JPH06201608A - Method for inspecting surface - Google Patents
Method for inspecting surfaceInfo
- Publication number
- JPH06201608A JPH06201608A JP4347182A JP34718292A JPH06201608A JP H06201608 A JPH06201608 A JP H06201608A JP 4347182 A JP4347182 A JP 4347182A JP 34718292 A JP34718292 A JP 34718292A JP H06201608 A JPH06201608 A JP H06201608A
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- inspected
- abnormal
- illuminated
- illumination light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Image Processing (AREA)
- Closed-Circuit Television Systems (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Input (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は面検査方法に関する。
この発明は、自動車の車体表面点検等に利用できる。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface inspection method.
INDUSTRIAL APPLICABILITY The present invention can be used for inspecting the body surface of an automobile.
【0002】[0002]
【従来の技術】自動車車体表面等である被検査面の検査
部を照明し、被照明部の像を読取装置により読み取って
信号化し、この信号を閾値処理することにより被検査面
上の異常個所(傷等)を検出する方法は従来から良く知
られている。2. Description of the Related Art An inspection portion of a surface to be inspected, such as the surface of an automobile body, is illuminated, an image of the illuminated portion is read by a reading device and converted into a signal, and this signal is thresholded to detect an abnormal portion on the surface to be inspected. A method for detecting (a scratch or the like) is well known in the art.
【0003】例えば、図2(a)は、自動車車体のフェ
ンダー部0の表面を被検査面として検査する場合を略図
的に示している。ハロゲンランプ等の照明光源10は制
御部30により点滅を制御されてフェンダー部0表面の
検査部0Aを照明する。For example, FIG. 2A schematically shows a case where the surface of the fender portion 0 of an automobile body is inspected as a surface to be inspected. The illumination light source 10 such as a halogen lamp is controlled to blink by the control unit 30 to illuminate the inspection unit 0A on the surface of the fender unit 0.
【0004】読取装置であるCCDカメラ20は制御部
30により制御され、フェンダー部0表面の、照明光源
10に照明された検査部0Aの部分を読み取り、画像信
号に変換してコンピューター等の画像処理部40に出力
する。The CCD camera 20 as a reading device is controlled by the control unit 30 to read the portion of the inspection unit 0A illuminated by the illumination light source 10 on the surface of the fender unit 0, convert it into an image signal, and perform image processing by a computer or the like. It is output to the unit 40.
【0005】検査部0Aに、例えば図2(b)に示すよ
うな「傷」A,B,Cが異常個所として存在すると、検
査部0Aを読み取った画像では、例えば傷A,B,Cの
部分が明るく、傷のない部分が暗くなる。読取画像にお
ける、傷部分とそれ以外の部分との明暗の関係は、照明
光の方向と読取装置との位置関係により異なり、傷のな
い部分を「明るい」背景として、傷の部分が「暗く」な
るように読み取ることも可能である。ここでは説明の具
体性のため、前述のように傷の部分が明るく、傷のない
部分が暗くなるものとする。If "scratches" A, B, and C as shown in FIG. 2 (b) exist as abnormal parts in the inspection section 0A, for example, in the image read by the inspection section 0A, the scratches A, B, and C are detected. Areas are bright and areas without scratches are dark. The relationship between the lightness and darkness of the scratched portion and other portions in the read image differs depending on the positional relationship between the direction of the illumination light and the reading device. It is also possible to read as follows. Here, for the sake of concreteness of description, it is assumed that the scratched portion is bright and the non-scratched portion is dark as described above.
【0006】読み取った画像を適当な閾値レベルで2値
化する「閾値処理」を行うと、図2(c)に示すよう
に、検査部0Aにおける異常個所A,B,Cに対応して
信号レベルが「H(ハイ)」となる部分a,b,cが得
られ、これにより前記異常個所A,B,Cを検出でき
る。When "threshold processing" for binarizing the read image at an appropriate threshold level is performed, as shown in FIG. 2C, signals corresponding to abnormal points A, B and C in the inspection unit 0A are output. The parts a, b, c where the level becomes “H (high)” are obtained, whereby the abnormal parts A, B, C can be detected.
【0007】ところで従来、このような面検査方法には
「ハレーションによる異常個所検出不全」の問題があっ
た。即ち、被検査面が自動車車体表面のように光沢のあ
る面の場合、読取装置20から見て、例えば図2(d)
に符号Dで示す部分が照明光によりハレーションを起こ
し、このような状態で前述の画像処理を行うと、ハレー
ションを生じている部分Dが、図2(e)に示すよう
に、2次元的に拡がりを持った異常個所dとして検出さ
れ、実際の異常個所である傷Cは検出されないのであ
る。[0007] By the way, conventionally, such a surface inspection method has a problem that "abnormal portion detection failure due to halation". That is, when the surface to be inspected is a glossy surface such as the surface of an automobile body, when viewed from the reading device 20, for example, as shown in FIG.
When a portion indicated by reference numeral D in FIG. 2 causes halation due to the illumination light and the above-described image processing is performed in such a state, the portion D in which halation occurs is two-dimensionally changed as shown in FIG. The abnormal portion d having a spread is detected, and the scratch C, which is the actual abnormal portion, is not detected.
【0008】[0008]
【発明が解決しようとする課題】この発明は上述した事
情に鑑みてなされたものであって、ハレーションの影響
を除去して、被検査面における異常個所を確実かつ容易
に検出できる新規な面検査方法の提供を目的とする。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned circumstances, and is a novel surface inspection capable of reliably and easily detecting an abnormal point on a surface to be inspected by removing the influence of halation. The purpose is to provide a method.
【0009】[0009]
【課題を解決するための手段】この発明の面検査方法は
「被検査面上の検査部を照明し、被照明部の像を読取装
置により読み取って信号化し、この信号を閾値処理する
ことにより検査部における異常個所を検出する方法」で
あって、以下の点を特徴とする。即ち、「検査部を異な
る2以上の方向から順次照明して、照明を行うごとに被
照明部の像を読み取り、信号化して閾値処理を行い、閾
値処理された各照明ごとの画像データをアンド演算して
異常個所を検出する」のである。According to the surface inspection method of the present invention, "the inspection section on the surface to be inspected is illuminated, the image of the section to be illuminated is read by a reading device and converted into a signal, and this signal is thresholded. A method for detecting an abnormal portion in the inspection section "and is characterized by the following points. That is, “the inspection section is sequentially illuminated from two or more different directions, and the image of the illuminated section is read every time the illumination is performed, signalized to perform threshold processing, and the threshold-processed image data of each illumination is acquired. It calculates and detects the abnormal part. "
【0010】検査部を2以上の方向から方向から順次照
明するには、例えば単一の照明光源を変位可能にしてお
き、この照明光源を移動させて、異なる方向から照明を
次々に行うようにしてもよく、あるいは複数の照明光源
を所定の位置に配備し、これらを順次点滅して検査部を
異なる方向から照明するようにしてもよい。In order to sequentially illuminate the inspection part from two or more directions, for example, a single illumination light source is made displaceable, and this illumination light source is moved so that illumination is performed successively from different directions. Alternatively, a plurality of illumination light sources may be provided at predetermined positions and these may be sequentially blinked to illuminate the inspection unit from different directions.
【0011】検査部は少なくとも異なる2方向から照明
されるので、複数の照明光源を用いる場合に必要最小限
の光源数は2個である。この場合、「2つの照明光源
が、読取装置を挾んで位置する」ように、2つの照明光
源の配置を定めることができる(請求項2)。Since the inspection unit is illuminated from at least two different directions, the minimum number of light sources required when using a plurality of illumination light sources is two. In this case, the arrangement of the two illumination light sources can be determined such that "the two illumination light sources are located so as to sandwich the reading device" (claim 2).
【0012】[0012]
【作用】上記のように、この発明においては、被検査面
の検査部は異なる2以上の方向から照明される。これら
異なる方向からの照明は時間的に分離しており、各照明
ごとにハレーションの生じる位置が異なる。As described above, in the present invention, the inspection portion of the surface to be inspected is illuminated from two or more different directions. Illumination from these different directions is temporally separated, and the position where halation occurs is different for each illumination.
【0013】[0013]
【実施例】図1は1実施例を示している。繁雑を避ける
ため、混同の虞れがないと思われるものに就いては図2
におけると同一の符号を用いた。図1(a)において、
符号12は第2の照明光源を示す。第2の照明光源12
は、第1の照明光源10と同様にハロゲンランプ等であ
り、読取装置であるCCDカメラ20を介して互いに反
対側に配備される。EXAMPLE FIG. 1 shows one example. To avoid complications, see Figure 2 for things that are not likely to be confused.
The same reference numerals were used as in. In FIG. 1 (a),
Reference numeral 12 indicates a second illumination light source. Second illumination light source 12
Are halogen lamps and the like like the first illumination light source 10, and are arranged on opposite sides via the CCD camera 20 which is a reading device.
【0014】説明の具体性のため、この実施例でも各照
明光源とCCDカメラ20の位置関係は、読み取られた
検査部の画像において「傷部分が明るく、傷のない部分
が暗くなる」ように定められているものとする。For the sake of concreteness of the description, the positional relationship between each illumination light source and the CCD camera 20 is also "this is such that the scratched portion is bright and the non-scratched portion is dark" in the read image of the inspection portion. It shall be stipulated.
【0015】被検査面0における検査部0Aに、図1
(b)に示す如き傷A,B,Cが異常個所として存在す
るものとする。最初に照明光源10のみを点燈させて照
明を行うと、CCDカメラ20の位置から見て図1
(c)に符号D1で示すようにハレーションが生じ、こ
の照明状態をCCDカメラ20で読み取って閾値処理に
より2値化すると、傷A,Bとともにハレーション部分
D1が信号レベル「H」の状態となり、図1(e)示す
ように、「H」の部分はa,b,d1となって、異常個
所Cは検出されない。As shown in FIG.
It is assumed that the scratches A, B, and C as shown in (b) are present as abnormal parts. First, when only the illumination light source 10 is turned on to perform illumination, when viewed from the position of the CCD camera 20, FIG.
Halation occurs as indicated by reference numeral D1 in (c), and when this illumination state is read by the CCD camera 20 and binarized by threshold processing, the halation portion D1 becomes a signal level "H" together with the scratches A and B, As shown in FIG. 1E, the "H" portion becomes a, b, d1 and the abnormal portion C is not detected.
【0016】次に、照明光源10を消灯した状態で照明
光源12のみを点燈して検査部0Aの照明を行うと、C
CDカメラ20から見た照明状態は図1(d)に示すよ
うになり、ハレーション部分D2は傷Aと重なるように
現れる。従って、この状態を読み取って閾値処理により
2値化すると、傷B,Cとハレーション部分D2に応じ
て、信号レベルが「H」となる部分が、図1(f)に符
号b,c,d2で示すように検出される。Next, when the illumination light source 12 is turned off and only the illumination light source 12 is turned on to illuminate the inspection unit 0A, C
The illumination state viewed from the CD camera 20 is as shown in FIG. 1D, and the halation portion D2 appears to overlap the scratch A. Therefore, when this state is read and binarized by threshold processing, the portions where the signal level becomes “H” according to the scratches B and C and the halation portion D2 are denoted by the symbols b, c, and d2 in FIG. 1 (f). It is detected as shown in.
【0017】そこで、画像処理装置40において、上記
2種の照明状態により得られた画像データ(図1の
(e)と(f))を「アンド演算」する。即ち、図1の
(e)と(f)に示す画像データを、画素ごとにアンド
処理すると、各照明ごとの画像データにおける信号レベ
ルがともに「H」である画素のみが「H」となるので、
演算処理の結果、信号レベル「H」を有する部分は図1
(g)に示す部分a,b,cのように、検査部における
異常個所A,B,Cに正しく対応したものとなり、ハレ
ーションの影響を除去して、検査面の異常個所を確実に
検出することができる。Therefore, in the image processing device 40, the AND operation is performed on the image data ((e) and (f) in FIG. 1) obtained by the above two kinds of illumination states. That is, when the image data shown in (e) and (f) of FIG. 1 is AND-processed for each pixel, only the pixels whose signal level in the image data for each illumination is “H” become “H”. ,
As a result of the arithmetic processing, the portion having the signal level "H" is shown in FIG.
Like the parts a, b, and c shown in (g), the abnormal parts A, B, and C in the inspection part are correctly dealt with, and the influence of halation is removed to reliably detect the abnormal parts on the inspection surface. be able to.
【0018】[0018]
【発明の効果】以上のように、この発明によれば新規な
面検査方法を提供できる。この発明は上記の如く構成さ
れているので、被検査面が光沢を有するものである場合
にも、ハレーションの影響を除去して、被検査面検査部
の異常個所を容易且つ確実に検出することができる。As described above, according to the present invention, a novel surface inspection method can be provided. Since the present invention is configured as described above, even when the surface to be inspected has gloss, the influence of halation can be removed to easily and surely detect the abnormal portion of the surface to be inspected. You can
【図1】この発明の1実施例を説明する図である。FIG. 1 is a diagram illustrating an embodiment of the present invention.
【図2】従来技術と、その問題点を説明する図である。FIG. 2 is a diagram illustrating a conventional technique and its problems.
0 被検査面 0A 検査部 10,12 照明光源 A,B,C 傷(検査部における異常個所) D1,D2 ハレーション部分 0 Surface to be inspected 0A Inspection part 10, 12 Illumination light source A, B, C Damage (abnormal part in inspection part) D1, D2 Halation part
フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 G06F 15/64 400 J 7631−5L H04N 7/18 B Continuation of front page (51) Int.Cl. 5 Identification number Office reference number FI Technical display location G06F 15/64 400 J 7631-5L H04N 7/18 B
Claims (2)
像を読取装置により読み取って信号化し、この信号を閾
値処理することにより検査部における異常個所を検出す
る方法において、 検査部を異なる2以上の方向から順次照明して、照明を
行うごとに被照明部の像を読み取り、信号化して閾値処
理を行い、 閾値処理された各照明ごとの画像データをアンド演算し
て異常個所を検出することを特徴とする面検査方法。1. A method for detecting an abnormal part in an inspection part by illuminating an inspection part on a surface to be inspected, reading an image of the illuminated part by a reading device to convert it into a signal, and subjecting this signal to threshold processing. Parts are sequentially illuminated from two or more different directions, the image of the illuminated part is read every time it is illuminated, signalized to perform threshold processing, and the thresholded image data for each illumination is ANDed and abnormal A surface inspection method characterized by detecting points.
置を挾んで設けられ、これら2つの照明光源を順次点滅
して、検査部を異なる方向から順次照明することを特徴
とする面検査方法。2. The surface inspection method according to claim 1, wherein two illumination light sources for illuminating the inspection portion of the surface to be inspected are provided so as to sandwich the reading device, and these two illumination light sources are sequentially blinked to perform inspection. A surface inspection method, which comprises sequentially illuminating a part from different directions.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4347182A JPH06201608A (en) | 1992-12-25 | 1992-12-25 | Method for inspecting surface |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4347182A JPH06201608A (en) | 1992-12-25 | 1992-12-25 | Method for inspecting surface |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH06201608A true JPH06201608A (en) | 1994-07-22 |
Family
ID=18388482
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4347182A Withdrawn JPH06201608A (en) | 1992-12-25 | 1992-12-25 | Method for inspecting surface |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06201608A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008233107A (en) * | 2008-06-16 | 2008-10-02 | Matsushita Electric Works Ltd | Visual examination method and visual examination device |
JP2008233106A (en) * | 2008-06-16 | 2008-10-02 | Matsushita Electric Works Ltd | Visual examination method and visual examination device |
JP2010249598A (en) * | 2009-04-14 | 2010-11-04 | Honda Motor Co Ltd | Three-dimensional shape measuring system and method |
WO2020110667A1 (en) * | 2018-11-30 | 2020-06-04 | Jfeスチール株式会社 | Surface defect detecting method, surface defect detecting device, method for manufacturing steel material, steel material quality control method, steel material manufacturing equipment, method for creating surface defect determination model, and surface defect determination model |
JP2020169920A (en) * | 2019-04-04 | 2020-10-15 | 株式会社ソフト99コーポレーション | Flaw inspection assisting system, image processing method, and vehicle use state display method |
-
1992
- 1992-12-25 JP JP4347182A patent/JPH06201608A/en not_active Withdrawn
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008233107A (en) * | 2008-06-16 | 2008-10-02 | Matsushita Electric Works Ltd | Visual examination method and visual examination device |
JP2008233106A (en) * | 2008-06-16 | 2008-10-02 | Matsushita Electric Works Ltd | Visual examination method and visual examination device |
JP2010249598A (en) * | 2009-04-14 | 2010-11-04 | Honda Motor Co Ltd | Three-dimensional shape measuring system and method |
WO2020110667A1 (en) * | 2018-11-30 | 2020-06-04 | Jfeスチール株式会社 | Surface defect detecting method, surface defect detecting device, method for manufacturing steel material, steel material quality control method, steel material manufacturing equipment, method for creating surface defect determination model, and surface defect determination model |
JP6753553B1 (en) * | 2018-11-30 | 2020-09-09 | Jfeスチール株式会社 | Surface defect detection method, surface defect detection device, steel material manufacturing method, steel material quality control method, steel material manufacturing equipment, surface defect judgment model generation method, and surface defect judgment model |
KR20210080535A (en) * | 2018-11-30 | 2021-06-30 | 제이에프이 스틸 가부시키가이샤 | Surface defect detection method, surface defect detection apparatus, steel manufacturing method, steel quality control method, steel manufacturing equipment, surface defect determination model generation method, and surface defect determination model |
CN113196040A (en) * | 2018-11-30 | 2021-07-30 | 杰富意钢铁株式会社 | Surface defect detection method, surface defect detection device, steel product manufacturing method, steel product quality management method, steel product manufacturing facility, surface defect determination model generation method, and surface defect determination model |
JP2020169920A (en) * | 2019-04-04 | 2020-10-15 | 株式会社ソフト99コーポレーション | Flaw inspection assisting system, image processing method, and vehicle use state display method |
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