CN115407541B - Array substrate, manufacturing method thereof and display device - Google Patents
Array substrate, manufacturing method thereof and display device Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 187
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 claims abstract description 37
- 230000000149 penetrating effect Effects 0.000 claims abstract description 6
- 238000005530 etching Methods 0.000 claims description 38
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- 230000007547 defect Effects 0.000 abstract description 11
- 238000005516 engineering process Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 29
- 239000000047 product Substances 0.000 description 19
- 230000009286 beneficial effect Effects 0.000 description 11
- 239000013067 intermediate product Substances 0.000 description 10
- 238000002161 passivation Methods 0.000 description 10
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 9
- 239000000463 material Substances 0.000 description 6
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 4
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 1
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- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
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Abstract
本发明公开了一种阵列基板及其制作方法、显示装置,涉及显示技术领域,衬底、设置于衬底一侧的晶体管;设置于晶体管背离衬底一侧的第一绝缘层和第二绝缘层,沿阵列基板的厚度方向,第一绝缘层位于第二绝缘层和衬底之间;第一开孔,沿阵列基板的厚度方向,第一开孔贯穿第一绝缘层和第二绝缘层,且暴露晶体管的漏极;辅助垫层,位于第一绝缘层和第二绝缘层之间,辅助垫层环绕第一开孔设置,且第一开孔暴露辅助垫层的侧壁;第一电极,位于第二绝缘层背离衬底的一侧,且第一电极的至少部分位于第一开孔中、与辅助垫层的侧壁接触并且与晶体管的漏极电连接。如此有利于降低在形成第一开孔的过程中第一绝缘层发生侧刻的风险,改善暗点不良现象。
The present invention discloses an array substrate and a manufacturing method thereof, and a display device, and relates to the field of display technology, a substrate, a transistor arranged on one side of the substrate; a first insulating layer and a second insulating layer arranged on the side of the transistor away from the substrate, the first insulating layer being located between the second insulating layer and the substrate along the thickness direction of the array substrate; a first opening, the first opening penetrating the first insulating layer and the second insulating layer along the thickness direction of the array substrate, and exposing the drain of the transistor; an auxiliary pad layer, located between the first insulating layer and the second insulating layer, the auxiliary pad layer being arranged around the first opening, and the first opening exposing the side wall of the auxiliary pad layer; a first electrode, located on the side of the second insulating layer away from the substrate, and at least part of the first electrode being located in the first opening, contacting the side wall of the auxiliary pad layer and being electrically connected to the drain of the transistor. This is conducive to reducing the risk of side engraving of the first insulating layer in the process of forming the first opening, and improving the dark spot defect phenomenon.
Description
技术领域Technical Field
本发明涉及显示技术领域,更具体地,涉及一种阵列基板及其制作方法、显示装置。The present invention relates to the field of display technology, and more specifically, to an array substrate and a manufacturing method thereof, and a display device.
背景技术Background technique
从CRT(Cathode Ray Tube,阴极射线管)时代到液晶显示(LCD,Liquid CrystalDisplay)时代,再到现在到来的OLED(Organic Light-Emitting Diode,有机发光二极管)时代和发光二极管显示时代,显示行业经历了几十年的发展变得日新月异。显示产业已经与我们的生活息息相关,从传统的手机、平板、电视和PC,再到现在的智能穿戴设备、VR、车载显示等电子设备都离不开显示技术。From the CRT (Cathode Ray Tube) era to the LCD (Liquid Crystal Display) era, and now to the OLED (Organic Light-Emitting Diode) era and the LED display era, the display industry has experienced decades of development and has changed with each passing day. The display industry is closely related to our lives, from traditional mobile phones, tablets, TVs and PCs to today's smart wearable devices, VR, car displays and other electronic devices, all of which are inseparable from display technology.
阵列基板是显示面板的重要组成部分,阵列基板上包括多个晶体管,在阵列基板的制作工艺中,在完成晶体管的制作后,会在晶体管一侧沉积绝缘层,利用刻蚀的方式在绝缘层上形成过孔,再在绝缘层上形成电极层,使得电极层与晶体管电连接。但是,传统阵列基板的制作工艺中,在绝缘层上形成过孔的过程中,难免会在过孔内发生侧刻的现象,造成电极层与晶体管之间接触不良,导致产品显示异常例如出现暗点不良的现象,降低了产品良率。The array substrate is an important component of the display panel. The array substrate includes multiple transistors. In the manufacturing process of the array substrate, after the transistor is manufactured, an insulating layer is deposited on one side of the transistor, and a via is formed on the insulating layer by etching, and then an electrode layer is formed on the insulating layer, so that the electrode layer is electrically connected to the transistor. However, in the manufacturing process of the traditional array substrate, in the process of forming the via on the insulating layer, side etching will inevitably occur in the via, resulting in poor contact between the electrode layer and the transistor, resulting in abnormal product display, such as the appearance of dark spots, and reducing the product yield.
发明内容Summary of the invention
有鉴于此,本发明提供了一种阵列基板及其制作方法、显示装置,旨在降低在形成第一开孔的过程中第一绝缘层发生侧刻的风险,改善暗点不良现象,提升产品良率。In view of this, the present invention provides an array substrate and a manufacturing method thereof, and a display device, aiming to reduce the risk of side etching of the first insulating layer during the formation of the first opening, improve the dark spot defect phenomenon, and improve the product yield.
第一方面,本申请提供一种阵列基板,包括:In a first aspect, the present application provides an array substrate, comprising:
衬底、设置于衬底一侧的晶体管;A substrate and a transistor disposed on one side of the substrate;
设置于所述晶体管背离所述衬底一侧的第一绝缘层和第二绝缘层,沿所述阵列基板的厚度方向,所述第一绝缘层位于所述第二绝缘层和所述衬底之间;A first insulating layer and a second insulating layer are provided on a side of the transistor away from the substrate, wherein the first insulating layer is located between the second insulating layer and the substrate along a thickness direction of the array substrate;
第一开孔,沿所述阵列基板的厚度方向,所述第一开孔贯穿所述第一绝缘层和所述第二绝缘层,且暴露所述晶体管的漏极;A first opening, along a thickness direction of the array substrate, the first opening penetrating the first insulating layer and the second insulating layer and exposing the drain of the transistor;
辅助垫层,位于所述第一绝缘层和所述第二绝缘层之间,所述辅助垫层环绕所述第一开孔设置,且所述第一开孔暴露所述辅助垫层的侧壁;an auxiliary pad layer, located between the first insulating layer and the second insulating layer, the auxiliary pad layer being disposed around the first opening, and the first opening exposing a side wall of the auxiliary pad layer;
第一电极,位于所述第二绝缘层背离所述衬底的一侧,且所述第一电极的至少部分位于所述第一开孔中、与所述辅助垫层的侧壁接触并且与所述晶体管的漏极电连接。The first electrode is located on a side of the second insulating layer away from the substrate, and at least a portion of the first electrode is located in the first opening, in contact with a side wall of the auxiliary pad layer and electrically connected to a drain of the transistor.
第二方面,本发明提供一种阵列基板的制作方法,包括:In a second aspect, the present invention provides a method for manufacturing an array substrate, comprising:
提供一衬底,并在所述衬底上制作晶体管层,所述晶体管层包括多个晶体管;Providing a substrate, and manufacturing a transistor layer on the substrate, wherein the transistor layer includes a plurality of transistors;
在所述晶体管层背离所述衬底的一侧制作第一绝缘层;Forming a first insulating layer on a side of the transistor layer facing away from the substrate;
在所述第一绝缘层背离所述衬底的一侧制作辅助层,沿所述阵列基板的厚度方向,所述辅助层与所述晶体管的漏极交叠;An auxiliary layer is formed on a side of the first insulating layer away from the substrate, wherein the auxiliary layer overlaps with the drain of the transistor along a thickness direction of the array substrate;
在辅助层背离所述第一绝缘层的一侧制作第二绝缘层;forming a second insulating layer on a side of the auxiliary layer away from the first insulating layer;
通过一道刻蚀工艺对所述第一绝缘层、所述辅助层和所述第二绝缘层进行刻蚀,形成第一开孔和辅助垫层,其中,所述辅助垫层环绕所述第一开孔,且所述第一开孔暴露所述晶体管的漏极以及所述辅助垫层的侧壁;Etching the first insulating layer, the auxiliary layer and the second insulating layer through an etching process to form a first opening and an auxiliary pad layer, wherein the auxiliary pad layer surrounds the first opening, and the first opening exposes the drain of the transistor and the sidewall of the auxiliary pad layer;
在所述的第二绝缘层背离所述衬底的一侧制作第一电极,使所述第一电极的至少部分位于所述第一开孔中、与所述辅助垫层的侧壁接触并且与所述晶体管的漏极电连接。A first electrode is formed on a side of the second insulating layer away from the substrate, so that at least a portion of the first electrode is located in the first opening, contacts the side wall of the auxiliary pad layer and is electrically connected to the drain of the transistor.
第三方面,本发明还提供一种显示装置,包括本发明第一方面所提供的阵列基板。In a third aspect, the present invention further provides a display device, comprising the array substrate provided in the first aspect of the present invention.
与现有技术相比,本发明提供的阵列基板及其制作方法、显示装置,至少实现了如下的有益效果:Compared with the prior art, the array substrate and the manufacturing method thereof, and the display device provided by the present invention achieve at least the following beneficial effects:
本发明所提供的阵列基板和显示装置中,在阵列基板的晶体管背离衬底的一侧设置有第一绝缘层和第二绝缘层以及贯穿第一绝缘层和第二绝缘层的第一开孔,第一电极中的至少部分位于第一开孔中,与晶体管的漏极形成电连接。特别是,本发明在第一绝缘层和第二绝缘层之间引入了辅助垫层,辅助垫层环绕第一开孔设置,且第一开孔暴露辅助垫层的侧壁,如此,在通过刻蚀的方法形成第一开孔时,由于辅助垫层的阻挡作用,能够在很大程度上避免第一开孔在第一绝缘层和第二绝缘层的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极与晶体管的连接不可靠的现象,因此有利于提升第一电极与晶体管的连接可靠性,避免或减小暗点不良现象的发生,故有利于提升产品的显示可靠性以及生产良率。In the array substrate and display device provided by the present invention, a first insulating layer and a second insulating layer and a first opening penetrating the first insulating layer and the second insulating layer are provided on the side of the transistor of the array substrate facing away from the substrate, and at least a portion of the first electrode is located in the first opening to form an electrical connection with the drain of the transistor. In particular, the present invention introduces an auxiliary pad layer between the first insulating layer and the second insulating layer, the auxiliary pad layer is arranged around the first opening, and the first opening exposes the side wall of the auxiliary pad layer, so that when the first opening is formed by etching, due to the blocking effect of the auxiliary pad layer, the phenomenon of side engraving of the first opening at the junction of the first insulating layer and the second insulating layer can be avoided to a large extent, so it is helpful to avoid or reduce the phenomenon of unreliable connection between the first electrode and the transistor caused by side engraving, so it is helpful to improve the connection reliability between the first electrode and the transistor, avoid or reduce the occurrence of dark spot defects, so it is helpful to improve the display reliability and production yield of the product.
本发明实施例所提供的阵列基板的制作方法中,在在第一绝缘层和第二绝缘层之间引入了辅助层,通过一道刻蚀工艺对第一绝缘层、辅助层和第二绝缘层进行刻蚀形成第一开孔,刻蚀后的辅助层形成环绕的一开孔的辅助垫层,辅助层的引入有效减小或者避免了第一开孔在第一绝缘层和第二绝缘层的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极与晶体管的连接不可靠的现象。通过一道刻蚀工艺形成第一开孔的方式,既有利于避免暗点不良现象的发生,又有利于简化生产工艺,提高生产效率。In the manufacturing method of the array substrate provided by the embodiment of the present invention, an auxiliary layer is introduced between the first insulating layer and the second insulating layer, and the first insulating layer, the auxiliary layer and the second insulating layer are etched by an etching process to form a first opening, and the etched auxiliary layer forms an auxiliary pad layer surrounding the opening. The introduction of the auxiliary layer effectively reduces or avoids the phenomenon that the first opening forms side etching at the junction of the first insulating layer and the second insulating layer, so it is helpful to avoid or reduce the phenomenon that the connection between the first electrode and the transistor is unreliable due to side etching. The method of forming the first opening by an etching process is not only helpful to avoid the occurrence of dark spot defects, but also helpful to simplify the production process and improve production efficiency.
当然,实施本发明的任一产品必不特定需要同时达到以上所述的所有技术效果。Of course, any product implementing the present invention does not necessarily need to achieve all of the technical effects described above at the same time.
通过以下参照附图对本发明的示例性实施例的详细描述,本发明的其它特征及其优点将会变得清楚。Further features and advantages of the present invention will become apparent from the following detailed description of exemplary embodiments of the present invention with reference to the attached drawings.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
被结合在说明书中并构成说明书的一部分的附图示出了本发明的实施例,并且连同其说明一起用于解释本发明的原理。The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
图1所示为相关技术中阵列基板的一种膜层示意图;FIG1 is a schematic diagram of a film layer of an array substrate in the related art;
图2所示为本发明实施例所提供的阵列基板的俯视图;FIG2 is a top view of an array substrate provided by an embodiment of the present invention;
图3所示为图2中阵列基板的一种膜层示意图;FIG3 is a schematic diagram of a film layer of the array substrate in FIG2 ;
图4所示为本发明实施例所提供的阵列基板中辅助垫层、第一电极以及第一开孔的一种俯视图;FIG4 is a top view of an auxiliary pad layer, a first electrode and a first opening in an array substrate provided by an embodiment of the present invention;
图5所示为图2中阵列基板的另一种膜层示意图;FIG5 is a schematic diagram of another film layer of the array substrate in FIG2 ;
图6所示为图2中阵列基板的另一种膜层示意图;FIG6 is a schematic diagram showing another film layer of the array substrate in FIG2 ;
图7所示为图2中阵列基板的另一种膜层示意图;FIG. 7 is a schematic diagram of another film layer of the array substrate in FIG. 2 ;
图8所示为图2中阵列基板的另一种膜层示意图;FIG8 is a schematic diagram of another film layer of the array substrate in FIG2 ;
图9所示为本发明实施例所提供的阵列基板的一种制作流程图;FIG9 is a flowchart showing a manufacturing process of an array substrate provided by an embodiment of the present invention;
图10所示为本发明实施例所提供的阵列基板制作过程中所形成的中间产品的一种结构示意图;FIG10 is a schematic structural diagram of an intermediate product formed in the process of manufacturing an array substrate provided in an embodiment of the present invention;
图11所示为本发明实施例所提供的阵列基板制作过程中所形成的中间产品的另一种结构示意图;FIG. 11 is another schematic structural diagram of an intermediate product formed in the process of manufacturing an array substrate provided in an embodiment of the present invention;
图12所示为本发明实施例所提供的阵列基板制作过程中所形成的中间产品的另一种结构示意图;FIG. 12 is another schematic structural diagram of an intermediate product formed in the process of manufacturing an array substrate provided in an embodiment of the present invention;
图13所示为本发明实施例所提供的阵列基板制作过程中所形成的中间产品的另一种结构示意图;FIG. 13 is another schematic structural diagram of an intermediate product formed in the process of manufacturing an array substrate provided in an embodiment of the present invention;
图14所示为本发明实施例所提供的阵列基板制作过程中所形成的中间产品的另一种结构示意图;FIG. 14 is another schematic structural diagram of an intermediate product formed in the process of manufacturing an array substrate provided in an embodiment of the present invention;
图15所示为本发明实施例所提供的显示装置的一种结构示意图。FIG. 15 is a schematic diagram showing a structure of a display device provided in an embodiment of the present invention.
具体实施方式Detailed ways
现在将参照附图来详细描述本发明的各种示例性实施例。应注意到:除非另外具体说明,否则在这些实施例中阐述的部件和步骤的相对布置、数字表达式和数值不限制本发明的范围。Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless otherwise specifically stated.
以下对至少一个示例性实施例的描述实际上仅仅是说明性的,决不作为对本发明及其应用或使用的任何限制。The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
对于相关领域普通技术人员已知的技术、方法和设备可能不作详细讨论,但在适当情况下,所述技术、方法和设备应当被视为说明书的一部分。Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered as part of the specification.
在这里示出和讨论的所有例子中,任何具体值应被解释为仅仅是示例性的,而不是作为限制。因此,示例性实施例的其它例子可以具有不同的值。In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.
应注意到:相似的标号和字母在下面的附图中表示类似项,因此,一旦某一项在一个附图中被定义,则在随后的附图中不需要对其进行进一步讨论。It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.
图1所示为相关技术中阵列基板100’的一种膜层示意图,请参考图1,相关技术中,阵列基板100’上设置有两层钝化层20’,电极41’和晶体管10’分别位于两层钝化层20’整体的两侧。由于钝化层20’的膜层较厚,且两层钝化层20’的材质相同,在一层钝化层20’上形成另一层钝化层20’的过程中,若两层钝化层20’搭接不可靠,在对两层钝化层20’刻蚀形成连接电极41’和晶体管10’的刻蚀孔K1’时,在刻蚀孔K1’中两层钝化层20’交界的位置极易出现侧刻(如图1中圆形虚框示出的部分)的现象。为实现电极41’与晶体管10’的电连接,电极41’的部分材料会从刻蚀孔K1’的顶部流淌至孔底,与晶体管10’搭接。但是,由于刻蚀孔K1’内存在侧刻的现象,刻蚀孔K1’中的电极41’材料极易出现断裂,进而导致刻蚀孔K1’内的电极41’材料与晶体管10’的搭接阻抗变大甚至断开连接,对显示效果造成的直接影响是可能会在对应的区域出现暗点不良的现象,影响显示面板的整体显示效果。FIG1 is a schematic diagram of a film layer of an array substrate 100' in the related art. Please refer to FIG1. In the related art, two passivation layers 20' are arranged on the array substrate 100', and the electrode 41' and the transistor 10' are respectively located on both sides of the two passivation layers 20'. Since the film layer of the passivation layer 20' is relatively thick, and the two passivation layers 20' are made of the same material, in the process of forming another passivation layer 20' on one passivation layer 20', if the overlap of the two passivation layers 20' is not reliable, when the two passivation layers 20' are etched to form an etching hole K1' connecting the electrode 41' and the transistor 10', the position where the two passivation layers 20' intersect in the etching hole K1' is prone to side etching (as shown by the circular dotted frame in FIG1). In order to achieve the electrical connection between the electrode 41' and the transistor 10', part of the material of the electrode 41' will flow from the top of the etching hole K1' to the bottom of the hole and overlap the transistor 10'. However, due to the side etching phenomenon in the etching hole K1’, the electrode 41’ material in the etching hole K1’ is very easy to break, which will cause the overlapping impedance between the electrode 41’ material in the etching hole K1’ and the transistor 10’ to increase or even disconnect. The direct impact on the display effect is that dark spots may appear in the corresponding area, affecting the overall display effect of the display panel.
鉴于此,本发明提供一种阵列基板及其制作方法、显示装置,旨在降低在形成第一开孔的过程中第一绝缘层发生侧刻的风险,改善暗点不良现象,提升产品良率。In view of this, the present invention provides an array substrate and a manufacturing method thereof, and a display device, aiming to reduce the risk of side etching of the first insulating layer during the formation of the first opening, improve the dark spot defect phenomenon, and improve the product yield.
图2所示为本发明实施例所提供的阵列基板100的俯视图,图3所示为图2中阵列基板100的一种膜层示意图,该膜层示意图体现了阵列基板100中的第一电极41与晶体管10的一种连接示意,图4所示为本发明实施例所提供的阵列基板100中辅助垫层30、第一电极41以及第一开孔K1的一种俯视图,请参考图2至图4,本发明实施提供一种阵列基板100,包括:FIG. 2 is a top view of an array substrate 100 provided in an embodiment of the present invention. FIG. 3 is a schematic diagram of a film layer of the array substrate 100 in FIG. 2 , which shows a schematic diagram of a connection between a first electrode 41 in the array substrate 100 and a transistor 10. FIG. 4 is a top view of an auxiliary pad layer 30, a first electrode 41 and a first opening K1 in the array substrate 100 provided in an embodiment of the present invention. Referring to FIG. 2 to FIG. 4 , the present invention provides an array substrate 100, including:
衬底00、设置于衬底00一侧的晶体管10;A substrate 00 and a transistor 10 disposed on one side of the substrate 00;
设置于晶体管10背离衬底00一侧的第一绝缘层21和第二绝缘层22,沿阵列基板100的厚度方向,第一绝缘层21位于第二绝缘层22和衬底00之间;A first insulating layer 21 and a second insulating layer 22 are provided on a side of the transistor 10 away from the substrate 00 , and along the thickness direction of the array substrate 100 , the first insulating layer 21 is located between the second insulating layer 22 and the substrate 00 ;
第一开孔K1,沿阵列基板100的厚度方向,第一开孔K1贯穿第一绝缘层21和第二绝缘层22,且暴露晶体管10的漏极;A first opening K1 is formed along the thickness direction of the array substrate 100 . The first opening K1 penetrates the first insulating layer 21 and the second insulating layer 22 and exposes the drain of the transistor 10 .
辅助垫层30,位于第一绝缘层21和第二绝缘层22之间,辅助垫层30环绕第一开孔K1设置,且第一开孔K1暴露辅助垫层30的侧壁;The auxiliary pad layer 30 is located between the first insulating layer 21 and the second insulating layer 22. The auxiliary pad layer 30 is disposed around the first opening K1, and the first opening K1 exposes the side wall of the auxiliary pad layer 30.
第一电极41,位于第二绝缘层22背离衬底00的一侧,且第一电极41的至少部分位于第一开孔K1中、与辅助垫层30的侧壁接触并且与晶体管10的漏极电连接。The first electrode 41 is located on a side of the second insulating layer 22 facing away from the substrate 00 , and at least a portion of the first electrode 41 is located in the first opening K1 , in contact with a sidewall of the auxiliary pad layer 30 and electrically connected to the drain of the transistor 10 .
需要说明的是,图2仅以矩形结构的阵列基板100为例进行说明,并不对阵列基板100的实际形状进行限定,在本发明的一些其他实施例中,阵列基板100的形状还可体现为圆角矩形、圆形或者其他异形。而且,图2中也仅对阵列基板100上的部分第一电极41进行了示意,并不代表阵列基板100所包含的第一电极41的实际数量。图3仅对阵列基板100的一种膜层结构进行了示意,并不代表阵列基板100实际所包含的膜层数量和膜层厚度。图4仅对辅助垫层30、第一电极41和第一开孔K1的一种俯视关系进行了示意,并不代表实际的尺寸。It should be noted that FIG. 2 only illustrates an array substrate 100 with a rectangular structure, and does not limit the actual shape of the array substrate 100. In some other embodiments of the present invention, the shape of the array substrate 100 may also be a rounded rectangle, a circle or other special shapes. Moreover, FIG. 2 only illustrates a portion of the first electrodes 41 on the array substrate 100, and does not represent the actual number of first electrodes 41 included in the array substrate 100. FIG. 3 only illustrates a film layer structure of the array substrate 100, and does not represent the actual number of film layers and the thickness of the film layers included in the array substrate 100. FIG. 4 only illustrates a top-down relationship between the auxiliary pad 30, the first electrode 41 and the first opening K1, and does not represent the actual size.
具体而言,继续参考图2和图3,本发明所提供的阵列基板100中通常设置有多个像素驱动电路,像素驱动电路包括多个晶体管10,虽然图2和图3仅示出了与第一电极41连接的一个晶体管10,但并不代表与第一电极41所对应的像素驱动电路中晶体的实际数量。可选地,阵列基板还包括多条扫描线S和多条数据线D,与第一电极41所连接的晶体管的栅极连接扫描线S,源极连接数据线D。本发明实施例中,在阵列基板100的晶体管10背离衬底00的一侧设置有第一绝缘层21和第二绝缘层22,第一电极41位于第二绝缘层22背离第一绝缘层21的一侧,为实现第一电极41与晶体管10的电连接,设置有沿阵列基板100的厚度方向贯穿第一绝缘层21和第二绝缘层22的第一开孔K1,第一电极41中的至少部分位于第一开孔K1中,与晶体管10的漏极形成电连接。Specifically, referring to FIG. 2 and FIG. 3 , the array substrate 100 provided by the present invention is generally provided with a plurality of pixel driving circuits, and the pixel driving circuit includes a plurality of transistors 10. Although FIG. 2 and FIG. 3 only show one transistor 10 connected to the first electrode 41, they do not represent the actual number of transistors in the pixel driving circuit corresponding to the first electrode 41. Optionally, the array substrate further includes a plurality of scanning lines S and a plurality of data lines D, and the gate of the transistor connected to the first electrode 41 is connected to the scanning line S, and the source is connected to the data line D. In the embodiment of the present invention, a first insulating layer 21 and a second insulating layer 22 are provided on the side of the transistor 10 of the array substrate 100 away from the substrate 00, and the first electrode 41 is located on the side of the second insulating layer 22 away from the first insulating layer 21. In order to realize the electrical connection between the first electrode 41 and the transistor 10, a first opening K1 is provided that penetrates the first insulating layer 21 and the second insulating layer 22 along the thickness direction of the array substrate 100, and at least a portion of the first electrode 41 is located in the first opening K1, and is electrically connected to the drain of the transistor 10.
特别是,本发明实施例在第一绝缘层21和第二绝缘层22之间引入了辅助垫层30,也就是说在第一绝缘层21和第二绝缘层22交界的至少部分区域引入了辅助垫层30,辅助垫层30环绕第一开孔K1设置,且第一开孔K1暴露辅助垫层30的侧壁,如此,在通过刻蚀的方法形成第一开孔K1时,由于辅助垫层30的阻挡作用,能够在很大程度上避免第一开孔K1在第一绝缘层21和第二绝缘层22的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极41与晶体管10的连接不可靠的现象,因此有利于提升第一电极41与晶体管10的连接可靠性,当将本发明所提供的阵列基板100应用于显示产品中时,能够避免或减小暗点不良现象的发生,故有利于提升产品的显示可靠性以及生产良率。In particular, the embodiment of the present invention introduces an auxiliary pad layer 30 between the first insulating layer 21 and the second insulating layer 22, that is, the auxiliary pad layer 30 is introduced into at least a portion of the junction area of the first insulating layer 21 and the second insulating layer 22, the auxiliary pad layer 30 is arranged around the first opening K1, and the first opening K1 exposes the side wall of the auxiliary pad layer 30. In this way, when the first opening K1 is formed by etching, due to the blocking effect of the auxiliary pad layer 30, the first opening K1 can be prevented from forming side etching at the junction of the first insulating layer 21 and the second insulating layer 22 to a large extent. Therefore, it is beneficial to avoid or reduce the unreliable connection between the first electrode 41 and the transistor 10 caused by the side etching, and therefore it is beneficial to improve the connection reliability between the first electrode 41 and the transistor 10. When the array substrate 100 provided by the present invention is applied to a display product, it can avoid or reduce the occurrence of dark spot defects, so it is beneficial to improve the display reliability and production yield of the product.
可选地,本发明实施例中的第一绝缘层21和第二绝缘层22均为钝化层。Optionally, the first insulating layer 21 and the second insulating layer 22 in the embodiment of the present invention are both passivation layers.
在本发明的一种可选实施方式中,辅助垫层30为导电材料层。In an optional embodiment of the present invention, the auxiliary pad layer 30 is a conductive material layer.
具体而言,本发明实施例中,将第一绝缘层21和第二绝缘层22之间的辅助垫层30设置为导电材料层,第一电极41中位于第一开孔K1中的部分将能够与辅助垫层30搭接,辅助垫层30可看作是第一电极41与晶体管10的导电搭接平台,有利于避免第一电极41中位于第一开孔K1中的部分在第一开孔K1中出现断裂的现象,因而有利于保证第一电极41与晶体管10之间电连接的可靠性,避免在将阵列基板100应用于显示产品中时出现暗点不良的现象。Specifically, in the embodiment of the present invention, the auxiliary pad layer 30 between the first insulating layer 21 and the second insulating layer 22 is set as a conductive material layer, and the portion of the first electrode 41 located in the first opening K1 will be able to overlap with the auxiliary pad layer 30. The auxiliary pad layer 30 can be regarded as a conductive overlapping platform between the first electrode 41 and the transistor 10, which is beneficial to avoid the portion of the first electrode 41 located in the first opening K1 from breaking in the first opening K1, thereby ensuring the reliability of the electrical connection between the first electrode 41 and the transistor 10, and avoiding the occurrence of dark spot defects when the array substrate 100 is applied to display products.
可选地,本发明实施例中的辅助垫层30除体现为导电材料层外,还可体现为与第一绝缘层21和第二绝缘层22材料不同的非导电材料层。Optionally, the auxiliary pad layer 30 in the embodiment of the present invention may be a non-conductive material layer different from the first insulating layer 21 and the second insulating layer 22 in addition to being a conductive material layer.
需要说明的是,本发明实施例中的辅助垫层30除与第一电极41形成电连接外,并未与阵列基板100上的其他导电层电连接,也就是说,辅助垫层30上的信号和与其连接的第一电极41上的信号是一致的,从而避免当辅助垫层30与其他膜层连接时对第一电极41上的信号准确性造成影响。It should be noted that, in addition to forming an electrical connection with the first electrode 41, the auxiliary pad layer 30 in the embodiment of the present invention is not electrically connected to other conductive layers on the array substrate 100. That is to say, the signal on the auxiliary pad layer 30 is consistent with the signal on the first electrode 41 connected thereto, thereby avoiding affecting the accuracy of the signal on the first electrode 41 when the auxiliary pad layer 30 is connected to other film layers.
图5所示为图2中阵列基板100的另一种膜层示意图,该膜层示意图除体现阵列基板100中的第一电极41与晶体管10的连接示意外,还进一步体现了阵列基板100中包括第一电极41和第二电极42时,第一电极41和第二电极42的一种相对位置关系。FIG5 is another film layer schematic diagram of the array substrate 100 in FIG2 . In addition to illustrating the connection between the first electrode 41 in the array substrate 100 and the transistor 10 , the film layer schematic diagram further illustrates a relative position relationship between the first electrode 41 and the second electrode 42 when the array substrate 100 includes the first electrode 41 and the second electrode 42 .
请参考图5,在本发明的一种可选实施方式中,本发明实施例中的阵列基板100还包括位于第一绝缘层21与第二绝缘层22之间的第二电极42,第二电极42与辅助垫层30绝缘,且沿阵列基板100的厚度方向,辅助垫层30与第二电极42的厚度相同。Please refer to Figure 5. In an optional embodiment of the present invention, the array substrate 100 in the embodiment of the present invention also includes a second electrode 42 located between the first insulating layer 21 and the second insulating layer 22. The second electrode 42 is insulated from the auxiliary pad layer 30, and along the thickness direction of the array substrate 100, the thickness of the auxiliary pad layer 30 is the same as that of the second electrode 42.
可选地,本发明实施例所提供的阵列基板100可应用于液晶显示产品,本发明实施例中引入的第一电极41和第二电极42分别对应液晶显示产品中的像素电极和公共电极,通过晶体管10向像素电极提供电压信号,使得像素电极和公共电极之间形成驱动液晶偏转的电压,进而实现显示功能。Optionally, the array substrate 100 provided in the embodiment of the present invention can be applied to liquid crystal display products. The first electrode 41 and the second electrode 42 introduced in the embodiment of the present invention correspond to the pixel electrode and the common electrode in the liquid crystal display product, respectively. A voltage signal is provided to the pixel electrode through the transistor 10, so that a voltage for driving the liquid crystal deflection is formed between the pixel electrode and the common electrode, thereby realizing the display function.
可选地,第二电极42和辅助垫层30均位于第一绝缘层21与第二绝缘层22之间,在实际制作过程中,在第一绝缘层21上形成第二电极42和辅助垫层30后,再在第二电极42和辅助垫层30背离第一绝缘层21的一侧形成第二绝缘层22。本发明实施例中设置辅助垫层30与第二电极42的厚度相同时,在辅助垫层30与第二电极42背离第一绝缘层21的一侧形成第二绝缘层22时,有利于保证第二绝缘层22背离第一绝缘层21的一侧表面的平整性,从而有利于保证形成于第二绝缘层22上的第二电极42的平整性,进而有利于保证当将阵列基板100应用于显示产品中时显示产品的显示均一性。Optionally, the second electrode 42 and the auxiliary pad layer 30 are both located between the first insulating layer 21 and the second insulating layer 22. In the actual manufacturing process, after the second electrode 42 and the auxiliary pad layer 30 are formed on the first insulating layer 21, the second insulating layer 22 is formed on the side of the second electrode 42 and the auxiliary pad layer 30 away from the first insulating layer 21. In the embodiment of the present invention, when the thickness of the auxiliary pad layer 30 and the second electrode 42 are the same, when the second insulating layer 22 is formed on the side of the auxiliary pad layer 30 and the second electrode 42 away from the first insulating layer 21, it is beneficial to ensure the flatness of the surface of the side of the second insulating layer 22 away from the first insulating layer 21, thereby facilitating the flatness of the second electrode 42 formed on the second insulating layer 22, and further facilitating the display uniformity of the display product when the array substrate 100 is applied to the display product.
图6所示为图2中阵列基板100的另一种膜层示意图,在本发明的一种可选实施方式中,辅助垫层30与第二电极42采用同一掩膜版在同一制作工序中制作。需要说明的是,为体现辅助垫层30与第二电极42采用同一制作工序制作,图6中对辅助垫层30和第二电极42进行了相同的填充。当然,其他实施例中辅助垫层30和第二电极42为不同的填充时,既可代表二者采用相同的材料制作,也可代表二者可采用不同的材料制作。FIG6 is another schematic diagram of a film layer of the array substrate 100 in FIG2. In an optional embodiment of the present invention, the auxiliary pad layer 30 and the second electrode 42 are made in the same manufacturing process using the same mask. It should be noted that in order to reflect that the auxiliary pad layer 30 and the second electrode 42 are made in the same manufacturing process, the auxiliary pad layer 30 and the second electrode 42 are filled in the same way in FIG6. Of course, in other embodiments, when the auxiliary pad layer 30 and the second electrode 42 are filled differently, it can mean that the two are made of the same material or different materials.
具体而言,本发明实施例所提供的阵列基板100中,当将辅助垫层30与第二电极42均设置在第一绝缘层21与第二绝缘层22之间时,在第一绝缘层21上形成辅助垫层30与第二电极42的过程中,辅助垫层30与第二电极42可采用同一掩膜版在同一制作工序中制作,如此,无需为辅助垫层30引入另外的掩膜版及制作工艺,在制作第二电极42的过程中即可完成辅助垫层30的制作,因而有利于简化阵列基板100整体的制作工艺,提高整列基板的生产效率。Specifically, in the array substrate 100 provided by the embodiment of the present invention, when the auxiliary pad layer 30 and the second electrode 42 are both arranged between the first insulating layer 21 and the second insulating layer 22, in the process of forming the auxiliary pad layer 30 and the second electrode 42 on the first insulating layer 21, the auxiliary pad layer 30 and the second electrode 42 can be produced using the same mask plate in the same production process. In this way, there is no need to introduce additional mask plates and production processes for the auxiliary pad layer 30. The production of the auxiliary pad layer 30 can be completed in the process of producing the second electrode 42, which is beneficial to simplify the overall production process of the array substrate 100 and improve the production efficiency of the entire array substrate.
图7所示为图2中阵列基板100的另一种膜层示意图,该膜层示意图除体现阵列基板100中的第一电极41与晶体管10的连接示意外,还体现了辅助垫层30与第二绝缘层22的另一种相对位置关系。图5和图6所示的膜层示意图中,第一开孔K1仅暴露辅助垫层30的侧面;图7所示的膜层示意图中,第一开孔K1除暴露辅助垫层30的侧面外,还暴露了辅助垫层30朝向第二绝缘层22的至少部分表面。FIG7 is another schematic diagram of the film layer of the array substrate 100 in FIG2, which not only shows the connection diagram of the first electrode 41 and the transistor 10 in the array substrate 100, but also shows another relative position relationship between the auxiliary pad layer 30 and the second insulating layer 22. In the schematic diagrams of the film layer shown in FIG5 and FIG6, the first opening K1 only exposes the side surface of the auxiliary pad layer 30; in the schematic diagram of the film layer shown in FIG7, the first opening K1 not only exposes the side surface of the auxiliary pad layer 30, but also exposes at least a portion of the surface of the auxiliary pad layer 30 facing the second insulating layer 22.
请参考图7,在本发明的一种可选实施方式中,第一开孔K1暴露辅助垫层30背离衬底00一侧的至少部分表面,第一电极41还与辅助垫层30背离衬底00一侧的至少部分表面接触。Please refer to FIG. 7 . In an optional embodiment of the present invention, the first opening K1 exposes at least part of the surface of the auxiliary pad layer 30 facing away from the substrate 00 , and the first electrode 41 is also in contact with at least part of the surface of the auxiliary pad layer 30 facing away from the substrate 00 .
具体而言,本发明实施例所提供的阵列基板100中,在第一绝缘层21和第二绝缘层22之间引入了辅助垫层30,当形成第一开孔K1时,第一开孔K1实际上是分别贯穿第二绝缘层22、辅助垫层30和第一绝缘层21的,如此,第一开孔K1将暴露辅助垫层30的侧壁。进一步地,本实施例中的第一开孔K1还暴露了辅助垫层30朝向第二绝缘层22的至少部分表面,当在第二绝缘层22背离第一绝缘层21的一侧形成第一电极41时,第一电极41位于第一开孔K1中的部分将既与辅助垫层30的侧壁接触,又与辅助垫层30朝向第二绝缘层22的表面接触,如此有效增大了第一电极41与辅助垫层30的接触面积,从而有利于提升第一电极41与辅助垫层30之间的电连接的可靠性,更加有利于避免第一电极41位于第一开孔K1中的部分出现断裂的现象,因此更加有利于提升第一电极41与晶体管10的连接可靠性,避免将阵列基板100应用于显示产品中时出现暗点不良的现象。Specifically, in the array substrate 100 provided in the embodiment of the present invention, an auxiliary pad layer 30 is introduced between the first insulating layer 21 and the second insulating layer 22. When the first opening K1 is formed, the first opening K1 actually penetrates the second insulating layer 22, the auxiliary pad layer 30 and the first insulating layer 21 respectively. In this way, the first opening K1 will expose the side wall of the auxiliary pad layer 30. Furthermore, the first opening K1 in the present embodiment also exposes at least a portion of the surface of the auxiliary pad 30 toward the second insulating layer 22. When the first electrode 41 is formed on the side of the second insulating layer 22 away from the first insulating layer 21, the portion of the first electrode 41 located in the first opening K1 will contact both the side wall of the auxiliary pad 30 and the surface of the auxiliary pad 30 facing the second insulating layer 22. This effectively increases the contact area between the first electrode 41 and the auxiliary pad 30, thereby facilitating the improvement of the reliability of the electrical connection between the first electrode 41 and the auxiliary pad 30, and further facilitating the avoidance of the breakage of the portion of the first electrode 41 located in the first opening K1. Therefore, it is more conducive to improving the connection reliability between the first electrode 41 and the transistor 10, and avoiding the occurrence of dark spots when the array substrate 100 is applied to display products.
继续参考图7,在本发明的一种可选实施方式中,辅助垫层30背离衬底00一侧的至少部分表面由第二绝缘层22覆盖。7 , in an optional embodiment of the present invention, at least a portion of the surface of the auxiliary pad layer 30 facing away from the substrate 00 is covered by the second insulating layer 22 .
需要说明的是,当辅助垫层30背离衬底00的一侧表面均被第一开口暴露时,在刻蚀形成第一开孔K1的过程中,沿平行于第二绝缘层22所在平面的表面,位于辅助垫层30远离开孔一侧的第一绝缘层21极有可能发生不期望的刻蚀,影响整列基板的功能可靠性。故,当本发明中的第一开孔K1暴露辅助垫层30朝向第二绝缘层22的至少部分表面以提高第一电极41与辅助垫层30之间的连接可靠性时,还确保辅助垫层30中朝向第二绝缘层22的其余表面被第二绝缘层22所覆盖,也就是说,在刻蚀形成第一开孔K1的过程中有效避免了对位于辅助垫层30远离第一开孔K1一侧的第一绝缘层21造成不期望的刻蚀现象,因而有利于提高阵列基板100的功能稳定性。It should be noted that when the surface of the auxiliary pad layer 30 facing away from the substrate 00 is exposed by the first opening, in the process of etching to form the first opening K1, the first insulating layer 21 located on the side of the auxiliary pad layer 30 far from the opening along the surface parallel to the plane where the second insulating layer 22 is located is very likely to be undesirably etched, affecting the functional reliability of the entire array substrate. Therefore, when the first opening K1 in the present invention exposes at least part of the surface of the auxiliary pad layer 30 facing the second insulating layer 22 to improve the connection reliability between the first electrode 41 and the auxiliary pad layer 30, it is also ensured that the remaining surface of the auxiliary pad layer 30 facing the second insulating layer 22 is covered by the second insulating layer 22, that is, in the process of etching to form the first opening K1, the undesirable etching phenomenon of the first insulating layer 21 located on the side of the auxiliary pad layer 30 far from the first opening K1 is effectively avoided, thereby helping to improve the functional stability of the array substrate 100.
请参考图5至图7,在本发明的一种可选实施方式中,阵列基板100还包括位于晶体管10与第一绝缘层21之间的平坦层50,平坦层50包括暴露晶体管10的漏极的第二开孔K2,沿阵列基板100的厚度方向,第一开孔K1和的第二开孔K2交叠。Please refer to Figures 5 to 7. In an optional embodiment of the present invention, the array substrate 100 also includes a planar layer 50 located between the transistor 10 and the first insulating layer 21. The planar layer 50 includes a second opening K2 exposing the drain of the transistor 10. Along the thickness direction of the array substrate 100, the first opening K1 and the second opening K2 overlap.
具体而言,本发明实施例在晶体管10背离衬底00的一侧形成平坦层50,从而为晶体管10之上的其余膜层提供平坦化的表面,便于后续膜层的制作。这样,晶体管10与第一电极41之间的绝缘层除包括第一绝缘层21和第二绝缘层22外,还包括位于第一绝缘层21朝向衬底00一侧的平坦层50。在实际制作过程中,在晶体管10之上完成平坦层50的制作后,为实现后续形成的第一电极41与晶体管10的电连接,可首先在平坦层50上形成第二开孔K2,该第二开孔K2暴露晶体管10的漏极,然后再在平坦层50背离衬底00的一侧形成第一绝缘层21、辅助垫层30和第二电极42层、第二绝缘层22,在完成第二绝缘层22的制作之后,再通过刻蚀的方式形成贯穿第二绝缘层22、辅助垫层30以及第一绝缘层21的第一开孔K1。本发明实施例设置第一开孔K1和第二开孔K2沿阵列基板100的厚度方向交叠,从而使得第一开孔K1能够通过第二开孔K2暴露出晶体管10的漏极,如此,在第二绝缘层22背离衬底00的一侧形成第一电极41时,进入第一开孔K1中的第一电极41能够与晶体管10的漏极形成电连接,提升第一电极41与晶体管10的电连接可靠性。此外,在形成第一开孔K1的过程中,由于辅助垫层30的阻挡作用,能够在很大程度上避免第一开孔K1在第一绝缘层21和第二绝缘层22的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极41与晶体管10的连接不可靠的现象,因此有利于提升第一电极41与晶体管10的连接可靠性,当将本发明所提供的阵列基板100应用于显示产品中时,能够避免或减小暗点不良现象的发生,故有利于提升产品的显示可靠性以及生产良率。Specifically, the embodiment of the present invention forms a flat layer 50 on the side of the transistor 10 away from the substrate 00, thereby providing a flat surface for the remaining film layers on the transistor 10, which is convenient for the subsequent film layer production. In this way, the insulating layer between the transistor 10 and the first electrode 41 includes not only the first insulating layer 21 and the second insulating layer 22, but also the flat layer 50 located on the side of the first insulating layer 21 facing the substrate 00. In the actual production process, after the flat layer 50 is produced on the transistor 10, in order to realize the electrical connection between the subsequently formed first electrode 41 and the transistor 10, a second opening K2 can be first formed on the flat layer 50, and the second opening K2 exposes the drain of the transistor 10, and then the first insulating layer 21, the auxiliary pad layer 30, the second electrode 42 layer, and the second insulating layer 22 are formed on the side of the flat layer 50 away from the substrate 00. After the second insulating layer 22 is produced, the first opening K1 penetrating the second insulating layer 22, the auxiliary pad layer 30 and the first insulating layer 21 is formed by etching. In the embodiment of the present invention, the first opening K1 and the second opening K2 are arranged to overlap along the thickness direction of the array substrate 100, so that the first opening K1 can expose the drain of the transistor 10 through the second opening K2. In this way, when the first electrode 41 is formed on the side of the second insulating layer 22 away from the substrate 00, the first electrode 41 entering the first opening K1 can form an electrical connection with the drain of the transistor 10, thereby improving the reliability of the electrical connection between the first electrode 41 and the transistor 10. In addition, in the process of forming the first opening K1, due to the blocking effect of the auxiliary pad layer 30, the phenomenon of side engraving of the first opening K1 at the junction of the first insulating layer 21 and the second insulating layer 22 can be avoided to a large extent, so it is helpful to avoid or reduce the phenomenon of unreliable connection between the first electrode 41 and the transistor 10 caused by side engraving, so it is helpful to improve the connection reliability between the first electrode 41 and the transistor 10. When the array substrate 100 provided by the present invention is applied to a display product, it can avoid or reduce the occurrence of dark spot defects, so it is helpful to improve the display reliability and production yield of the product.
图8所示为图2中阵列基板100的另一种膜层示意图,该实施例示出了第一开孔K1与晶体管10的漏极的另外一种方案。在本发明的一种可选实施方式中,沿阵列基板100的厚度方向,晶体管10的漏极位于第二开孔K2中;第一开孔K1在衬底00的正投影位于漏极在衬底00的正投影范围内。FIG8 is another schematic diagram of a film layer of the array substrate 100 in FIG2 , and this embodiment shows another solution of the first opening K1 and the drain of the transistor 10. In an optional embodiment of the present invention, along the thickness direction of the array substrate 100, the drain of the transistor 10 is located in the second opening K2; the orthographic projection of the first opening K1 on the substrate 00 is located within the orthographic projection range of the drain on the substrate 00.
具体而言,当在平坦层50上形成暴露晶体管10的漏极的第一开孔K1时,本实施例将第一开孔K1的孔径设置的较大,使得晶体管10的漏极完全被暴露,也就是说使得晶体管10的漏极完全位于第一开孔K1中。当再形成第一开孔K1时,本实施例限定第一开孔K1在衬底00的正投影位于晶体管10的漏极在衬底00的正投影范围内,如此,有利于增大第一电极41位于第一开孔K1中的部分与晶体管10的漏极之间的接触面积,因而有利于提升第一电极41与晶体管10的电连接可靠性。Specifically, when the first opening K1 exposing the drain of the transistor 10 is formed on the planar layer 50, the aperture of the first opening K1 is set larger in this embodiment so that the drain of the transistor 10 is completely exposed, that is, the drain of the transistor 10 is completely located in the first opening K1. When the first opening K1 is formed again, this embodiment defines that the orthographic projection of the first opening K1 on the substrate 00 is located within the orthographic projection range of the drain of the transistor 10 on the substrate 00, which is conducive to increasing the contact area between the portion of the first electrode 41 located in the first opening K1 and the drain of the transistor 10, thereby facilitating the improvement of the electrical connection reliability between the first electrode 41 and the transistor 10.
图9所示为本发明实施例所提供的阵列基板100的一种制作流程图,请参考图9,基于同一发明构思,本发明还提供一种阵列基板100的制作方法,包括:FIG9 is a flowchart of manufacturing an array substrate 100 provided in an embodiment of the present invention. Referring to FIG9 , based on the same inventive concept, the present invention further provides a method for manufacturing the array substrate 100, including:
S201、提供一衬底00,并在衬底00上制作晶体管层11,晶体管层11包括多个晶体管10,请参考图10,图10所示为本发明实施例所提供的阵列基板100制作过程中所形成的中间产品的一种结构示意图;S201, providing a substrate 00, and manufacturing a transistor layer 11 on the substrate 00, wherein the transistor layer 11 includes a plurality of transistors 10. Please refer to FIG. 10, which is a schematic structural diagram of an intermediate product formed in the manufacturing process of the array substrate 100 provided in an embodiment of the present invention;
可选地,在衬底00上形成晶体管层11之后,还包括在晶体管层11背离衬底00的一侧形成平坦层50,并在平坦层50上形成第二开孔K2的步骤,其中,沿衬底00的厚度方向,第二开孔K2与晶体管10的漏极交叠。Optionally, after forming the transistor layer 11 on the substrate 00, the step further includes forming a planar layer 50 on the side of the transistor layer 11 facing away from the substrate 00, and forming a second opening K2 on the planar layer 50, wherein the second opening K2 overlaps with the drain of the transistor 10 along the thickness direction of the substrate 00.
S202、在晶体管层11背离衬底00的一侧制作第一绝缘层21,具体为,在平坦层50背离衬底00的一侧制作第一绝缘层21,此时,至少部分第一绝缘层21将填充于第二开孔K2中。请参考图11,图11所示为本发明实施例所提供的阵列基板100制作过程中所形成的中间产品的另一种结构示意图;S202, forming a first insulating layer 21 on the side of the transistor layer 11 away from the substrate 00, specifically, forming the first insulating layer 21 on the side of the flat layer 50 away from the substrate 00, at this time, at least part of the first insulating layer 21 will be filled in the second opening K2. Please refer to Figure 11, which is another structural schematic diagram of an intermediate product formed in the process of manufacturing the array substrate 100 provided in an embodiment of the present invention;
S203、在第一绝缘层21背离衬底00的一侧制作辅助层31,沿阵列基板100的厚度方向,辅助层31与晶体管10的漏极交叠,请参考图12,图12所示为本发明实施例所提供的阵列基板100制作过程中所形成的中间产品的另一种结构示意图;S203, forming an auxiliary layer 31 on the side of the first insulating layer 21 away from the substrate 00, and the auxiliary layer 31 overlaps with the drain of the transistor 10 along the thickness direction of the array substrate 100. Please refer to FIG. 12, which is another structural schematic diagram of an intermediate product formed in the process of manufacturing the array substrate 100 provided in an embodiment of the present invention;
S204、在辅助层31背离第一绝缘层21的一侧制作第二绝缘层22,请参考图13,图13所示为本发明实施例所提供的阵列基板100制作过程中所形成的中间产品的另一种结构示意图;S204, forming a second insulating layer 22 on a side of the auxiliary layer 31 away from the first insulating layer 21, referring to FIG. 13, which is another structural schematic diagram of an intermediate product formed in the manufacturing process of the array substrate 100 provided in an embodiment of the present invention;
S205、通过一道刻蚀工艺对第一绝缘层21、辅助层31和第二绝缘层22进行刻蚀,形成第一开孔K1和辅助垫层30,其中,辅助垫层30环绕第一开孔K1,且第一开孔K1暴露晶体管10的漏极以及辅助垫层30的侧壁,请参考图14,图14所示为本发明实施例所提供的阵列基板100制作过程中所形成的中间产品的另一种结构示意图;S205, etching the first insulating layer 21, the auxiliary layer 31 and the second insulating layer 22 through an etching process to form a first opening K1 and an auxiliary pad layer 30, wherein the auxiliary pad layer 30 surrounds the first opening K1, and the first opening K1 exposes the drain of the transistor 10 and the side wall of the auxiliary pad layer 30. Please refer to FIG. 14, which is another schematic structural diagram of an intermediate product formed in the manufacturing process of the array substrate 100 provided in an embodiment of the present invention;
S206、在的第二绝缘层22背离衬底00的一侧制作第一电极41,使第一电极41的至少部分位于第一开孔K1中、与辅助垫层30的侧壁接触并且与晶体管10的漏极电连接,请参考图3。S206 , forming a first electrode 41 on the side of the second insulating layer 22 facing away from the substrate 00 , so that at least a portion of the first electrode 41 is located in the first opening K1 , contacts the side wall of the auxiliary pad layer 30 , and is electrically connected to the drain of the transistor 10 , please refer to FIG. 3 .
具体而言,本发明实施例所提供的阵列基板100的制作方法中,在第一绝缘层21和第二绝缘层22之间引入了辅助层31,通过一道刻蚀工艺对第一绝缘层21、辅助层31和第二绝缘层22进行刻蚀形成第一开孔K1,刻蚀后的辅助层31形成环绕第一开孔K1的辅助垫层30,辅助层31的引入有效减小或者避免了第一开孔K1在第一绝缘层21和第二绝缘层22的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极41与晶体管10的连接不可靠的现象。此外,通过一道刻蚀工艺形成第一开孔K1的方式,既有利于避免暗点不良现象的发生,又有利于简化生产工艺,提高生产效率。Specifically, in the manufacturing method of the array substrate 100 provided in the embodiment of the present invention, an auxiliary layer 31 is introduced between the first insulating layer 21 and the second insulating layer 22, and the first insulating layer 21, the auxiliary layer 31 and the second insulating layer 22 are etched by an etching process to form the first opening K1. The etched auxiliary layer 31 forms an auxiliary pad layer 30 surrounding the first opening K1. The introduction of the auxiliary layer 31 effectively reduces or avoids the phenomenon that the first opening K1 is side-etched at the junction of the first insulating layer 21 and the second insulating layer 22, so it is helpful to avoid or reduce the phenomenon that the connection between the first electrode 41 and the transistor 10 is unreliable due to the side etching. In addition, the method of forming the first opening K1 by an etching process is not only helpful to avoid the occurrence of dark spot defects, but also helpful to simplify the production process and improve production efficiency.
继续参考图12,在本发明的一种可选实施方式中,在晶体管层11背离衬底00的一侧制作第一绝缘层21之后、在辅助层31背离第一绝缘层21的一侧制作第二绝缘层22之前,还包括:在第一绝缘层21背离衬底00的一侧制作第二电极42,使第二电极42与辅助层31绝缘,且第二电极42与辅助层31的厚度相同。Continuing to refer to Figure 12, in an optional embodiment of the present invention, after the first insulating layer 21 is formed on the side of the transistor layer 11 facing away from the substrate 00 and before the second insulating layer 22 is formed on the side of the auxiliary layer 31 facing away from the first insulating layer 21, it also includes: forming a second electrode 42 on the side of the first insulating layer 21 facing away from the substrate 00, so that the second electrode 42 is insulated from the auxiliary layer 31, and the second electrode 42 has the same thickness as the auxiliary layer 31.
可选地,第二电极42和辅助垫层30均位于第一绝缘层21与第二绝缘层22之间,在实际制作过程中,在第一绝缘层21上形成第二电极42和辅助垫层30后,再在第二电极42和辅助垫层30背离第一绝缘层21的一侧形成第二绝缘层22。本发明实施例中设置辅助垫层30与第二电极42的厚度相同时,在辅助垫层30与第二电极42背离第一绝缘层21的一侧形成第二绝缘层22时,有利于保证第二绝缘层22背离第一绝缘层21的一侧表面的平整性,从而有利于保证形成于第二绝缘层22上的第二电极42的平整性,进而有利于保证当将阵列基板100应用于显示产品中时显示产品的显示均一性。Optionally, the second electrode 42 and the auxiliary pad layer 30 are both located between the first insulating layer 21 and the second insulating layer 22. In the actual manufacturing process, after the second electrode 42 and the auxiliary pad layer 30 are formed on the first insulating layer 21, the second insulating layer 22 is formed on the side of the second electrode 42 and the auxiliary pad layer 30 away from the first insulating layer 21. In the embodiment of the present invention, when the thickness of the auxiliary pad layer 30 and the second electrode 42 are the same, when the second insulating layer 22 is formed on the side of the auxiliary pad layer 30 and the second electrode 42 away from the first insulating layer 21, it is beneficial to ensure the flatness of the surface of the side of the second insulating layer 22 away from the first insulating layer 21, thereby facilitating the flatness of the second electrode 42 formed on the second insulating layer 22, and further facilitating the display uniformity of the display product when the array substrate 100 is applied to the display product.
在本发明的一种可选实施方式中,在第一绝缘层21背离衬底00的一侧制作第二电极42,具体为:在第一绝缘层21背离衬底00的一侧设置第一掩膜版,利用第一掩膜版在第一绝缘层21背离衬底00的一侧同时形成辅助层31和第二电极42。In an optional embodiment of the present invention, the second electrode 42 is produced on the side of the first insulating layer 21 facing away from the substrate 00, specifically: a first mask is set on the side of the first insulating layer 21 facing away from the substrate 00, and the auxiliary layer 31 and the second electrode 42 are simultaneously formed on the side of the first insulating layer 21 facing away from the substrate 00 by using the first mask.
具体而言,本发明实施例所提供的阵列基板100中,当将辅助垫层30与第二电极42均设置在第一绝缘层21与第二绝缘层22之间时,在第一绝缘层21上形成辅助垫层30与第二电极42的过程中,辅助垫层30与第二电极42采用同一掩膜版在同一制作工序中制作,如此,无需为辅助垫层30引入另外的掩膜版及制作工艺,在制作第二电极42的过程中即可完成辅助垫层30的制作,因而有利于简化阵列基板100整体的制作工艺,提高整列基板的生产效率。Specifically, in the array substrate 100 provided by the embodiment of the present invention, when the auxiliary pad layer 30 and the second electrode 42 are both arranged between the first insulating layer 21 and the second insulating layer 22, in the process of forming the auxiliary pad layer 30 and the second electrode 42 on the first insulating layer 21, the auxiliary pad layer 30 and the second electrode 42 are produced using the same mask plate in the same production process. In this way, there is no need to introduce another mask plate and production process for the auxiliary pad layer 30. The production of the auxiliary pad layer 30 can be completed in the process of producing the second electrode 42, which is beneficial to simplify the overall production process of the array substrate 100 and improve the production efficiency of the entire array substrate.
基于同一发明构思,本发明还提供一种显示装置300,图15所示为本发明实施例所提供的显示装置300的一种结构示意图,该显示装置300包括本发明上述任一实施例所提供的阵列基板100。Based on the same inventive concept, the present invention further provides a display device 300. FIG. 15 is a schematic structural diagram of a display device 300 provided by an embodiment of the present invention. The display device 300 includes an array substrate 100 provided by any of the above embodiments of the present invention.
可以理解的是,本发明实施例提供的显示装置300,可以是电脑、手机、平板、等其他具有显示功能的显示装置300,本发明对此不作具体限制。本发明实施例提供的显示装置300,具有本发明实施例提供的阵列基板100的有益效果,具体可以参考上述各实施例对于显示面板的具体说明,本实施例在此不再赘述。It is understandable that the display device 300 provided in the embodiment of the present invention may be a computer, a mobile phone, a tablet, or other display device 300 with a display function, and the present invention does not specifically limit this. The display device 300 provided in the embodiment of the present invention has the beneficial effects of the array substrate 100 provided in the embodiment of the present invention, and the specific description of the display panel in the above embodiments can be referred to, and this embodiment will not be repeated here.
综上,本发明提供的阵列基板及其制作方法、显示装置,至少实现了如下的有益效果:In summary, the array substrate and the manufacturing method thereof, and the display device provided by the present invention achieve at least the following beneficial effects:
本发明所提供的阵列基板和显示装置中,在阵列基板的晶体管背离衬底的一侧设置有第一绝缘层和第二绝缘层以及贯穿第一绝缘层和第二绝缘层的第一开孔,第一电极中的至少部分位于第一开孔中,与晶体管的漏极形成电连接。特别是,本发明在第一绝缘层和第二绝缘层之间引入了辅助垫层,辅助垫层环绕第一开孔设置,且第一开孔暴露辅助垫层的侧壁,如此,在通过刻蚀的方法形成第一开孔时,由于辅助垫层的阻挡作用,能够在很大程度上避免第一开孔在第一绝缘层和第二绝缘层的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极与晶体管的连接不可靠的现象,因此有利于提升第一电极与晶体管的连接可靠性,避免或减小暗点不良现象的发生,故有利于提升产品的显示可靠性以及生产良率。In the array substrate and display device provided by the present invention, a first insulating layer and a second insulating layer and a first opening penetrating the first insulating layer and the second insulating layer are provided on the side of the transistor of the array substrate facing away from the substrate, and at least a portion of the first electrode is located in the first opening to form an electrical connection with the drain of the transistor. In particular, the present invention introduces an auxiliary pad layer between the first insulating layer and the second insulating layer, the auxiliary pad layer is arranged around the first opening, and the first opening exposes the side wall of the auxiliary pad layer, so that when the first opening is formed by etching, due to the blocking effect of the auxiliary pad layer, the phenomenon of side engraving of the first opening at the junction of the first insulating layer and the second insulating layer can be avoided to a large extent, so it is helpful to avoid or reduce the phenomenon of unreliable connection between the first electrode and the transistor caused by side engraving, so it is helpful to improve the connection reliability between the first electrode and the transistor, avoid or reduce the occurrence of dark spot defects, so it is helpful to improve the display reliability and production yield of the product.
本发明实施例所提供的阵列基板的制作方法中,在在第一绝缘层和第二绝缘层之间引入了辅助层,通过一道刻蚀工艺对第一绝缘层、辅助层和第二绝缘层进行刻蚀形成第一开孔,刻蚀后的辅助层形成环绕的一开孔的辅助垫层,辅助层的引入有效减小或者避免了第一开孔在第一绝缘层和第二绝缘层的交界处形成侧刻的现象,故有利于避免或减小由于侧刻而导致的第一电极与晶体管的连接不可靠的现象。通过一道刻蚀工艺形成第一开孔的方式,既有利于避免暗点不良现象的发生,又有利于简化生产工艺,提高生产效率。In the manufacturing method of the array substrate provided by the embodiment of the present invention, an auxiliary layer is introduced between the first insulating layer and the second insulating layer, and the first insulating layer, the auxiliary layer and the second insulating layer are etched by an etching process to form a first opening, and the etched auxiliary layer forms an auxiliary pad layer surrounding the opening. The introduction of the auxiliary layer effectively reduces or avoids the phenomenon that the first opening forms side etching at the junction of the first insulating layer and the second insulating layer, so it is helpful to avoid or reduce the phenomenon that the connection between the first electrode and the transistor is unreliable due to side etching. The method of forming the first opening by an etching process is not only helpful to avoid the occurrence of dark spot defects, but also helpful to simplify the production process and improve production efficiency.
虽然已经通过例子对本发明的一些特定实施例进行了详细说明,但是本领域的技术人员应该理解,以上例子仅是为了进行说明,而不是为了限制本发明的范围。本领域的技术人员应该理解,可在不脱离本发明的范围和精神的情况下,对以上实施例进行修改。本发明的范围由所附权利要求来限定。Although some specific embodiments of the present invention have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present invention. It will be appreciated by those skilled in the art that the above embodiments may be modified without departing from the scope and spirit of the present invention. The scope of the present invention is defined by the appended claims.
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