CN1151371C - Reflecting and scattering pinhole imager - Google Patents
Reflecting and scattering pinhole imager Download PDFInfo
- Publication number
- CN1151371C CN1151371C CNB001074792A CN00107479A CN1151371C CN 1151371 C CN1151371 C CN 1151371C CN B001074792 A CNB001074792 A CN B001074792A CN 00107479 A CN00107479 A CN 00107479A CN 1151371 C CN1151371 C CN 1151371C
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- ray
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- 230000002285 radioactive effect Effects 0.000 claims description 2
- 238000003384 imaging method Methods 0.000 abstract description 8
- 238000007689 inspection Methods 0.000 abstract 2
- 230000001066 destructive effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
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Abstract
The present invention relates to a needle hole back scattering imaging device which comprises an X-ray source, a fan-shaped collimator and a detector. The present invention is structurally characterized in that rays transmitted by the X-ray source are formed into a fan-shaped beam through the fan-shaped collimator; the rays of the fan-shaped beam are irradiated on an object to be measured to be scattered, and the rays of the fan-shaped beam are received by an array detector through an arranged needle hole collimator. Compared with the prior art, the present invention can fully utilize the X-ray source, which greatly improves the image taking speed, the resolution and the mechanical stability. The present invention is suitable for all X-ray imaging devices of an X-ray inspection system. The present invention is especially suitable for various shipping container inspection systems used in custom offices.
Description
Technical field
The present invention relates to the x-ray imaging device of X-ray examination system.Be applicable to the used container check system of X-ray examination system, particularly customs that every profession and trade is used.
Background technology
Existing X ray backscattering imaging has many devices, and these devices all adopt the pencil beam flying-spot scanner to finish.Its principle of work is as follows: the ray of X source emission is configured as pencil beam through collimating apparatus, penetrates on testee, and ray is received by detector after scattering.When collimating apparatus when X source rotates, pencil beam forms flying-spot scanner to testee.Because the signal difference of diverse location, the signal of detector is respective change also, has therefore formed a series of backscattering images.This backscattering imaging method, though the efficient of collection backscattering ray is higher, because the pencil beam collimating apparatus needs constantly to rotate in scanning, the utilization factor that therefore exists X source is low, sweep velocity is slow, the unstable shortcoming of mechanical property.
Summary of the invention
In order to overcome the shortcoming that exists in the above-mentioned prior art, the purpose of this invention is to provide a kind of reflecting and scattering pinhole imager.Use it can make full use of X source, improve sweep velocity and mechanical stability thereof.
To achieve the above object, technical scheme of the present invention realizes in the following way: reflecting and scattering pinhole imager comprises X source, fan-shaped collimating apparatus and detector.Its design feature is: the ray of described X source emission forms fladellum through fan-shaped collimating apparatus, and the fladellum ray shoots is being received by detector array by set pinhole collimator through after the backscattering on the testee.
According to above-mentioned technical scheme, the transmit direction that sees through side, fladellum ray of described testee also is provided with the detector that receives X ray.
The present invention has been owing to adopted X ray with the imaging of fladellum form, thereby can make full use of X source, improves image taking speed and resolution greatly.Again because fan-shaped collimating apparatus and pinhole collimator belong to not moving component, thereby improved the stability of imaging device.Compare with prior art, though the collection rate of backscattering ray is lower than flying spot formula scanning form, because X source utilization factor height, so total detection efficiency is not low.That the present invention has is reasonable in design, simple in structure, the characteristics of stable mechanical performance.
The invention will be further described below in conjunction with accompanying drawing and concrete embodiment.
Description of drawings
Fig. 1 is one embodiment of the present invention principle schematic;
Fig. 2 is the another embodiment of the invention principle schematic.
Embodiment
The embodiment of the invention 1 is applicable to all x-ray imaging devices that adopt the X-ray examination system.Comprise the used all kinds of container check systems of customs, aviation goods X-ray examination system, mail X-ray examination system, hand baggage X-ray examination system and other ray non-destructive detecting device.The embodiment of the invention 2 also is suitable for above-mentioned various check systems, is particularly useful for the used all kinds of container check systems of customs.
Claims (3)
1. reflecting and scattering pinhole imager that is used for the X-ray examination system, it comprises X source, fan-shaped collimating apparatus and detector, it is characterized in that: the ray of described X source (1) emission forms fladellum (3) through fan-shaped collimating apparatus (2), and fladellum (3) ray shoots goes up through being received by detector array (6) by set pinhole collimator (5) after the backscattering at testee (4).
2. according to the described reflecting and scattering pinhole imager of claim 1, it is characterized in that: the transmit direction that sees through side, fladellum (3) ray of described testee (4) also is provided with the detector (7) that receives X ray.
3. according to claim 1 or 2 described reflecting and scattering pinhole imagers, it is characterized in that: described X source (1) can be X-ray pipe, linac or isotope radioactive source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001074792A CN1151371C (en) | 2000-05-18 | 2000-05-18 | Reflecting and scattering pinhole imager |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001074792A CN1151371C (en) | 2000-05-18 | 2000-05-18 | Reflecting and scattering pinhole imager |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1325025A CN1325025A (en) | 2001-12-05 |
| CN1151371C true CN1151371C (en) | 2004-05-26 |
Family
ID=4578730
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB001074792A Expired - Lifetime CN1151371C (en) | 2000-05-18 | 2000-05-18 | Reflecting and scattering pinhole imager |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1151371C (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100480692C (en) * | 2003-08-23 | 2009-04-22 | 上海世鹏实验室科技发展有限公司 | Radiation source device |
| CN100545641C (en) * | 2004-04-03 | 2009-09-30 | 宋世鹏 | A kind of ray detecting device |
| KR101311487B1 (en) * | 2004-11-12 | 2013-09-25 | 엑스트랄리스 테크놀로지스 엘티디. | Particle Detector, System And Method |
| CN103983654B (en) * | 2014-05-26 | 2016-09-14 | 中国科学院高能物理研究所 | A kind of ray scattering imaging system based on aperture coding techniques |
| CN106829388A (en) * | 2017-03-10 | 2017-06-13 | 天津工业大学 | Conveyer band discerption fault detection method and device based on X-ray backscattering technology |
| US10859719B2 (en) * | 2018-12-13 | 2020-12-08 | The Boeing Company | Adjustable multifacet x-ray sensor array |
-
2000
- 2000-05-18 CN CNB001074792A patent/CN1151371C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CN1325025A (en) | 2001-12-05 |
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Owner name: TONGFANGWEISHI TECHNOLOGY CO., LTD.; QINGHUA UNIVE Free format text: FORMER NAME OR ADDRESS: TONGFANG WEISHI TECHNOLOGY CO., LTD., QINGHUA; QINGHUA UNIVERSITY |
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| CP01 | Change in the name or title of a patent holder |
Address after: Beijing Tsinghua Tongfang science and Technology Square, block A, 2907 Patentee after: Nuctech Company Limited Patentee after: Tsinghua University Address before: Beijing Tsinghua Tongfang science and Technology Square, block A, 2907 Patentee before: Qinghua Tongfang Weishi Tech Co.,Ltd. Patentee before: Tsinghua University |
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