b)。具體而言,如圖4的(a)~圖4的(c)所示,所述磁場透射窗3w由設置於電漿生成容器1的後側壁11b的開口1x以及以堵塞所述開口1x的方式安裝於電漿生成容器1的窗構件33形成。The magnetic field transmission window 3w is formed on the side wall (referred to as the rear side wall 11b) facing the front side wall 11a of the plasma generating container 1. Specifically, as shown in FIG. 4 (a) to FIG. 4 (c), the magnetic field transmission window 3w is formed by an opening 1x provided on the rear side wall 11b of the plasma generating container 1 and a window member 33 installed on the plasma generating container 1 in a manner of blocking the opening 1x.
自離子引出方向觀察時,所述開口1x呈沿著電漿生成容器1的長邊方向的長度大於沿著寬度方向的長度的矩形形狀。而且,所述開口1x在後側壁11b形成於面向天線31以及離子引出口1H此兩者的位置,更具體而言,以位於將天線31與離子引出口1H連結的線上的方式形成。When viewed from the ion extraction direction, the opening 1x is in a rectangular shape in which the length along the long side direction of the plasma generating container 1 is greater than the length along the width direction. Furthermore, the opening 1x is formed in the rear wall 11b at a position facing both the antenna 31 and the ion extraction port 1H, and more specifically, is formed so as to be located on a line connecting the antenna 31 and the ion extraction port 1H.
窗構件33包括:狹縫板331,自外側堵塞形成於電漿生成容器1的後側壁11b的開口1x;以及介電板332,自電漿生成容器1的外側堵塞形成於狹縫板331的狹縫331x。The window member 33 includes a slit plate 331 for closing an opening 1x formed in the rear wall 11b of the plasma generating container 1 from the outside, and a dielectric plate 332 for closing a slit 331x formed in the slit plate 331 from the outside of the plasma generating container 1.
狹縫板331使由天線31產生的高頻磁場透射至電漿生成容器1內,並且防止電場自電漿生成容器1的外部進入電漿生成容器1的內部。具體而言,所述狹縫板331是沿著天線31的長邊方向形成有多個沿所述狹縫板331的厚度方向貫通而成的狹縫331x的平板狀者。所述狹縫板331較佳為機械強度高於後述的介電板332,且較佳為厚度尺寸大於介電板332。而且,自厚度方向觀察時,多個狹縫331x彼此平行且以與天線31交叉(具體而言為正交)的方式形成。多個狹縫331x均為相同形狀(具體而言為俯視呈矩形形狀)。The slit plate 331 allows the high-frequency magnetic field generated by the antenna 31 to be transmitted into the plasma generating container 1, and prevents the electric field from entering the plasma generating container 1 from the outside. Specifically, the slit plate 331 is a flat plate having a plurality of slits 331x formed along the long side direction of the antenna 31 and penetrating the slit plate 331 in the thickness direction. The slit plate 331 preferably has a higher mechanical strength than the dielectric plate 332 described later, and preferably has a greater thickness than the dielectric plate 332. Furthermore, when viewed from the thickness direction, the plurality of slits 331x are parallel to each other and are formed in a manner intersecting (specifically, orthogonal to) the antenna 31. The multiple slits 331x are all of the same shape (specifically, a rectangular shape when viewed from above).
具體而言,所述狹縫板331是金屬製,藉由壓延加工(例如冷軋或熱軋)等對例如選自包含Cu、Al、Zn、Ni、Sn、Si、Ti、Fe、Cr、Nb、C、Mo、W或Co的群組中的一種金屬或該些的合金(例如不鏽鋼合金、鋁合金等)等金屬材料進行製造而得。Specifically, the slit plate 331 is made of metal, and is manufactured by a metal material such as a metal selected from a group including Cu, Al, Zn, Ni, Sn, Si, Ti, Fe, Cr, Nb, C, Mo, W or Co or an alloy thereof (such as a stainless steel alloy, an aluminum alloy, etc.) through a rolling process (such as cold rolling or hot rolling).
所述狹縫板331在俯視時較電漿生成容器1的開口1x大,在被後側壁11b支撐的狀態(即,載置於後側壁11b的狀態)下堵塞開口1x,且設為與電漿生成容器1為相同電位。在狹縫板331與後側壁11b之間介隔存在O形環或墊圈等密封構件,該些之間被真空密封。The slit plate 331 is larger than the opening 1x of the plasma generating container 1 in a plan view, and blocks the opening 1x in a state supported by the rear side wall 11b (i.e., placed on the rear side wall 11b), and is set to the same potential as the plasma generating container 1. A sealing member such as an O-ring or a gasket is interposed between the slit plate 331 and the rear side wall 11b, and the space therebetween is vacuum-sealed.
介電板332載置於狹縫板331中朝向電漿生成容器1的外側的向外面(朝向電漿生成容器1的內部的向內面的背面),以堵塞狹縫板331的狹縫331x。在所述介電板332與狹縫板331之間介隔存在密封構件,該些之間被真空密封。The dielectric plate 332 is placed on the outer side of the slit plate 331 facing the outside of the plasma generating container 1 (the back side of the inner side facing the inside of the plasma generating container 1) to block the slit 331x of the slit plate 331. A sealing member is interposed between the dielectric plate 332 and the slit plate 331, and the space therebetween is vacuum-sealed.
介電板332整體包含介電物質,呈平板狀,例如包含氧化鋁、碳化矽、氮化矽等陶瓷、石英玻璃、無鹼玻璃等無機材料、氟樹脂(例如鐵氟龍(Teflon))等樹脂材料等。The dielectric plate 332 as a whole includes dielectric material and is in the shape of a flat plate, for example, ceramics such as aluminum oxide, silicon carbide, and silicon nitride, inorganic materials such as quartz glass and alkali-free glass, and resin materials such as fluororesins (such as Teflon).
藉由所述結構,狹縫板331及介電板332擔負作為使由天線31產生的磁場透射的磁場透射窗3w的功能。即,當自高頻電源32對天線31施加高頻時,由天線31產生的高頻磁場透射包含狹縫板331及介電板332的磁場透射窗3w而形成(供給)於電漿生成容器1內。藉此,在電漿生成容器1內的空間產生感應電場,從而生成感應耦合型的電漿。With the above structure, the slit plate 331 and the dielectric plate 332 function as a magnetic field transmission window 3w that transmits the magnetic field generated by the antenna 31. That is, when a high frequency is applied to the antenna 31 from the high frequency power source 32, the high frequency magnetic field generated by the antenna 31 transmits the magnetic field transmission window 3w including the slit plate 331 and the dielectric plate 332 and is formed (supplied) in the plasma generation container 1. Thereby, an induced electric field is generated in the space in the plasma generation container 1, thereby generating inductively coupled plasma.
而且,在本實施形態的電漿處理裝置中,窗構件33更包括遮罩板333,所述遮罩板333自電漿生成容器1的內側空開間隙地覆蓋形成於狹縫板331的各狹縫331x。Moreover, in the plasma processing apparatus of the present embodiment, the window member 33 further includes a mask plate 333 that covers each slit 331x formed in the slit plate 331 with a gap from the inner side of the plasma generating container 1.
若更具體地進行說明,則遮罩板333是沿著天線31的長邊方向形成有多個沿所述遮罩板333的厚度方向貫通而成的狹縫333x的平板狀者。自厚度方向觀察時,所述多個狹縫333x彼此平行且以與形成於狹縫板331的多個狹縫331x平行的方式形成。此處,各狹縫333x以與天線31交叉(具體而言為正交)的方式形成。多個狹縫333x均以成為相同形狀(具體而言為俯視呈矩形形狀)的方式形成。To explain more specifically, the shield plate 333 is a flat plate having a plurality of slits 333x formed along the long side direction of the antenna 31 and extending through the shield plate 333 in the thickness direction. When viewed from the thickness direction, the plurality of slits 333x are parallel to each other and are formed in parallel with the plurality of slits 331x formed in the slit plate 331. Here, each slit 333x is formed in a manner intersecting (specifically, orthogonal to) the antenna 31. The plurality of slits 333x are all formed in the same shape (specifically, a rectangular shape when viewed from above).
在遮罩板333中相鄰的狹縫333x之間形成有與各狹縫333x平行的樑狀區域333z。所述樑狀區域333z以與形成於狹縫板331的多個狹縫331x對應的方式形成有多個,藉由各樑狀區域333z對狹縫板331的各狹縫331x進行覆蓋。此處,沿著天線31的長邊方向的樑狀區域333z的長度(寬度)與狹縫板331的狹縫331x的寬度大致相同,各樑狀區域333z對狹縫板331的各狹縫331x的大致全部進行覆蓋。各樑狀區域333z亦可以僅覆蓋各狹縫331x的一部分的方式形成。再者,遮罩板333連接於狹縫板331的向內面,且設為相同電位。A beam-shaped region 333z parallel to each slit 333x is formed between adjacent slits 333x in the mask plate 333. A plurality of beam-shaped regions 333z are formed in a manner corresponding to the plurality of slits 331x formed in the slit plate 331, and each beam-shaped region 333z covers each slit 331x of the slit plate 331. Here, the length (width) of the beam-shaped region 333z along the long side direction of the antenna 31 is substantially the same as the width of the slit 331x of the slit plate 331, and each beam-shaped region 333z covers substantially all of each slit 331x of the slit plate 331. Each beam-shaped region 333z may also be formed in a manner of covering only a portion of each slit 331x. Furthermore, the mask plate 333 is connected to the inner surface of the slit plate 331 and is set to the same potential.
具體而言,遮罩板333包含例如選自包含Cu、Al、Zn、Ni、Sn、Si、Ti、Fe、Cr、Nb、C、Mo、W或Co的群組中的一種金屬或該些的合金(例如不鏽鋼合金、鋁合金等)等金屬材料。遮罩板333的厚度較佳為小於狹縫板331的厚度。Specifically, the mask plate 333 includes a metal material such as a metal selected from the group consisting of Cu, Al, Zn, Ni, Sn, Si, Ti, Fe, Cr, Nb, C, Mo, W, or Co, or an alloy thereof (such as a stainless steel alloy, an aluminum alloy, etc.). The thickness of the mask plate 333 is preferably smaller than the thickness of the slit plate 331.
另外,在所述實施形態中,在狹縫板331形成有供水等冷卻介質流動的流路331r。所述流路331r在狹縫板331中的遮罩板333的連接區域的附近沿著天線31的長邊方向形成。此處,流路331r以沿著狹縫板331的厚度方向位於連接區域的正上方的方式形成。In addition, in the embodiment, a flow path 331r for a cooling medium such as water to flow is formed in the slit plate 331. The flow path 331r is formed along the long side direction of the antenna 31 near the connection area of the mask plate 333 in the slit plate 331. Here, the flow path 331r is formed in a manner to be located directly above the connection area along the thickness direction of the slit plate 331.
另外,在本實施形態的離子源100中,磁場透射窗3w的向內面(具體而言為狹縫板331的向內面)與引出電極系統4的離電漿生成容器1最近的電極的表面之間的距離較佳設定為約45 mm〜約140 mm的範圍。In addition, in the ion source 100 of the present embodiment, the distance between the inward surface of the magnetic field transmission window 3w (specifically, the inward surface of the slit plate 331) and the surface of the electrode of the extraction electrode system 4 closest to the plasma generating container 1 is preferably set to a range of about 45 mm to about 140 mm.
而且,在本實施形態的離子源100中,如圖2及圖3所示,在電漿生成容器1的內部空間中,在離子引出口1H的附近設置有放電電極7。所述放電電極7使用藉由感應耦合在內部空間1s內形成的電漿在與引出電極系統4中離電漿生成容器1最近的電極(此處為電漿電極41)之間產生直流放電或低頻放電,藉此提高在內部空間1s中的離子引出口1H附近生成的電漿密度。In addition, in the ion source 100 of the present embodiment, as shown in FIG2 and FIG3, a discharge electrode 7 is provided near the ion extraction port 1H in the internal space of the plasma generation container 1. The discharge electrode 7 generates a direct current discharge or a low frequency discharge between the discharge electrode 7 and the electrode (here, the plasma electrode 41) closest to the plasma generation container 1 in the extraction electrode system 4 using the plasma formed in the internal space 1s by inductive coupling, thereby increasing the density of the plasma generated near the ion extraction port 1H in the internal space 1s.
本實施形態的放電電極7是呈棒狀或直管狀的金屬製的電極,在內部空間1s中在面向離子引出口1H的位置(具體而言亦稱為將天線31與離子引出口1H連結的線上或者離子引出軸線L1上),以沿著長邊方向平行的方式設置。即,所述放電電極7以與離子引出口1H及形成於構成引出電極系統4的電極41~電極44的狹縫4x的長邊方向一致的方式配置。The discharge electrode 7 of this embodiment is a rod-shaped or straight-tube-shaped metal electrode, and is disposed in parallel along the long-side direction at a position facing the ion extraction port 1H in the internal space 1s (specifically, also referred to as a line connecting the antenna 31 and the ion extraction port 1H or an ion extraction axis L1). That is, the discharge electrode 7 is arranged so as to coincide with the long-side direction of the slit 4x formed in the electrodes 41 to 44 constituting the extraction electrode system 4.
放電電極7在呈棒狀的情況下,較佳為包含例如鎢等高熔點材料。另外,放電電極7在為管狀的情況下,較佳為包含不鏽鋼管、鋁(或鋁合金)管、銅(或銅合金)管等,在內部形成有供冷卻流體流動的流路。When the discharge electrode 7 is in a rod shape, it is preferably made of a high melting point material such as tungsten. In addition, when the discharge electrode 7 is in a tubular shape, it is preferably made of a stainless steel tube, an aluminum (or aluminum alloy) tube, a copper (or copper alloy) tube, etc., and a flow path for cooling fluid to flow is formed inside.
對於放電電極7,可相對於引出電極系統4中的離電漿生成容器1最近的電極(電漿電極41)而施加負的直流電壓,或者亦可施加約10 kHz左右或其以下的頻率的交變電壓。另外,電漿生成容器1與電漿電極41之間亦可短路或經由電阻器而連接。或者,亦可使用直流電源相對於電漿電極41而對電漿生成容器1施加正電壓。A negative direct current voltage may be applied to the discharge electrode 7 relative to the electrode (plasma electrode 41) closest to the plasma generation container 1 in the extraction electrode system 4, or an alternating voltage with a frequency of about 10 kHz or less may be applied. In addition, the plasma generation container 1 and the plasma electrode 41 may be short-circuited or connected via a resistor. Alternatively, a positive voltage may be applied to the plasma generation container 1 relative to the plasma electrode 41 using a direct current power source.
<本實施形態的效果> 根據如此般構成的本實施形態的離子源100,在不使用突出至電漿生成容器1的內部空間1s的燈絲的情況下藉由設置於電漿生成容器1的外部的天線31在內部空間1s產生電漿,因此可減少在電漿生成容器1內因濺鍍而受到消耗的零件,從而可延長維護的週期。另外可藉由沿著離子引出口方向延伸的一根天線31以及一台高頻電源32在內部空間1s產生大致均勻的電漿,因此可大幅度地減少零件個數,使裝置小型化,並且可減少安裝所需的加工工時或電源的控制點數,從而可抑制製造成本。進而,藉由減少電源數,能夠大幅度地削減電力供給的線材及設備的控制線,從而可使組裝時的配線作業或維護時的拆裝作業變得簡單,可提高作業性。 進而,藉由在離子引出口1H的附近設置放電電極7,可利用在內部空間1s產生的電漿,在與引出電極系統4(具體而言為離離子引出口1H最近的電極41)之間產生直流放電或低頻放電,從而可增加在離子引出口1H附近生成的電漿密度。 <Effects of the present embodiment> According to the ion source 100 of the present embodiment constructed in this way, plasma is generated in the inner space 1s by the antenna 31 provided outside the plasma generating container 1 without using a filament protruding into the inner space 1s of the plasma generating container 1, thereby reducing the parts consumed by sputtering in the plasma generating container 1, thereby extending the maintenance cycle. In addition, a roughly uniform plasma can be generated in the inner space 1s by an antenna 31 extending in the direction of the ion extraction port and a high-frequency power supply 32, thereby significantly reducing the number of parts, miniaturizing the device, and reducing the processing time required for installation or the number of power supply control points, thereby suppressing the manufacturing cost. Furthermore, by reducing the number of power sources, the wires for power supply and the control wires of the equipment can be greatly reduced, thereby simplifying the wiring work during assembly and the disassembly work during maintenance, and improving the workability. Furthermore, by setting the discharge electrode 7 near the ion extraction port 1H, the plasma generated in the internal space 1s can be used to generate direct current discharge or low-frequency discharge between the extraction electrode system 4 (specifically, the electrode 41 closest to the ion extraction port 1H), thereby increasing the plasma density generated near the ion extraction port 1H.
此處,在具有大面積的大型離子源或長條離子源的情況下,在電漿室內的氣壓(真空度)與被施加高電壓的引出電極系統4的區域的真空度之間,由於引出電極系統4的狹縫4x的狹縫電導大,因此不會出現壓力差而大致同等。另一方面,為了對引出電極系統4穩定地施加高電壓,需要以約1 mTorr(約133 mPa)為上限對設置引出電極系統4的區域的壓力進行設定。在此種壓力狀況下,在將以與引出電極系統4的狹縫4x相當的、約數毫米~約十幾毫米左右的間隔配置的平行平板電極單體用作電漿生成單元3的情況下,無法利用直流電壓生成電漿,另外,即使為通常的高頻放電亦無法生成電漿。 另一方面,根據本實施形態的離子源100,在感應耦合型放電的能夠放電的下限附近即此種低壓力下,可向放電電極7與引出電極系統4之間供給基於高頻電漿的電漿點燃的物種(物種電漿),另一方面,可藉由利用了所述物種電漿的直流放電或交變電壓(高頻電壓)使電漿密度增加,藉此可在不使用燈絲的情況下有效率地引出離子束。 進而,在使用平行平板電極作為電漿生成單元3的情況下,幾乎無法對真空內的電極間距離的必要部位進行調整,但在本實施形態的離子源100中,藉由使用外部天線31作為電漿生成單元3,可進行基於物種電漿的分佈的電漿分佈的調整,因此可以說外部天線31與真空內的放電電極7的組合是非常有效的結構。 Here, in the case of a large ion source or a strip ion source having a large area, the pressure (vacuum degree) in the plasma chamber and the vacuum degree in the region of the extraction electrode system 4 to which a high voltage is applied are approximately equal because there is no pressure difference due to the large slit conductance of the slit 4x of the extraction electrode system 4. On the other hand, in order to stably apply a high voltage to the extraction electrode system 4, the pressure in the region where the extraction electrode system 4 is installed needs to be set to about 1 mTorr (about 133 mPa) as the upper limit. Under such pressure conditions, when a parallel plate electrode unit arranged at a distance of about several millimeters to about ten millimeters corresponding to the slit 4x of the lead electrode system 4 is used as the plasma generating unit 3, plasma cannot be generated by direct current voltage, and plasma cannot be generated even by normal high-frequency discharge. On the other hand, according to the ion source 100 of this embodiment, at such a low pressure near the lower limit of the discharge capability of the inductively coupled discharge, a plasma-ignited species (species plasma) based on high-frequency plasma can be supplied between the discharge electrode 7 and the extraction electrode system 4, and on the other hand, the plasma density can be increased by using direct current discharge or alternating voltage (high-frequency voltage) of the species plasma, thereby efficiently extracting an ion beam without using a filament. Furthermore, when a parallel plate electrode is used as the plasma generating unit 3, it is almost impossible to adjust the necessary position of the distance between electrodes in a vacuum. However, in the ion source 100 of this embodiment, by using an external antenna 31 as the plasma generating unit 3, the plasma distribution can be adjusted based on the distribution of the species plasma. Therefore, it can be said that the combination of the external antenna 31 and the discharge electrode 7 in a vacuum is a very effective structure.
<其他變形實施形態> 再者,本發明並不限於所述實施形態。 <Other variant implementation forms> Furthermore, the present invention is not limited to the above-mentioned implementation forms.
例如,另一實施形態的離子源100如圖5的(a)所示,亦可包括對天線31與磁場透射窗3w之間的距離進行調整的距離調整機構6。所述距離調整機構6構成為藉由對天線31的多個部位的位置進行調整來部分地調整天線31與磁場透射窗3w之間的距離,具體而言,構成為能夠對天線31的沿著長邊方向的一部分或多個部分的位置進行調整。For example, as shown in FIG5(a), another embodiment of the ion source 100 may also include a distance adjustment mechanism 6 for adjusting the distance between the antenna 31 and the magnetic field transmission window 3w. The distance adjustment mechanism 6 is configured to partially adjust the distance between the antenna 31 and the magnetic field transmission window 3w by adjusting the positions of multiple parts of the antenna 31. Specifically, the distance adjustment mechanism 6 is configured to be able to adjust the position of a part or multiple parts of the antenna 31 along the long side direction.
若更具體地進行說明,則距離調整機構6包括:天線支撐構件61,設置於窗構件33的上表面,對天線31的兩端部進行支撐;多個把持部62,把持天線31的多個部位,並且使所述把持的部位相對於磁場透射窗3w(具體而言為介電板332)移位;以及使該些把持部62獨立地移動的馬達等未圖示的驅動源。To explain more specifically, the distance adjustment mechanism 6 includes: an antenna supporting member 61, which is arranged on the upper surface of the window member 33 and supports the two ends of the antenna 31; a plurality of holding parts 62, which hold a plurality of parts of the antenna 31 and shift the held parts relative to the magnetic field transmission window 3w (specifically, the dielectric plate 332); and a driving source (not shown) such as a motor that moves the holding parts 62 independently.
多個把持部62是與天線31電性絕緣的絕緣物。該些把持部62中的一個把持部62配置於電漿生成容器1的開口1x的中央部的正上方,在相對於所述把持部62沿著天線31的長邊方向的對稱的位置設置有其他把持部62。另外,在本實施形態中,多個把持部62等間隔地配置,自與電漿生成容器1的開口1x正交的方向觀察時,該些均設置於開口1x的內側。The plurality of gripping parts 62 are insulators electrically insulated from the antenna 31. One of the gripping parts 62 is disposed just above the center of the opening 1x of the plasma generating container 1, and other gripping parts 62 are disposed at symmetrical positions relative to the gripping part 62 along the long side direction of the antenna 31. In addition, in the present embodiment, the plurality of gripping parts 62 are disposed at equal intervals, and when viewed from a direction orthogonal to the opening 1x of the plasma generating container 1, they are all disposed on the inner side of the opening 1x.
具體而言,所述把持部62包括:按壓夾具621,將天線31的側面向窗構件33側推壓;以及間隙調整夾具622,以支承於天線31與窗構件33之間的方式設置。所述按壓夾具621構成為,藉由使用例如彈簧材等將天線31始終向窗構件33側按入。間隙調整夾具622構成為,能夠對沿著窗構件33的厚度方向的長度進行調整。此處,間隙調整夾具622為剖面呈橢圓形狀的夾具,且構成為藉由進行旋轉來變更沿著厚度方向的長度,從而對天線31與窗構件33之間的距離進行調整。Specifically, the gripping portion 62 includes: a pressing clamp 621 for pressing the side of the antenna 31 toward the window member 33; and a gap adjusting clamp 622 provided to be supported between the antenna 31 and the window member 33. The pressing clamp 621 is configured to always press the antenna 31 toward the window member 33 using, for example, a spring material. The gap adjusting clamp 622 is configured to be able to adjust the length along the thickness direction of the window member 33. Here, the gap adjusting clamp 622 is a clamp having an elliptical cross-section, and is configured to change the length along the thickness direction by rotating, thereby adjusting the distance between the antenna 31 and the window member 33.
另外,在所述實施形態的離子源100中,遮罩板333形成有多個狹縫333x,藉由形成於所述多個狹縫333x之間的樑狀區域333z對狹縫板331的狹縫331x進行覆蓋,但並不限於此。如圖5的(b)所示,另一實施形態的遮罩板333亦可由呈條狀的金屬板構成。在此情況下,可在面向形成於狹縫板331的多個狹縫331x的各者的位置設置一張或多張遮罩板333。在針對一個狹縫331x而設置多張遮罩板333的情況下,較佳為將該些配置成在厚度方向上彼此高低不同。In addition, in the ion source 100 of the embodiment, the mask plate 333 is formed with a plurality of slits 333x, and the slits 331x of the slit plate 331 are covered by beam-shaped regions 333z formed between the plurality of slits 333x, but the present invention is not limited thereto. As shown in (b) of FIG. 5 , the mask plate 333 of another embodiment may also be formed of a strip-shaped metal plate. In this case, one or more mask plates 333 may be provided at positions facing each of the plurality of slits 331x formed in the slit plate 331. In the case where a plurality of mask plates 333 are provided for one slit 331x, it is preferred that the mask plates 333 be arranged so as to have different heights in the thickness direction.
另外,另一實施形態的離子注入裝置400亦可構成為,根據所引出的離子束IB的電流值對天線31與磁場透射窗3w之間的距離、或高頻電源32的輸出進行調整。具體而言,如圖6所示,離子注入裝置400在質量分析磁鐵210的後段,包括對沿著長邊方向的離子束IB的電流分佈進行監測的電流分佈監視器,且構成為藉由比較運算器對監測到的離子束IB的電流分佈與平均電流密度或均勻性的目標值進行比較,根據其比較結果對天線31與磁場透射窗3w之間的距離、或高頻電源32的輸出進行調整。In addition, another embodiment of the ion implantation device 400 may also be configured to adjust the distance between the antenna 31 and the magnetic field transmission window 3w, or the output of the high-frequency power supply 32, according to the current value of the introduced ion beam IB. Specifically, as shown in FIG6 , the ion implantation device 400 includes a current distribution monitor for monitoring the current distribution of the ion beam IB along the long side direction at the rear end of the mass analysis magnet 210, and is configured to compare the monitored current distribution of the ion beam IB with the target value of the average current density or uniformity through a comparison operator, and adjust the distance between the antenna 31 and the magnetic field transmission window 3w, or the output of the high-frequency power supply 32 according to the comparison result.
另外,在所述實施形態中,放電電極7呈棒狀或直管狀,但並不限於此。如圖7所示,另一實施形態的放電電極7亦可包括夾著離子引出軸線L1而相向配置的彼此平行的一對板狀電極。在此情況下,較佳為以電漿生成容器1為基準電位對放電電極7施加約10 kHz左右或其以下的頻率的交變電壓。而且,在此情況下,較佳為包括對放電電極7的背面及側面(彼此相向的面以外的側面)進行覆蓋的屏蔽構件71。所述屏蔽構件71用於防止放電電極7與電漿產生容器1的內壁面之間的由電壓引起的不必要的放電。所述屏蔽構件71較佳為由耐熱性、加工性及基於氣體種的耐腐蝕性優異的材質構成,例如較佳為包含不鏽鋼、鎢、鉬、鉭或包含該些中的任一種的合金而構成,但並不限於該些。藉由包括此種屏蔽構件71,可針對一對放電電極7之間的放電而有效地利用電力。In addition, in the embodiment, the discharge electrode 7 is in a rod or straight tube shape, but is not limited to this. As shown in FIG7 , the discharge electrode 7 of another embodiment may also include a pair of plate-shaped electrodes that are arranged opposite to each other and are parallel to each other with the ion extraction axis L1 sandwiched therebetween. In this case, it is preferred to apply an alternating voltage of a frequency of about 10 kHz or less to the discharge electrode 7 with the plasma generation container 1 as a reference potential. Moreover, in this case, it is preferred to include a shielding member 71 that covers the back and side surfaces (side surfaces other than the surfaces facing each other) of the discharge electrode 7. The shielding member 71 is used to prevent unnecessary discharge caused by voltage between the discharge electrode 7 and the inner wall surface of the plasma generation container 1. The shielding member 71 is preferably made of a material having excellent heat resistance, workability, and corrosion resistance based on gas species, such as preferably stainless steel, tungsten, molybdenum, tantalum, or an alloy containing any of these, but not limited to these. By including such a shielding member 71, the discharge between the pair of discharge electrodes 7 can be effectively utilized.
另外,在所述實施形態中,磁場透射窗3w形成於電漿生成容器1的後側壁11b,但並不限於此。例如,在另一實施形態中,自長邊方向觀察時,磁場透射窗3w亦可形成於夾著離子引出軸線L1而相向的兩個側壁(橫側壁11c、橫側壁11d)的其中一者或此兩者。In addition, in the above-mentioned embodiment, the magnetic field transmission window 3w is formed on the rear side wall 11b of the plasma generating container 1, but the present invention is not limited thereto. For example, in another embodiment, when viewed from the long side direction, the magnetic field transmission window 3w may also be formed on one or both of the two side walls (lateral side wall 11c, lateral side wall 11d) facing each other with the ion extraction axis L1 sandwiched therebetween.
另外,所述實施形態的離子源100中將高頻電源32以及匹配電路321設置於高電壓部,但並不限於此。另一實施形態的離子源100中亦可將高頻電源32以及匹配電路321設置為接地電位,藉由如此,可有助於降低用於向高電壓部供給電力的絕緣變壓器的容量,進而有助於系統整體的小型化、低成本化及避免因高電壓引起的放電故障時的設備故障。In addition, in the ion source 100 of the embodiment, the high-frequency power supply 32 and the matching circuit 321 are set in the high-voltage part, but the present invention is not limited to this. In another embodiment of the ion source 100, the high-frequency power supply 32 and the matching circuit 321 can also be set to the ground potential, which can help reduce the capacity of the insulating transformer used to supply power to the high-voltage part, thereby helping to miniaturize the entire system, reduce costs, and avoid equipment failures caused by discharge failures due to high voltage.
另外,天線31亦可為在內部形成有能夠供冷卻液流通的流路的中空結構的構件。另外,天線31亦可為包括如下構件的所謂電感電容(inductor capacitor,LC)天線31,即至少兩個導體組件以及與彼此相鄰的導體組件電性串聯連接的作為定量元件的電容器。例如天線31包括三個導體組件以及兩個電容器,各導體組件亦可為在內部形成有供冷卻液流動的直線狀的流路且呈直管狀(具體而言為圓管狀)的相同形狀的構件。各導體組件的材質例如可為銅、鋁、該些的合金或不鏽鋼等金屬等。In addition, the antenna 31 may also be a hollow structure component having a flow path for cooling liquid to flow therein. In addition, the antenna 31 may also be a so-called inductor capacitor (LC) antenna 31 including the following components, namely, at least two conductor components and a capacitor as a quantitative element electrically connected in series with adjacent conductor components. For example, the antenna 31 includes three conductor components and two capacitors, and each conductor component may also be a component of the same shape having a straight flow path for cooling liquid to flow therein and in a straight tube shape (specifically, a round tube shape). The material of each conductor component may be, for example, copper, aluminum, alloys thereof, or metals such as stainless steel.
藉由如此般構成天線31,天線31的合成電抗簡單而言成為自感應性電抗減去電容性電抗後的形式,因此可減少天線31的阻抗。其結果為,即使在延長天線31的情況下亦可抑制其阻抗的增大,高頻電流容易流經天線31,從而可在內部空間1s效率良好地產生感應耦合型的電漿。By configuring the antenna 31 in this way, the composite reactance of the antenna 31 is simply the inductive reactance minus the capacitive reactance, so it is possible to reduce the impedance of the antenna 31. As a result, even when the antenna 31 is extended, the increase in its impedance can be suppressed, and high-frequency current can easily flow through the antenna 31, so that inductively coupled plasma can be efficiently generated in the internal space 1s.
此外,本發明並不限於所述實施形態,當然能夠在不脫離其主旨的範圍內進行各種變形。In addition, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist of the invention.
進而,本說明書的揭示可包括以下的形態1-形態6。Furthermore, the disclosure of this specification may include the following Form 1-Form 6.
(形態1)一種離子源,包括:電漿生成容器,為具有供離子源氣體導入的內部空間的容器,在其一個側壁形成有離子引出口;電漿生成單元,使所述離子源氣體電離而在所述內部空間生成電漿,且包括天線以及磁場透射窗,所述天線設置於所述電漿生成容器的外部並與高頻電源連接而產生高頻磁場,所述磁場透射窗形成於所述電漿生成容器的側壁的面向所述天線的位置,使由所述天線產生的高頻磁場透射至所述內部空間;放電電極,設置於所述內部空間的所述離子引出口的附近;以及引出電極系統,設置於電漿生成容器的外部,將離子束經由所述離子引出口自所述內部空間引出。(Form 1) An ion source, comprising: a plasma generating container, which is a container having an inner space for introducing an ion source gas, and an ion introduction port formed on one side wall thereof; a plasma generating unit, which ionizes the ion source gas to generate plasma in the inner space, and comprises an antenna and a magnetic field transmission window, wherein the antenna is arranged outside the plasma generating container and connected to a high frequency power source to generate a high frequency magnetic field. The invention relates to a plasma generating container comprising a discharge electrode system, a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and an extraction electrode system. The discharge electrode system comprises a discharge electrode system and a discharge ...
若為此種形態,則在不使用突出至電漿生成容器的內部空間的燈絲的情況下藉由設置於電漿生成容器的外部的天線在內部空間產生電漿,因此可減少在電漿生成容器內因濺鍍而受到消耗的零件,可延長維護的週期。 另外,可藉由沿著離子引出口方向延伸的一根天線以及一台高頻電源在內部空間產生大致均勻的電漿,因此可大幅度地減少零件個數,使裝置小型化,並且可減少安裝所需的加工工時或電源的控制點數,從而可抑制製造成本。進而,藉由減少電源數,能夠大幅度地削減電力供給的線材及設備的控制線,從而可使組裝時的配線作業或維護時的拆裝作業變得簡單,可提高作業性。 進而,藉由在離子引出口的附近設置放電電極,可利用在內部空間產生的電漿,在與引出電極系統之間產生直流放電或低頻放電,從而可增加在離子引出口附近生成的電漿密度。 In this form, plasma is generated in the inner space of the plasma generating container by an antenna provided outside the plasma generating container without using a filament protruding into the inner space of the plasma generating container, thereby reducing the number of parts consumed by sputtering in the plasma generating container and extending the maintenance cycle. In addition, a roughly uniform plasma can be generated in the inner space by an antenna extending in the direction of the ion extraction port and a high-frequency power supply, thereby significantly reducing the number of parts, miniaturizing the device, and reducing the processing time required for installation or the number of power supply control points, thereby suppressing the manufacturing cost. Furthermore, by reducing the number of power sources, the number of power supply wires and equipment control wires can be greatly reduced, thereby simplifying the wiring work during assembly and the disassembly work during maintenance, and improving workability. Furthermore, by setting a discharge electrode near the ion extraction port, the plasma generated in the internal space can be used to generate direct current discharge or low-frequency discharge between the extraction electrode system, thereby increasing the plasma density generated near the ion extraction port.
(形態2)如形態1所述的離子源,其中,所述電漿生成容器呈長條狀,在沿著其長邊方向的所述一個側壁形成有所述離子引出口,所述引出電極系統包括設置於面向所述離子引出口的位置的一張或多張板狀的電極,在所述各電極的與所述離子引出口對應的位置,沿著所述長邊方向形成有沿所述各電極的厚度方向貫通的狹縫,所述天線以及所述放電電極呈沿著所述長邊方向伸長的形狀。 若為此種形態,則藉由使天線及放電電極伸長的方向與引出電極系統的狹縫伸長的方向均在長邊方向上一致,而可以藉由在天線中流動高頻電力而產生的電漿為物種在離子引出口附近有效率地生成電漿。 (Form 2) An ion source as described in Form 1, wherein the plasma generation container is in the shape of an elongated strip, the ion extraction port is formed on the one side wall along the long side direction thereof, the extraction electrode system includes one or more plate-shaped electrodes arranged at positions facing the ion extraction port, and slits are formed along the long side direction at positions of each electrode corresponding to the ion extraction port and extending along the thickness direction of each electrode, and the antenna and the discharge electrode are in the shape of being elongated along the long side direction. In this configuration, by making the direction in which the antenna and discharge electrode are extended and the direction in which the slit of the extraction electrode system is extended all coincide with each other in the long-side direction, plasma can be efficiently generated near the ion extraction port using plasma species generated by high-frequency electricity flowing in the antenna.
(形態3)如形態2所述的離子源,其中,自所述長邊方向觀察時,所述放電電極配置於將所述天線與所述離子引出口連結的線上。 若為此種形態,則可藉由使用了一根放電電極的簡易的結構,效率良好地生成電漿。 (Form 3) The ion source as described in Form 2, wherein the discharge electrode is arranged on a line connecting the antenna and the ion extraction port when viewed from the long side. In this form, plasma can be efficiently generated by a simple structure using one discharge electrode.
(形態4)如形態2或3所述的離子源,其中,所述放電電極為在內部形成有供冷卻流體流動的流路的呈管狀的構件。 若為此種形態,則藉由使冷卻流體流動,可抑制放電電極的溫度上升所引起的變形,可穩定地保持放電電極與引出電極等周邊結構物的距離,可穩定地生成電漿並且可使電漿分佈穩定化。 (Form 4) An ion source as described in Form 2 or 3, wherein the discharge electrode is a tubular member having a flow path for cooling fluid to flow therein. In this form, by flowing the cooling fluid, deformation caused by a temperature rise of the discharge electrode can be suppressed, the distance between the discharge electrode and peripheral structures such as an extraction electrode can be stably maintained, plasma can be stably generated, and plasma distribution can be stabilized.
(形態5)如形態2所述的離子源,其中,自所述長邊方向觀察時,所述放電電極包括一對板狀電極,所述一對板狀電極夾著將所述天線與所述離子引出口連結的線而相向配置。 若為此種形態,則藉由以夾著離子引出口的方式配置一對板狀電極,可將所產生的高頻電漿的高密度的區域設定於離子引出口附近,並且可在夾著離子引出口的電極間效率良好地生成電漿。 (Form 5) The ion source as described in Form 2, wherein, when viewed from the long side direction, the discharge electrode includes a pair of plate electrodes, and the pair of plate electrodes are arranged facing each other with the line connecting the antenna and the ion extraction port sandwiched therebetween. In this form, by arranging the pair of plate electrodes so as to sandwich the ion extraction port, a high-density region of the generated high-frequency plasma can be set near the ion extraction port, and plasma can be efficiently generated between the electrodes sandwiching the ion extraction port.
(形態6)如形態5所述的離子源,其中,在所述一對板狀電極各自的背面側配置有屏蔽構件,所述屏蔽構件對所述板狀電極的背面與所述電漿生成容器的內壁之間的放電進行抑制。 由於在離子引出口附近生成的電漿作為離子束被引出,因此較佳為在所述位置有效率地生成電漿。藉由在板狀電極的背面側(即彼此相向的面的背面側)設置屏蔽構件,可抑制板狀電極與電漿生成容器的內壁間的不需要的電漿生成,有效利用電力,在離子引出口附近效率良好地生成電漿。 (Form 6) An ion source as described in Form 5, wherein a shielding member is arranged on the back side of each of the pair of plate-like electrodes, and the shielding member suppresses discharge between the back side of the plate-like electrode and the inner wall of the plasma generating container. Since the plasma generated near the ion extraction port is extracted as an ion beam, it is preferable to efficiently generate plasma at the position. By providing a shielding member on the back side of the plate-like electrode (i.e., the back side of the surfaces facing each other), unnecessary plasma generation between the plate-like electrode and the inner wall of the plasma generating container can be suppressed, and electric power can be effectively used to efficiently generate plasma near the ion extraction port.
1:電漿生成容器 1g:氣體導入孔 1H:離子引出口 1s:內部空間 1x:開口 2:磁鐵 3:電漿生成單元 3w:磁場透射窗 4:引出電極系統 4x:狹縫 5:氣體源 6:距離調整機構 7:放電電極 11a:側壁(前側壁) 11b:後側壁 11c、11d:橫側壁 31:天線 32:高頻電源 33:窗構件 41:電漿電極(板狀電極)(電極) 42:引出電極(板狀電極)(電極) 43:抑制電極(板狀電極)(電極) 44:接地電極(板狀電極)(電極) 61:天線支撐構件 62:把持部 71:屏蔽構件 100:離子源 200:質量分析部 210:質量分析磁鐵 211:狹縫板 220:分析狹縫 300:處理室 310:基板驅動裝置 321:匹配電路 331:狹縫板 331r:流路 331x:狹縫 332:介電板 333:遮罩板 333x:狹縫 333z:樑狀區域 400:離子注入裝置 621:按壓夾具 622:間隙調整夾具 IB:離子束 L1:離子引出軸線 W:基板 1: Plasma generation container 1g: Gas inlet hole 1H: Ion extraction port 1s: Internal space 1x: Opening 2: Magnet 3: Plasma generation unit 3w: Magnetic field transmission window 4: Extraction electrode system 4x: Slit 5: Gas source 6: Distance adjustment mechanism 7: Discharge electrode 11a: Side wall (front side wall) 11b: Rear side wall 11c, 11d: Horizontal side wall 31: Antenna 32: High-frequency power supply 33: Window member 41: Plasma electrode (plate electrode) (electrode) 42: Extraction electrode (plate electrode) (electrode) 43: Suppression electrode (plate electrode) (electrode) 44: Grounding electrode (plate electrode) (electrode) 61: Antenna support member 62: Holding part 71: Shielding member 100: Ion source 200: Mass analysis part 210: Mass analysis magnet 211: Slit plate 220: Analysis slit 300: Processing chamber 310: Substrate drive device 321: Matching circuit 331: Slit plate 331r: Flow path 331x: Slit 332: Dielectric plate 333: Shield plate 333x: Slit 333z: Beam region 400: Ion implantation device 621: Pressing fixture 622: Gap adjustment fixture IB: Ion beam L1: Ion extraction axis W: Substrate
圖1是表示本發明的一實施形態的離子注入裝置的整體結構的示意圖。 圖2是示意性地表示所述實施形態的離子源的結構的橫剖面圖。 圖3是示意性地表示所述實施形態的離子源的結構的縱剖面圖。 圖4的(a)~圖4的(c)是示意性地表示所述實施形態的窗構件的結構的圖,圖4的(a)是橫剖面圖,圖4的(b)是自天線側觀察到的平面圖,圖4的(c)是自內部空間側觀察到的平面圖。 圖5的(a)及圖5的(b)是示意性地表示另一實施形態的窗構件的結構的圖,圖5的(a)是橫剖面圖,圖5的(b)是自內部空間側觀察到的平面圖。 圖6是對另一實施形態的離子注入裝置的電流分佈監視器的功能進行說明的圖。 圖7是示意性地表示另一實施形態的離子源的結構的縱剖面圖。 FIG1 is a schematic diagram showing the overall structure of an ion implantation device of an embodiment of the present invention. FIG2 is a cross-sectional diagram schematically showing the structure of an ion source of the embodiment. FIG3 is a longitudinal cross-sectional diagram schematically showing the structure of an ion source of the embodiment. FIG4 (a) to FIG4 (c) are diagrams schematically showing the structure of a window member of the embodiment, FIG4 (a) is a cross-sectional diagram, FIG4 (b) is a plan view observed from the antenna side, and FIG4 (c) is a plan view observed from the inner space side. FIG. 5 (a) and FIG. 5 (b) are diagrams schematically showing the structure of a window member of another embodiment, FIG. 5 (a) is a cross-sectional view, and FIG. 5 (b) is a plan view observed from the inner space side. FIG. 6 is a diagram for explaining the function of a current distribution monitor of an ion injection device of another embodiment. FIG. 7 is a longitudinal cross-sectional view schematically showing the structure of an ion source of another embodiment.
1:電漿生成容器 1: Plasma generation container
1g:氣體導入孔 1g: Gas inlet hole
1H:離子引出口 1H: ion extraction port
1s:內部空間 1s: Internal space
1x:開口 1x: Open
2:磁鐵 2: Magnet
3:電漿生成單元 3: Plasma generation unit
3w:磁場透射窗 3w: Magnetic field transmission window
4:引出電極系統 4: Lead out electrode system
4x:狹縫 4x: Narrow seam
7:放電電極 7: Discharge electrode
11a:側壁(前側壁) 11a: Side wall (front side wall)
11b:後側壁 11b: posterior wall
11c、11d:橫側壁 11c, 11d: lateral wall
31:天線 31: Antenna
32:高頻電源 32: High frequency power supply
33:窗構件 33: Window components
41:電漿電極(板狀電極)(電極) 41: Plasma electrode (plate electrode) (electrode)
42:引出電極(板狀電極)(電極) 42: Lead-out electrode (plate electrode) (electrode)
43:抑制電極(板狀電極)(電極) 43: Suppression electrode (plate electrode) (electrode)
44:接地電極(板狀電極)(電極) 44: Ground electrode (plate electrode) (electrode)
100:離子源 100:Ion source
321:匹配電路 321: Matching circuit
331:狹縫板 331: Slit board
332:介電板 332: Dielectric board
333:遮罩板 333: Masking board
IB:離子束 IB: Ion beam
L1:離子引出軸線 L1: ion extraction axis
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2023-031892 | 2023-03-02 | ||
JP2023031892A JP2024124014A (en) | 2023-03-02 | 2023-03-02 | Ion source |
Publications (2)
Publication Number | Publication Date |
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TW202437296A true TW202437296A (en) | 2024-09-16 |
TWI884675B TWI884675B (en) | 2025-05-21 |
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WO2024181226A1 (en) | 2024-09-06 |
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