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JPS5563768A - Threshold voltage measuring instrument - Google Patents

Threshold voltage measuring instrument

Info

Publication number
JPS5563768A
JPS5563768A JP13770178A JP13770178A JPS5563768A JP S5563768 A JPS5563768 A JP S5563768A JP 13770178 A JP13770178 A JP 13770178A JP 13770178 A JP13770178 A JP 13770178A JP S5563768 A JPS5563768 A JP S5563768A
Authority
JP
Japan
Prior art keywords
counter
measured
output
threshold voltage
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13770178A
Other languages
Japanese (ja)
Inventor
Hiroshi Tsukada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP13770178A priority Critical patent/JPS5563768A/en
Publication of JPS5563768A publication Critical patent/JPS5563768A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To perform an accurate and simple measurement of a threshold voltage by so constructing that, an element to be measured is provided at its input side with a counter and at its input and/or output sides with comparators.
CONSTITUTION: The up/down counter 10 holds a proper initial value. A start signal from the start switch 17 allows the counter 10 to start counting pluses from the clock pulse generater 20, superimposing them on the initial value. The output from the counter 10 is converted by the D/A converter 30 to an analogue quantity, amplified 40 as required, and enters the device to be measured 50. The comparator 62 compares the output voltage VOUT from the device to be measured 50 with the reference voltage VREF. If the output voltage VOUT exceeds the reference voltage VRFE, the comparator 62 immediately signals to stop the counter. Thus, this signal permits the counter 10 to stop counting and the voltmeter 80 to indicate the input voltage VIN of the element to be measured 50.
COPYRIGHT: (C)1980,JPO&Japio
JP13770178A 1978-11-08 1978-11-08 Threshold voltage measuring instrument Pending JPS5563768A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13770178A JPS5563768A (en) 1978-11-08 1978-11-08 Threshold voltage measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13770178A JPS5563768A (en) 1978-11-08 1978-11-08 Threshold voltage measuring instrument

Publications (1)

Publication Number Publication Date
JPS5563768A true JPS5563768A (en) 1980-05-14

Family

ID=15204786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13770178A Pending JPS5563768A (en) 1978-11-08 1978-11-08 Threshold voltage measuring instrument

Country Status (1)

Country Link
JP (1) JPS5563768A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221078A (en) * 1985-07-19 1987-01-29 Yokogawa Hewlett Packard Ltd Apparatus for measuring characteristics of circuit element
JPS63138281A (en) * 1986-11-29 1988-06-10 Ando Electric Co Ltd Threshold value measuring instrument
JPH0511016A (en) * 1991-07-04 1993-01-19 Sharp Corp Integrated circuit inspecting device
JP2011516904A (en) * 2008-02-11 2011-05-26 クォルコム・メムズ・テクノロジーズ・インコーポレーテッド Method and apparatus for detection, measurement or characterization of display elements integrated with a display drive mechanism, and systems and applications using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53125771A (en) * 1977-04-08 1978-11-02 Toshiba Corp Measuring unit for semiconductor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53125771A (en) * 1977-04-08 1978-11-02 Toshiba Corp Measuring unit for semiconductor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6221078A (en) * 1985-07-19 1987-01-29 Yokogawa Hewlett Packard Ltd Apparatus for measuring characteristics of circuit element
JPS63138281A (en) * 1986-11-29 1988-06-10 Ando Electric Co Ltd Threshold value measuring instrument
JPH0511016A (en) * 1991-07-04 1993-01-19 Sharp Corp Integrated circuit inspecting device
JP2011516904A (en) * 2008-02-11 2011-05-26 クォルコム・メムズ・テクノロジーズ・インコーポレーテッド Method and apparatus for detection, measurement or characterization of display elements integrated with a display drive mechanism, and systems and applications using the same

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