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SE7608971L - Anordning for provning av monsterkort - Google Patents

Anordning for provning av monsterkort

Info

Publication number
SE7608971L
SE7608971L SE7608971A SE7608971A SE7608971L SE 7608971 L SE7608971 L SE 7608971L SE 7608971 A SE7608971 A SE 7608971A SE 7608971 A SE7608971 A SE 7608971A SE 7608971 L SE7608971 L SE 7608971L
Authority
SE
Sweden
Prior art keywords
testing device
monster card
card testing
monster
testing
Prior art date
Application number
SE7608971A
Other languages
English (en)
Other versions
SE412470B (sv
Inventor
G Billet
J Blottiau
Original Assignee
Cit Alcatel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cit Alcatel filed Critical Cit Alcatel
Publication of SE7608971L publication Critical patent/SE7608971L/sv
Publication of SE412470B publication Critical patent/SE412470B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
SE7608971A 1975-08-13 1976-08-11 Sett och anordning for automatisk provning av monster pa tryckta kretskort SE412470B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7525234A FR2321229A1 (fr) 1975-08-13 1975-08-13 Procede et appareillage pour controle automatique de graphisme

Publications (2)

Publication Number Publication Date
SE7608971L true SE7608971L (sv) 1977-02-14
SE412470B SE412470B (sv) 1980-03-03

Family

ID=9159057

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7608971A SE412470B (sv) 1975-08-13 1976-08-11 Sett och anordning for automatisk provning av monster pa tryckta kretskort

Country Status (11)

Country Link
US (1) US4185298A (sv)
JP (1) JPS5223365A (sv)
BE (1) BE844695A (sv)
CH (1) CH609820A5 (sv)
DE (1) DE2635563A1 (sv)
FR (1) FR2321229A1 (sv)
GB (1) GB1515206A (sv)
IE (1) IE43287B1 (sv)
IT (1) IT1067798B (sv)
NL (1) NL7609069A (sv)
SE (1) SE412470B (sv)

Families Citing this family (58)

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FR2420796A1 (fr) * 1978-03-24 1979-10-19 Thomson Csf Systeme de controle d'un dessin inscrit sur un support plan
US4498779A (en) * 1979-01-10 1985-02-12 Rca Corporation Automatic stripe width reader
JPS55132904A (en) * 1979-04-05 1980-10-16 Fuji Electric Co Ltd Shape inspection system
JPS55142254A (en) * 1979-04-25 1980-11-06 Hitachi Ltd Inspecting method for pattern of printed wiring board
DE2934038C2 (de) * 1979-08-23 1982-02-25 Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln Rißfortschritts-Meßeinrichtung
DE2950003C2 (de) * 1979-12-12 1983-08-11 Windmöller & Hölscher, 4540 Lengerich Verfahren zur Regelung der Foliendicke an einer Blasfolien-Extruderanlage
EP0054596B1 (fr) * 1980-12-18 1985-05-29 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre
EP0054598B1 (fr) * 1980-12-18 1985-04-03 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles fixes et équipement de mise en oeuvre
FR2500925A1 (fr) * 1981-03-02 1982-09-03 Atelier Outillage Orleanais Sa Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede
DE3274015D1 (en) * 1981-07-14 1986-12-04 Hitachi Ltd Pattern detection system
DE3151265C2 (de) * 1981-12-24 1984-03-29 Bayerische Motoren Werke AG, 8000 München Prüfverfahren für eine Schraubenverbindung und Vorrichtung zur Durchführung des Verfahrens
US4910401A (en) * 1982-01-20 1990-03-20 The Boeing Company LWIR sensor system with improved clutter rejection
US4500202A (en) * 1982-05-24 1985-02-19 Itek Corporation Printed circuit board defect detection of detecting maximum line width violations
JPS5987607U (ja) * 1982-12-03 1984-06-13 日立電子エンジニアリング株式会社 相互比較方式パタ−ン検査機の位置合せ装置
US4538909A (en) * 1983-05-24 1985-09-03 Automation Engineering, Inc. Circuit board inspection apparatus and method
US4578810A (en) * 1983-08-08 1986-03-25 Itek Corporation System for printed circuit board defect detection
US4600951A (en) * 1983-12-20 1986-07-15 At&T Technologies, Inc. Scanning sample, signal generation, data digitizing and retiming system
US4556903A (en) * 1983-12-20 1985-12-03 At&T Technologies, Inc. Inspection scanning system
US4556317A (en) * 1984-02-22 1985-12-03 Kla Instruments Corporation X-Y Stage for a patterned wafer automatic inspection system
US4618938A (en) * 1984-02-22 1986-10-21 Kla Instruments Corporation Method and apparatus for automatic wafer inspection
JPS60263807A (ja) * 1984-06-12 1985-12-27 Dainippon Screen Mfg Co Ltd プリント配線板のパタ−ン欠陥検査装置
US4648053A (en) * 1984-10-30 1987-03-03 Kollmorgen Technologies, Corp. High speed optical inspection system
JPS61213612A (ja) * 1985-03-19 1986-09-22 Hitachi Ltd プリント基板のパタ−ン検査装置
US4881269A (en) * 1985-07-29 1989-11-14 French Limited Company - Centaure Robotique Automatic method of optically scanning a two-dimensional scene line-by-line and of electronically inspecting patterns therein by "shape-tracking"
JPS62244611A (ja) * 1986-04-18 1987-10-26 Toshiba Mach Co Ltd プラスチツク筒状物成形用プラグ装置
US4905261A (en) * 1989-01-23 1990-02-27 Zane Machine Co. Defrosting grid system testing apparatus
US5125035A (en) * 1989-12-18 1992-06-23 Chromalloy Gas Turbine Corporation Five axis generated hole inspection system
FR2669180A1 (fr) * 1990-11-12 1992-05-15 Axis Vision Sarl Machine d'inspection de composants assembles sur une carte electronique.
JP2500961B2 (ja) * 1990-11-27 1996-05-29 大日本スクリーン製造株式会社 プリント基板の座残り検査方法
US5164785A (en) * 1991-02-08 1992-11-17 Hopkins Manufacturing Corporation Headlight aiming apparatus and display
US5335091A (en) * 1991-12-31 1994-08-02 Eastman Kodak Company Apparatus for mechanically dithering a CCD array
US5331393A (en) * 1992-12-11 1994-07-19 Hopkins Manufacturing Corporation Method and apparatus for locating a specific location on a vehicle headlamp
US5392360A (en) * 1993-04-28 1995-02-21 International Business Machines Corporation Method and apparatus for inspection of matched substrate heatsink and hat assemblies
US5485265A (en) * 1994-09-02 1996-01-16 Hopkins Manufacturing Corporation Vehicle headlight aiming apparatus
EP0718624A3 (en) * 1994-12-19 1997-07-30 At & T Corp Device and method for illuminating transparent and semi-transparent materials
US5831669A (en) * 1996-07-09 1998-11-03 Ericsson Inc Facility monitoring system with image memory and correlation
US6366358B1 (en) * 1996-10-09 2002-04-02 Dai Nippon Printing Co., Ltd. Method and apparatus for detecting stripe defects of printed matter
US6158119A (en) * 1997-07-14 2000-12-12 Motorola, Inc. Circuit board panel test strip and associated method of assembly
US6173071B1 (en) * 1997-12-16 2001-01-09 Harold Wasserman Apparatus and method for processing video data in automatic optical inspection
JPH11271959A (ja) * 1998-03-24 1999-10-08 Oki Electric Ind Co Ltd フォトマスク並びにその良否判定方法及び装置
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
IL133313A (en) * 1999-12-05 2004-12-15 Orbotech Ltd Adaptive tolerance reference inspection system
US7034930B1 (en) * 2000-08-08 2006-04-25 Advanced Micro Devices, Inc. System and method for defect identification and location using an optical indicia device
JP2004510363A (ja) * 2000-08-31 2004-04-02 ライテック　コーポレイション センサおよびイメージングシステム
US7562350B2 (en) * 2000-12-15 2009-07-14 Ricoh Company, Ltd. Processing system and method using recomposable software
US7321699B2 (en) * 2002-09-06 2008-01-22 Rytec Corporation Signal intensity range transformation apparatus and method
US7233871B2 (en) * 2003-03-10 2007-06-19 Landrex Technologies Co., Ltd. Inspection window guard banding
US7504965B1 (en) 2005-08-05 2009-03-17 Elsag North America, Llc Portable covert license plate reader
US7869645B2 (en) * 2008-07-22 2011-01-11 Seiko Epson Corporation Image capture and calibratiion
US8090184B2 (en) * 2008-07-23 2012-01-03 Seiko Epson Corporation Fault detection of a printed dot-pattern bitmap
US8269836B2 (en) * 2008-07-24 2012-09-18 Seiko Epson Corporation Image capture, alignment, and registration
KR101251372B1 (ko) * 2008-10-13 2013-04-05 주식회사 고영테크놀러지 3차원형상 측정방법
USRE43925E1 (en) * 2008-11-21 2013-01-15 Industrial Technology Research Institute Three dimensional profile inspecting apparatus
TWI387721B (zh) * 2008-11-21 2013-03-01 Ind Tech Res Inst 三維形貌檢測裝置
DE102010037788B4 (de) 2010-09-27 2012-07-19 Viprotron Gmbh Verfahren und Vorrichtung zur Anzeige von automatisiert ermittelten Fehlerstellen
US9355444B2 (en) * 2012-09-28 2016-05-31 Skyworks Solutions, Inc. Systems and methods for processing packaged radio-frequency modules identified as being potentially defective
CN103149150B (zh) * 2013-01-31 2015-07-01 厦门大学 一种悬挂式检测台
CN103487442A (zh) * 2013-09-25 2014-01-01 华南理工大学 一种新型挠性电路板缺陷检测装置及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3339076A (en) * 1964-01-13 1967-08-29 Univ Minnesota Dual differential densitometer
NL7409850A (nl) * 1974-07-22 1976-01-26 Philips Nv Werkwijze en inrichting voor het testen van een tweedimensionaal patroon.

Also Published As

Publication number Publication date
IT1067798B (it) 1985-03-16
NL7609069A (nl) 1977-02-15
FR2321229B1 (sv) 1980-02-08
JPS5223365A (en) 1977-02-22
IE43287B1 (en) 1981-01-28
GB1515206A (en) 1978-06-21
FR2321229A1 (fr) 1977-03-11
BE844695A (fr) 1977-01-31
DE2635563A1 (de) 1977-03-03
US4185298A (en) 1980-01-22
SE412470B (sv) 1980-03-03
IE43287L (en) 1977-02-13
CH609820A5 (sv) 1979-03-15

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