KR100865348B1 - 갈륨함유 질화물 단결정의 이종기판상의 형성법 - Google Patents
갈륨함유 질화물 단결정의 이종기판상의 형성법 Download PDFInfo
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- KR100865348B1 KR100865348B1 KR1020037001729A KR20037001729A KR100865348B1 KR 100865348 B1 KR100865348 B1 KR 100865348B1 KR 1020037001729 A KR1020037001729 A KR 1020037001729A KR 20037001729 A KR20037001729 A KR 20037001729A KR 100865348 B1 KR100865348 B1 KR 100865348B1
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- 229910052733 gallium Inorganic materials 0.000 title claims abstract description 161
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 title claims abstract description 158
- 239000013078 crystal Substances 0.000 title claims abstract description 131
- 150000004767 nitrides Chemical class 0.000 title claims abstract description 111
- 238000000034 method Methods 0.000 title claims abstract description 89
- 239000000758 substrate Substances 0.000 title claims abstract description 37
- 230000015572 biosynthetic process Effects 0.000 title description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims abstract description 94
- 229910002601 GaN Inorganic materials 0.000 claims abstract description 61
- 229910021529 ammonia Inorganic materials 0.000 claims abstract description 47
- 239000002904 solvent Substances 0.000 claims abstract description 45
- 229910001413 alkali metal ion Inorganic materials 0.000 claims abstract description 20
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000001301 oxygen Substances 0.000 claims abstract description 6
- 238000002425 crystallisation Methods 0.000 claims description 73
- 230000008025 crystallization Effects 0.000 claims description 73
- 238000004090 dissolution Methods 0.000 claims description 36
- 238000002844 melting Methods 0.000 claims description 29
- 230000008018 melting Effects 0.000 claims description 29
- 229910021431 alpha silicon carbide Inorganic materials 0.000 claims description 19
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 13
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 10
- 230000007547 defect Effects 0.000 claims description 8
- 229910052750 molybdenum Inorganic materials 0.000 claims description 8
- 229910052721 tungsten Inorganic materials 0.000 claims description 8
- 229910003460 diamond Inorganic materials 0.000 claims description 5
- 239000010432 diamond Substances 0.000 claims description 5
- 230000002269 spontaneous effect Effects 0.000 claims description 4
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 claims description 2
- 238000010899 nucleation Methods 0.000 claims description 2
- 239000000470 constituent Substances 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
- -1 gallium nitride compound Chemical class 0.000 abstract description 6
- 239000004065 semiconductor Substances 0.000 abstract description 3
- 239000000243 solution Substances 0.000 description 31
- 229910052751 metal Inorganic materials 0.000 description 23
- 239000002184 metal Substances 0.000 description 23
- 238000010438 heat treatment Methods 0.000 description 12
- 239000000126 substance Substances 0.000 description 12
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 11
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 10
- 238000005192 partition Methods 0.000 description 10
- 238000001816 cooling Methods 0.000 description 9
- 229910052700 potassium Inorganic materials 0.000 description 9
- 239000011591 potassium Substances 0.000 description 9
- 150000001875 compounds Chemical class 0.000 description 8
- 235000011114 ammonium hydroxide Nutrition 0.000 description 7
- 150000002259 gallium compounds Chemical class 0.000 description 7
- 229910003465 moissanite Inorganic materials 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 229910052783 alkali metal Inorganic materials 0.000 description 6
- 150000001340 alkali metals Chemical class 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 239000002243 precursor Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 239000008188 pellet Substances 0.000 description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 4
- 239000011734 sodium Substances 0.000 description 4
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonium chloride Substances [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 3
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 3
- 239000000370 acceptor Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 150000001408 amides Chemical class 0.000 description 3
- 150000001540 azides Chemical group 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 150000004678 hydrides Chemical class 0.000 description 3
- 150000003949 imides Chemical class 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 229910052708 sodium Inorganic materials 0.000 description 3
- 239000000446 fuel Substances 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 229910000765 intermetallic Inorganic materials 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 239000003446 ligand Substances 0.000 description 2
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 238000010956 selective crystallization Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- ZFFBIQMNKOJDJE-UHFFFAOYSA-N 2-bromo-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(Br)C(=O)C1=CC=CC=C1 ZFFBIQMNKOJDJE-UHFFFAOYSA-N 0.000 description 1
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 229920000742 Cotton Polymers 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- KEAYESYHFKHZAL-UHFFFAOYSA-N Sodium Chemical compound [Na] KEAYESYHFKHZAL-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 239000011557 critical solution Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 150000002258 gallium Chemical class 0.000 description 1
- 238000001534 heteroepitaxy Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000005184 irreversible process Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 150000002902 organometallic compounds Chemical class 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000001953 recrystallisation Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000006228 supernatant Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B21/00—Unidirectional solidification of eutectic materials
- C30B21/02—Unidirectional solidification of eutectic materials by normal casting or gradient freezing
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
- C30B7/10—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by application of pressure, e.g. hydrothermal processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0281—Coatings made of semiconductor materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/102—Apparatus for forming a platelet shape or a small diameter, elongate, generally cylindrical shape [e.g., whisker, fiber, needle, filament]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
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- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Luminescent Compositions (AREA)
Abstract
Description
Claims (23)
- 오토클레이브 안에 알칼리 금속이온을 함유하는 초임계 암모니아 용매를 형성하고, 상기 초임계 암모니아 용매에 갈륨함유 공급원료를 용해시키고, 상기 초임계 암모니아 용매에 갈륨함유 공급원료를 용해시킬 때의 온도보다 고온 또는 상기 초임계 암모니아 용매에 갈륨함유 공급원료를 용해시킬 때의 압력보다 저압의 조건에서, 상기 공급원료가 용해된 초임계 용액으로부터 갈륨함유 질화물을, 구성원소에 산소를 포함시키지 않고, a0 축의 격자정수가 2.8∼3.6 인 시드면에 결정시키는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,시드가 체심입방결정계의 Mo,W, 육방최밀충전결정계의 α-Hf, α-Zr, 정방형결정계 다이아몬드, WC구조결정계 WC, W2C, ZnO구조결정계 SiC, TaN, NbN, AlN, 육방체결정(P6/mmm)계 AgB2, AuB2, HfB2,육방체결정(P63/mmc)계 γ-MoC에서 선택되는 1층을 적어도 표면에 가지는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,오토클레이브 내에 온도차를 가지는 적어도 두 개의 영역을 형성하고, 갈륨함유 공급원료를 저온의 용해영역에 배치하고, 시드를 고온의 결정화영역에 배치하는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,갈륨함유 질화물은 AlxGa1-x-y InyN(0≤x<1, 0≤y<1, 0≤x+y<1)인 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,갈륨함유 질화물은 도너, 억셉터 또는 자기성 도프를 함유할 수 있는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,시드가 가지는 갈륨함유 질화물의 결정층의 표면결함밀도는 0~106 /cm2인 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,갈륨함유 질화물의 결정화는 100∼800℃온도에서 행해지는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,갈륨함유 질화물의 결정화는 100∼10000bar의 압력에서 행해지는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,초임계 용매내의 알칼리 금속 이온의 농도는 공급원료 및 갈륨함유 질화물의 특정 용해도를 확보할 수 있도록 조정되는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,초임계 용액내의 다른 성분에 대한 알칼리 금속이온의 몰비를 1:200∼1:2의 범위내로 관리하는 갈륨 함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 오토클레이브내에서 갈륨함유 공급원료를 암모니아와 알칼리 금속이온을 함유하는 초임계 용매에 용해시키고, 갈륨함유 질화물의 용해도가 음 온도계수를 가지는 초임계 용액을 공급하고, 상기 초임계 용액으로부터 갈륨함유 질화물의 용해도의 음온도계수를 이용하여 오토클레이브내로 배치되며, 구성원소에 산소를 포함하지 않는, a0축의 격자정수가 2.8∼3.6 인 시드면에 갈륨 함유 질화물의 결정을 선택적으로 성장시키는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 형성하는 방법.
- 오토클레이브내에 갈륨함유 공급원료를 암모니아와 알칼리 금속이온을 함유하는 초임계 용매에 용해시키고, 갈륨함유 질화물의 용해도가 양(+) 압력계수를 가지는 초임계 용액을 공급하고, 상기 초임계 용액으로부터 갈륨함유 질화물의 용해도의 양압력계수를 이용하여 오토클레이브내로 배치되며, 구성원소에 산소를 포함하지 않는, a0축의 격자정수가 2.8∼3.6 인 시드면에 갈륨 함유 질화물의 결정을 선택적으로 성장시키는 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 형성하는 방법.
- 제 11 항 또는 제 12 항에 있어서,시드가 체심입방결정계인 Mo, W, 육방최밀충전결정계인 α-Hf, α-Zr, 정방형결정계 다이아몬드, WC구조결정계 WC, W2C, ZnO구조결정계 SiC, TaN, NbN, AlN, 육방체결정(P6/mmm)계 AgB2, AuB2, HfB2, 육방체결정(P63/mmc)계 γ-MoC로부터 선택되는 1층을 적어도 표면에 가지는 갈륨 함유 질화물의 벌크 단결정을 이종기판상에 형성하는 방법.
- 제 11 항 또는 제 12 항에 있어서,상기 갈륨함유 질화물이 질화갈륨인 것을 특징으로 하는 갈륨 함유 질화물의 단결정을 이종기판상에 형성하는 방법.
- 오토클레이브 내에서 갈륨함유 공급원료를 암모니아와 알칼리 금속이온을 함유하는 초임계 용매에 용해시키고, 갈륨함유 질화물의 용해도가 음의 온도계수를 가지는 초임계 용액을, 적어도 오토클레이브내의 구성원소에 산소를 포함하지 않고, a0축의 격자정수가 2.8∼3.6 인 시드면을 가지는 시드가 배치된 영역에서, 상기 초임계 용매에 갈륨함유 공급원료를 용해시킬 때의 온도보다 높은 온도로 상승시키거나 또는 상기 초임계 용매에 갈륨함유 공급원료를 용해시킬 때의 압력보다 낮은 압력으로 저하시켜 초임계용액의 용해도를 상기 시드에 대한 과포화 영역으로서 자발적 결정화가 일어나지 않는 농도 이하로 조절하여 오토클레이브 내에 배치된 상기 시드면에 갈륨함유 질화물의 결정을 선택적으로 성장시키는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 결정화시키는 방법.
- 제 15 항에 있어서,오토클레이브내에 용해영역과 결정화영역이라는 두 개의 영역을 형성하고, 시드에 대한 초임계용액의 과포화 관리를 용해온도와 결정화온도의 조정에 의하여 행하는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 결정화시키는 방법.
- 제 15 항에 있어서,결정화영역의 온도를 400∼600℃의 온도로 설정하는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 결정화시키는 방법.
- 제 15 항에 있어서,오토클레이브내에 용해영역과 결정화영역이라는 두 개의 영역을 형성하고, 영역간의 온도차를 1℃~150℃로 유지하는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 결정화시키는 방법.
- 제 15 항에 있어서,오토클레이브내에 특정의 온도차를 가지는 용해영역과 결정화영역이라는 두 개의 영역을 형성하고, 구성원소에 산소를 포함하지 않으며, a0축의 격자정수가 2.8∼3.6 인 시드면을 가지는 시드에 대한 초임계 용액의 과포화 조정은, 시드의 총면적을 상회하는 총면적을 가지는 GaN 결정으로서 투여되는 갈륨함유 공급원료를 이용함으로서 행해지는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 결정화시키는 방법.
- 제 1 항에 있어서,상기 시드가 체심입방결정계 또는 면심입방결정계의 결정구조를 가지며, [1, 1, 1]방향으로 잘라 내져 있는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 이종기판상에 성장시키는 방법.
- 제 1 항에 있어서,상기 시드가 도전성을 가지는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 이종기판상에 형성시키는 방법.
- 제 21 항에 있어서,상기 시드가, α-SiC, Mo, W로부터 선택되는 층을 적어도 표면에 가지는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 이종기판상에 형성시키는 방법.
- 제 1 항에 있어서,상기 시드의 양면에 상기 갈륨함유 질화물을 결정화시키는 것을 특징으로 하는 갈륨함유 질화물의 단결정을 이종기판상에 형성시키는 방법.
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