JPS57108766A - Multi-wavelength spectroscope - Google Patents
Multi-wavelength spectroscopeInfo
- Publication number
- JPS57108766A JPS57108766A JP18843680A JP18843680A JPS57108766A JP S57108766 A JPS57108766 A JP S57108766A JP 18843680 A JP18843680 A JP 18843680A JP 18843680 A JP18843680 A JP 18843680A JP S57108766 A JPS57108766 A JP S57108766A
- Authority
- JP
- Japan
- Prior art keywords
- filter
- substrate
- wavelengths
- light receiving
- wide range
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- 238000001228 spectrum Methods 0.000 abstract 2
- 102100025490 Slit homolog 1 protein Human genes 0.000 abstract 1
- 101710123186 Slit homolog 1 protein Proteins 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To measure at a time a wide range of wavelengths, by setting a filter that has different properties according to the areas on a substrate in front of the light receiving surface of a 1-dimensional image pickup element. CONSTITUTION:The incident beam passed through an incident slit 1 is supplied to a 1-dimensional image pickup element 6 via a collimator mirror 2, a plane diffraction grating 3, a camera mirror 4 and a filter 5 respectively. The filter 5 is a BPF formed on a substrate and disposed on the light receiving suface of the element 6. Furthrmore the filter 5 has different transmission properties at the long and short wavelength sides of a spectrum image, and the transmission property differs according to the area so that the short wavelength side has a shorter transmission wavelength than the long wavelength side. Such filter is formed on a substrate to cut the undesired beams at each point on the surface of a spectrum image. Thus a wide range of wavelengths can be measured at a time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18843680A JPS57108766A (en) | 1980-12-26 | 1980-12-26 | Multi-wavelength spectroscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18843680A JPS57108766A (en) | 1980-12-26 | 1980-12-26 | Multi-wavelength spectroscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57108766A true JPS57108766A (en) | 1982-07-06 |
JPS6341411B2 JPS6341411B2 (en) | 1988-08-17 |
Family
ID=16223638
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18843680A Granted JPS57108766A (en) | 1980-12-26 | 1980-12-26 | Multi-wavelength spectroscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57108766A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5989245U (en) * | 1982-12-08 | 1984-06-16 | 日本ジヤ−レル・アツシユ株式会社 | Interference spectrum removal mechanism of spectrometer |
JPS59131123A (en) * | 1983-01-17 | 1984-07-27 | Union Giken:Kk | Spectrophotometer |
FR2588656A1 (en) * | 1985-10-16 | 1987-04-17 | Bertin & Cie | OPTICAL FIBER SPECTRO COLORIMETRY APPARATUS |
JPH0372226A (en) * | 1989-08-12 | 1991-03-27 | Res Dev Corp Of Japan | Highly sensitive multi-wavelength spectroscope |
JP2021071651A (en) * | 2019-10-31 | 2021-05-06 | キヤノン株式会社 | Optical system, and imaging apparatus and imaging system equipped with the same |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5339784A (en) * | 1976-09-23 | 1978-04-11 | Ibm | Spectrophotometer |
JPS5439650A (en) * | 1977-09-04 | 1979-03-27 | Ritsuo Hasumi | Wide band light wave analyzer |
JPS54141149A (en) * | 1978-04-24 | 1979-11-02 | Nec Corp | Interference filter |
-
1980
- 1980-12-26 JP JP18843680A patent/JPS57108766A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5339784A (en) * | 1976-09-23 | 1978-04-11 | Ibm | Spectrophotometer |
JPS5439650A (en) * | 1977-09-04 | 1979-03-27 | Ritsuo Hasumi | Wide band light wave analyzer |
JPS54141149A (en) * | 1978-04-24 | 1979-11-02 | Nec Corp | Interference filter |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5989245U (en) * | 1982-12-08 | 1984-06-16 | 日本ジヤ−レル・アツシユ株式会社 | Interference spectrum removal mechanism of spectrometer |
JPS59131123A (en) * | 1983-01-17 | 1984-07-27 | Union Giken:Kk | Spectrophotometer |
FR2588656A1 (en) * | 1985-10-16 | 1987-04-17 | Bertin & Cie | OPTICAL FIBER SPECTRO COLORIMETRY APPARATUS |
US4758085A (en) * | 1985-10-16 | 1988-07-19 | Bertin & Cie | Optical fiber spectrometer/colorimeter apparatus |
JPH0372226A (en) * | 1989-08-12 | 1991-03-27 | Res Dev Corp Of Japan | Highly sensitive multi-wavelength spectroscope |
JP2021071651A (en) * | 2019-10-31 | 2021-05-06 | キヤノン株式会社 | Optical system, and imaging apparatus and imaging system equipped with the same |
Also Published As
Publication number | Publication date |
---|---|
JPS6341411B2 (en) | 1988-08-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69523524T2 (en) | Tunable two-beam spectrometer | |
US2708389A (en) | Spectral wedge interference filter combined with purifying filters | |
US3791737A (en) | Spectrometer in which a desired number of spectral lines are focused at one fixed output slit | |
US4320967A (en) | Apparatus for measuring a radiation affecting parameter of a film or coating | |
DE3706833A1 (en) | METHOD FOR FABRY PEROT SPECTROSCOPY AND SPECTROSCOPE WORKING WITH THIS METHOD | |
JPS6415931A (en) | Manufacture of semiconductor device | |
JPS57108766A (en) | Multi-wavelength spectroscope | |
DE3685631T2 (en) | ABSORPTION METER FOR DETERMINING THE THICKNESS, MOISTURE OR OTHER PARAMETERS OF A FILM OR COATING. | |
KR930017251A (en) | Apparatus for fabricating a diffraction grating lying on a surface-emission distributed feedback semiconductor laser diode device | |
EP1178281B1 (en) | Method for the determination of the optical thickness of coatings | |
JPS56119822A (en) | Multichannel spectral radiometer | |
DE3737426A1 (en) | INTERFEROMETER | |
US4140399A (en) | Monochromator for simultaneous selection and utilization of two wave-lengths | |
JPS5529824A (en) | Photo branching filter | |
JPS6422080A (en) | Distributed feedback type laser | |
JPS5640804A (en) | Optical branching filter | |
CA2100897A1 (en) | Polarization Detector | |
JPS57108740A (en) | Device to obtain beam having optional wavelength distribution | |
JPS56137230A (en) | Spectral measurement device | |
JPS566126A (en) | Multiple diffraction type spectroscope | |
JPS5472068A (en) | Optical processor | |
DE69619184T2 (en) | Beam splitter in the form of a diamond optical plate | |
JPS56125638A (en) | Multiwavelength spectral radiometer | |
SU1154527A1 (en) | Multiple-reflection interferometer | |
JPS5362992A (en) | Oscillation wavelength stabilization method of semiconductor laser |