TW202303893A - Electronic device - Google Patents
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- TW202303893A TW202303893A TW111113803A TW111113803A TW202303893A TW 202303893 A TW202303893 A TW 202303893A TW 111113803 A TW111113803 A TW 111113803A TW 111113803 A TW111113803 A TW 111113803A TW 202303893 A TW202303893 A TW 202303893A
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3494—Heating methods for reflowing of solder
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
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Abstract
Description
本發明是有關於一種電子裝置,且特別是有關於一種具有較佳結構可靠度的電子裝置。The present invention relates to an electronic device, and more particularly to an electronic device with better structural reliability.
覆晶封裝(Flip Chip)技術為目前廣泛使用的半導體封裝技術。在覆晶封裝技術中,電子元件通常會通過焊料焊接於基板上。然而,在回焊(reflowing)的過程中,由於焊料會呈現熔融狀態,因此焊料的厚度在回焊過程中不易控制,容易導致設置於基板上的電子元件出現歪斜的情況。如何有效地改善回焊制程所導致的電子元件歪斜等問題,實為研發人員目前亟待解決的問題之一。Flip chip packaging (Flip Chip) technology is currently widely used semiconductor packaging technology. In flip-chip packaging technology, electronic components are usually soldered to a substrate by soldering. However, in the process of reflowing, since the solder will be in a molten state, the thickness of the solder is difficult to control during the reflowing process, which may easily lead to distortion of the electronic components disposed on the substrate. How to effectively improve problems such as the skew of electronic components caused by the reflow process is one of the problems that R&D personnel need to solve urgently.
本發明提供一種電子裝置,其具有較佳結構可靠度。The invention provides an electronic device with better structural reliability.
本發明的電子裝置包括基板、多個第一接墊、電子元件以及第一間隙物。第一接墊設置於基板上。電子元件設置於基板上,且電性連接第一接墊。第一間隙物設置於電子元件與基板之間。The electronic device of the present invention includes a substrate, a plurality of first pads, an electronic component, and a first spacer. The first pad is disposed on the substrate. The electronic component is disposed on the substrate and electrically connected to the first pad. The first spacer is disposed between the electronic component and the substrate.
本發明的電子裝置包括基板、電子元件、多個間隙物以及接墊。電子元件設置於基板上。間隙物設置於電子元件與基板其中的一者上。接墊設置於電子元件與基板其中的另一者上。基板與電子元件通過間隙物與接墊而電性連接。The electronic device of the present invention includes a substrate, an electronic component, a plurality of spacers and pads. The electronic components are arranged on the substrate. The spacer is disposed on one of the electronic component and the substrate. The pad is disposed on the other of the electronic component and the substrate. The substrate and the electronic components are electrically connected through the spacers and the pads.
基於上述,在本揭露的實施例中,間隙物設置於電子元件與基板之間,可有效地控制電子元件與基板之間的間隙高度與均勻性,以防止電子元件產生歪斜。故,本揭露的電子裝置可具有較佳結構可靠度。Based on the above, in the embodiments of the present disclosure, the spacer is disposed between the electronic component and the substrate, which can effectively control the height and uniformity of the gap between the electronic component and the substrate, so as to prevent the electronic component from being skewed. Therefore, the electronic device of the present disclosure can have better structural reliability.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail together with the accompanying drawings.
通過參考以下的詳細描述並同時結合附圖可以理解本揭露,須注意的是,為了使讀者能容易瞭解及為了圖式的簡潔,本揭露中的多張圖式只繪出電子裝置的一部分,且圖式中的特定元件並非依照實際比例繪圖。此外,圖中各元件的數量及尺寸僅作為示意,並非用來限制本揭露的範圍。The present disclosure can be understood by referring to the following detailed description combined with the accompanying drawings. It should be noted that, in order to make the readers understand easily and for the simplicity of the drawings, several drawings in the present disclosure only depict a part of the electronic device. Also, certain elements in the drawings are not drawn to actual scale. In addition, the number and size of each component in the figure are only for illustration, and are not intended to limit the scope of the present disclosure.
本揭露通篇說明書與所附的權利要求中會使用某些詞匯來指稱特定元件。本領域技術人員應理解,電子設備製造商可能會以不同的名稱來指稱相同的元件。本文並不意在區分那些功能相同但名稱不同的元件。Certain terms will be used throughout the specification and appended claims of this disclosure to refer to particular elements. Those skilled in the art should understand that electronic device manufacturers may refer to the same element by different names. This document does not intend to distinguish between those elements that have the same function but have different names.
在下文說明書與權利要求書中,「含有」與「包括」等詞為開放式詞語,因此其應被解釋為「含有但不限定為…」之意。In the description and claims below, words such as "comprising" and "comprising" are open-ended words, so they should be interpreted as meaning "including but not limited to...".
此外,實施例中可能使用相對性的用語,例如「下方」或「底部」及「上方」或「頂部」,以描述圖式的一個元件對於另一元件的相對關係。能理解的是,如果將圖式的裝置翻轉使其上下顛倒,則所敘述在「下方」側的元件將會成為在「上方」側的元件。In addition, relative terms such as "below" or "bottom" and "upper" or "top" may be used in the embodiments to describe the relative relationship of one element to another element in the drawings. It will be appreciated that if the illustrated device is turned over so that it is upside down, elements described as being on the "lower" side will then become elements on the "upper" side.
在本揭露一些實施例中,關於接合、連接之用語例如「連接」、「互連」等,除非特別定義,否則可指兩個結構系直接接觸,或者亦可指兩個結構並非直接(間接)接觸,其中有其它結構設於此兩個結構之間。且此關於接合、連接之用語亦可包括兩個結構都可移動,或者兩個結構都固定之情況。此外,用語「耦合」包含兩個結構之間系通過直接或間接電性連接的手段來傳遞能量,或是兩個分離的結構之間系以相互感應的手段來傳遞能量。In some embodiments of the present disclosure, terms such as “connected” and “interconnected” related to bonding and connection, unless otherwise specified, may mean that two structures are in direct contact, or may also mean that two structures are not directly (indirectly). ) contact with other structures interposed between the two structures. And the terms about joining and connecting may also include the situation that both structures are movable, or both structures are fixed. In addition, the term "coupled" includes the transfer of energy between two structures by means of direct or indirect electrical connection, or the transfer of energy between two separate structures by means of mutual induction.
應瞭解到,當元件或膜層被稱為在另一個元件或膜層「上」或「連接到」另一個元件或膜層時,它可以直接在此另一元件或膜層上或直接連接到此另一元件或膜層,或者兩者之間存在有插入的元件或膜層(非直接情況)。相反地,當元件被稱為「直接」在另一個元件或膜層「上」或「直接連接到」另一個元件或膜層時,兩者之間不存在有插入的元件或膜層。It will be understood that when an element or film is referred to as being "on" or "connected to" another element or film, it can be directly on or directly connected to the other element or film To another element or layer, or there is an intervening element or layer between the two (indirect cases). In contrast, when an element is referred to as being "directly on" or "directly connected to" another element or film, there are no intervening elements or layers present.
術語「大約」、「等於」、「相等」或「相同」、「實質上」或「大致上」一般解釋為在所給定的值或範圍的20%以內,或解釋為在所給定的值或範圍的10%、5%、3%、2%、1%或0.5%以內。The terms "about", "equal", "equal" or "same", "substantially" or "substantially" are generally interpreted as being within 20% of a given value or range, or as being within 20% of a given value or range Within 10%, 5%, 3%, 2%, 1%, or 0.5% of a value or range.
如本文所使用,用語「膜(film)」及/或「層(layer)」可指任何連續或不連續的結構及材料(諸如,借由本文所揭示之方法沉積之材料)。例如,膜及/或層可包括二維材料、三維材料、奈米粒子、或甚至部分或完整分子層、或部分或完整原子層、或原子及/或分子團簇(clusters)。膜或層可包含具有針孔(pinholes)的材料或層,其可以是至少部分連續的。As used herein, the terms "film" and/or "layer" may refer to any continuous or discontinuous structures and materials (such as materials deposited by the methods disclosed herein). For example, films and/or layers may comprise two-dimensional materials, three-dimensional materials, nanoparticles, or even partial or complete molecular layers, or partial or complete atomic layers, or clusters of atoms and/or molecules. The film or layer may comprise a material or layer having pinholes, which may be at least partially continuous.
雖然術語第一、第二、第三…可用以描述多種組成元件,但組成元件並不以此術語為限。此術語僅用於區別說明書內單一組成元件與其他組成元件。權利要求中可不使用相同術語,而依照權利要求中元件宣告的順序以第一、第二、第三…取代。因此,在下文說明書中,第一組成元件在權利要求中可能為第二組成元件。Although the terms first, second, third... may be used to describe various constituent elements, the constituent elements are not limited to this term. This term is only used to distinguish a single constituent element from other constituent elements in the specification. The same terms may not be used in the claims, but are replaced by first, second, third... in the order in which elements are declared in the claims. Therefore, in the following description, a first constituent element may be a second constituent element in the claims.
除非另外定義,在此使用的全部用語(包括技術及科學用語)具有與此篇揭露所屬之一般技藝者所通常理解的相同涵義。能理解的是這些用語,例如在通常使用的字典中定義的用語,應被解讀成具有一與相關技術及本揭露的背景或上下文一致的意思,而不應以一理想化或過度正式的方式解讀,除非在此特別定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It is understood that these terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning consistent with the background or context of the related art and the present disclosure, and not in an idealized or overly formal manner Interpretation, unless specifically defined herein.
須知悉的是,以下所舉實施例可以在不脫離本揭露的精神下,將數個不同實施例中的技術特徵進行替換、重組、混合以完成其他實施例。It should be noted that in the following embodiments, without departing from the spirit of the present disclosure, technical features in several different embodiments may be replaced, reorganized, and mixed to complete other embodiments.
本揭露的電子裝置可包括顯示裝置、天線裝置、感測裝置、發光裝置、或拼接裝置,但不以此為限。電子裝置可包括可彎折或可撓式電子裝置。電子裝置可包括電子元件。電子元件可包括被動元件、主動元件或上述的組合,例如電容、電阻、電感、可變電容、濾波器、二極體、電晶體(transistors)、感應器、微機電系統元件(MEMS)、液晶晶片(liquid crystal chip)等,但不限於此。二極體可包括發光二極體或非發光二極體。二極體包括P-N接面二極體(P-N. Junction diode)、PIN型二極體(PIN Diode)或定電流二極體(Constant Current Diode)。發光二極體可例如包括有機發光二極體(organic light emitting diode,OLED)、次毫米發光二極體(mini LED)、微發光二極體(micro LED)、量子點發光二極體(quantum dot LED)、螢光(fluorescence)、磷光(phosphor)或其他適合之材料、或上述組合,但不以此為限。感應器可例如包括電容式感應器(capacitive sensors)、光學式感應器(optical sensors)、電磁式感應器(electromagnetic sensors)、指紋感應器(fingerprint sensor,FPS)、觸控感應器(touch sensor)、天線(antenna)、或觸控筆(pen sensor)等,但不限於此。下文將以顯示裝置做為電子裝置以說明本揭露內容,但本揭露不以此為限。The electronic device of the present disclosure may include a display device, an antenna device, a sensing device, a light emitting device, or a splicing device, but is not limited thereto. Electronic devices may include bendable or flexible electronic devices. Electronic devices may include electronic components. Electronic components may include passive components, active components, or combinations of the above, such as capacitors, resistors, inductors, variable capacitors, filters, diodes, transistors, inductors, MEMS, liquid crystals Chip (liquid crystal chip), etc., but not limited thereto. Diodes may include light emitting diodes or non-light emitting diodes. Diodes include P-N junction diodes (P-N. Junction diode), PIN type diodes (PIN Diode) or constant current diodes (Constant Current Diode). The light emitting diodes may, for example, include organic light emitting diodes (organic light emitting diodes, OLEDs), submillimeter light emitting diodes (mini LEDs), micro light emitting diodes (micro LEDs), quantum dot light emitting diodes (quantum dot LED), fluorescence (fluorescence), phosphorescence (phosphor) or other suitable materials, or a combination of the above, but not limited thereto. The sensors may, for example, include capacitive sensors, optical sensors, electromagnetic sensors, fingerprint sensors (fingerprint sensor, FPS), touch sensors (touch sensor) , antenna (antenna), or stylus (pen sensor), etc., but not limited thereto. In the following, a display device is used as an electronic device to illustrate the content of the disclosure, but the disclosure is not limited thereto.
現將詳細地參考本揭露的示範性實施例,示範性實施例的實例說明於附圖中。只要有可能,相同元件符號在圖式和描述中用來表示相同或相似部分。Reference will now be made in detail to the exemplary embodiments of the present disclosure, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and descriptions to refer to the same or like parts.
圖1A是本揭露的一實施例的一種電子裝置的俯視示意圖。圖1B是沿圖1A的線I-I的剖面示意圖。為了清楚起見,圖1A中省略繪示圖1B中的焊料150。請同時參考圖1A與圖1B,在本實施例中,電子裝置100a包括基板110、多個第一接墊115(示意地繪示二個)、電子元件120以及第一間隙物130a。第一接墊115設置於基板110上。電子元件120設置於基板110上,且電性連接第一接墊115。第一間隙物130a設置於電子元件120與基板110之間。FIG. 1A is a schematic top view of an electronic device according to an embodiment of the present disclosure. FIG. 1B is a schematic cross-sectional view along line I-I of FIG. 1A . For clarity, the
詳細來說,在本實施例中,基板110包含母板及位於母板上的電路,母板可以是玻璃基板、玻纖(FR4)基板、可撓曲塑膠基板、薄膜電晶體基板、軟性基板或其他適當的母板,但不限於此。電子元件120例如是發光二極體晶片(LED die),它可以是由矽(Si)、砷化鎵(GaAs)、氮化鎵(GaN)、碳化矽(SiC) 、藍寶石(Sapphire)或玻璃基板所製成的晶片,但不限於此。於另一實施例中,晶片亦可以是半導體封裝元件,例如是球格陣列式(Ball Grid Array, BGA)封裝元件、晶片尺寸封裝(Chip Size Package,CSP)元件、覆晶晶片或2.5維/3維(2.5D/3D)半導體封裝元件,但不限於此。於另一實施例中,晶片也可以是任何一種覆晶晶片鍵合元件,例如是集成電路(IC)、電晶體(transistors)、可控矽整流器、閥門(valves)、薄膜電晶體(Thin Film Transistors)、電容、電感、可變電容、濾波器、電阻、二極體、發光二極體、微機電系統元件(MEMS)、液晶晶片(liquid crystal chip)等,但不限於此。本實施例的電子裝置100a還包括多個第二接墊125(示意地繪示二個),設置於電子元件120上,且第二接墊125的個數可對應第一接墊115的個數,第二接墊125的個數亦可與第一接墊115的個數不同。第一接墊115與第二接墊125透過焊料150而結構性且電性連接在一起。意即,本實施例的電子元件120例如是以覆晶的方式接合於基板110上。In detail, in this embodiment, the
特別是,在本實施例中,第一間隙物130a設置於電子元件120與基板110之間,可用以維持電子元件120與基板110之間的間隙高度與均勻性,並支撐電子元件120,以防止電子元件120產生歪斜。第一間隙物130a可製作於電子元件120上、基板110上或電子元件120與基板110上,於此並不加以限制。如圖1A與圖1B所示,第一間隙物130a是設置於第一接墊115之間。In particular, in this embodiment, the
此外,本實施例的電子裝置100a還包括第二間隙物140a,設置於第一接墊115之間。也就是說,第一間隙物130a與第二間隙物140a是設置於電子元件120與基板110之間,且位於第一接墊115之間。此處,第一間隙物130a與第二間隙物140a的材質例如是光刻劑(意即光間隙物(photo spacer))、聚合物(意即聚合物圖案(polymer pattern))、金屬(意即金屬圖案(metal pattern))、薄膜(film)、膠帶(tape)、膠水(glue)或底部填充物(underfill)但不以此為限。In addition, the
簡言之,在本揭露的實施例中,由於第一間隙物130a與第二間隙物140a設置於電子元件120與基板110之間,其中第一間隙物130a與第二間隙物140a可用以支撐電子元件120,並維持電子元件120與基板110之間的間隙高度與均勻性,以防止電子元件120產生歪斜。故,本揭露的電子裝置100a可具有較佳結構可靠度。In short, in the embodiment of the present disclosure, since the
在此須說明的是,下述實施例沿用前述實施例的元件標號與部分內容,其中採用相同的標號來表示相同或近似的元件,並省略相同技術內容的說明。關於省略部分的說明可參考前述實施例,下述實施例不再重複贅述。It should be noted here that the following embodiments use the component numbers and partial content of the previous embodiments, wherein the same numbers are used to denote the same or similar components, and descriptions of the same technical content are omitted. For the description of omitted parts, reference may be made to the foregoing embodiments, and the following embodiments will not be repeated.
圖2A是本揭露的另一實施例的一種電子裝置的俯視示意圖。圖2B是沿圖2A的線II-II的剖面示意圖。為了清楚起見,圖2A中省略繪示圖2B中的焊料150。請同時參考圖1A、圖2A與圖2B,電子裝置100b與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一接墊115設置於第一間隙物130b與第二間隙物140b之間。也就是說,第一間隙物130b與第二間隙物140b位於第一接墊115的相對側。FIG. 2A is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 2B is a schematic cross-sectional view along line II-II of FIG. 2A . For clarity, the
本揭露並不限制第一間隙物130a、第一間隙物130b、第二間隙物140b、與第二間隙物140b的大小、排列方式及其數量。於未繪示的實施例中,第一間隙物與第二間隙物亦可由電子元件與基板之間延伸至電子元件外;或者是,第一間隙物與第二間隙物可為多個,且彼此分離地環繞在第一接墊的周圍,上述皆屬於本揭露所欲保護的範圍。The present disclosure does not limit the size, arrangement and quantity of the
圖3是本揭露的另一實施例的一種電子裝置的俯視示意圖。為了清楚起見,圖3中省略繪示位於第一接墊115與第二接墊125之間的焊料。請同時參考圖1A與圖3,在本實施例中,電子裝置100c與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一間隙物130c的數量為四個,且第一間隙物130c例如為球狀間隙物。如圖3所示,四個第一間隙物130c分別配置於第一接墊115的周圍,且呈對稱設置,但不以此為限。於其他未繪示的實施例中,第一間隙物的數量可例如是2個到10個,且可分散配置於第一接墊的周圍或之間,此仍屬於本揭露所欲保護的範圍。FIG. 3 is a schematic top view of an electronic device according to another embodiment of the present disclosure. For clarity, the solder between the
圖4是本揭露的另一實施例的一種電子裝置的俯視示意圖。為了清楚起見,圖4中省略繪示位於第一接墊115與第二接墊125之間的焊料。請同時參考圖1A與圖4,電子裝置100d與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一間隙物130d的形狀例如是英文字母H型,且環繞第一接墊115的三個側面,其中電子元件120的面積為A1,而第一間隙物130d的面積為A3,則A3 > 0.5A1。也就是說,第一間隙物130d是以大面積的方式配置於電子元件120與基板110之間,以增加支撐力來支撐電子元件120,並維持電子元件120與基板110之間的間隙高度與均勻性,以防止電子元件120產生歪斜。故,本揭露的電子裝置100d可具有較佳結構可靠度。此處,所述的面積為在基板110上的正投影面積。當然,於其他未繪示的實施例中,第一隙物的形狀亦可例如是矩形或其他適當的形狀,於此並不加以限制。FIG. 4 is a schematic top view of an electronic device according to another embodiment of the present disclosure. For clarity, the solder between the
圖5 A是本揭露的另一實施例的一種電子裝置的俯視示意圖。圖5B是沿圖5A的線III-III的剖面示意圖。為了清楚起見,圖5A中省略繪示圖5B中的焊料150。請同時參考圖1A、圖5A與圖5B,電子裝置100e與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一間隙物130e在基板110上的正投影面積大於電子元件120於基板110上的正投影面積。詳細來說,第一間隙物130e的形狀例如是矩形,且具有兩個開孔132。第一接墊115、焊料150及第二接墊125位於開孔132內,且第一間隙物130e環繞且包圍第一接墊115。電子元件120的面積為A1,而第一間隙物130e的面積為A4,則A4 > 0.5A1。也就是說,第一間隙物130e是以大面積的方式配置於電子元件120與基板110之間,以增加支撐力來支撐電子元件120,並維持電子元件120與基板110之間的間隙高度與均勻性,以防止電子元件120產生歪斜。故,本揭露的電子裝置100e可具有較佳結構可靠度。FIG. 5A is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 5B is a schematic cross-sectional view along line III-III of FIG. 5A . For clarity, the
圖6是本揭露的另一實施例的一種電子裝置的剖面示意圖。請同時參考圖1A與圖6,電子裝置100f與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一間隙物130f設置於第一接墊115與第二接墊125之間,其中第一間隙物130f例如是焊球。第一間隙物130f被添加至焊料150內,其中焊料150例如是焊膏,可以以網版列印或噴錫的方式來完成。也就是說,第一間隙物130f被焊料150包覆於其內,以維持電子元件120與基板110之間的間隙高度與均勻性,以防止電子元件120產生歪斜。故,本揭露的電子裝置100f可具有較佳結構可靠度。FIG. 6 is a schematic cross-sectional view of an electronic device according to another embodiment of the present disclosure. Please refer to FIG. 1A and FIG. 6 at the same time, the
圖7是本揭露的另一實施例的一種電子裝置的俯視示意圖。圖7中省略繪示位於第一接墊115g與第二接墊125g之間的焊料。請同時參考圖1A與圖7,電子裝置100g與圖1A的電子裝置100a相似,兩者的差異在於:在本實施例中,第一接墊115g與第二接墊125g的形狀例如為L型,且電子元件120的面積為A1,而第一接墊115g或第二接墊125g的面積為A2,則A2 > 0.3A1。也就是說,本實施例是通過改變第一接墊115g與第二接墊125g的形狀及面積,以增加支撐力來支撐電子元件120,並維持電子元件120與基板110之間的間隙高度與均勻性,以防止電子元件120產生歪斜。故,本揭露的電子裝置100g可具有較佳結構可靠度。FIG. 7 is a schematic top view of an electronic device according to another embodiment of the present disclosure. In FIG. 7 , the solder between the
於其他未繪示的實施例中,第一接墊與第二接墊的形狀例如為矩型,且電子元件的面積為A1,而第二接墊的面積為A2,則A2 > 0.3A1;或者是,第一接墊的個數與第二接墊的個數大於二個,例如是三個或四個等,通過增加接墊的數量來維持電子元件與基板之間的間隙高度與均勻性,並支撐電子元件,使電子元件更穩定以防止歪斜。In other unillustrated embodiments, the shapes of the first pad and the second pad are, for example, rectangular, and the area of the electronic component is A1, and the area of the second pad is A2, then A2 > 0.3A1; Alternatively, the number of the first pads and the number of the second pads are greater than two, such as three or four, etc., by increasing the number of pads to maintain the height and uniformity of the gap between the electronic component and the substrate. Resilience, and support electronic components, making electronic components more stable to prevent skewing.
圖8是本揭露的另一實施例的一種電子裝置的剖面示意圖。請參考圖8,在本實施例中,間隙物130h設置於電子元件120與基板110其中的一者上,而接墊160設置於電子元件120與基板110其中的另一者上。詳細來說,間隙物130h例如是設置於基板110上,而接墊160例如是設置於電子元件120上,其中焊料150h位於間隙物130h與接墊160之間。基板110與電子元件120通過間隙物130h、焊料150h與接墊160而電性連接。此處,每一間隙物130h的高度為H1,而每一接墊160的高度為H2,且焊料150h的高度為H3,且H1>H2>H3。由於間隙物130h的高度H1大於焊料150h的高度H3,因此回焊制程時,不會有過多的熔融態的焊料150h,且間隙物130h可支撐電子元件120,使電子元件120更穩定以防止歪斜。故,本揭露的電子裝置100h可具有較佳結構可靠度。FIG. 8 is a schematic cross-sectional view of an electronic device according to another embodiment of the present disclosure. Please refer to FIG. 8 , in this embodiment, the
基於上述,在本揭露的實施例中,間隙物設置於電子元件與基板之間,可有效地控制電子元件與基板之間的間隙高度與均勻性,以防止電子元件產生歪斜。故,本揭露的電子裝置可具有較佳結構可靠度。Based on the above, in the embodiments of the present disclosure, the spacer is disposed between the electronic component and the substrate, which can effectively control the height and uniformity of the gap between the electronic component and the substrate, so as to prevent the electronic component from being skewed. Therefore, the electronic device of the present disclosure can have better structural reliability.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention should be defined by the scope of the appended patent application.
100a、100b、100c、100d、100e、100f、100g、100h:電子裝置
110:基板
115、115g:第一接墊
120:電子元件
125、125g:第二接墊
130a、130b、130c、130d、130e、130f:第一間隙物
130h:間隙物
132:開孔
140a、140b:第二間隙物
150、150h:焊料
160:接墊
A1、A2、A3、A4:面積
H1、H2、H3:厚度
100a, 100b, 100c, 100d, 100e, 100f, 100g, 100h: electronic device
110:
圖1A是本揭露的一實施例的一種電子裝置的俯視示意圖。 圖1B是沿圖1A的線I-I的剖面示意圖。 圖2A是本揭露的另一實施例的一種電子裝置的俯視示意圖。 圖2B是沿圖2A的線II-II的剖面示意圖。 圖3是本揭露的另一實施例的一種電子裝置的俯視示意圖。 圖4是本揭露的另一實施例的一種電子裝置的俯視示意圖。 圖5 A是本揭露的另一實施例的一種電子裝置的俯視示意圖。 圖5B是沿圖5A的線III-III的剖面示意圖。 圖6是本揭露的另一實施例的一種電子裝置的剖面示意圖。 圖7是本揭露的另一實施例的一種電子裝置的俯視示意圖。 圖8是本揭露的另一實施例的一種電子裝置的剖面示意圖。 FIG. 1A is a schematic top view of an electronic device according to an embodiment of the present disclosure. FIG. 1B is a schematic cross-sectional view along line I-I of FIG. 1A . FIG. 2A is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 2B is a schematic cross-sectional view along line II-II of FIG. 2A . FIG. 3 is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 4 is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 5A is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 5B is a schematic cross-sectional view along line III-III of FIG. 5A . FIG. 6 is a schematic cross-sectional view of an electronic device according to another embodiment of the present disclosure. FIG. 7 is a schematic top view of an electronic device according to another embodiment of the present disclosure. FIG. 8 is a schematic cross-sectional view of an electronic device according to another embodiment of the present disclosure.
100a:電子裝置 100a: electronic device
110:基板 110: Substrate
115:第一接墊 115: The first pad
120:電子元件 120: Electronic components
125:第二接墊 125: Second pad
130a:第一間隙物 130a: first spacer
140a:第二間隙物 140a: second spacer
150:焊料 150: Solder
Claims (10)
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US63/219,832 | 2021-07-09 |
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TW202303893A true TW202303893A (en) | 2023-01-16 |
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