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JPH0244702A - Resistance regulation method for thick film hybrid integrated circuit - Google Patents

Resistance regulation method for thick film hybrid integrated circuit

Info

Publication number
JPH0244702A
JPH0244702A JP63195607A JP19560788A JPH0244702A JP H0244702 A JPH0244702 A JP H0244702A JP 63195607 A JP63195607 A JP 63195607A JP 19560788 A JP19560788 A JP 19560788A JP H0244702 A JPH0244702 A JP H0244702A
Authority
JP
Japan
Prior art keywords
resistance value
resistance
resistors
resistor
cutting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63195607A
Other languages
Japanese (ja)
Inventor
Toshiaki Kumabayashi
熊林 敏明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP63195607A priority Critical patent/JPH0244702A/en
Publication of JPH0244702A publication Critical patent/JPH0244702A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/16Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor

Landscapes

  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Abstract

PURPOSE:To broaden the regulation range of a resistance and to facilitate the regulation by connecting a plurality of resistors in series, short-circuiting both end resistors by the use of a conductor pattern, and cutting the pattern. CONSTITUTION:In a thick film hybrid integrated circuit, a plurality of resistors 2a-2c are connected in series, the resistors 2a, 2c of both ends of them are short-circuited by a conductor pattern 1, and the printed resistors are trimmed in combination by cutting the pattern 1. For example, if there is possibility that the resistance value or the shape of the resistor (the ratio of the length: the width) is altered, a cutting part 3 is so cut that the resistance vale (R1+R2) between A-B becomes a predetermined value R. If a target resistance value cannot be obtained by this regulating method so that the resistance value becomes high, the resistor R3 is shortcircuited by omitting the cutting of the conductor cutting part 4, and the part 3 of the resistor 2b is cut to be regulated, thereby reducing the resistance value only by the resistance value R3 of the resistor 2c. Thus, the regulation range of the resistance by trimming is broadened to facilitate the regulation.

Description

【発明の詳細な説明】 A、産業上の利用分野 この発明は厚膜混成集積回路の抵抗調整方法に関する。[Detailed description of the invention] A. Industrial application field The present invention relates to a method for adjusting the resistance of a thick film hybrid integrated circuit.

B1発明の概要 この発明は厚膜混成集積回路の抵抗調整方法において、 複数の抵抗体を直列に接続し、そのうちの両端の導体パ
ターンで短絡し、その導体パターンを切断することによ
り、 抵抗の調整範囲を広くして調整を容易にしたものである
B1 Summary of the Invention This invention provides a method for adjusting the resistance of a thick film hybrid integrated circuit, in which a plurality of resistors are connected in series, the conductor patterns at both ends are short-circuited, and the conductor patterns are cut. It has a wide range and is easy to adjust.

C1従来の技術 厚膜混成集積回路において、抵抗値を調整する方法とし
てレーザーによって抵抗体を切断して調整するレーザー
トリミング法(以下単にトリミングと呼ぶ)がよく用い
られている。第4図は従来のトリミングの例で、図中、
1は導体パターン、2は抵抗体、3はレーザーによりカ
ットした逆り字状のカット部である。なお、図中のA−
8間の抵抗値はトリミングによりR2となっているもの
とする。
C1 Prior Art In thick film hybrid integrated circuits, a laser trimming method (hereinafter simply referred to as trimming) is often used to adjust the resistance value by cutting the resistor with a laser. Figure 4 shows an example of conventional trimming.
1 is a conductor pattern, 2 is a resistor, and 3 is an inverted cut portion cut by a laser. In addition, A- in the figure
It is assumed that the resistance value between 8 and 8 is R2 due to trimming.

トリミングによって抵抗値を高(することはできるが、
ひく(することはできないので、所定の値例えばRとす
ると、このRよりも低い抵抗値となるように設計(例え
ばRの40〜60%)し、トリミングによりR2の値を
Rに近づけるのが−り8発明が解決しようとする課題 上記のような調整方法では次に示すような問題点がある
Although it is possible to increase the resistance value by trimming,
(Since it is not possible to subtract the value, it is best to design the resistance value to be lower than this R (for example, 40 to 60% of R) and make the value of R2 closer to R by trimming. -8 Problems to be Solved by the Invention The adjustment method described above has the following problems.

(1)印刷抵抗のばらつき、あるいはレーザーによる切
り過ぎなどで、所定の値よりも高くなったとき、抵抗値
を低くできない。
(1) If the resistance value becomes higher than a predetermined value due to variations in printed resistance or excessive laser cutting, the resistance value cannot be lowered.

(2)設計上あるいは製造上の原因で前記所定の値Rよ
りかなり低くなったため、トリミングだけでは調整がで
きないときがある。
(2) Because the value R is considerably lower than the predetermined value R due to design or manufacturing reasons, it may not be possible to adjust it by trimming alone.

上記のような場合、すでに印刷済みの回路基板は全て破
棄して作り直さなければならないため、その損失は多大
なものとなる。
In the above case, all printed circuit boards must be discarded and remade, resulting in a significant loss.

この発明は上記の事情に鑑みてなされたもので、トリミ
ングによる抵抗の調整範囲を広くしてその調整を容易に
できるようにした厚膜混成集積回路の抵抗調整方法を提
供することを目的とする。
The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a method for adjusting the resistance of a thick film hybrid integrated circuit, which widens the adjustment range of the resistance by trimming and facilitates the adjustment. .

81課題を解決するための手段 この発明は厚膜混成集積回路において、複数の抵抗体を
直列に接続し、そのうちの両端の抵抗体を導体パターン
で短絡し、その導体パターンを切断する組み合わせによ
って印刷抵抗体のトリミングを行うことを特徴とするも
のである。
81 Means for Solving the Problems This invention is a thick film hybrid integrated circuit, in which a plurality of resistors are connected in series, the resistors at both ends are short-circuited with a conductor pattern, and the conductor pattern is cut. This method is characterized by trimming the resistor.

F5作用 抵抗値が所定の値よりも高くなったとき、導体パターン
の切断部の切断を止め5.抵抗値が低くなったとき、導
体パターンの切断を行って所定の抵抗値にする。
When the F5 action resistance value becomes higher than a predetermined value, stop cutting the cut portion of the conductor pattern5. When the resistance value becomes low, the conductor pattern is cut to reach a predetermined resistance value.

G、実施例 以下この発明の一実施例を図面に基づいて説明する。G. Example An embodiment of the present invention will be described below based on the drawings.

第1図から第3図はこの発明による抵抗値の調整方法を
説明するもので、図中の1は導体パターン、2a、2b
、2cは抵抗体(図中斜線部分)である。なお、抵抗体
の値を各々R1,R2,R3とする。3は抵抗体2bを
レーザーにより切断した逆り字状のカット部である。4
と5は導体パターンをレーザーにより切断した導体カッ
ト部である。
1 to 3 explain the method of adjusting the resistance value according to the present invention, 1 in the figure is a conductor pattern, 2a, 2b
, 2c is a resistor (shaded portion in the figure). Note that the values of the resistors are R1, R2, and R3, respectively. Reference numeral 3 designates an inverted cut portion obtained by cutting the resistor 2b with a laser. 4
and 5 are conductor cut portions obtained by cutting the conductor pattern with a laser.

上記実施例において、まず、抵抗値又は抵抗体の形状(
長さ二輪の比)が変更される可能性のある場合には、予
め第1図に示すパターンに形成する。第1図は導体パタ
ーン1が導体カット部4にて切断されているので、A−
8間の抵抗値はR1+R2の和になる。この抵抗値が所
定の値Rとなるようにカット部3の切断を行う。厚膜混
成集積るかをチエツクする。この調整方法により目的の
抵抗値が得られれば全ての部品を、この方法で行うが、
この調整方法で目的の抵抗値が得られないで高くなって
しまった場合には次のようにして調整する。
In the above embodiment, first, the resistance value or the shape of the resistor (
If there is a possibility that the length (ratio of two wheels) may be changed, the pattern shown in FIG. 1 is formed in advance. In FIG. 1, the conductor pattern 1 is cut at the conductor cut portion 4, so A-
The resistance value between 8 is the sum of R1+R2. The cut portion 3 is cut so that this resistance value becomes a predetermined value R. Check for thick film mixed accumulation. If the desired resistance value can be obtained using this adjustment method, all parts will be adjusted using this method.
If the desired resistance value cannot be obtained with this adjustment method and becomes high, adjust it as follows.

(1)抵抗値が所定の値よりも高くなったときには、第
1図に示す導体カット部4の切断を省略すると、抵抗体
R3は短絡状態になる。第2図がこの状態を示すパター
ンで、この第2図においては、A−8間の抵抗値が所定
の値Rとなるように抵抗体2b部分のカット部3を切断
して調整する。
(1) When the resistance value becomes higher than a predetermined value, if the cutting of the conductor cut portion 4 shown in FIG. 1 is omitted, the resistor R3 becomes short-circuited. FIG. 2 shows a pattern showing this state. In FIG. 2, the resistance value between A and 8 is adjusted by cutting the cut portion 3 of the resistor 2b so that it becomes a predetermined value R.

このようにして調整すれば抵抗体2cの抵抗値R3だけ
抵抗値が低くできる。
By adjusting in this way, the resistance value can be lowered by the resistance value R3 of the resistor 2c.

(2)上記の調整方法で抵抗値が低すぎて、トリミング
だけでは調整不能のときは、第3図に示すように導体カ
ット部4.5にて導体パターンをカットする。これによ
り、A−8間の抵抗値はR1+R2+R3となって所定
の値Rになる。このときの抵抗値は第1図に比較してR
1の分だけ抵抗値が高くなる。
(2) If the resistance value is too low by the above adjustment method and cannot be adjusted by trimming alone, the conductor pattern is cut using the conductor cutting section 4.5 as shown in FIG. As a result, the resistance value between A-8 becomes R1+R2+R3, which is a predetermined value R. The resistance value at this time is R compared to that in Figure 1.
The resistance value increases by 1.

上述のように実施すれば、従来のトリミングでは、所定
の値Rを越えたとき、抵抗値を低くできな(なり、また
、Rよりも非常に低い抵抗値のときも、トリミングだけ
では調整不良となる。例えばRの40%で設計すると、
トリミングによる調整範囲は0.4R−Rとなるが、こ
の発明の実施例では、第1図に示すようにR2+R3で
所定の値をRを得るのを基本として、上記(1)、(2
)の調整方法を行うことにより、抵抗の調整範囲は、(
R2+R3) −R3〜R] + (R2+R3)にな
り、調整範囲が広くなる。またトリミングによりR2の
値を調整できるので、更に調整範囲を広くできる。
If carried out as described above, conventional trimming will not be able to lower the resistance value when it exceeds a predetermined value R (also, even if the resistance value is much lower than R, trimming alone will result in poor adjustment). For example, when designing with 40% of R,
The adjustment range by trimming is 0.4R-R, but in the embodiment of the present invention, as shown in FIG.
), the resistance adjustment range is (
R2+R3) -R3~R] + (R2+R3), and the adjustment range becomes wider. Furthermore, since the value of R2 can be adjusted by trimming, the adjustment range can be further widened.

H8発明の効果 以上述べたように、この発明によれば、抵抗値の調整範
囲を非常に広くできるとともに抵抗値も低くできる利点
がある。また、厚膜混成集積回路を印刷後も、柔軟に抵
抗値の変更に対処できるので、再度作り直さなくてもす
み、製造コストと納期に影響を与えない利点もある。さ
らにトリミング装置のプログラムを変更するだけである
から、特別な設備や、製造工程を必要としないので実用
上極めて有益である。
Effects of the H8 Invention As described above, the present invention has the advantage that the adjustment range of the resistance value can be made very wide and the resistance value can also be made low. Furthermore, even after printing the thick-film hybrid integrated circuit, it is possible to flexibly change the resistance value, so there is no need to remake it again, which has the advantage of not affecting manufacturing costs and delivery times. Furthermore, since only the program of the trimming device is changed, no special equipment or manufacturing process is required, which is extremely useful in practice.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図から第3図はこの発明の一実施例を示す抵抗値の
調整方法を説明する構成図、第4図は従来例における抵
抗値を調整するためのトリミングを示す説明図である。 1・・・導体パターン、2a、  2b、  2c・・
・抵抗体、3・・・逆り字状のカット部、4・・・導体
カット部。 第1図 実施例の構成図 第2図 実施例の構成図 a D c  l
1 to 3 are block diagrams illustrating a method for adjusting a resistance value according to an embodiment of the present invention, and FIG. 4 is an explanatory diagram showing trimming for adjusting a resistance value in a conventional example. 1... Conductor pattern, 2a, 2b, 2c...
- Resistor, 3... Inverted cut part, 4... Conductor cut part. Figure 1: Configuration diagram of the embodiment Figure 2: Configuration diagram of the embodiment a D c l

Claims (1)

【特許請求の範囲】[Claims] (1)厚膜混成集積回路において、複数の抵抗体を直列
に接続し、そのうちの両端の抵抗体を導体パターンで短
絡し、その導体パターンを切断する組み合わせによって
印刷抵抗体のトリミングを行うことを特徴とする厚膜混
成集積回路の抵抗調整方法。
(1) In thick film hybrid integrated circuits, printed resistors are trimmed by connecting multiple resistors in series, shorting the resistors at both ends with a conductor pattern, and cutting the conductor pattern. A method for adjusting the resistance of thick film hybrid integrated circuits.
JP63195607A 1988-08-05 1988-08-05 Resistance regulation method for thick film hybrid integrated circuit Pending JPH0244702A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63195607A JPH0244702A (en) 1988-08-05 1988-08-05 Resistance regulation method for thick film hybrid integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63195607A JPH0244702A (en) 1988-08-05 1988-08-05 Resistance regulation method for thick film hybrid integrated circuit

Publications (1)

Publication Number Publication Date
JPH0244702A true JPH0244702A (en) 1990-02-14

Family

ID=16343972

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63195607A Pending JPH0244702A (en) 1988-08-05 1988-08-05 Resistance regulation method for thick film hybrid integrated circuit

Country Status (1)

Country Link
JP (1) JPH0244702A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999018656A1 (en) * 1997-10-02 1999-04-15 Mitsubishi Denki Kabushiki Kaisha Voltage regulating device
JP2016066743A (en) * 2014-09-25 2016-04-28 Koa株式会社 Chip resistor
JP2016072298A (en) * 2014-09-26 2016-05-09 Koa株式会社 Manufacturing method of chip resistor
JP2017079321A (en) * 2015-10-19 2017-04-27 株式会社東芝 Semiconductor device
US9638843B2 (en) 2011-10-17 2017-05-02 Stanley Electric Co., Ltd. Reflector array optical device and method for manufacturing the same
US10109398B2 (en) 2014-09-25 2018-10-23 Koa Corporation Chip resistor and method for producing same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999018656A1 (en) * 1997-10-02 1999-04-15 Mitsubishi Denki Kabushiki Kaisha Voltage regulating device
US9638843B2 (en) 2011-10-17 2017-05-02 Stanley Electric Co., Ltd. Reflector array optical device and method for manufacturing the same
JP2016066743A (en) * 2014-09-25 2016-04-28 Koa株式会社 Chip resistor
US10109398B2 (en) 2014-09-25 2018-10-23 Koa Corporation Chip resistor and method for producing same
JP2016072298A (en) * 2014-09-26 2016-05-09 Koa株式会社 Manufacturing method of chip resistor
JP2017079321A (en) * 2015-10-19 2017-04-27 株式会社東芝 Semiconductor device

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